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Results for “common-mode voltage injection”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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NASA NTRS1974

ASTP simulated lightning test report

A simulated lightning test was conducted on the backup spacecraft for the Apollo Soyuz Test Project mission (CSM-119) to determine the susceptibility of the Apollo spacecraft to damage from the indirect effects of lightning. It is demonstrated that induced lightning effects from low-level injected currents can be scaled linearly to those which are obtained in a full threat lightning stroke. Test results indicate that: (1) many of the power and signal critical circuits would fail if subjected to full-threat lightning, (2) pyrotechnic circuits are safe for full-threat lightning, and (3) common-mode voltages exceeded the failure criteria level for all but three of the circuits tested.

Blount, R. L.↗
NASA NTRS2004

Design of an Auto-zeroed, Differential, Organic Thin-film Field-effect Transistor Amplifier for Sensor Applications

Organic strain gauge and other sensors require high-gain, precision dc amplification to process their low-level output signals. Ideally, amplifiers would be fabricated using organic thin-film field-effect transistors (OTFT's) adjacent to the sensors. However, OTFT amplifiers exhibit low gain and high input-referred dc offsets that must be effectively managed. This paper presents a four-stage, cascaded differential OTFT amplifier utilizing switched capacitor auto-zeroing. Each stage provides a nominal voltage gain of four through a differential pair driving low-impedance active loads, which provide common-mode output voltage control. p-type pentacence OTFT's are used for the amplifier devices and auto-zero switches. Simulations indicate the amplifier provides a nominal voltage gain of 280 V/V and effectively amplifies a 1-mV dc signal in the presence of 500-mV amplifier input-referred dc offset voltages. Future work could include the addition of digital gain calibration and offset correction of residual offsets associated with charge injection imbalance in the differential circuits.

large-area electronics↗