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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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ARETE: Accurate Error Assessment via Machine Learning-Guided Dynamic-Timing Analysis

Nanometer circuits are increasingly prone to timing errors, escalating the need for fault injection frameworks to accurately evaluate their impact on applications. Here in this paper, we propose ARETE, a novel cross-layer, fault-injection framework that combines dynamic-binary instrumentation with machine learning-guided dynamic-timing analysis. ARETE enables accurate fault-injection into any application by estimating the location of the injecting errors via dynamic-timing analysis. To accelerate fault-injection, we develop a novel, data-aware, machine learning-based mechanism that dynamically pre-selects the error-prone instructions and limits the application of the costly dynamic-timing analysis only to them. To evaluate ARETE's accuracy, our fully automated toolflow is configured to support fault-injection based on detailed post-layout gate-level simulations as well as via existing workload-agnostic error models. Our results for various workloads, including an autonomous-driving library, show that the location and time of injected errors performed by ARETE, is 89.9% consistent with fault-injection based on full gate-level simulation. On average, ARETE executes 84.6x faster than gate-level simulation and at a cost of 3.4% loss in the program output quality estimation. When compared to the existing statistical fault-injection tools that are based on workload-agnostic error models, ARETE improves the accuracy of fault-injection rate and output quality estimation by 143.9% and 40.4% on average, respectively.

97 MATHEMATICS AND COMPUTING↗

Machine Learning for Predictive Performance Analysis in Charged Particle Beam Tools

Imaging methods driven by probes, electrons, and ions have played a dominant role in modern science and engineering. Opportunities for machine vision and AI that focus on consumer problems like driving and feature recognition, are now presenting themselves for automating aspects of the scientific processes. This proposal aims to enable and drive discovery in ultra-low energy implantation by taking advantage of faster processing, flexible control and detection methods, and architecture-agnostic workflows that will result in higher efficiency and shorter scientific development cycles. Custom microscope control, collection and analysis hardware will provide a framework for conducting novel in situ experiments revealing unprecedented insight into surface dynamics at the nanoscale. Ion implantation is a key capability for the semiconductor industry. As devices shrink, novel materials enter the manufacturing line, and quantum technologies transition to being more mainstream. Traditional implantation methods fall short in terms of energy, ion species, and positional precision. Here we demonstrate 1 keV focused ion beam Au implantation into Si and validate the results via atom probe tomography. We show the Au implant depth at 1 keV is 0.8 nm and that identical results for low energy ion implants can be achieved by either lowering the column voltage, or decelerating ions using bias – while maintaining a sub-micron beam focus. We compare our experimental results to static calculations using SRIM and dynamic calculations using binary collision approximation codes TRIDYN and IMSIL. A large discrepancy between the static and dynamic simulation is found that is due to lattice enrichment with high stopping power Au and surface sputtering. Additionally, we demonstrate how model details are particularly important to the simulation of these low-energy heavy-ion implantations. Finally, we discuss how our results pave a way to much lower implantation energies, while maintaining high spatial resolution.

47 OTHER INSTRUMENTATION↗

Prospects for gravitational wave and ultra-light dark matter detection with binary resonances beyond the secular approximation

Precision observations of orbital systems have recently emerged as a promising new means of detecting gravitational waves and ultra-light dark matter, offering sensitivity in new regimes with significant discovery potential. These searches rely critically on precise modeling of the dynamical effects of these signals on the observed system; however, previous analyses have mainly only relied on the secularly-averaged part of the response. We introduce here a fundamentally different approach that allows for a fully time-resolved description of the effects of oscillatory metric perturbations on orbital dynamics. We find that gravitational waves and ultra-light dark matter can induce large oscillations in the orbital parameters of realistic binaries, enhancing the sensitivity to such signals by orders of magnitude compared to previous estimates.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

In-pixel automatic threshold calibration for the CMS Endcap Timing Layer readout chip

We present the implementation and verification of an in-pixel automatic threshold calibration circuit for the CMS Endcap Timing Layer (ETL) in the High-Luminosity LHC upgrade. The discriminator threshold of the ETL readout chip (ETROC) needs to be calibrated regularly to mitigate the circuit baseline change. Traditional methods need a lot of communication through a slow control system hence are time-consuming. This paper describes an in-pixel automatic scheme with improvements in operating time and usability. In this scheme, a sample-accumulation circuit is used to measure the average discriminator output. A binary successive approximation and linear combination scan are applied to find the equivalent baseline. The actual calibration procedure has been first implemented in FPGA firmware and tested with the ETROC front-end prototype chip (ETROC0). The calibration circuit has been implemented with Triple Modular Redundancy (TMR) and verified with Single Event Effects (SEEs) simulation. A complete calibration process lasts 35 ms with a 40 MHz clock. In the worst case, the dynamic and static power consumption are estimated to be 300 uW and 10.4 uW, respectively. The circuit design, implemented in a 65 CMOS technology, will be integrated into ETROC2, the next iteration of the ETROC with a 16 x16 pixel matrix.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

Photometry of Outer Solar System Objects from the Dark Energy Survey. I. Photometric Methods, Light-curve Distributions, and Trans-Neptunian Binaries

We report the methods of and initial scientific inferences from the extraction of precision photometric information for the >800 trans-Neptunian objects (TNOs) discovered in the images of the Dark Energy Survey (DES). Scene-modeling photometry is used to obtain shot-noise-limited flux measures for each exposure of each TNO, with background sources subtracted. Comparison of double-source fits to the pixel data with single-source fits are used to identify and characterize two binary TNO systems. A Markov Chain Monte Carlo method samples the joint likelihood of the intrinsic colors of each source as well as the amplitude of its flux variation, given the time series of multiband flux measurements and their uncertainties. A catalog of these colors and light-curve amplitudes A is included with this publication. We show how to assign a likelihood to the distribution q(A) of light-curve amplitudes in any subpopulation. Using this method, we find decisive evidence (i.e., evidence ratio <0.01) that cold classical (CC) TNOs with absolute magnitude 6 < H$_{r}$ < 8.2 are more variable than the hot classical (HC) population of the same H$_{r}$, reinforcing theories that the former form in situ and the latter arise from a different physical population. Resonant and scattering TNOs in this H$_{r}$ range have variability consistent with either the HCs or CCs. DES TNOs with H$_{r}$ < 6 are seen to be decisively less variable than higher-H$_{r}$ members of any dynamical group, as expected. More surprising is that detached TNOs are decisively less variable than scattering TNOs, which requires them to have distinct source regions or some subsequent differential processing.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