Alternate Grade Parts Selection Tools & Processes
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alternate reliability grade electronic parts↗
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The NASA Electronic Parts and Packaging (NEPP) Program - Automotive Electronics
Overview of NEPP Automotive Electronics Plans.
reliability↗
An Overview Of NASA Automotive Component Reliability Studies
The results of NASAs studies into the appropriateness of using US Automotive electronic parts in NASA spaceflight systems will be presented. The first part of the presentation provides an overview of the United States Automotive Electronics Councils AECQ standardization program, the second part provides a summary of the results of NASAs procurement and testing experiences and other lessons learned along with preliminary test results.
alternate grade electronics↗
An Overview of NASA Automotive Component Reliability Studies
The results of NASAs studies into the appropriateness of using US Automotive electronic parts in NASA spaceflight systems will be presented. The first part of the presentation provides an overview of the United States Automotive Electronics Councils AECQ standardization program, the second part provides a summary of the results of NASAs procurement and testing experiences and other lessons learned along with preliminary test results.
Automotive electronics↗
An Overview of NASA Automotive Component Reliability Studies
The results of NASAs studies into the appropriateness of using US Automotive electronic parts in NASA spaceflight systems will be presented. The first part of the presentation provides an overview of the United States Automotive Electronics Councils AECQ standardization program, the second part provides a summary of the results of NASAs procurement and testing experiences and other lessons learned along with preliminary test results.
Automotive electronics↗
Evaluation of Automotive Grade Resistors for Space Flight
Over the past decade, electronic, electrical, and electromechanical (EEE) parts for space applications have undergone significant changes, largely driven by CubeSat and commercial space developers pushing the boundaries on the utilization of commercial parts in space. Global product shortages and shipping delays are still impacting space flight project deadlines. Many projects have turned to automotive grade resistors as an alternate to their MILSPEC counterparts to fulfill requirements. In addition, automotive grade resistors may offer designers a wider range of parts to consider. A recent NASA study recommended the use of high-volume manufactured commercial components for space applications provided these components show evidence of stringent fabrication controls and thorough reliability monitoring practices. Automotive grade components have stringent qualification requirements per the Automotive Electronic Council (AEC). However, the end user usually does not have insight into the practices the manufacturer may use to reduce/eliminate infant mortality nor for compliance to all datasheet specifications. Screening, Life and Accelerated Life testing on a set of standard automotive-grade chip resistors is proposed to evaluate the reliability of these components. Requirements from both the AEC-Q (Automotive Electronic Council Qualification) and EEE-INST-002 (Instructions for EEE Parts Selection, Screening, Qualification, and Derating) for resistors is compared and discussed. The resistors have been tested by using a modified methodology from EEEINST-002 to evaluate their reliability for space flight projects. The findings of this study indicate that the underlying degradation mechanisms at rated temperature and power are best represented by power law models with a fitted exponent between 0 and 1. A linear model is more conservative which compensates for potential model uncertainty given the wide range of design and materials used in automotive resistors, while still providing useful long-term resistance drift estimates. No electrical anomalies or failures were observed throughout the 1000-hour Life Tests other than small in tolerance resistance drift aging. Degradation models were utilized to quantify and extrapolate the long-term resistance drift under operating conditions for the components. The models demonstrated that some automotive-grade resistors are likely to operate 10 years at nominal usage conditions while others might fail earlier.
Zainab Abdullahi↗
Evaluation of Automotive Grade Resistors for Space Flight
Over the past decade, electronic, electrical, and electromechanical (EEE) parts for space applications have undergone significant changes, largely driven by CubeSat and commercial space developers pushing the boundaries on the utilization of commercial parts in space. Global product shortages and shipping delays are still impacting space flight project deadlines. Many projects have turned to automotive grade resistors as an alternate to their MIL-SPEC counterparts to fulfill requirements. In addition, automotive grade resistors may offer designers a wider range of parts to consider. A recent NASA study recommended the use of high-volume manufactured commercial components for space applications provided these components show evidence of stringent fabrication controls and thorough reliability monitoring practices [1]. Automotive grade components have stringent qualification requirements per the Automotive Electronic Council (AEC). However, the end user usually does not have insight into the practices the manufacturer may use to reduce/eliminate infant mortality nor for compliance to all datasheet specifications. Screening, Life and Accelerated Life testing on a set of standard automotive-grade chip resistors is proposed to evaluate the reliability of these components. Requirements from both the AEC-Q (Automotive Electronic Council Qualification) and EEE-INST-002 (Instructions for EEE Parts Selection, Screening, Qualification, and Derating) for resistors is compared and discussed. The resistors have been tested by using a modified methodology from EEE-INST-002 to evaluate their reliability for space flight projects. The findings of this study indicate that the underlying degradation mechanisms at rated temperature and power are best represented by power law models with a fitted exponent between 0 and 1. A linear model is more conservative which compensates for potential model uncertainty given the wide range of design and materials used in automotive resistors, while still providing useful long-term resistance drift estimates. No electrical anomalies or failures were observed throughout the 1,000-hour Life Tests other than small in tolerance resistance drift aging. Degradation models were utilized to quantify and extrapolate the long-term resistance drift under operating conditions for the components. The models demonstrated that some automotive-grade resistors are likely to operate 10 years at nominal usage conditions while others might fail earlier.
Zainab Abdullahi↗
The NASA Electronic Parts and Packaging (NEPP) Program: NEPP Overview - Automotive Electronics
The results of NASAs studies into the appropriateness of using U.S. Automotive electronic parts in NASA spaceflight systems will be presented. The first part of the presentation provides an overview of the United States Automotive Electronics Council's AECQ standardization program, the second part provides a summary of the results of NASA's procurement and testing experiences and other lessons learned along with preliminary test results.
Reliability↗
Small Satellite Industrial Base Study: Foundational Findings
This report documents findings from a Small Satellite (SmallSat) Industrial Base Study conducted by The Aerospace Corporation between November 2018 and September 2019. The primary objectives of this study were a) to gain a better understanding of the SmallSat community’s technical practices, engineering approaches, requirements flow-downs, and common processes and b) identify insights and recommendations for how the government can further capitalize on the strengths and capabilities of SmallSat offerings. In the context of this study, SmallSats are understood to weigh no more than 500 kg, as described in “State of the Art Small Spacecraft Technology, NASA/TP-2018- 220027, December 2018. CubeSats were excluded from this study to avoid overlap and duplication of recently completed work or other studies already under way. The team also touched on differences between traditional space-grade and the emerging “mid-grade” and other non-space, alternate-grade EEEE (electrical, electronic, electromechanical, electro-optical) piece part categories. Finally, the participants sought to understand the potential effects of increased use of alternate-grade parts on the traditional space-grade industrial base. The study team was keenly aware that there are missions for which non-space grade parts currently are infeasible for the foreseeable future. National security, long-duration and high-reliability missions intolerant of risk are a few examples. The team sought to identify benefits of alternative parts and approaches that can be harnessed by the government to achieve greater efficiencies and capabilities without impacting mission success.
Allyson D Yarbrough↗