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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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14 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS2013

Data Compression Algorithm Architecture for Large Depth-of-Field Particle Image Velocimeters

A large depth-of-field particle image velocimeter (PIV) is designed to characterize dynamic dust environments on planetary surfaces. This instrument detects lofted dust particles, and senses the number of particles per unit volume, measuring their sizes, velocities (both speed and direction), and shape factors when the particles are large. To measure these particle characteristics in-flight, the instrument gathers two-dimensional image data at a high frame rate, typically >4,000 Hz, generating large amounts of data for every second of operation, approximately 6 GB/s. To characterize a planetary dust environment that is dynamic, the instrument would have to operate for at least several minutes during an observation period, easily producing more than a terabyte of data per observation. Given current technology, this amount of data would be very difficult to store onboard a spacecraft, and downlink to Earth. Since 2007, innovators have been developing an autonomous image analysis algorithm architecture for the PIV instrument to greatly reduce the amount of data that it has to store and downlink. The algorithm analyzes PIV images and automatically reduces the image information down to only the particle measurement data that is of interest, reducing the amount of data that is handled by more than 10(exp 3). The state of development for this innovation is now fairly mature, with a functional algorithm architecture, along with several key pieces of algorithm logic, that has been proven through field test data acquired with a proof-of-concept PIV instrument.

Bos, Brent↗
NASA NTRS1978

Wide angle pinhole camera

Hemispherical refracting element gives pinhole camera 180 degree field-of-view without compromising its simplicity and depth-of-field. Refracting element, located just behind pinhole, bends light coming in from sides so that it falls within image area of film. In contrast to earlier pinhole cameras that used water or other transparent fluids to widen field, this model is not subject to leakage and is easily loaded and unloaded with film. Moreover, by selecting glass with different indices of refraction, field at film plane can be widened or reduced.

Franke, J. M.↗
NASA NTRS1993

A sharp-focusing schlieren optical deflectometer

A new instrument capable of localized, nonintrusive turbulence measurements is developed by combining a focusing schlieren system with an optical deflectometer. This instrument records the fluctuating light intensity at a point in the focused schlieren image. Its capability is verified by making benchmark measurements of Kelvin-Helmholtz vortices produced in a low-speed axisymmetric mixing layer. The sharp-focusing effect is demonstrated both visually and quantitatively. The results show that the instrument is capable of optical turbulence measurements within a 4 mm depth-of-field.

Alvi, F. S.↗
NASA NTRS2000

A New Digital Holographic Instrument for Measuring Microphysical Properties of Contrails in the SASS (Subsonic Assessment) Program

SPEC incorporated designed, built and operated a new instrument, called a pi-Nephelometer, on the NASA DC-8 for the SUCCESS field project. The pi-Nephelometer casts an image of a particle on a 400,000 pixel solid-state camera by freezing the motion of the particle using a 25 ns pulsed, high-power (60 W) laser diode. Unique optical imaging and particle detection systems precisely detect particles and define the depth-of-field so that at least one particle in the image is almost always in focus. A powerful image processing engine processes frames from the solid-state camera, identifies and records regions of interest (i.e. particle images) in real time. Images of ice crystals are displayed and recorded with 5 micron pixel resolution. In addition, a scattered light system simultaneously measures the scattering phase function of the imaged particle. The system consists of twenty-eight 1-mm optical fibers connected to microlenses bonded on the surface of avalanche photo diodes (APDs). Data collected with the pi-Nephelometer during the SUCCESS field project was reported in a special issue of Geophysical Research Letters. The pi-Nephelometer provided the basis for development of a commercial imaging probe, called the cloud particle imager (CPI), which has been installed on several research aircraft and used in More than a dozen field programs.

Lawson, R. Paul↗
NASA NTRS2000

The Athena Pancam and Color Microscopic Imager (CMI)

The Athena Mars rover payload includes two primary science-grade imagers: Pancam, a multispectral, stereo, panoramic camera system, and the Color Microscopic Imager (CMI), a multispectral and variable depth-of-field microscope. Both of these instruments will help to achieve the primary Athena science goals by providing information on the geology, mineralogy, and climate history of the landing site. In addition, Pancam provides important support for rover navigation and target selection for Athena in situ investigations. Here we describe the science goals, instrument designs, and instrument performance of the Pancam and CMI investigations.

Bell, J. F., III↗
NASA NTRS1999

The Eyes Have It

NASA'S Ames Research Center contracted with SRI international to contract a device that would be able to anticipate, track, and monitor involuntary ocular movement horizontally, vertically, and with respect to depth-of-field. This development helped research institutions to understand the eye. The Eyetracker, manufactured and distributed by Forward Optical Technologies, Inc. is now used in the clinical/medical field.

