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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1995

Multi-angle Imaging SpectroRadiometer (MISR): Optical Characterization of the Spectralon Calibration Panels

The reflectance properties of an engineering model of the Spectralon panel intended for use within an On-Board Calibrator (OBC) on the NASA Multi-angle Imaging SpectroRadiometer (MISR) instrument have been fully characterized with regard to panel uniformity and isotropy in response to three incident laser wavelengths of 442, 632.8 and 859.9 nm. A regional variation in bidirectional reflectance function (BRF) across the surface of the engineering model (EM) panel, contributing to spatial non-uniformity at the +/-2% level has been measured at all three laser wavelengths. Further, a BRF anisotropy has been identified. The mechanism causing these departures from the ideal Lambertian surface may originate in the sanding of the Spectralon surface in the final stage of preparation. This is corroborated by measurements made on a 'pressed' polytetrafluoroethylene (PTFE) panel in which a greatly reduced anisotropy in panel BRF is measured. The EM panel BRF reveals deviation from a Lambertian characteristic manifest as an off-specular peak in the forward scattering direction. A common cross-over point at an angle of reflection of around 37 at which the BRF is constant within 0.4% for an illumination angle range of ui = 30 60 is observed at all three wavelengths. Two Spectralon protoflight panels which were fabricated after the engineering model was studied were also the subject of a uniformity study over part of the area of the Spectralon panels at the 442 nm wavelength. The analysis indicated that the panel uniformity satisfies the 0.5% criterion indicating improved panel preparation. However, the off specular peak in the forward scattering direction is essentially unchanged with the cross-over point at approximately 37.

Multi-angle Imaging SpectroRadiometer↗
NASA NTRS2023

JPSS J2 Spectralon Performance Prelaunch

Spectralon® is a high reflectance excellent diffuser used to reflect sunlight for use as a calibrator for on-orbit and ground instruments. Radiometric calibration of the reflective bands in the 0.4 to 2.5μm wavelength range is performed by measuring the sunlight reflected from Spectralon®. Reflected sunlight is directly proportional to the Bidirectional Reflectance Distribution Function (BRDF) of the Spectralon®. On-orbit exposure to sunlight results in solarization due to solar UV and the presence of residual contamination. Spectralon® quality is checked at start of build by measuring the change in reflectance on exposing a witness sample to 100 hours Solar UV as an indication of on orbit performance. For JPSS J2, the witness samples accompanied the sensor till 30 days before launch. Measuring the reflectance change on exposure to Solar UV of the witness samples accompanying the sensor through build and test is a better indication of on orbit performance as this includes any additional contamination during the build and test phase.

spectral reflectance↗
NASA NTRS2012

Directional Degradation of Spectralon Diffuser Under Ionizing Radiation for Calibration of Space-Based Sensors

Assessment of the effect of Vacuum Ultra Violet (VUV) irradiation on the Bidirectional Reflectance Distribution Function (BRDF) of Spectralon is presented in this paper. The sample was a 99% white Spectralon calibration standard irradiated with VUV source positioned at 60o off the irradiation direction for a total of 20 hours. The BRDF before and after VUV irradiation was measured and compared at number of wavelengths in the UV, VIS and IR. Non-isotropic directional degradation of Spectralon diffuser under ionizing radiation was detected at different BRDF measurement geometries primarily at UV spectral range. The 8o directional/hemispherical reflectance of the same sample was also measured and compared from 200nm to 2500nm. Index Terms BRDF, Reflectance, Multiangular, Spectralon, Remote Sensing

Georgiev, G. T.↗
NASA NTRS1993

Modeling Spectralon's Bidirectional Reflectance for In-Flight Calibration of Earth-Orbiting Sensors

This paper describes the results of a model inversion which was conducted using measured Spectralon BRDF data at several illumination angles. We can describe the bidirectional reflectance of the Spectralon and in paticular its slight anisotrophy with a physically-based model. The root mean square difference between the model and the observations is currently of the order of the noise in the data (+/-1%). It is expected that meaningful corrections to account for the anisotrophy of the Spectralon panels will be achieved in the next few years and will improve the calibration of the MISR instrument.

