Search NASA⌕ Search

SEARCH · Search NASA

Results for “beam rastering”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 19 records

Circuit enhances vertical resolution in raster scanning systems

Circuit enhances vertical resolution in electron beam, raster scanning systems exhibiting aperture distortion in the vertical direction. A sensitized area /image/ produces a video output when the scan beam nears it, which causes vertical elongation in the reconstructed images of all sensitized areas on the surface.

Alsovsky, W. H.↗

Diffusion-controlled magnesium isotopic fractionation of a single crystal forsterite evaporated from the solid state

Though the origin of calcium- and aluminum-rich inclusions (CAI's) in carbonaceous chondrites is till a disputed issue, evaporation is no doubt one of the most important processes for the formation of CAI's in the early solar nebula. The mechanism for production of large isotopic mass fractionation effects in magnesium, silicon, oxygen, and chromium in CAI's can be better understood by examining isotopic fractionation during the evaporation of minerals. New evaporation experiments were performed on single-crystal forsterite. The magnesium isotopic distribution near the evaporating surfaces of the residues using a modified AEI IM-20 ion microprobe to obtain rastered beam depth profiles was measured. A theoretical model was used to explain the profiles and allowed determination of the diffusion coefficient of Mg(++) in forsterite at higher temperatures than previous measurements. The gas/solid isotopic fractionation factor for magnesium for evaporation from solid forsterite was also determined and found to be nearly the same as that for evaporation of liquid Mg2SiO4.

Wang, Jianhua↗

Production and Performance of the InFOCmicronS 20-40 keV Graded Multilayer Mirror

The International Focusing Optics Collaboration for micron Crab Sensitivity (InFOC micronS) balloon-borne hard x-ray incorporates graded multilayer technology to obtain significant effective area at energies previously inaccessible to x-ray optics. The telescope mirror consists of 2040 segmented thin aluminum foils coated with replicated Pt/C multilayers. A sample of these foils was scanned using a pencil-beam reflectometer to determine, multilayer quality. The results of the reflectometer measurements demonstrate our capability to produce large quantity of foils while maintaining high-quality multilayers with a mean Nevot-Croce interface roughness of 0.5nm. We characterize the performance of the complete InFOC micronS telescope with a pencil beam raster scan to determine the effective area and encircled energy function of the telescope. The effective area of the complete telescope is 78, 42 and 22 square centimeters at 20 30 and 40 keV. respectively. The measured encircled energy fraction of the mirror has a half-power diameter of 2.0 plus or minus 0.5 arcmin (90% confidence). The mirror successfully obtained an image of the accreting black hole Cygnus X-1 during a balloon flight in July, 2001. The successful completion and flight test of this telescope demonstrates that graded-multilayer telescopes can be manufactured with high reliability for future x-ray telescope missions such as Constellation-X.

Berendse, F.↗

Evaluation of an Al-Cu-Zn-Mg Alloy for Wire-Fed Additive Manufacturing

A collaborative research study was conducted to evaluate an experimental Al-Cu-Zn-Mg alloy, designated Al C380H, developed by Arconic Corporation for wire-fed additive manufacturing (AM) techniques such as NASA’s electron beam freeform fabrication (EBF 3 ) process and the wire arc additive manufacturing (WAAM) process. The goal of the study was to determine, based upon metallurgical properties, whether additively manufactured Al C380H represented a viable alternative for applications currently using wrought 7xxx series aluminum. Al 2319 and Al 7075 were also deposited as AM-compatible and non-AM-compatible baselines, respectively. Evaluation was based on tensile, fracture, and corrosion properties. The strength and ductility of Al C380H-T6 materials produced by EBF3 and WAAM were sufficiently lower than typical values for Al 7050-T7 to indicate that additively manufactured Al C380H is not a viable replacement for current parts fabricated with Al 7050, due largely to the significant losses in Zn and Mg and development of porosity during deposition. EBF 3 parameters that reduced porosity, such as increasing electron beam current, higher raster frequency, sharper beam focus, and slower travel speed, augmented de-alloying of fugitive solute. Further enhancement of Zn and Mg content in Al C380H feedstock wire combined with adjustments to deposition conditions to minimize porosity may enable production of Al C380H parts by EBF 3 or WAAM that are viable replacements for current Al 7050 wrought products.

electron beam freeform fabrication (EBF3)↗

Application of an electron beam facility for heat transfer measurements in capillary tubes

A unique method was developed for the determination of heat transfer coefficients for water flowing through capillary tubes using a rastered electron beam heater. Heat flux levels of 150 and 500 watts/sq cm were provided on the top surface of four square tubes. Temperature gradient along the tube length and mass flow rates versus pressure drop were measured.

