Search NASA⌕ Search

SEARCH · Search NASA

Results for “accelerated stress test”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1982

Accelerated stress testing of terrestrial solar cells

The development of an accelerated test schedule for terrestrial solar cells is described. This schedule, based on anticipated failure modes deduced from a consideration of IC failure mechanisms, involves bias-temperature testing, humidity testing (including both 85-85 and pressure cooker stress), and thermal-cycle thermal-shock testing. Results are described for 12 different unencapsulated cell types. Both gradual electrical degradation and sudden catastrophic mechanical change were observed. These effects can be used to discriminate between cell types and technologies relative to their reliability attributes. Consideration is given to identifying laboratory failure modes which might lead to severe degradation in the field through second quadrant operation. Test results indicate that the ability of most cell types to withstand accelerated stress testing depends more on the manufacturer's design, processing, and worksmanship than on the particular metallization system. Preliminary tests comparing accelerated test results on encapsulated and unencapsulated cells are described.

Lathrop, J. W.↗
NASA NTRS1985

Accelerated stress testing of amorphous silicon solar cells

A technique for performing accelerated stress tests of large-area thin a-Si solar cells is presented. A computer-controlled short-interval test system employing low-cost ac-powered ELH illumination and a simulated a-Si reference cell (seven individually bandpass-filtered zero-biased crystalline PIN photodiodes) calibrated to the response of an a-Si control cell is described and illustrated with flow diagrams, drawings, and graphs. Preliminary results indicate that while most tests of a program developed for c-Si cells are applicable to a-Si cells, spurious degradation may appear in a-Si cells tested at temperatures above 130 C.

Stoddard, W. G.↗
NASA NTRS1979

Accelerated stress testing of terrestrial solar cells

A program to investigate the reliability characteristics of unencapsulated low-cost terrestrial solar cells using accelerated stress testing is described. Reliability (or parametric degradation) factors appropriate to the cell technologies and use conditions were studied and a series of accelerated stress tests was synthesized. An electrical measurement procedure and a data analysis and management system was derived, and stress test fixturing and material flow procedures were set up after consideration was given to the number of cells to be stress tested and measured and the nature of the information to be obtained from the process. Selected results and conclusions are presented.

Prince, J. L.↗
NASA NTRS1985

Repeatable electrical measurement instrumentation for use in the accelerated stress testing of thin film solar cells

Attention is given to the construction, calibration, and performance of a repeatable measurement system for use in conjunction with the accelerated stress testing of a-Si:H cells. A filtered diode array is utilized to approximate the spectral response of any type of solar cell in discrete portions of the spectrum. It is noted that in order to achieve the necessary degree of overall repeatability, it is necessary to pay particular attention to methods of contacting and positioning the cells.

Davis, C. W.↗
NASA NTRS1985

Accelerated stress testing of thin film solar cells: Development of test methods and preliminary results

If thin film cells are to be considered a viable option for terrestrial power generation their reliability attributes will need to be explored and confidence in their stability obtained through accelerated testing. Development of a thin film accelerated test program will be more difficult than was the case for crystalline cells because of the monolithic construction nature of the cells. Specially constructed test samples will need to be fabricated, requiring committment to the concept of accelerated testing by the manufacturers. A new test schedule appropriate to thin film cells will need to be developed which will be different from that used in connection with crystalline cells. Preliminary work has been started to seek thin film schedule variations to two of the simplest tests: unbiased temperature and unbiased temperature humidity. Still to be examined are tests which involve the passage of current during temperature and/or humidity stress, either by biasing in the forward (or reverse) directions or by the application of light during stress. Investigation of these current (voltage) accelerated tests will involve development of methods of reliably contacting the thin conductive films during stress.

Lathrop, J. W.↗
NASA NTRS1982

An accelerated stress testing program for determining the reliability sensitivity of silicon solar cells to encapsulation and metallization systems

The use of accelerated testing methods in a program to determine the reliability attributes of terrestrial silicon solar cells is discussed. Different failure modes are to be expected when cells with and without encapsulation are subjected to accelerated testing and separate test schedules for each are described. Unencapsulated test cells having slight variations in metallization are used to illustrate how accelerated testing can highlight different diffusion related failure mechanisms. The usefulness of accelerated testing when applied to encapsulated cells is illustrated by results showing that moisture related degradation may be many times worse with some forms of encapsulation than with no encapsulation at all.

