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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2025

Chemical Analysis of Tantalum Thin Films compared to Niobium Thin Films using SIMS and XPS

Superconducting qubits are a leading platform for quantum computation. These circuits are typically made from superconducting materials like aluminum or niobium. However, the amorphous niobium oxide and aluminum oxide on the surface of these circuits introduce considerable RF loss due to the presence of two-level systems (TLS), which limits the maximum coherence times T1 to ~100 μs. Capping the niobium qubits with a tantalum layer leads to a 3- 5x improvement [Bal et al., 2024]. But even in this case, tantalum forms an amorphous surface oxide that introduces loss. In an effort to devise strategies to eliminate the presence of this oxide, we present a comprehensive study on the nature of Ta oxide using x-ray photoemission spectroscopy (XPS) and secondary ion mass spectrometry (ToF-SIMS) as a function of heat treatment. The thin films were annealed in ultra-high vacuum conditions and analyzed in situ to characterize the composition and evolution of the native tantalum oxide layer and oxide-metal interface. Our analysis reveals two critical differences between tantalum and niobium oxides: Nb2O5 completely dissolves at 400°C, while Ta2O5 persists even at 800°C. Additionally, tantalum oxide contains only a single suboxide (TaO), in contrast to niobium's two suboxides (NbO and NbO2). The suboxide of tantalum contributes minimally to the total oxide content and shows a relative increase with temperature. Understanding the oxide’s behavior will open new pathways for optimizing coherence times in tantalum qubits.

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗
DOE OSTI2016

XPS and SIMS study of the surface and interface of aged C + implanted uranium

X-ray photoelectron spectroscopy in combination with secondary ion mass spectrometry depth profiling were used to investigate the surface and interfacial chemistry of C + ion implanted polycrystalline uranium subsequently oxidized in air for over 10 years at ambient temperature. The original implantation of 33 keV C + ions into U 238 with a dose of 4.3 × 10 17 cm –3 produced a physically and chemically modified surface layer that was characterized and shown to initially prevent air oxidation and corrosion of the uranium after 1 year in air at ambient temperature. The aging of the surface and interfacial layers were examined by using the chemical shift of the U 4f, C 1s, and O 1s photoelectron lines. In addition, valence band spectra were used to explore the electronic structure of the aged carbide surface and interface layer. Moreover, the time-of-flight secondary ion mass spectrometry depth profiling results for the aged sample confirmed an oxidized uranium carbide layer over the carbide layer/U metal interface.

36 MATERIALS SCIENCE↗
DOE OSTI2012

The effect of PECVD plasma decomposition on the wettability and dielectric constant changes in silicon modified DLC films for potential MEMS and low stiction applications

We have carried out investigations aimed at understanding the mechanism responsible for a water contact angle increase of up to ten degrees and a decrease in dielectric constant in silicon modified hydrogenated amorphous carbon films compared to unmodified hydrogenated amorphous carbon films. Our investigations based on surface chemical constituent analysis using Raman spectroscopy, x-ray photoelectron spectroscopy (XPS), SIMS, FTIR, contact angle / surface energy measurements and spectroscopic ellipsometry suggests the presence of hydrophobic chemical entities on the surface of the films. This observation is consistent with earlier theoretical plasma chemistry predictions and observed Raman peak shifts in the films. These surface hydrophobic entities also have a lower polarizability than the bonds in the un-modified films thereby reducing the dielectric constant of the silicon modified films measured by spectroscopic ellipsometry. Ellipsometric dielectric constant measurement is directly related to the surface energy through Hamaker's constant. Our current finding is expected to be of benefit to understanding stiction, friction and lubrication in areas that range from nano-tribology to microfluidics.

36 MATERIALS SCIENCE↗
DOE OSTI2025

High-Quality Factor Microwave Resonators using Rhenium

Coplanar waveguide resonators are a perfect tool to evaluate the losses induced by defects and interfaces in superconducting devices. Even if niobium is the most used superconductor for resonators and qubits, its native oxide at the metal-air (MA) interface limits the device results. Tantalum has recently significantly improved qubit performances due to a thinner and less disordered oxide layer compared to Nb. To further improve the MA interface, we used rhenium, a superconducting material with 1.7 K critical temperature resistant to oxidation: it forms an oxide layer thinner than 1 nm. In this study, we will present a thorough investigation of rhenium CPW resonator measurements with internal quality factors at the single photon level exceeding 2 million. The devices have been fabricated on a sapphire substrate while the processing parameters have been varying and optimized. The measurements have been performed as a function of power and temperature to disentangle different sources of losses, such as two-level systems (TLS) and quasi-particles. A peculiar TLS temperature dependence has been measured and analyzed. In this work, we also vary the participation ratio of the devices to extract the losses introduced by the involved interfaces with higher fidelity and precision. We carried on a deep material characterization effort to link the results to the differences in the fabrication steps, and we will present material characterization measurements performed via AFM, ToF-SIMS, XPS, and TEM.