Lunde, A. R.↗

Use of beam deflection to control an electron beam wire deposition process

A method for controlling an electron beam process wherein a wire is melted and deposited on a substrate as a molten pool comprises generating the electron beam with a complex raster pattern, and directing the beam onto an outer surface of the wire to thereby control a location of the wire with respect to the molten pool. Directing the beam selectively heats the outer surface of the wire and maintains the position of the wire with respect to the molten pool. An apparatus for controlling an electron beam process includes a beam gun adapted for generating the electron beam, and a controller adapted for providing the electron beam with a complex raster pattern and for directing the electron beam onto an outer surface of the wire to control a location of the wire with respect to the molten pool.

Taminger, Karen M.↗

Investigation of ion-beam machining methods for replicated x-ray optics

The final figuring step in the fabrication of an optical component involves imparting a specified contour onto the surface. This can be expensive and time consuming step. The recent development of ion beam figuring provides a method for performing the figuring process with advantages over standard mechanical methods. Ion figuring has proven effective in figuring large optical components. The process of ion beam figuring removes material by transferring kinetic energy from impinging neutral particles. The process utilizes a Kaufman type ion source, where a plasma is generated in a discharge chamber by controlled electric potentials. Charged grids extract and accelerate ions from the chamber. The accelerated ions form a directional beam. A neutralizer outside the accelerator grids supplies electrons to the positive ion beam. It is necessary to neutralize the beam to prevent charging workpieces and to avoid bending the beam with extraneous electro-magnetic fields. When the directed beam strikes the workpiece, material sputters in a predicable manner. The amount and distribution of material sputtered is a function of the energy of the beam, material of the component, distance from the workpiece, and angle of incidence of the beam. The figuring method described here assumes a constant beam removal, so that the process can be represented by a convolution operation. A fixed beam energy maintains a constant sputtering rate. This temporally and spatially stable beam is held perpendicular to the workpiece at a fixed distance. For non-constant removal, corrections would be required to model the process as a convolution operation. Specific figures (contours) are achieved by rastering the beam over the workpiece at varying velocities. A unique deconvolution is performed, using series-derivative solution developed for the system, to determine these velocities.

Drueding, Thomas W.↗

Charging and discharging characteristics of dielectric materials exposed to low- and mid-energy electrons

Charging and discharging characteristics of dielectric samples exposed to 1-25 keV and 25-100 keV electrons in a laboratory environment are reported. The materials examined comprised OSR, Mylar, Kapton, perforated Kapton, and Alphaquartz, serving as models for materials employed on spacecraft in geosynchronous orbit. The tests were performed in a vacuum chamber with electron guns whose beams were rastered over the entire surface of the planar samples. The specimens were examined in low-impedance-grounded, high-impedance-grounded, and isolated configurations. The worst-case and average peak discharge currents were observed to be independent of the incident electron energy, the time-dependent changes in the worst case discharge peak current were independent of the energy, and predischarge surface potentials are negligibly dependent on incident monoenergetic electrons.

Coakley, P.↗

Effects of low earth orbit on the optical performance of multi-layer enhanced high reflectance mirrors

Two mirror designs developed for space applications were flown along with a standard mid-infrared design on the leading and trailing edges of the Long Duration Exposure Facility (LDEF). Preliminary observations of induced changes in optical performance of ZnS-coated mirrors and impact-related microstructural and microchemical effects are described in the proceedings of the First LDEF Post-Retrieval Symposium. In this paper, effects of the induced environment and meteoroid/debris impacts on mirror performance are described in more detail. Also, an analysis of reflectance spectra using the results of Auger and secondary ion mass spectroscopy (SIMS) profiling measurements are used to identify an optical-degradation mechanism for the ZnS-coated mirrors. Structural damage associated with a high-velocity impact on a (Si/Al2O3)-coated mirror was imaged optically and with scanning electron and atomic force microscopy (SEM and AFM). Scanning Auger and SIMS analysis provided chemical mapping of selected impact sites. The impact data suggest design and fabrication modifications for obtaining improved mechanical performance using a design variation identified in preflight laboratory simulations. Auger surface profile and SIMS imaging data verified the conclusion that secondary impacts are the source of contamination associated with the dendrites grown on the leading-edge ZnS-coated test samples. It was also found that dendrites can be grown in the laboratory by irradiating contaminated sites on a trailing-edge ZnS-coated sample with a rastered electron beam. These results suggest a mechanism for dendrite growth.

