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At least 19 records

Demonstration of closed shell breeding of cesium ions with an electron beam ion source

An electron beam ion source serves as a charge breeder for the Californium Rare Isotope Breeder Upgrade (CARIBU) at the Argonne Tandem Linac Accelerator System (ATLAS). The source accepts radioactive beams of 1+ or 2+ ions and raises their charge state for post-acceleration by ATLAS. The efficiency of this process impacts the length of each experiment and, hence, the type and number of experiments that can be run in each program cycle. Recent efforts to improve the charge breeding efficiency for the 80 < A < 160 species typical of CARIBU have focused on utilizing the closed shell breeding technique. Here, with this technique, the electron beam energy is manipulated to take advantage of the large gap in ionization energies at shell closures and selectively populate a single charge state. Charge breeding studies with stable cesium ions have demonstrated an absolute efficiency of 72% for Cs 27+ and a total efficiency of 93%. The Cs 27+ efficiency result represents a factor of 3 improvement over the previous best charge breeding result of 23% for Cs 27+ .

Vondrasek, R. [Argonne National Laboratory (ANL), ↗

Commissioning of Extended Electron Beam Ion Source at Brookhaven National Laboratory

Here, the Extended Electron Beam Ion Source (EEBIS) has been installed and commissioned at Brookhaven National Laboratory (BNL) hadron accelerator complex in the spring of 2023. EEBIS has replaced its predecessor, RhicEBIS, which provided ions for BNL hadron facilities for over a decade since 2009. The motivations for the source upgrade are to provide higher intensities of the Au 32+ ion beam for the Relativistic Heavy Ion Collider (RHIC) and to provide of an intense source of polarized 3 He 2+ ions for the future Electron Ion Collider (EIC) at BNL. EEBIS is and will continue to be the primary source for a variety of different ion species for the NASA Space Radiation Laboratory (NSRL) at BNL. EEBIS utilizes two identical, two-meter-long unshielded 5T warm bore superconducting solenoids, and it is operated with electron beam current up to 10 A, providing a high-capacity ion traps to fulfill the requirement for high intensity ion beams. The upstream solenoid contains a “short ion trap” with a length of 95 cm, while the “long ion trap” with a length of 178 cm is located inside the downstream solenoid bore. The main features of EEBIS are: * A Gas injection and ionization cell equipped with a Lorenz pulse valve * High-capacity ZAO non-evaporable getter (NEG) custom linear pumping units * In situ apparatus for pumping speed measurements to monitor NEG activation and saturation * “External drift tube” construction with differential pumping stages to provide space for Lorentz pulse valve and 3 He high-field polarization cell * A Ba oxide electron gun cathode. The design of EEBIS as well as the results of its commissioning and first-year operation are presented and discussed.

43 PARTICLE ACCELERATORS↗

Optically pumped polarized 3 He ++ ion source development for RHIC/EIC

The proposed polarized 3 He ++ acceleration in RHIC and the future Electron-Ion Collider will require about 2×10 11 ions in the source pulse. A new technique had been proposed for production of high intensity polarized 3 He ++ ion beams. It is based on ionization and accumulation of the 3 He gas (polarized by metastability-exchange optical pumping and in the 5T high magnetic field) in the existing Electron Beam Ion Source (EBIS). A novel 3 He cryogenic purification and storage technique was developed to provide the required gas purity. An original gas refill and polarized 3 He gas injection to the EBIS long drift tubes, (which serves as the storage cell) were developed to ensure polarization preservation. An infrared laser system for optical pumping and polarization measurements in the high 3–5 T field has been developed. The 3 He polarization 80–85% (and sufficiently long ~30 min relaxation time) was obtained in the “open” cell configuration with refilling valve tube inlet and isolation valve closed. The development of the spin-rotator and 3 He 4 He absolute nuclear polarimeter at 6 MeV 3 He ++ beam energy is also presented here in this work.

43 PARTICLE ACCELERATORS↗

Progress of the laser ion source upgrade (LION2) for RHIC and NSRL program at Brookhaven National Laboratory

At Brookhaven National Laboratory (BNL), the LION2 ion source is being constructed to replace an existing laser ion ablation ion source (LIS) at the EBIS facility, which provides heavy ion beams of multiple ion species for the operation of NASA Space Radiation Laboratory (NSRL) and Relativistic Heavy Ion Collider (RHIC). The LION1 ion source currently provides singly charged ions of Li, B, C, O, Al, Si, Ca, Ti, Fe, Cu, Zr, Nb, Ag, Tb, Ta, W, Au, Bi, and Th with a rapid-species-change capability. An electron beam ion source, Extended-EBIS captures, confines, and ionizes the ions to high charge state, suitable for injection and acceleration by an RFQ accelerator. Typically, single pulses of the LIS ion species for NSRL are changed sequentially during Galactic Cosmic Ray experiments, while multiple pulses of a given ion beam are provided quasi-simultaneously for RHIC. LION2 will have the same capability of the rapid-species-change with improved beam performance and reliability. LION2 is being constructed in a remote assembly location and is expected to finish in December 2023. The removal of LION1 and installation of LION2 is planned during the December 2023 or summer 2024 shutdown.