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗
DOE OSTI2015

Progress With Multi-Cell Nb3Sn Cavity Development Linked With Sample Materials Characterization

Exploiting both the new Nb3Sn coating system and the materials characterization tools nearby, we report our progress in low-loss Nb3Sn films development. Nb3Sn films a few micrometers thick were grown on Nb coupons as well as single- and multi-cell cavities by the Sn-diffusion technique. Films structure and composition were investigated on coated samples and cavity cutouts with characterization tools including SEM/EDS/EBSD, AFM, XPS, SIMS towards correlating film growth and RF loss to material properties and deposition parameters. Cavity coating efforts focused on establishing techniques for coating progressively more complicated RF structures, and understanding limiting mechanisms in coated cavities. Nb3Sn coated 1.5 GHz 1-cell and 1.3 GHz 2-cell cavities have shown quality factors of 1010 at 4.3 K, with several cavities reaching above Eacc = 10 MV/m. The dominant limiting mechanisms were low field quenches and quality factor degradation above 8 MV/m. The surface data indicates a near-stoichiometric Nb3Sn consistent with the transition temperature and gap measurements. The Nb3Sn layer is covered with Nb2O5 and SnO2 native oxides and has little memory of the pre-coating surface.

Eremeev, Grigory V.↗
DOE OSTI2019

Advanced Characterization of Materials for Superconducting Radiofrequency Accelerator Cavities

Particle accelerators are a leading tool for frontier science. Pushing that frontier further demands more machines with higher performance, and more of a very expensive technology: superconducting radio-frequency (SRF) acceleration. From a materials perspective this means reducing residual surface resistance or raising the operating temperature (currently ~2 K) of SRF cavities. Both are pursued by materials modification: nitrogen doping/infusion in the first instance and coating with Nb3Sn in the second. Materials characterization is key to achieving understanding and directing R&D. However, very little has been done. This present work aims to fill the knowledge gap and to provide needed, validated tools to the accelerator science community. In this connection, SIMS, XPS and EBSD have proven especially valuable and represent the majority of discussion in this dissertation.

Tuggle Jr., James Robert↗
DOE OSTI2012

Chemical Characterization and Removal of C-14 from Irradiated Graphite-12010

Quantities of irradiated graphite waste are expected to drastically increase, which indicates the need for a graphite waste management strategy. Of greatest concern for long-term disposal of irradiated graphite is carbon-14 (C-14), with a half-life of 5730 years. Study of irradiated graphite from nuclear reactors indicates C-14 is concentrated on the outer 5 mm of the graphite structure. The aim of the research described here is to identify the chemical form of C-14 in irradiated graphite and develop a practical method by which C-14 can be removed. Characterization of pre- and post-irradiation graphite was conducted to determine bond type, functional groups, location and concentration of C-14 and its precursors via the use of surface sensitive characterization techniques. Because most surface C-14 originates from neutron activation of nitrogen, an understanding of nitrogen bonding to graphite may lead to a greater understanding of the formation pathway of C-14. However, no single technique provides a complete picture. Therefore, a portfolio of techniques has been developed, with each technique providing another piece to the puzzle that is the chemical nature of the C-14. Scanning Electron Microscopy (SEM), X-Ray Diffraction (XRD), and Raman Spectroscopy were used to evaluate the morphological features of graphite samples. The concentration, chemical composition, and bonding characteristics of C-14 and its precursors were determined through X-ray Photoelectron Spectroscopy (XPS), Time-of-Flight Secondary Ion Mass Spectrometry (SIMS), and Auger and Energy Dispersive X-ray Analysis Spectroscopy (EDX). High-surface-area graphite foam, POCOFoam{sup R}, was exposed to liquid nitrogen and irradiated. Characterization of this material has shown C-14 to C-12 ratios of 0.035. This information was used to optimize the thermal treatment of graphite. Thermal treatment of irradiated graphite as reported by Fachinger et al. (2007) uses naturally adsorbed oxygen complexes to gasify graphite, thus its effectiveness is highly dependent on the availability of adsorbed oxygen compounds. In research presented, the quantity and form of adsorbed oxygen complexes in pre- and post irradiated graphite was studied using SIMS and XPS. SIMS and XPS detected adsorbed oxygen compounds on both irradiated and unirradiated graphite. During thermal treatment graphite samples are heated in the presence of inert argon gas, which carries off gaseous products released during treatment. Experiments were performed at 900 deg. C and 1400 deg. C to evaluate the selective removal of C-14. (authors)

12 MANAGEMENT OF RADIOACTIVE AND NON-RADIOACTIVE W↗
DOE OSTI2021

SIMS and HR-XPS characterization of lithiated graphite from the magnetic fusion device RFX-mod