Donovan, Terence↗

Improved spatial uniformity of beam-plane interaction by means of inverse rastering

An analysis is presented that shows the desirability and feasibility of conducting irradiations of large test objects by beams of penetrating radiation, by the method of moving the test object back and forth through the beam, rather than by sweeping the beam across the object. An extension of this method of inverse rastering allows the generation of composite beams with any desired intensity-vs-energy spectrum, obviating the need to determine equivalent damage factors for every energy in the spectrum.

Miller, C. G.↗

Electron spectroscopy analysis

The Surface Science Laboratories at the University of Alabama in Huntsville (UAH) are equipped with x-ray photoelectron spectroscopy (XPS or ESCA) and Auger electron spectroscopy (AES) facilities. These techniques provide information from the uppermost atomic layers of a sample, and are thus truly surface sensitive. XPS provides both elemental and chemical state information without restriction on the type of material that can be analyzed. The sample is placed into an ultra high vacuum (UHV) chamber and irradiated with x-rays which cause the ejection of photoelectrons from the sample surface. Since x-rays do not normally cause charging problems or beam damage, XPS is applicable to a wide range of samples including metals, polymers, catalysts, and fibers. AES uses a beam of high energy electrons as a surface probe. Following electronic rearrangements within excited atoms by this probe, Auger electrons characteristic of each element present are emitted from the sample. The main advantage of electron induced AES is that the electron beam can be focused down to a small diameter and localized analysis can be carried out. On the rastering of this beam synchronously with a video display using established scanning electron microscopy techniques, physical images and chemical distribution maps of the surface can be produced. Thus very small features, such as electronic circuit elements or corrosion pits in metals, can be investigated. Facilities are available on both XPS and AES instruments for depth-profiling of materials, using a beam of argon ions to sputter away consecutive layers of material to reveal sub-surface (and even semi-bulk) analyses.

Gregory, John C.↗

Simultaneous Conoscopic Holography and Raman Spectroscopy

A new instrument was developed for chemical characterization of surfaces that combines the analytical power of Raman spectroscopy with the three-dimensional topographic information provided by conoscopic holography. The figure schematically depicts the proposed hybrid instrument. The output of the conoscopic holographic portion of the instrument is a topographical map of the surface; the output of the Raman portion of the instrument is hyperspectral Raman data, from which the chemical and/or biological composition of the surface would be deduced. By virtue of the basic principles of design and operation of the instrument, the hyperspectral image data would be inherently spatially registered with the topographical data. In conoscopic holography, the object and reference beams of classical holography are replaced by the ordinary and extraordinary components generated by a single beam traveling through a birefringent, uniaxial crystal. In the basic conoscopic configuration, a laser light is projected onto a specimen and the resulting illuminated spot becomes a point source of diffuse light that propagates in every direction. The laser beam is rasterscanned in two dimensions (x and y) perpendicular to the beam axis (z), and at each x,y location, the pattern of interference between the ordinary and extraordinary rays is recorded. The recorded interferogram constitutes the conoscopic hologram. Of particular significance for the proposed instrument is that the conoscopic hologram contains information on the z coordinate (height) of the illuminated surface spot. Hence, a topographical map of the specimen is constructed point-by-point by rastering the laser beam in the x and y directions and correlating the x and y coordinates with the z information obtained from the interferograms. Conoscopic imaging is an established method, and conoscopic laboratory instruments for surface metrology are commercially available. In Raman spectroscopy of a surface, one measures the spectrum of laser light scattered inelastically from a laser-illuminated spot on the surface. The wavelengths of the inelastically scattered light differ from that of the incident laser beam by amounts that correspond to the energies of molecular vibrations. The resulting vibrational spectrum can be used to identify the molecules. Raman spectroscopy is a standard laboratory technique for identifying mineralogical, biological, and other specific chemical compositions.

Schramm, Harry F.↗

Semiconductor Laser With Two-Dimensional Beam Steering

Modification of monolithic semiconductor injection laser capable of one-dimensional electronic beam steering enables deflection of beam in second direction. Such laser chip provides beam pointing or raster scanning for applications in optical communications, data processing, image scanning, and optical ranging.

Katz, J.↗

Photocurrent Imaging Detects Solar-Module Defects

Raster-scanned laser beam excites photocurrents in thin-film amorphous silicon devices. Solar-cell laser scanner uses two galvanometer-driven mirrors to scan laser-beam spot over surface of module or cell under test. Position signals from scan controllers used to index storage of photocurrent signal data in scan-converter image memory. Stored image displayed on television monitor.

