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Results for “Spoof Plasmon Polaritons”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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NASA NTRSDate not supplied

Defect Detection in ISC Cylinder Using Spoof Plasmon Polaritons

NASA is exploring the use of microwave spoof plasmon polaritons to detect defects in integrally stiffened cylinders. This work investigates the detection of simulated defects in the form of aluminum wires as small as 10 mm long and 3.1 mm diameter that are placed in between stiffeners of an ISC. The wires simulate manufacturing inclusions defects, and the sum of the delta impedance is shown to increase with increasing volume of added metal.

spoof↗
NASA NTRSDate not supplied

Spoof Plasmon Polaritons for NDE Applications an Experimental Demonstration

NASA is exploring the use of microwave spoof plasmon polaritons to detect defects in metallic structures. This work investigates the detection of simulated defects in the form of aluminum wires as small as 1.6 mm diameter and 2mm long that are placed in a grooved aluminum test article. The inclusions simulate manufacturing defects, and the sum of the delta impedance is shown to increase with increasing volume of added metal. A threshold value of 50Ω has been proposed for defect detection. In addition to detecting defects, the technique also estimates the volume of the defect.

Microwave↗
NASA NTRSDate not supplied

Spoof Plasmon Sensing for NDE Application

NASA is exploring the use of microwave spoof plasmon polaritons to detect defects in metallic structures. This work investigates the detection of simulated defects in the form of aluminum wires as small as 1.6 mm diameter and 2 mm long that are placed in a grooved aluminum test article. The inclusions simulate manufacturing defects, and the sum of the delta impedance is shown to increase with increasing volume of added metal. Based on the results, a threshold value of 50Ω has been proposed for defect detection. In addition to detecting defects, the technique also estimates the volume of the defect.

Microwave↗