43 PARTICLE ACCELERATORS↗

The neutral mass spectrometer on Dynamics Explorer B

A neutral gas mass spectrometer has been developed to satisfy the measurement requirements of the Dynamics Explorer mission. The mass spectrometer, a quadrupole, will measure the abundances of neutral species in the region 300-500 km in the earth's atmosphere. These measurements will be used in concert with other simultaneous observations on Dynamics Explorer to study the physical processes involved in the interactions of the magnetosphere-ionosphere-atmosphere system. The instrument, which is similar to that flown on Atmosphere Explorer, employs an electron beam ion source operating in the closed mode and a discrete dynode multiplier as a detector. The mass range is 22 to 50 amu. The abundances of atomic oxygen, molecular nitrogen, helium, argon, and possibly atomic nitrogen will be measured to an accuracy of about + or - 15% over the specified altitude range, with a temporal resolution of one second.

Carignan, G. R.↗

Wind tunnel mass spectrometer design study

The sampling probe to measure the free stream gas composition in a hypersonic wind tunnel is described. Using a free expansion of the continuum flow, a series of sampling inlet-pumping stages is evaluated. Mass analysis is carried out with a quadrupole mass spectrometer employing a crossed electron beam, molecular beam ion source, and an off-axis electron multiplier. The spatial distribution of the sampled molecular flux and the pumping requirements are evaluated for varying inlet conditions of gas density and flow velocity. The signal-to-noise ratio of the molecular beam formed by this series of coaxial inlets is also determined. The signal-to-noise ratio of the unscattered flux is sufficiently high that an unambiguous determination of the beam composition and of the free stream gas properties can be made. The magnitude of the detected signal is sufficiently high that measurement of trace constituents two orders of magnitude below the primary beam signal can be made.

Hueser, J. E.↗

Ion source design for industrial applications

The more frequently used design techniques for the components of broad-beam electron bombardment ion sources are discussed. The approach used emphasizes refractory metal cathodes and permanent-magnet multipole discharge chambers. Design procedures and sample calculations are given for the discharge chamber, ion optics, the cathodes, and the magnetic circuit. Hardware designs are included for the isolator, cathode supports, anode supports, pole-piece assembly, and ion-optics supports. A comparison is made between two-grid and three-grid optics. The designs presented are representative of current technology and are adaptable to a wide range of configurations.

Kaufman, H. R.↗

Ion beam technology applications study

Specific perceptions and possible ion beam technology applications were obtained as a result of a literature search and contact interviews with various institutions and individuals which took place over a 5-month period. The use of broad beam electron bombardment ion sources is assessed for materials deposition, removal, and alteration. Special techniques examined include: (1) cleaning, cutting, and texturing for surface treatment; (2) crosslinking of polymers, stress relief in deposited layers, and the creation of defect states in crystalline material by ion impact; and (3) ion implantation during epitaxial growth and the deposition of neutral materials sputtered by the ion beam. The aspects, advantages, and disadvantages of ion beam technology and the competitive role of alternative technologies are discussed.

Sellen, J. M., Jr.↗

The use of an ion-beam source to alter the surface morphology of biological implant materials

An electron bombardment, ion thruster was used as a neutralized-ion beam sputtering source to texture the surfaces of biological implant materials. Scanning electron microscopy was used to determine surface morphology changes of all materials after ion-texturing. Electron spectroscopy for chemical analysis was used to determine the effects of ion texturing on the surface chemical composition of some polymers. Liquid contact angle data were obtained for ion textured and untextured polymer samples. Results of tensile and fatigue tests of ion-textured metal alloys are presented. Preliminary data of tissue response to ion textured surfaces of some metals, polytetrafluoroethylene, alumina, and segmented polyurethane were obtained.

Weigand, A. J.↗

The use of an ion-beam source to alter the surface morphology of biological implant materials

An electron-bombardment ion-thruster was used as a neutralized-ion-beam sputtering source to texture the surfaces of biological implant materials. The materials investigated included 316 stainless steel; titanium-6% aluminum, 4% vanadium; cobalt-20% chromium, 15% tungsten; cobalt-35% nickel, 20% chromium, 10% molybdenum; polytetrafluoroethylene; polyoxymethylene; silicone and polyurethane copolymer; 32%-carbon-impregnated polyolefin; segmented polyurethane; silicone rubber; and alumina. Scanning electron microscopy was used to determine surface morphology changes of all materials after ion-texturing. Electron spectroscopy for chemical analysis was used to determine the effects of ion-texturing on the surface chemical composition of some polymers. Liquid contact angle data were obtained for ion-textured and untextured polymer samples. Results of tensile and fatigue tests of ion-textured metal alloys are presented. Preliminary data of tissue response to ion-textured surfaces of some metals, polytetrafluoroethylene, alumina, and segmented polyurethane have been obtained.