EOS↗
NASA NTRS2011

jasonSWIR Calibration of Spectralon Reflectance Factor

Satellite instruments operating in the reflective solar wavelength region require accurate and precise determination of the Bidirectional Reflectance Factor (BRF) of laboratory-based diffusers used in their pre-flight and on-orbit radiometric calibrations. BRF measurements are required throughout the reflected-solar spectrum from the ultraviolet through the shortwave infrared. Spectralon diffusers are commonly used as a reflectance standard for bidirectional and hemispherical geometries. The Diffuser Calibration Laboratory (DCaL) at NASA's Goddard Space Flight Center is a secondary calibration facility with reflectance measurements traceable to those made by the Spectral Tri-function Automated Reference Reflectometer (STARR) facility at the National Institute of Standards and Technology (NIST). For more than two decades, the DCaL has provided numerous NASA projects with BRF data in the ultraviolet (UV), visible (VIS) and the Near infraRed (NIR) spectral regions. Presented in this paper are measurements of BRF from 1475nm to 1625nm obtained using an indium gallium arsenide detector and a tunable coherent light source. The sample was a 2 inch diameter, 99% white Spectralon target. The BRF results are discussed and compared to empirically generated data from a model based on NIST certified values of 6deg directional/hemispherical spectral reflectance factors from 900nm to 2500nm. Employing a new NIST capability for measuring bidirectional reflectance using a cooled, extended InGaAs detector, BRF calibration measurements of the same sample were also made using NIST's STARR from 1475nm to 1625nm at an incident angle of 0deg and at viewing angles of 40deg, 45deg, and 50deg. The total combined uncertainty for BRF in this ShortWave Infrared (SWIR) range is less than 1%. This measurement capability will evolve into a BRF calibration service in SWIR region in support of NASA remote sensing missions. Keywords: BRF, BRDF, Calibration, Spectralon, Reflectance, Remote Sensing.

Georgiev, Georgi T.↗
NASA NTRS1993

Ultraviolet stability and contamination analysis of Spectralon diffuse reflectance material

A detailed chemical analysis was carried out on Spectralon, a highly Lambertian, diffuse reflectance material. Results of this investigation unambiguously identified the presence of an organic (hydrocarbon) impurity intrinsic to the commercial material. This impurity could be removed by a vacuum bake-out procedure and was identified as the cause of optical changes (degradation) that occur in the material when exposed to UV light. It was found that when this impurity was removed, the Spectralon material was photochemically stable and maintained its reflectance properties even after extensive solar UV exposure.

Stiegman, Albert E.↗
NASA NTRS1993

Modeling Spectralon's Bidirectional Reflectance for In-flight Calibration of Earth-Orbiting Sensors

The in-flight calibration of the EOS Multi-angle Imaging SpectroRadiometer (MISR) will be achieved, in part, by observing deployable Spectralon panels. This material reflects light diffusely, and allows all cameras to view a near constant radiance field. This is particularly true when a panel is illuminated near the surface normal. To meet the challenging MISR calibration requirements, however, very accurate knowledge of the panel reflectance must be known for all utilized angles of illumination, and for all camera and monitoring photodiode view angles. It is believed that model predictions of the panels Bidirectional Reflectance Distribution Function (BRDF) can be used in conjunction with a measurements program to provide the required characterization. This paper describes the results of a model inversion which was conducted using measured Spectralon BRDF data at several illumination angles. Four physical parameters of the material were retrieved, and are available for use with the model to predict reflectance for any arbitrary illumination or view angle. With these data the root mean square difference between the model and the observations is currently of the order of the noise in the data, at about +/- l%. With this success the model will now be used in a variety of future studies, including the development of a measurements test plan, the validation of these data, and the prediction of a new BRDF profile, should the material degrade in space.