Lathrop, J. W.↗
NASA NTRS2000

Failure Engineering Study and Accelerated Stress Test Results for the Mars Global Surveyor Spacecraft's Power Shunt Assemblies

An Engineering-of-Failure approach to designing and executing an accelerated product qualification test was performed to support a risk assessment of a "work-around" necessitated by an on-orbit failure of another piece of hardware on the Mars Global Surveyor spacecraft. The proposed work-around involved exceeding the previous qualification experience both in terms of extreme cold exposure level and in terms of demonstrated low cycle fatigue life for the power shunt assemblies. An analysis was performed to identify potential failure sites, modes and associated failure mechanisms consistent with the new use conditions. A test was then designed and executed which accelerated the failure mechanisms identified by analysis. Verification of the resulting failure mechanism concluded the effort.

Gibbel, Mark↗
NASA NTRS1999

Failure Engineering Study and Accelerated Stress Test Results for the Mars Global Surveyor Spacecraft's Power Shunt Assemblies

Due to a post launch failure of a part a new plan for the Mars Global Surveyor was developed. This new plan involved the addition of many deep thermal cycles to the Power Shunt Assemblies (PSA's). This new plan exceeds the previous acceptance cold level, and fatigue life on packaging design. This presentation reviews the experiments that were used to test the capabilities of the PSA to function in the new situation. It also reviews the analyses preformed to verify the most likely failure mechanism, and the likelihood that these failures would impact the new mission requirements.

Gibbel, Mark↗
NASA NTRS1986

Flat-plate solar array project. Volume 7: Module encapsulation

The objective of the Encapsulation Task was to develop, demonstrate, and qualify photovoltaic (PV) module encapsulation systems that would provide 20 year (later decreased to 30 year) life expectancies in terrestrial environments, and which would be compatible with the cost and performance goals of the Flat-Plate Solar Array (FSA) Project. The scope of the Encapsulation Task included the identification, development, and evaluation of material systems and configurations required to support and protect the optically and electrically active solar cell circuit components in the PV module operating environment. Encapsulation material technologies summarized include the development of low cost ultraviolet protection techniques, stable low cost pottants, soiling resistant coatings, electrical isolation criteria, processes for optimum interface bonding, and analytical and experimental tools for evaluating the long term durability and structural adequacy of encapsulated modules. Field testing, accelerated stress testing, and design studies have demonstrated that encapsulation materials, processes, and configurations are available that meet the FSA cost and performance goals.

Cuddihy, E.↗
NASA NTRS1999

EOS--AM1 Nickel Hydrogen Cell Interim Life Test Report

This paper reports the interim results of the Earth Observing System AM-1 project (EOS-AM-1) nickel hydrogen cell life test being conducted under contract to National Aeronautics and Space Administration (NASA) Goddard Space Flight Center (GSFC) at the Lockheed Martin Missiles and Space (LMMS) facility in East Windsor, NJ; and at COMSAT Labs., Clarksburg, MD. The purpose of the tests is to verify that the EOS-AM-1 cell design can meet five years of real-time Low Earth Orbit (LEO) cycling. The tests include both real-time LEO and accelerated stress tests. At LMMS, the first real-time LEO simulated 99 minute orbital cycle started on February 7, 1994 and the test has been running continuously since that time, with 18202 LEO cycles completed as of September 1, 1997. Each cycle consists of a 64 minute charge (VT at 1.507 volts per cell. 1.06 C/D ratio, followed by 0.6 ampere trickle charge) and a 35 minute constant power discharge at 177 watts (22.5% DOD). At COMSAT, the accelerated stress test consists of 90 minute orbital cycles at 60% DOD with a 30 minute discharge at 60 amperes and a 60 minute charge at 40 amperes (VT at 1.54 volts per cell to 1.09 C/D ratio, followed by 0.6 ampere trickle charge). The real-time LEO life test battery consists of seven, 50AH (nameplate rating) Eagle-Picher, Inc. (EPI) Mantech cells manufactured into three. 3-cell pack assemblies (there are two place holder cells that are not part of the life test electrical circuit). The test pack is configured to simulate the conductive thermal design of the spacecraft battery, including: conductive aluminum sleeves, 3-cell pack aluminum baseplate, and honeycomb panel all mounted to a liquid (-5 C) cold plate. The entire assembly is located in a thermal chamber operatina at +30 C. The accelerated stress test unit consists of five cells mounted in machined aluminum test sleeves and is operating at +10 C. The real-time LEO life test battery has met all performance requirements throuch the first 18,202 cycles, including: end of chargee and discharge cell voltages and voltace -radients; end of charge and discharge cell pressures; within cell and between cell temperature gradients; discharge capacity; current and power levels; and all charge parameters. The accelerated stress test battery has completed 11,998 cycles when the test was terminated. The stress test unit met all test parameters. This paper reports battery performances as a function of cycle life for both the real time LEO and the accelerated life test regimes.

