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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Radiation sensitivity of electronic instruments susceptible to neutron and gamma radiation is evaluated by means of a radioisotope thermoelectric generator /RTG/. The gamma field of the RTG affects instrument operation and requires shielding, the neutron field does not affect operation via secondary capture-gamma production.
Mass spectrometer, spectrography, and other electronic instrumentation development
Electronic instruments onboard San Marco 2 satellite
Development costs of a few recent spaceflight instrument electrical and electronics subsystems have diverged from respective heritage cost model predictions. The cost models used are Grass Roots, Price-H and Parametric Model. These cost models originated in the military and industry around 1970 and were successfully adopted and patched by NASA on a mission-by-mission basis for years. However, the complexity of new instruments recently changed rapidly by orders of magnitude. This is most obvious in the complexity of representative spaceflight instrument electronics' data system. It is now required to perform intermediate processing of digitized data apart from conventional processing of science phenomenon signals from multiple detectors. This involves on-board instrument formatting of computational operands from row data for example, images), multi-million operations per second on large volumes of data in reconfigurable hardware (in addition to processing on a general purpose imbedded or standalone instrument flight computer), as well as making decisions for on-board system adaptation and resource reconfiguration. The instrument data system is now tasked to perform more functions, such as forming packets and instrument-level data compression of more than one data stream, which are traditionally performed by the spacecraft command and data handling system. It is furthermore required that the electronics box for new complex instruments is developed for one-digit watt power consumption, small size and that it is light-weight, and delivers super-computing capabilities. The conflict between the actual development cost of newer complex instruments and its electronics components' heritage cost model predictions seems to be irreconcilable. This conflict and an approach to its resolution are addressed in this paper by determining the complexity parameters, complexity index, and their use in enhanced cost model.
The quality assurance program demonstrates recognition of the quality aspects and an organized approach to achieve them. It ensures that quality requirements are determined and satisfied throughout all phases of contract performance, including preliminary and engineering design, development, fabrication, processing, assembly, inspection, test, checkout, packaging, shipping, storage, maintenance field use, flight preparations, flight operations and post-flight analysis, as applicable.
Electron optical metallographic instruments including electron microprobe X ray analyzer, scanning electron microscope, and transmission electron microscope
An electron beam source having a single electron optical axis is provided with two coplanar cathodes equally spaced on opposite sides from the electron optical axis. A switch permits selecting either cathode, and a deflection system comprised of electromagnets, each with separate pole pieces equally spaced from the plane of the cathodes and electron optical axis, first deflects the electron beam from a selected cathode toward the electron optical axis, and then in an opposite direction into convergence with the electron optical axis. The result is that the electron beam from one selected cathode undergoes a sigmoid deflection in two opposite directions, like the letter S, with the sigmoid deflection of each being a mirror image of the other.
Development of electronic visual instrumentation for spacecraft applications
The Electron Drift Instrument (EDI) measures the drift of a weak beam of test electrons that, when emitted in certain directions, return to the spacecraft after one or more gyrations. This drift is related to the electric field and the gradient in the magnetic field, and these quantities can, by use of different electron energies, be determined separately. As a by-product, the magnetic field strength is also measured. The present paper describes the scientific objectives, the experimental method, and the technical realization of the various elements of the instrument.
Electron beam-induced current (EBIC) imaging is a well-established scanning electron microscope (SEM) technique used to analyze the behavior of microelectronic devices including solar cells. Recently, the application of EBIC imaging in an aberration-corrected scanning transmission electron microscope (STEM) has been demonstrated and offers great potential for the in situ study of electronic materials, correlating charge transport properties to atomic structural and elemental information. Here, this work presents two ways to implement EBIC imaging in conventional SEM and STEM systems: one relying on the instrument's inherent scanning and imaging electronics and the other involving third-party systems usually available in electron microscopes. The implementation of lock-in EBIC in systems equipped with a fast beam blanker is also described. In addition, this work shows and discusses the different mechanisms at play in EBIC imaging and their dependence on beam energy, sample impedance, and electrical measurement configuration, providing researchers with the basic information needed to apply the technique to their research.
