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All sourcesNASA NTRSDOE OSTI
NASA NTRSDate not supplied

Overview of Space Environmental Effects (SEE) Team Electrostatic Discharge (ESD) Testing

Electrostatic discharge (ESD) due to the radiation environment encountered during spaceflight missions is a serious risk that must be mitigated by careful testing and design considerations. The MSFC Space Environmental Effects (SEE) Team has world-class facilities for ESD testing along with decades of experience. The Team has recently conducted successful campaigns for several high-profile projects including Europa Clipper, Exploration Upper Stage, Lunar Gateway, Orion, Docking System, and Human Landing System. This presentation will give a brief overview of ESD causes, hazards, test methods and test deliverables.

Peter Bertone↗
NASA NTRS2013

ESD Test Apparatus for Soldering Irons

ESDA (Electrostatic Discharge Association) ESD STM 13.1-2000 requires frequent testing of the voltage leakage from the tip of a soldering iron and the resistance from the tip of the soldering iron to the common point ground. Without this test apparatus, the process is time-consuming and requires several wires, alligator clips, or test probes, as well as additional equipment. Soldering iron tips must be tested for electrostatic discharge risks frequently, and this typically takes a lot of time in setup and testing. This device enables the operator to execute the full test in one minute or less. This innovation is a simple apparatus that plugs into a digital multimeter (DMM) and the Common Point Ground (CPG) reference. It enables the user to perform two of the electrostatic discharge tests required in ESD STM 13.1-2000. The device consists of a small black box with two prongs sticking out of one end, two inputs on the opposite end (one of the inputs is used to connect the reference CPG to the DMM), and a metal tab on one side. Inside the box are wires, several washers of various materials, and assembly hardware (nuts and screws/bolts). The device is a passive electronic component that is plugged into a DMM. The operator sets the DMM to read voltage. The operator places the heated tip of the soldering iron onto the metal tab with a small amount of solder to ensure a complete connection. The voltage is read and recorded. The operator switches the DMM to read resistance. The operator places the heated tip of the soldering iron onto the metal tab with a small amount of solder to ensure a complete connection. The resistance is recorded. If the recorded voltage and resistance are below a number stated in ESDA ESD STM 13.1-2000, the test is considered to pass. The device includes all the necessary wiring internal to its body so the operator does not need to do any independent wiring, except for grounding. It uses a stack of high-thermal-resistance washers to minimize the heat transfer from the soldering iron to the wiring used to measure the resistance and voltages. This minimizes thermal error. The device allows very rapid execution of a test that is performed frequently.

Sancho, Jose↗
DOE OSTI2013

Imaging Indicator for ESD Safety Testing

This report describes the development of a new detection method for electrostatic discharge (ESD) testing of explosives, using a single-lens reflex (SLR) digital camera and a 200-mm macro lens. This method has demonstrated several distinct advantages to other current ESD detection methods, including the creation of a permanent record, an enlarged image for real-time viewing as well as extended periods of review, and ability to combine with most other Go/No-Go sensors. This report includes details of the method, including camera settings and position, and results with well-characterized explosives PETN and RDX, and two ESD-sensitive aluminum powders.

Whinnery, LeRoy L.↗
NASA NTRS2012

Age Induced Effects on ESD Characteristics of Solar Array Coupons After Combined Space Environmental Exposures

A set of multi-junction GaAs/Ge solar array test coupons provided by Space Systems/Loral were subjected to a sequence of 5-year increments of combined space environment exposure tests. The test coupons capture an integrated design intended for use in a geosynchronous (GEO) space environment. A key component of this test campaign is performing electrostatic discharge (ESD) tests in the inverted gradient mode. The protocol of the ESD tests is based on the ISO standard for ESD testing on solar array panels [ISO-11221]. The test schematic in the ISO reference has been modified with Space System/Loral designed circuitry to better simulate the on-orbit operational conditions of its solar array design. Part of the modified circuitry is to simulate a solar array panel coverglass flashover discharge. All solar array coupons used in the test campaign consist of four cells constructed to form two strings. The ESD tests were performed at the beginning-of-life (BOL) and at each 5-year environment exposure point until end-of-life (EOL) at 15 years. The space environmental exposure sequence consisted of ultra-violet radiation, electron/proton particle radiation, thermal cycling, and Xenon ion thruster plume erosion. This paper describes the ESD test setup and the importance of the electrical test design in simulating the on-orbit operational conditions. Arc inception voltage results along with ESD test behavior from the BOL condition through the 15th year age condition are discussed. In addition, results from a Xenon plasma plume exposure test with an EOL coupon under the full ESD test condition will be discussed.

Wright, Kenneth H.↗
NASA NTRS2010

Electrostatic Discharge Test of Multi-Junction Solar Array Coupons After Combined Space Environmental Exposures

A set of multi-junction GaAs/Ge solar array test coupons were subjected to a sequence of 5-year increments of combined environmental exposure tests. The test coupons capture an integrated design intended for use in a geosynchronous (GEO) space environment. A key component of this test campaign is conducting electrostatic discharge (ESD) tests in the inverted gradient mode. The protocol of the ESD tests is based on the ISO/CD 11221, the ISO standard for ESD testing on solar array panels. This standard is currently in its final review with expected approval in 2010. The test schematic in the ISO reference has been modified with Space System/Loral designed circuitry to better simulate the on-orbit operational conditions of its solar array design. Part of the modified circuitry is to simulate a solar array panel coverglass flashover discharge. All solar array coupons used in the test campaign consist of 4 cells. The ESD tests are performed at the beginning of life (BOL) and at each 5-year environment exposure point. The environmental exposure sequence consists of UV radiation, electron/proton particle radiation, thermal cycling, and ion thruster plume. This paper discusses the coverglass flashover simulation, ESD test setup, and the importance of the electrical test design in simulating the on-orbit operational conditions. Results from 5th-year testing are compared to the baseline ESD characteristics determined at the BOL condition.