Bennett, C. W.↗
NASA NTRS1997

EOS-AM1 Nickel Hydrogen Cell

This paper reports the interim results of the Earth Observing System AM-1 project (EOS-AM-1) nickel hydrogen cell life test being conducted under contract to National Aeronautics and Space Administration (NASA) Goddard Space Flight Center (GSFC) at the Lockheed Martin Missile and Space (LMMS) facility in East Windsor, NJ; and at COMSAT Labs., Clarksburg, MD. The purpose of die tests is to verify that the EOS-AM-1 cell design can meet five years of real-time Low Earth Orbit (LEO) cycling. The tests include both real-time LEO and accelerated stress tests. At LMMS, the first real-time LEO simulated 99 minute orbital cycle started on February 7, 1994 and the test has been running continuously since that time, with 18,202 LEO cycles completed as of September 1, 1997. Each cycle consists of a 64 minute charge (VT at 1.507 volts per cell, 1.06 C/D ratio, followed by 0.6 ampere trickle charge) and a 35 minute constant power discharge at 177 watts (22.5% DOD). At COMSAT, the accelerated stress test consists of 90 minute orbital cycles at 60% DOD with a 30 minute discharge at 60 amperes and a 60 minute charge at 40 amperes (VT at 1.54 volts per cell to 1.09 C/D ratio, followed by 0.6 ampere trickle charge). The real-time LEO life test battery consists of seven, 50AH (nameplate rating) Eagle-Picher, Inc. (EPI) Mantech cells manufactured into three, 3-cell pack assemblies (there are two place holder cells that are not part of the life test electrical circuit). The test pack is configured to simulate the conductive thermal design of the spacecraft battery, including: conductive aluminum sleeves, 3-cell pack aluminum baseplate, and honeycomb panel all mounted to a liquid (-5 C) cold plate. The entire assembly is located in a thermal chamber operating at +30 C. The accelerated stress test unit consists of five cells mounted in machined aluminum test sleeves and is operating at +10 C. The real-time LEO life test battery has met all performance requirements through the first 18,202 cycles, including: end of charge mid discharge cell voltages and voltage gradients; end of charge and discharge cell pressures; within cell and between cell temperature gradients; discharge capacity; current and power levels; and all charge parameters. The accelerated stress test battery has completed 11,998 cycles when the test was terminated. The stress test unit met all test parameters. This paper reports battery perfortnances as a funcfion of cycle life for both the real-time LEO and the accelerated life test regimes.

Bennett, Charles W.↗
NASA NTRS1998

EOS-AM1 Nickel Hydrogen Cell Interim Life Test Report

This paper reports the interim results Earth Observing System AM-1 project (EOS-AM-1) nickel hydrogen cell life test being conducted under contract to National Aeronautics and Space Administration (NASA) Goddard Space Flight Center (GSFC) at the Lockheed Martin Missiles and Space (LMMS) facility in East Windsor, NJ; and at COMSAT Labs., Clarksburg, MD. The purpose of the tests is to verify that the EOS-AM-1 cell design can meet five years of real-time Low Earth Orbit (LEO) cycling. The tests include both real-time LEO and accelerated stress tests. At LMMS, the first real-time LEO simulated 99 minute orbital cycle started on February 7, 1994 and the test has been running continuously since that time, with 18202 LEO cycles completed as of September 1, 1997. Each cycle consists of a 64-minute charge (VT at 1,507 volts per cell, 1.06 C/D ratio, followed by 0.6 ampere trickle charge) and a 35 minute constant power discharge at 177 watts (22.5 percent DOD). At COMSAT, the accelerated stress test consists of 90 minute orbital cycles at 60 percent DOD with a 30 minute discharge at 60 amperes and a 60 minute charge at 40 amperes (VT at 1.54 volts per cell to 1.90 C/D ratio, followed by 0.6 ampere trickle charge). The real-time LEO life test battery consists of seven, 50AH (nameplate rating) Eagle-Picher, Inc. (EPI) Mantech cells manufactured into three, 3-cell pack assemblies (there are two place holder cells that are not part of the life test electrical circuit). The test pack is configured to simulate the conductive thermal design of the spacecraft battery, including: conductive aluminum sleeves, 3-cell pack aluminum baseplate, and honeycomb panel all mounted to a liquid (minus 5 deg) cold plate. The entire assembly is located in a thermal chamber operating at plus 3 deg. The accelerated stress test unit consists of five cells mounted in machined aluminum test sleeves and is operating at plus 10 deg. The real-time LEO life test battery has met all performance requirements through the first 18,202 cycles, including: end of charge and discharge cell voltages and voltage gradients; end of charge and discharge cells pressures; within cell and between cell temperature gradients dischare capacity; current and power levels; and all charge parameters. The accelerated stress test battery has completed 11998 cycles when the test was terminated. The stress test unit met all test parameters. This paper reports battery performances as a function of cycle life for both the real-time LEO and the accelerated life test regimes.