Flasse, Stephane P.↗
NASA NTRS2016

Spectralon BRDF and DHR Measurements in Support of Satellite Instruments Operating Through Shortwave Infrared

Satellite instruments operating in the reflective solar wavelength region require accurate and precise determination of the Bidirectional Reflectance Distribution Functions (BRDFs) of the laboratory and flight diffusers used in their pre-flight and on-orbit calibrations. This paper advances that initial work and presents a comparison of spectral Bidirectional Reflectance Distribution Function (BRDF) and Directional Hemispherical Reflectance (DHR) of Spectralon*, a common material for laboratory and onorbit flight diffusers. A new measurement setup for BRDF measurements from 900 nm to 2500 nm located at NASA Goddard Space Flight Center (GSFC) is described. The GSFC setup employs an extended indium gallium arsenide detector, bandpass filters, and a supercontinuum light source. Comparisons of the GSFC BRDF measurements in the ShortWave InfraRed (SWIR) with those made by the NIST Spectral Trifunction Automated Reference Reflectometer (STARR) are presented. The Spectralon sample used in this study was 2 inch diameter, 99% white pressed and sintered Polytetrafluoroethylene (PTFE) target. The NASA/NIST BRDF comparison measurements were made at an incident angle of 0 deg and viewing angle of 45 deg. Additional BRDF data not compared to NIST were measured at additional incident and viewing angle geometries and are not presented here The total combined uncertainty for the measurement of BRDF in the SWIR range made by the GSFC scatterometer is less than 1% (k=1). This study is in support of the calibration of the Joint Polar Satellite System (JPSS) Radiation Budget Instrument (RBI) and Visible Infrared Imaging Radiometer Suite (VIIRS) of and other current and future NASA remote sensing missions operating across the reflected solar wavelength region.

Georgiev, Georgi T.↗
NASA NTRS1999

Polarization Characteristics of Spectralon Illuminated by Coherent Light

The Multi-angle Imaging Spectroradiometer (MISR) makes use of an on-board calibration system to provide routine absolute radiometric calibrations of the instrument while in flight. In addition to on-board detector standards, two spectralon panels will reflect sunlight into the nine cameras.

reflectance standards spectralon polarization↗
NASA NTRS1997

Measurement of the Depolarization of Reflected Light From Spectralon

Light reflected from Spectralon, the material chosen for on-board radiometric calibration of the Multi-angle Imaging SpectroRadiometer (MISR) is quantified in terms of the fraction of the reflected intensity that has the same polarization as the incident light.

Spectralon Radiometric Calibration↗
NASA NTRS1991

Reflectance stability analysis of Spectralon diffuse calibration panels

The Multi-angle Imaging SpectroRadiometer (MISR) plans to use deployable diffuse reflectance panels to provide periodic radiometric calibrations of its nine cameras while in-flight. Near-Lambertian reflectance characteristics are desirable to facilitate flat-field camera intercomparisons. Also required is panel spatial and spectral uniformity, and stability with time. Spectralon, a commercially available polytetrafluoroethylene (PTFE) compound, has been baselined in the MISR design. To assess the suitability of this material, a series of degradation tests were planned and implemented. These included UV vacuum exposure and proton bombardment tests which simulated the exposure levels to be encountered during the mission life. Proton levels are now considered too low to be of concern, but UV vacuum tests demonstrate sensitivity to material contamination. Material investigations have concluded that hydrocarbons are present in the bulk of the material, and that plastic packaging materials can introduce additional surface-layer contamination. It is found however, that these unwanted elements can be eliminated through vacuum pumping at elevated temperatures. Exposure to a UV source, while in vacuum, is again planned for a set of targets which have been vacuum baked. This will assess the stability of the pure PTFE form.

Bruegge, Carol J.↗
NASA NTRS1993

Use of Spectralon as a diffuse reflectance standard for in-flight calibration of earth-orbiting sensors

Spectralon, a commercially available diffuse reflectance material made from polytetrafluoroethylene (PTFE), is being evaluated for the multiangle imaging spectroradiometer (MISR), currently under development for the Earth Observing System. Results of a series of environmental exposure tests indicate that no degradation of the optical properties was apparent following proton bombardment, and stability through UV illumination was satisfactory, provided simple cleaning and handling procedures were implemented. A buildup of several thousand volts of static charge was found to develop while simulating a rare pass through an auroral storm.

