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Results for “dynamic mechanical loading (DML)”

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Reliability Implications of Solder in Multiwire Modules under Dynamic Mechanical Loading: Preprint

Two generations of multiwire modules were studied under dynamic mechanical loading (DML). The earlier generation module was found to use an In-based solder alloy, and the current generation a Bi-based alloy. The earlier generation module degraded significantly under DML with increasing resistance, while the state-of-the-art module did not demonstrate degradation under DML. The degradation in the earlier module was attributed to damage at the solder-gridline interfaces. Atomic force microscopy scratch testing estimated the wear resistance of each solder alloy to assess susceptibility to degradation. Bi-based alloys appear to be more wear resistant than In-based alloys, consistent with the DML results. These results indicate that current multiwire designs may have higher mechanical durability than earlier generations.

41 EE - Solar Energy Technologies Office (EE-4S)↗

Reliability Implications of Solder in Multiwire Modules under Dynamic Mechanical Loading

Two generations of multiwire modules were studied under dynamic mechanical loading (DML) with in-situ differential conductance (dG) and electroluminescence (EL) imaging. Energy-dispersive x-ray spectroscopy (EDS) was used to identity the solder alloys. The earlier generation module was found to use an In-based solder alloy, and the current generation a Bi-based alloy. The earlier generation module degraded significantly under DML with increasing resistance, while the current generation module did not demonstrate degradation under DML. Atomic force microscopy scratch testing was used to probe the wear resistance of each solder alloy. These results indicate that current multiwire designs may have higher mechanical durability than earlier generations.

atomic force microscopy↗

Millions of Small Pressure Cycles Drive Damage in Cracked Solar Cells

Here, we applied time-varying air pressure to a PV module containing newly cracked cells. The test used a new dynamic mechanical acceleration (DMX) apparatus. We applied pressure cycles similar to natural, wind-driven cycles. Compared to standard dynamic mechanical load (DML) tests, we applied much lower pressure (10 Pa to 300 Pa RMS) and many more cycles (one million at each of four pressure levels). We present a case study on a single cell in a commercial module. We monitored electrical continuity loss across cracks using electroluminescence (EL) imaging. 10 Pa pressure cycles caused negligible change. 30 Pa pressure cycles caused permanent damage that continued worsening even after tens of thousands of cycles. After one million 30 Pa cycles, a series of 100 Pa cycles still caused new, permanent damage to existing cracks. 300 Pa cycles caused further worsening and introduced new cracks.

14 SOLAR ENERGY↗