Source record↗
NASA NTRS2009

High-Grading Lunar Samples

Astronauts on long-duration lunar missions will need the capability to high-grade their samples to select the highest value samples for transport to Earth and to leave others on the Moon. We are supporting studies to define the necessary and sufficient measurements and techniques for high-grading samples at a lunar outpost. A glovebox, dedicated to testing instruments and techniques for high-grading samples, is in operation at the JSC Lunar Experiment Laboratory. A reference suite of lunar rocks and soils, spanning the full compositional range found in the Apollo collection, is available for testing in this laboratory. Thin sections of these samples are available for direct comparison. The Lunar Sample Compendium, on-line at http://www-curator.jsc.nasa.gov/lunar/compendium.cfm, summarizes previous analyses of these samples. The laboratory, sample suite, and Compendium are available to the lunar research and exploration community. In the first test of possible instruments for lunar sample high-grading, we imaged 18 lunar rocks and four soils from the reference suite using the Multispectral Microscopic Imager (MMI) developed by Arizona State University and JPL (see Farmer et. al. abstract). The MMI is a fixed-focus digital imaging system with a resolution of 62.5 microns/pixel, a field size of 40 x 32 mm, and a depth-of-field of approximately 5 mm. Samples are illuminated sequentially by 21 light emitting diodes in discrete wavelengths spanning the visible to shortwave infrared. Measurements of reflectance standards and background allow calibration to absolute reflectance. ENVI-based software is used to produce spectra for specific minerals as well as multi-spectral images of rock textures.

Allen, Carlton↗
NASA NTRS2013

NASA Tech Briefs, March 2013

Topics covered include: Remote Data Access with IDL Data Compression Algorithm Architecture for Large Depth-of-Field Particle Image Velocimeters Vectorized Rebinning Algorithm for Fast Data Down-Sampling Display Provides Pilots with Real-Time Sonic-Boom Information Onboard Algorithms for Data Prioritization and Summarization of Aerial Imagery Monitoring and Acquisition Real-time System (MARS) Analog Signal Correlating Using an Analog-Based Signal Conditioning Front End Micro-Textured Black Silicon Wick for Silicon Heat Pipe Array Robust Multivariable Optimization and Performance Simulation for ASIC Design; Castable Amorphous Metal Mirrors and Mirror Assemblies; Sandwich Core Heat-Pipe Radiator for Power and Propulsion Systems; Apparatus for Pumping a Fluid; Cobra Fiber-Optic Positioner Upgrade; Improved Wide Operating Temperature Range of Li-Ion Cells; Non-Toxic, Non-Flammable, -80 C Phase Change Materials; Soft-Bake Purification of SWCNTs Produced by Pulsed Laser Vaporization; Improved Cell Culture Method for Growing Contracting Skeletal Muscle Models; Hand-Based Biometric Analysis; The Next Generation of Cold Immersion Dry Suit Design Evolution for Hypothermia Prevention; Integrated Lunar Information Architecture for Decision Support Version 3.0 (ILIADS 3.0); Relay Forward-Link File Management Services (MaROS Phase 2); Two Mechanisms to Avoid Control Conflicts Resulting from Uncoordinated Intent; XTCE GOVSAT Tool Suite 1.0; Determining Temperature Differential to Prevent Hardware Cross-Contamination in a Vacuum Chamber; SequenceL: Automated Parallel Algorithms Derived from CSP-NT Computational Laws; Remote Data Exploration with the Interactive Data Language (IDL); Mixture-Tuned, Clutter Matched Filter for Remote Detection of Subpixel Spectral Signals; Partitioned-Interval Quantum Optical Communications Receiver; and Practical UAV Optical Sensor Bench with Minimal Adjustability.

Source record↗
NASA NTRS2010

Characterization of Moving Dust Particles

A large depth-of-field Particle Image Velocimeter (PIV) has been developed at NASA GSFC to characterize dynamic dust environments on planetary surfaces. This instrument detects and senses lofted dust particles. We have been developing an autonomous image analysis algorithm architecture for the PIV instrument to greatly reduce the amount of data that it has to store and downlink. The algorithm analyzes PIV images and reduces the image information down to only the particle measurement data we are interested in receiving on the ground - typically reducing the amount of data to be handled by more than two orders of magnitude. We give a general description of PIV algorithms and describe only the algorithm for estimating the velocity of the traveling particles.

Bos, Brent J.↗
NASA NTRSDate not supplied

Variable Pressure - Scanning Electron Microscopy (VP-SEM)