Weigand, A. J.↗

Reversal ion source - A new source of negative ion beams

A new type of ion source utilizing beams of electrons and target molecules, rather than a diffuse, volume plasma, is described. The source utilizes an electrostatic electron 'mirror' which reverses trajectories in an electron beam, producing electrons at their turning point having a distribution of velocities centered at zero velocity. A gas which attaches zero-velocity electrons is introduced at this turning point. Negative ions are produced by an attachment or dissociative attachment process. For many of the thermal electron-attaching molecules the cross sections can be quite large, varying as the inverse square root of the electron energy or just the s-wave threshold law. The efficiency and current density of the ion source for production of Cl(-) through the large, thermal energy attachment process is estimated. It is argued that the source can be used for the production of negative ions through attachment resonances located at higher energies as well.

Orient, O. J.↗

Measuring X-Ray Emission Line Shapes in Neutral Species for XRISM Calibration

Space X-ray spectrometers such as the Resolve instrument on XRISM require precise calibration in order to interpret the spectra of astrophysical objects. Key components of the calibration are the energy scale and the core line spread function, both of which vary with photon energy. A major issue in the calibration of high-resolution spectrometers is locating good calibrators with well-known and stable intrinsic line shapes. Neutral fluorescence is widely used, but inner-shell transitions in neutral atoms often exhibit complex, poorly documented line shapes that vary with excitation conditions. Here, in this study, we present empirical measurements of K-shell transitions in neutral O and F below 1 keV using an engineering model XRISM calorimeter array, an electron bombardment modulated X-ray source, and an electron beam ion trap (EBIT) to provide a precise energy reference. In addition, we report measurements of the Mo Lα complex with the transition-edge microcalorimeter spectrometer (TEMS), which reveal strong satellite structure and sensitivity of the line shape to the incident exciting spectrum. Together, these results demonstrate the need for empirical line-shape models, highlight the nonstationary nature of neutral fluorescence features, and define a path toward developing transfer standards for XRISM and future precision instruments such as Athena/X-IFU.

Astronomy and AstroPhysics↗

Characterization of an Atomic Hydrogen Source for Charge Exchange Experiments

We characterized the dissociation fraction of a thermal dissociation atomic hydrogen source byinjecting the mixed atomic and molecular output of the source into an electron beam ion trapcontaining highly charged ions and recording the x-ray spectrum generated by charge exchangeusing a high-resolution x-ray calorimeter spectrometer. We exploit the fact that the charge exchangestate-selective capture cross sections are very different for atomic and molecular hydrogen incidenton the same ions, enabling a clear spectroscopic diagnostic of the neutral species.

issociationX-ray spectrometersX-ray spectraMolecul↗

Ion concentration ratio measurements of ion beams generated by a commercial microwave electron cyclotron resonance plasma source

A commercially available electron cyclotron resonance (ECR) plasma source (GenII Plasma Source, tectra GmbH) is widely used for surface processing. This plasma source is compatible with ultrahigh vacuum systems, and its working pressure is relatively low, around 10 –6 –10 –4 Torr even without differential pumping. Here, we report ion flux concentration ratios for each ion species in an ion beam from this source, as measured by a mass/energy analyzer that is a combination of a quadrupole mass spectrometer, an electrostatic energy analyzer, and focusing ion optics. In this study, the examined beams were those arising from plasmas produced from feed gases of H 2 , D 2 , N 2 , O 2 , Ar, and dry air over a range of input power and working pressures. H 2 (D 2 ) plasmas are widely used for nuclear fusion applications and, hence, the ion concentration ratios of H + , H 2 + , and H 3 + reported here will be useful information for research that applies this plasma source to well-controlled plasma-material interaction studies. Ion energy distributions, stability of operation, and impurity concentrations were also assessed for each of the plasma species investigated.

47 OTHER INSTRUMENTATION↗

Optical and electrical properties of ion beam textured Kapton and Teflon

Results are given for ion beam texturing of polyimide (Kapton) and fluorinated ethylene propylene (Teflon) by means of a 30-cm diam electron bombardment argon ion source. Ion beam-textured Kapton and Teflon surfaces are evaluated for various beam energies, current densities, and exposure times. The optical properties and sheet resistance are measured after each exposure. Provided in the paper are optical spectral data, resistivity measurements, calculated absorptance and emittance measurements, and surface structure SEM micrographs for various exposures to argon ions. It is found that Kapton becomes conducting and Teflon nonconducting when ion beam-textured. Textured Kapton exhibits large changes in the transmittance and solar absorptance, but only slight changes in reflectance. Surface texturing of Teflon may allow better adherence of subsequent sputtered metallic films for a high absorptance value. The results are valuable in spacecraft charging applications.

Mirtich, M. J.↗

Improved ion sources

Ion sources with magnetically aligned electron beam and compatibility with quadrupole mass spectrometer for planetary atmospheric analysis

ELECTRON BEAM↗