Kim, Q.↗

Sidelooking laser altimeter for a flight simulator

An improved laser altimeter for a flight simulator which allows measurement of the height of the simulator probe above the terrain directly below the probe tip is described. A laser beam is directed from the probe at an angle theta to the horizontal to produce a beam spot on the terrain. The angle theta that the laser beam makes with the horizontal is varied so as to bring the beam spot into coincidence with a plumb line coaxial with the longitudinal axis of the probe. A television altimeter camera observes the beam spot and has a raster line aligned with the plumb line. Spot detector circuit coupled to the output of the TV camera monitors the position of the beam spot relative to the plumb line.

Webster, L. D.↗

Miniaturized Environmental Scanning Electron Microscope for In Situ Planetary Studies

The exploration of remote planetary surfaces calls for the advancement of low power, highly-miniaturized instrumentation. Instruments of this nature that are capable of multiple types of analyses will prove to be particularly useful as we prepare for human return to the moon, and as we continue to explore increasingly remote locations in our Solar System. To this end, our group has been developing a miniaturized Environmental-Scanning Electron Microscope (mESEM) capable of remote investigations of mineralogical samples through in-situ topographical and chemical analysis on a fine scale. The functioning of an SEM is well known: an electron beam is focused to nanometer-scale onto a given sample where resulting emissions such as backscattered and secondary electrons, X-rays, and visible light are registered. Raster scanning the primary electron beam across the sample then gives a fine-scale image of the surface topography (texture), crystalline structure and orientation, with accompanying elemental composition. The flexibility in the types of measurements the mESEM is capable of, makes it ideally suited for a variety of applications. The mESEM is appropriate for use on multiple planetary surfaces, and for a variety of mission goals (from science to non-destructive analysis to ISRU). We will identify potential applications and range of potential uses related to planetary exploration. Over the past few of years we have initiated fabrication and testing of a proof-of-concept assembly, consisting of a cold-field-emission electron gun and custom high-voltage power supply, electrostatic electron-beam focusing column, and scanning-imaging electronics plus backscatter detector. Current project status will be discussed. This effort is funded through the NASA Research Opportunities in Space and Earth Sciences - Planetary Instrument Definition and Development Program.

Gaskin, Jessica↗

Finite Element Models for Electron Beam Freeform Fabrication Process

Electron beam freeform fabrication (EBF3) is a member of an emerging class of direct manufacturing processes known as solid freeform fabrication (SFF); another member of the class is the laser deposition process. Successful application of the EBF3 process requires precise control of a number of process parameters such as the EB power, speed, and metal feed rate in order to ensure thermal management; good fusion between the substrate and the first layer and between successive layers; minimize part distortion and residual stresses; and control the microstructure of the finished product. This is the only effort thus far that has addressed computer simulation of the EBF3 process. The models developed in this effort can assist in reducing the number of trials in the laboratory or on the shop floor while making high-quality parts. With some modifications, their use can be further extended to the simulation of laser, TIG (tungsten inert gas), and other deposition processes. A solid mechanics-based finite element code, ABAQUS, was chosen as the primary engine in developing these models whereas a computational fluid dynamics (CFD) code, Fluent, was used in a support role. Several innovative concepts were developed, some of which are highlighted below. These concepts were implemented in a number of new computer models either in the form of stand-alone programs or as user subroutines for ABAQUS and Fluent codes. A database of thermo-physical, mechanical, fluid, and metallurgical properties of stainless steel 304 was developed. Computing models for Gaussian and raster modes of the electron beam heat input were developed. Also, new schemes were devised to account for the heat sink effect during the deposition process. These innovations, and others, lead to improved models for thermal management and prediction of transient/residual stresses and distortions. Two approaches for the prediction of microstructure were pursued. The first was an empirical approach involving the computation of thermal gradient, solidification rate, and velocity (G,R,V) coupled with the use of a solidification map that should be known a priori. The second approach relies completely on computer simulation. For this purpose a criterion for the prediction of morphology was proposed, which was combined with three alternative models for the prediction of microstructure; one based on solidification kinetics, the second on phase diagram, and the third on differential scanning calorimetry data. The last was found to be the simplest and the most versatile; it can be used with multicomponent alloys and rapid solidification without any additional difficulty. For the purpose of (limited) experimental validation, finite element models developed in this effort were applied to three different shapes made of stainless steel 304 material, designed expressly for this effort with an increasing level of complexity. These finite element models require large computation time, especially when applied to deposits with multiple adjacent beads and layers. This problem can be overcome, to some extent, by the use of fast, multi-core computers. Also, due to their numerical nature coupled with the fact that solid mechanics- based models are being used to represent the material behavior in liquid and vapor phases as well, the models have some inherent approximations that become more pronounced when dealing with multi-bead and multi-layer deposits.

Chandra, Umesh↗