Bennett, Charles W.↗
NASA NTRS1997

EOS-AM1 Nickel Hydrogen Cell Interim Life Test Report

This paper reports the interim results of the Earth Observing System AM-1 project (EOS-AM-1) nickel hydrogen cell life test being conducted under contract to National Aeronautics and Space Administration (NASA) Goddard Space Flight Center (GSFC) at the Lockheed Martin Missiles and Space (LMMS) facility in East Windsor, NJ; and at COMSAT Labs., Clarksburg, MD. The purpose of the tests is to verify that the EOS-AM-l cell design can meet five years of real-time Low Earth Orbit (LEO) cycling. The tests include both real-time LEO and accelerated stress tests. At LMMS, the first real-time LEO simulated 99 minute orbital cycle started on February 7, 1994 and the test has been running continuously since that time, with 13000 LEO cycles completed as of September 2, 1996. Each cycle consists of a 64 minute charge (VT at 1.507 volts per cell, 1.06 C/D ratio, followed by 0.6 ampere trickle charge) and a 35 minute constant power discharge at 177 watts (22.5% DOD). At COMSAT, the accelerated stress test consists of 90 minute orbital cycles at 60% DOD with a 30 minute discharge at 60 amperes and a 60 minute charge at 40 ampercs (VT at 1.54 volts per cell to 1.09 C/D ratio, followed by 0.6 ampere trickle charge). The real-time LEO life test battery consists of seven, 50AH (nameplate rating) Eagle-Picher, Inc. (EPI) Mantech cells manufactured into three, 3-cell pack assemblies (there are two place holder cells that are not part of the life test electrical circuit). The test pack is configured to simulate the conductive thermal design of the spacecraft battely, including: conductive aluminum sleeves, 3-cell pack aluminum baseplate, and honeycomb panel all mounted to a liquid (-5 C) cold plate. The entire assembly is located in a thermal chamber operating at +3 C. The accelerated stress test unit consists of five cells mounted in machined aluminum test sleeves and is operating at +10 C. The real-time LEO life test battery has met all performance requirements through the first 13,000 cycles, including: end of charge and discharge cell voltages and voltage gradients; end of chalge and discharge cell pressures; within cell and between cell temperature gradients; discharge capacity; current and power levels; and all chalge parameters. The accelerated stress test battely has completed over 5900 cycles as of 9/11/96. This paper reports both battery performances as a function of cycle life, with individual cell performance comparisons repolted for selected cycles in both tests.

Bennett, C. W.↗
NASA NTRS1986

Accelerated Stress-Corrosion Testing

Test procedures for accelerated stress-corrosion testing of high-strength aluminum alloys faster and provide more quantitative information than traditional pass/fail tests. Method uses data from tests on specimen sets exposed to corrosive environment at several levels of applied static tensile stress for selected exposure times then subsequently tensile tested to failure. Method potentially applicable to other degrading phenomena (such as fatigue, corrosion fatigue, fretting, wear, and creep) that promote development and growth of cracklike flaws within material.

Source record↗
NASA NTRS1979

Investigation of reliability attributes and accelerated stress factors on terrestrial solar cells

The results of accelerated stress testing of four different types of silicon terrestrial solar cells are discussed. The accelerated stress tests used included bias-temperature tests, bias-temperature-humidity tests, thermal cycle and thermal shock tests, and power cycle tests. Characterization of the cells was performed before stress testing and at periodic down-times, using electrical measurement, visual inspection, and metal adherence pull tests. Electrical parameters measured included short-circuit current, open circuit voltage, and output power, voltage, and current at the maximum power point. Incorporated in the report are the distributions of the prestress electrical data for all cell types. Data were also obtained on cell series and shunt resistance.

Prince, J. L.↗