The Electron Drift Instrument (EDI) is a new technique for measuring electric fields in space by detecting the effect on weak beams of test electrons. This U.S. portions of the technique, flight hardware, and flight software were developed for the Cluster mission under this contract. Dr. Goetz Paschmann of the Max Planck Institute in Garching, Germany, was the Principle Investigator for Cluster EDI. Hardware for Cluster was developed in the U.S. at the University of New Hampshire, Lockheed Palo Alto Research Laboratory, and University of California, San Diego. The Cluster satellites carrying the original EDI instruments were lost in the catastrophic launch failure of first flight of the Arianne-V rocket in 1996. Following that loss, NASA and ESA approved a rebuild of the Cluster mission, for which all four satellites were successfully launched in the Summer of 2000. Limited operations of EDI were also obtained on the Equator-S satellite, which was launched in December, 1997. A satellite failure caused a loss of the Equator-S mission after only 5 months, but these operations were extremely valuable in learning about the characteristics and operations of the complex EDI instrument. The Cluster mission, satellites, and instruments underwent an extensive on-orbit commissioning phase in the Fall of 2000, carrying over through January 2001. During this period all elements of the instruments were checked and careful measurements of inter-experiments interferences were made. EDI is currently working exceptionally well in orbit. Initial results verify that all aspects of the instrument are working as planned, and returning highly valuable scientific information. The first two papers describing EDI on-orbit results have been submitted for publication in April, 2001. The principles of the EDI technique, and its implementation on Cluster are described in two papers by Paschmann et al., attached as Appendices A and B. The EDI presentation at the formal Cluster Commissioning Review, held at ESA Headquarters in Paris, is attached as Appendix C.
Compilation of electronic test instrumentation and techniques derived from NASA programs
We present the design and performance of a compact ultrafast electron diffraction instrument. The diffractometer provides a means of examining time-resolved ultrafast dynamical properties of solids. The system’s utilization is discussed in terms of instrument parameters and diffraction data from selected condensed matter samples. Here, the difractometer’s performance is highlighted in terms of detection sensitivity, instrumental temporal resolution, and the electron beam transverse coherence length. Following specific details of the construction, we present a practical discussion of parameters such as repetition rate and provide advice on general construction approaches for laboratory-based, keV ultrafast electron diffractometers. In addition, design guidance for constructing a compact electron gun source that is well-suited for studying diffraction from hard condensed matter is given. A unique data acquisition scheme, utilizing high laser repetition rates, is presented.
Ultrafast electron diffraction (UED) stands as a powerful technique for real-time observation of structural dynamics at the atomic level. In recent years, the use of MeV electrons from radio frequency guns has been widely adopted to take advantage of the relativistic suppression of the space charge effects that otherwise limit the temporal resolution of the technique. Nevertheless, there is not a clear choice for the optimal energy for a UED instrument. Scaling to beam energies higher than a few MeV does pose significant technical challenges, mainly related to the inherent increase in diffraction camera length associated with the smaller Bragg angles. In this study, we report a solution by using a compact post-sample magnetic optical system to magnify the diffraction pattern from a crystal Au sample illuminated by an 8.2 MeV electron beam. Our method employs, as one of the lenses of the optical system, a triplet of compact, high field gradients (>500 T/m), small-gap (3.5 mm) Halbach permanent magnet quadrupoles. Shifting the relative position of the quadrupoles, we demonstrate tuning the magnification by more than a factor of two, a 6× improvement in camera length, and reciprocal space resolution better than 0.1 Å –1 in agreement with beam transport simulations.
"The Electronic Calibration (Ecal) tests are performed during various stages of instrument development to examinethe linearity of the instrument electronics. During this process, charges with stepwise increments are injected inthe analog electronics circuitry to generate a ramp signal that can be used to characterize any nonlinearities in theelectronics. The prelaunch characterization of MODIS (on the Terra and Aqua platforms) and VIIRS (on SNPP,JPSS-1 and JPSS-2) involved a regular evaluation of the electronics linearity using the Ecal tests. On orbit,the Ecal tests have been regularly performed over the mission for both the MODIS instruments to derive theelectronics gain and linearity. Unlike MODIS, the Ecal tests on the VIIRS instruments are performed on an as-needed basis. To date, no Ecal tests were performed for S-NPP VIIRS on orbit. The VIIRS instrument on JPSS-1(now NOAA 20) was launched on November 18, 2017. An Ecal test was performed to support the instrumentsinitial post-launch performance assessment. Shortly after the first on-orbit emissive band calibration, degradationin the instrument gain was observed for the LWIR bands (M15, M16 and I5). As a part of the investigationrelated to this anomaly, a second Ecal test was performed and results were compared with the prelaunch results.In this paper, we discuss the prelaunch Ecal tests and representative results from MODIS and VIIRS prelaunchcharacterization. Also, discussed are the on-orbit results from the two MODIS instruments as well as from therecently launched VIIRS instrument."
Use of controlled flow of electrons for analyzing and processing integrated circuits and focused electron beam as heat source for microwelding
Electron beam deflection devices for measuring electric fields
Static vibration tests of sailplanes with electronic measuring apparatus