Lithium wall conditioning has improved the performance of many magnetic fusion devices. Li conditioning in the RFX-mod device was performed by: (1) a single Li pellet injector and (2) a multi-Li pellet injector during He plasma discharges; (3) a Li evaporator after He glow discharge cleaning and He plasma discharge exposure. This report compares the spatial and depth distributions of Li deposited on polycrystalline graphite witness samples at different locations in RFX-mod and the elemental and chemical compositions of the resulting surfaces. The sample surfaces were analyzed ex situ using secondary ion mass spectrometry (SIMS) and high-resolution X-ray photoelectron spectroscopy (HR-XPS). The results showed that Li pellet injection provided a relatively uniform toroidal coverage while Li evaporation produced highly localized Li deposition. A Li 1s HR-XPS peak at 56.5 eV binding energy (BE) characteristic of lithium-intercalated graphite was only observed with the sample exposed to Li evaporation. All of the samples exhibited a HR-XPS C 1s peak at 285.1–285.2 eV BE that is largely attributed to hydrogenated graphite. This finding suggests that hydrogenation of fresh graphite occurs during He plasma discharge exposures. Finally, our results have implications for density control and the selection of Li conditioning techniques in magnetic fusion devices.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
DOE OSTI2015

Comparative study of the native oxide on 316L stainless steel by XPS and ToF-SIMS

The very thin native oxide film on stainless steel, of the order of 2 nm, is known to be readily modified by immersion in aqueous media. In this paper, X-ray photoelectron spectroscopy (XPS) and time of flight secondary ions mass spectrometry are employed to investigate the nature of the air-formed film and modification after water emersion. The film is described in terms of oxide, hydroxide, and water content. The preferential dissolution of iron is shown to occur on immersion. It is shown that a water absorbed layer and a hydroxide layer are present above the oxide-like passive film. The concentrations of water and hydroxide appear to be higher in the case of exposure to water. A secure method for the peak fitting of Fe2p and Cr2p XPS spectra of such films on their metallic substrates is described. The importance of XPS survey spectra is underlined and the feasibility of C{sub 60}{sup +} SIMS depth profiling of a thin oxide layer is shown.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
DOE OSTI2016

Identification of the mechanism that confers superhydrophobicity on 316L stainless steel

This study develops a rapid method to confer superhydrophobicity on 316L stainless steel surfaces with an amphiphilic reagent such as dodecanoic acid. The highest contact angle (approaching 173°) was obtained after forming hierarchical structures with a non-aqueous electrolyte by an electrolytic process. Our goal was to induce superhydrophobicity directly on 316L stainless steel substrates and to establish which molecules cause the effect. The superhydrophobic behaviour is analysed by contact angle measurements, scanning electron microscopy (SEM), IR spectroscopy and atomic force microscopy (AFM). The growth mechanism is analysed using FE-SEM, TOF-SIMS and XPS in order to determine the molecules involved in the reaction and the growth. The TOF-SIMS analysis revealed that the Ni{sup 2+} ions react with lauric acid to create an ester on the stainless steel surface. - Highlights: • This study develops a rapid and facile approach to impart superhydrophobicity properties to 316L stainless steel surfaces with an amphiphilic reagent such as dodecanoic acid. Surface character changes from superhydrophilicity to superhydrophobicity. • This process changes the surface character from superhydrophilicity to superhydrophobicity. • The process based on electrolysis of a nickel salt in lauric acid provides superhydrophobic behaviour in 316L stainless steel. • The growth mechanism is proposed as a mode island (Volmert- Weber mode). • TOF-SIMS and XPS provided the identification of the molecules involved in the surface modification reaction on AISI 316L inducing superhydrophobicity.

36 MATERIALS SCIENCE↗
DOE OSTI2021

Transformations of Ti-5Al-5V-5Cr-3Mo powder due to reuse in laser powder bed fusion: A surface analytical approach

Reactive Ti-5Al-5 V-5Cr-3Mo (Ti5553) alloy feedstock powder is used in laser powder-bed fusion (LPBF). Due to the large quantity of powder necessary for LPBF, powder is reused numerous times under oxidizing environments. Transformations to the powder’s native surface oxide may impact the LPBF process and lead to deviations from expected behavior of printed parts. In this work, we present a multimodal characterization of new and reused powder by combining X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (ToF-SIMS), and transmission electron microscopy (TEM) of focused ion beam (FIB)-prepared cross sections of individual powder particles to understand how the surface oxide composition changes, grows, and becomes hydroxylated and hydrated due to reuse. We show that the native oxide film of Ti5553 powder is a hydroxylated mixed oxide composed of TiO 2 and Al 2 O 3 that grows from 5.6 +/- 0.7 nm to 8.3 +/- 1.1 nm due to reuse. Al oxide regions of the surface oxide become more hydroxylated during reuse in comparison to Ti oxide regions. This indicates that an outer oxide of pure TiO 2 may enhance recyclability of Ti5553 powder while the presence of Al oxides may decrease recyclability. Further characterization of surface transformations due to recyclability may eliminate unnecessary variation in LPBF.