Variable Pressure (or Environmental) Scanning Electron Microscopy (VP-SEM) combined with Energy Dispersive X-ray Spectroscopy (EDS) is one of the most powerful methods for characterizing the sub-micron topography and chemical composition of uncoated samples. Terrestrially, VP-SEM is extensively used to non-destructively study geologic and manufactured materials with high spatial resolution (tens of nanometers) and large depth-of-field. An SEM offers a geologist a first survey of microscopic mineral phases via secondary electron imaging (SEI), which provides a topographic look at a sample, as well as backscattered electron (BEI) imaging, which contrasts the phases present based on their geochemistry (atomic number). A VP-SEM utilizes a gas in the sample chamber as a charge dissipation and signal amplification method, allowing analysis of a sample without preparation in the form of a conductive coating. A miniaturized VP-SEM operating in-situ on a lander or rover would be able to use the CO2-rich Martian atmosphere (e.g., Nier et al., 1976; Williams 2016) as an imaging medium for this purpose. Adaptation of a VP-SEM for in-situ Mars surface studies will provide a new imaging capability (via SEI) that is at least an order of magnitude higher resolution than the Mars Hand Lens Imager (MAHLI) on the Mars Science Laboratory (Williams et al., 2015), and equal to or better than the achieved resolution of the Atomic Force Microscope on the Phoenix Mars lander (Pike et al., 2011). In addition, the MVP-SEM is capable of BSI and simultaneous chemical analysis of the imaged region. In this sense, the MVP-SEM can be regarded as an instrument suite that will provide a new set of information not achievable by any other instrument. The Miniaturized Variable Pressure Scanning Electron Microscope (MVP-SEM) was designed, built, and benchtop tested by a team at NASA’s Marshall Space Flight Center and Jet Propulsion Laboratory (JPL), Jacobs Space Exploration Group, Applied Physics Technologies, Inc. (AP-Tech), and Creare LLC, working with a team of technical and science collaborators. Benchtop testing was successful, proving concept feasibility. To date, the MVP-SEM has achieved an imaging resolution of <100 nm in the lab, and with continued optimization, even better performance (~50 nm resolution) is possible. Use in-situ on the lunar or other planetary surfaces would require some redesign to optimize instrument performance, but such an instrument would be equally useful.

Variable Pressure Scanning Electron Microscopy↗
NASA NTRSDate not supplied

Miniature Variable Pressure - Scanning Electron Microscopy (MVP-SEM)

Variable Pressure (or Environmental) Scanning Electron Microscopy (VP-SEM) combined with Energy Dispersive X-ray Spectroscopy (EDS) is one of the most powerful methods for characterizing the sub-micron topography and chemical composition of uncoated samples. Terrestrially, VP-SEM is extensively used to non-destructively study geologic and manufactured materials with high spatial resolution (tens of nanometers) and large depth-of-field. An SEM offers a geologist a first survey of microscopic mineral phases via secondary electron imaging (SEI), which provides a topographic look at a sample, as well as backscattered electron (BEI) imaging, which contrasts the phases present based on their geochemistry (atomic number). A VP-SEM utilizes a gas in the sample chamber as a charge dissipation and signal amplification method, allowing analysis of a sample without preparation in the form of a conductive coating. A miniaturized VP-SEM operating in-situ on a lander or rover would be able to use the CO2-rich Martian atmosphere (e.g., Nier et al., 1976; Williams 2016) as an imaging medium for this purpose. Adaptation of a VP-SEM for in-situ Mars surface studies will provide a new imaging capability (via SEI) that is at least an order of magnitude higher resolution than the Mars Hand Lens Imager (MAHLI) on the Mars Science Laboratory (Williams et al., 2015), and equal to or better than the achieved resolution of the Atomic Force Microscope on the Phoenix Mars lander (Pike et al., 2011). In addition, the MVP-SEM is capable of BSI and simultaneous chemical analysis of the imaged region. In this sense, the MVP-SEM can be regarded as an instrument suite that will provide a new set of information not achievable by any other instrument. The Miniaturized Variable Pressure Scanning Electron Microscope (MVP-SEM) was designed, built, and benchtop tested by a team at NASA’s Marshall Space Flight Center and Jet Propulsion Laboratory (JPL), Jacobs Space Exploration Group, Applied Physics Technologies, Inc. (AP-Tech), and Creare LLC, working with a team of technical and science collaborators. Benchtop testing was successful, proving concept feasibility. To date, the MVP-SEM has achieved an imaging resolution of <100 nm in the lab, and with continued optimization, even better performance (~50 nm resolution) is possible. Use in-situ on the lunar or other planetary surfaces would require some redesign to optimize instrument performance, but such an instrument would be equally useful.

Variable Pressure Scanning Electron Microscopy↗
NASA NTRS1998

X-Ray Exposure of Electron-Deposited Photoresist for Conformal Lithography on Corrugated Surfaces

Proximity printing using synchrotron X-ray lithography provides high resolution pattern transfer with large depth of field, low diffraction effects and no reflection from the substrate. Electro-plating of photo-resist allows deposition of thin, uniform films over geometrically complex and topographically diverse, electrically conductive surfaces.

Electron-deposited resist X-ray lithography Deep d↗
NASA NTRS1999

Nanometer X-ray Lithography

New developments for X-ray nanomachinging include pattern transfer onto non-planar surfaces coated with eletrodeposited resists using synchrotron radion X-rays through extremely high-resolution masks made by chemically assisted focused ion beam lithography.

X-rays↗