Bruegge, Carol J.↗
NASA NTRS1996

Cleaning Spectralon(TM) To Maintain Reflectance Properties

Hydrocarbon impurities removed and stability of Spectralon(TM) towards ultraviolet and vacuum-ultraviolet radiation greatly enhanced by baking material at 90 degrees C for 24 h in vacuum of 10 to negative 5th power torr. After vacuum bake, material handled with white cotton, lint-free gloves in clean environment (preferably cleanroom). As material has tendency to reabsorb volatile organic compounds, stored and transported only in clean, air-tight (preferably glass or oil-free metal) containers.

Stiegman, Albert↗
NASA NTRS1999

A Spectralon BRF Data Base for MISR Calibration Application

The Multi-angle Imaging SpectroRadiometer (MISR) is an Earth observing sensor which will provide global retrievals of aerosols, clouds, and land surface parameters. Instrument specifications require high accuracy absolute calibration, as well as accurate camera-to-camera, band-to-band and pixel-to-pixel relative response determinations.

spectralon MISR spectroradiometer remote sensing↗
NASA NTRS2001

A Spectralon BRF data base for MISR calibration applications

The Multi-angle Imaging SpectroRadiometer (MISR) is an Earth-observing sensor which provides global retrievals of aerosols, clouds, and land surface parameters. Instrument specifications require an accurate absolute calibration, as well as accurate camera-to-camera, band-to-band, and pixel-to-pixel relative response determinations. In order to achieve these requirements, MISR makes use of an on-board calibrator (OBC), as well as vicarious calibration (VC) experiments.

Satellite↗
NASA NTRS2004

Laboratory Measurement of Bidirectional Reflectance of Radiometric Tarps

This experiment measured the reflectance of tarps with ground instruments in order to check radiometric calibration, validate atmospheric correction, and predict at-sensor radiance for satellite instruments. The procedure of this experiment is as follows: 1) Assemble laboratory apparatus to duplicate ground reference measurement geometry and satellite measurement geometry; 2) Measure spectral radiance with Optronics OL 750 double monochromator/spectroradiometer; 3) Measure radiance of NIST-calibrated Spectralon panel irradiated by collimated light at incidence angle of calibrated reflectance (20 deg, 30 deg, 40 deg, or 50 deg), viewing normal to panel surface; 4) Measure radiance of Spectralon panel irradiated at incidence angle equal to solar zenith angle at time of overpass; 5) Calculate reflectance of Spectralon panel irradiated at solar zenith angle, viewing normal to panel surface (ground geometry).

Knowlton, Kelly↗
NASA NTRS2012

Analysis of Suomi - NPP VIIRS Vignetting Functions Based on Yaw Maneuver Data

The Suomi NPP Visible Infrared Imager Radiometer Suite (VIIRS) reflective bands are calibrated on-orbit via reference to regular solar observations through a solar attenuation screen (SAS) and diffusely reflected off a Spectralon (Registered Trademark) panel. The degradation of the Spectralon panel BRDF due to UV exposure is tracked via a ratioing radiometer (SDSM) which compares near simultaneous observations of the panel with direct observations of the sun (through a separate attenuation screen). On-orbit, the vignetting functions of both attenuation screens are most easily measured when the satellite performs a series of yaw maneuvers over a short period of time (thereby covering the yearly angular variation of solar observations in a couple of days). Because the SAS is fixed, only the product of the screen transmission and the panel BRDF was measured. Moreover, this product was measured by both VIIRS detectors as well as the SDSM detectors (albeit at different reflectance angles off the Spectralon panel). The SDSM screen is also fixed; in this case, the screen transmission was measured directly. Corrections for instrument drift and degradation, solar geometry, and spectral effects were taken into consideration. The resulting vignetting functions were then compared to the pre-launch measurements as well as models based on screen geometry.

Xiong, Xiaoxiong↗