SEARCH · Search NASA

Results for “electron beam-induced current”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

SourceResearch connectionFrom yearThrough year

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

6 records

All sources NASA NTRS DOE OSTI

NASA NTRS1979

Silicon solar cell fabrication technology

The laser cell scanner was used to characterize a number of solar cells made in various materials. An electron beam-induced current (EBIC) study was performed using a stereoscan scanning electron microscope. Planar p-n junctions were analyzed. A theory for the EBIC based on the analytical solution of the ambipolar diffusion equation under the influence of electron beam excitation parameter z (which is related to beam penetration), the junction depth Z sub j, the beam current and the surface recombination, was formulated and tested. The effect of a grain boundary was studied.

Stafsudd, O. M.↗

NASA NTRS1977

Surface recombination velocity and diffusion length of minority carriers in heavily doped silicon layers

Quantitative analysis of the electron beam-induced current and the dependence of the effective diffusion length of the minority carriers on the penetration depth of the electron beam were employed for the analysis of the carrier recombination characteristics in heavily doped silicon layers. The analysis is based on the concept of the effective excitation strength of the carriers which takes into consideration all possible recombination sources. Two dimensional mapping of the surface recombination velocity of P-diffused Si layers will be presented together with a three dimensional mapping of minority carrier lifetime in ion implanted Si. Layers heavily doped with As exhibit improved recombination characteristics as compared to those of the layers doped with P.

Gatos, H. C.↗

NASA NTRS1985

EBIC spectroscopy - A new approach to microscale characterization of deep levels in semi-insulating GaAs

The microscale characterization of electronic defects in (SI) GaAs has been a challenging issue in connection with materials problems encountered in GaAs IC technology. The main obstacle which limits the applicability of high resolution electron beam methods such as Electron Beam-Induced Current (EBIC) and cathodoluminescence (CL) is the low concentration of free carriers in semiinsulating (SI) GaAs. The present paper provides a new photo-EBIC characterization approach which combines the spectroscopic advantages of optical methods with the high spatial resolution and scanning capability of EBIC. A scanning electron microscope modified for electronic characterization studies is shown schematically. The instrument can operate in the standard SEM mode, in the EBIC modes (including photo-EBIC and thermally stimulated EBIC /TS-EBIC/), and in the cathodo-luminescence (CL) and scanning modes. Attention is given to the use of CL, Photo-EBIC, and TS-EBIC techniques.

Li, C.-J.↗

NASA NTRS1986

ELF waves and ion resonances produced by an electron beam emitting rocket in the ionosphere

Results are reported from the ECHO-6 electron-beam-injection experiment, performed in the auroral-zone ionosphere on March 30, 1983 using a sounding rocket equipped with two electron guns and a free-flying plasma-diagnostics instrument package. The data are presented in extensive graphs and diagrams and characterized in detail. Large ELF wave variations, superposed on the strong beam-sector-directed quasi-dc component, are observed in the 100-eV beam-induced plasma when the beam is injected in a transverse spiral, but not when it is injected upward parallel to the magnetic-field line. ELF activity is found to be suppressed whenever the rocket passed through field lines with auroral activity, suggesting that the waves are produced by the interaction of the beam potentials, plasma currents, and return currents neutralizing the accelerator payload.

Winckler, J. R.↗

NASA NTRS1990

Effects of neutral gas releases on electron beam injection from electrically tethered spacecraft

The presence of high neutral densities at low altitudes and/or during thruster firings is known to modify the spacecraft potential during active electron beam injection. Two-dimensional (three velocity) particle simulations are used to investigate the ionization processes including the neutral density required, the modification of the spacecraft potential, beam profile and spatial distribution of the return current into the spacecraft. Three processes are identified: (1) beam-induced ionization, (2) vehicle-induced ionization, and (3) beam plasma discharge. Only in the first two cases does the beam propagate away with little distortion.

Winglee, R. M.↗

NASA NTRS1992

Observations of VHF emissions from 50-mA electron beam injections in the ionosphere that are associated with beam-induced discharges

Results are presented of observations of strong VHF plasma waves with amplitudes in excess of 0.1 mV/m (Hz)1/2 associated with 50 mA electron beam injections in the ionosphere. Data from three swept-frequency receivers carried on two daughter payloads are analyzed to determine the emission spectra of the electron beam for various energies and currents. These results were obtained from the rocket-borne experiment SCEX 3, NASA flight 39.002 UE, launched February 1, 1990. The accelerator payload also carried photometers, which measured luminosity at wavelengths of 391.4 and 380.5 nm. Several times during electron gun activity the measured luminosity increased much faster than proportional to the beam current. This nonlinear increase is evidence that a discharge is occurring in the vicinity of the accelerator payload. It is inferred from the uniform distribution of the luminosity around the accelerator payload that the observed discharge extends significantly outside the beam cylinder.

Goerke, R. T.↗