36 MATERIALS SCIENCE↗
DOE OSTI2024

Importance of standard terminology in surface chemical analysis: ISO 18115-1:2023, general terms and terms used in spectroscopy

The International Standard ISO 18115-1 on terminology in surface chemical analysis has been revised with clarifications, modifications, and deletions to more than 70 terms and with the addition of more than 50 terms in response to trends, issues, and needs identified by the surface analysis community. This revision adds terminology and concepts associated with emerging methods such as atom probe tomography, near ambient pressure XPS, and hard X-ray photoelectron spectroscopy. It includes 25 new and revised terms to ensure that the description of resolution is consistent across all surface analysis methods. The 630 terms in the document cover words or phrases used in describing the samples, instruments, and concepts involved in surface chemical analysis. Here, the terms have been collated into subject specific sections to ensure that related terms can be found easily.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
DOE OSTI2015

Coprecipitation of nickel zinc malonate: A facile and reproducible synthesis route for Ni{sub 1−x}Zn{sub x}O nanoparticles and Ni{sub 1−x}Zn{sub x}O/ZnO nanocomposites via pyrolysis

Nanoparticles of Ni{sub 1−x}Zn{sub x}O and Ni{sub 1−x}Zn{sub x}O/ZnO, which can be good candidates for selective gas sensors, were successfully obtained via a two-step synthetic route, in which the nickel zinc malonate precursor was first synthesized by co-precipitation from an aqueous solution, followed by pyrolysis in air at a relatively low temperature (~500 °C). The precursor was characterized by ICP-AES, FTIR and TG and the results indicate the molecular structure of the precursor to be compatible with Ni{sub 1−x}Zn{sub x}(OOCCH{sub 2}COO)·2H{sub 2}O. The decomposition product, characterized using various techniques (FTIR, XRD, ToF-SIMS, SEM, TEM and XPS), was established to be a doped nickel oxide (Ni{sub 1−x}Zn{sub x}O for 0.01≤x≤0.1) and a composite material (Ni{sub 1−x}Zn{sub x}O/ZnO for 0.2≤x≤0.5). To elucidate the form in which the Zn is present in the NiO structure, three analytical techniques were employed: ToF-SIMS, XRD and XPS. While ToF SIMS provided a direct evidence of the presence of Zn in the NiO crystal structure, XRD showed that Zn actually substitutes Ni in the structure and XPS is a bit more specific by indicating that the Zn is present in the form of Zn{sup 2+} ions. - Highlights: • Coprecipitation synthesis of nickel zinc malonate single bath precursor was achieved. • The as synthesized precursors are an homogeneous mixture of nickel and zinc malonate. • XRD, ToF-SIMS, XPS, SEM and TEM was used to characterized decomposition products. • Ni{sub 1−x}Zn{sub x}O nanoparticles (0.01≤x≤0.1) formed after pyrolysis (~500 °C) of precursor. • Ni{sub 1−x}Zn{sub x}O/ZnO nanocomposite (0.2≤x≤0.5) formed after pyrolysis at 500 °C of precursor.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
DOE OSTI2014

Observed damage during Argon gas cluster depth profiles of compound semiconductors

Argon Gas Cluster Ion Beam (GCIB) sources have become very popular in XPS and SIMS in recent years, due to the minimal chemical damage they introduce in the depth-profiling of polymer and other organic materials. These GCIB sources are therefore particularly useful for depth-profiling polymer and organic materials, but also (though more slowly) the surfaces of inorganic materials such as semiconductors, due to the lower roughness expected in cluster ion sputtering compared to that introduced by monatomic ions. We have examined experimentally a set of five compound semiconductors, cadmium telluride (CdTe), gallium arsenide (GaAs), gallium phosphide (GaP), indium arsenide (InAs), and zinc selenide (ZnSe) and a high-κ dielectric material, hafnium oxide (HfO), in their response to argon cluster profiling. An experimentally determined HfO etch rate of 0.025 nm/min (3.95 × 10{sup −2} amu/atom in ion) for 6 keV Ar gas clusters is used in the depth scale conversion for the profiles of the semiconductor materials. The assumption has been that, since the damage introduced into polymer materials is low, even though sputter yields are high, then there is little likelihood of damaging inorganic materials at all with cluster ions. This seems true in most cases; however, in this work, we report for the first time that this damage can in fact be very significant in the case of InAs, causing the formation of metallic indium that is readily visible even to the naked eye.

36 MATERIALS SCIENCE↗