Wright, Kenneth H.↗
NASA NTRS1993

System Electrostatic Discharge Testing for Space Charging Caused ESD Events

This talk is about ground testing of spacecraft to determine immunity to the electrostatic discharges (ESDs) in certain Earth orbits. The particular spacecraft used as an example is the TOPEX/Poseidon spacecraft, an Earth orbiter with a 1334 km, 62 degree orbit. The talk is based on my recent experience with that spacecraft, but is an example of a generally good program. The program and this talk consist of the following elements: a discussion of the environment, showing the specific hazard areas on the spacecraft to illustrate the space charging and ESD process; spacecraft design features related to the environmental threat; the test device used for TOPEX/Poseidon; the test itself, including logistic and actions to avoid inadvertent damage to the spacecraft; and conclusions and lessons learned.

electrostatic↗
NASA NTRS2020

Comparison of Extreme Value Distributions for Electrostatic Discharge Magnitudes in Spacecraft Charging Tests

Electrostatic Discharge (ESD) induced by the accumulation of charge in the space environment is known to cause spacecraft anomalies and failures. While it is critical to estimate the worst-case expected ESD, sensitive radar instruments can be impacted by high rates of occurrence of very small ESD. To estimate the correct extreme behavior, it is important to select the correct extreme value distribution for extrapolation of test results limited in time and sensitivity. Quantile-quantile (Q-Q) analysis is used to compare electron beam-induced ESD test data to several statistical distributions used in the published literature. The best-fit distribution is shown to vary from between tests on different materials; however, it is clear that power law distributions are not good approximations for low amplitude events. Q-Q analysis is a convenient graphical method for evaluating multiple theoretical extreme-value distributions simultaneously.

Kim, Wousik↗
NASA NTRS2014

High Current ESD Test of Advanced Triple Junction Solar Array Coupon

Testing was conducted on an Advanced Triple Junction (ATJ) coupon that was part of a risk reduction effort in the development of a high-powered solar array design by Space Systems Loral, LLC (SSL). The ATJ coupon was a small, 4-cell, two-string configuration of flight-type design that has served as the basic test coupon design used in previous SSL environmental aging campaigns. The objective of the present test was to evaluate the performance of the coupon after being subjected to induced electrostatic discharge (ESD) testing at two string voltages (100 V, 150 V) and four string currents (1.65 A, 2.0 A, 2.475 A, and 3.3 A). An ESD test circuit, unique to SSL solar array design, was built that simulates the effect of missing cells and strings in a full solar panel with special primary arc flashover circuitry. A total of 73 primary arcs were obtained that included 7 temporary sustained arcs (TSA) events. The durations of the TSAs ranged from 50 micro-seconds to 2.75 milli-seconds. All TSAs occurred at a string voltage of 150 V. Post-ESD functional testing showed that no degradation occurred due to the TSA events. These test results point to a robust design for application to a high-current, high-power mission.

Wright, Kenneth H., Jr.↗
NASA NTRS2014

High Current ESD Test of Advanced Triple Junction Solar Array Coupon

Testing was conducted on an Advanced Triple Junction (ATJ) coupon that was part of a risk reduction effort in the development of a high-powered solar array design by Space Systems/Loral, LLC (SSL). The ATJ coupon was a small, 4-cell, two-string configuration that has served as the basic test coupon design used in previous SSL environmental aging campaigns. The coupon has many attributes of the flight design; e.g., substrate structure with graphite face sheets, integrated by-pass diodes, cell interconnects, RTV grout, wire routing, etc. The objective of the present test was to evaluate the performance of the coupon after being subjected to induced electrostatic discharge (ESD) testing at two string voltages (100 V, 150 V) and four array currents (1.65 A, 2.0 A, 2.475 A, and 3.3 A). An ESD test circuit, unique to SSL solar array design, was built that simulates the effect of missing cells and strings in a full solar panel with special primary arc flashover circuitry. A total of 73 primary arcs were obtained that included 7 temporary sustained arcs (TSA) events. The durations of the TSAs ranged from 50 micro-seconds to 2.75 milli-seconds. All TSAs occurred at a string voltage of 150 V. Post-test Large Area Pulsed Solar Simulator (LAPSS), Dark I-V, and By-Pass Diode tests showed that no degradation occurred due to the TSA events. In addition, the post-test insulation resistance measured was > 50 G-ohms between cells and substrate. These test results indicate a robust design for application to a high-current, high-power mission.

Wright, Kenneth H., Jr.↗
NASA NTRS2017

Environmental Effects on Data Retention in Flash Cells

Flash technology is being utilized in fuzed munition applications and, based on the development of digital logic devices in the commercial world, usage of flash technology will increase. Antifuse technology, prevalent in non-volatile field programmable gate arrays (FPGAs), will eventually be phased out as new devices have not been developed for approximately a decade. The reliance on flash technology presents a long-term reliability issue for both DoD and NASA safety- and mission-critical applications. A thorough understanding of the data retention failure modes and statistics associated with Flash data retention is of vital concern to the fuze safety community. A key retention parameter for a flash cell is the threshold voltage (VTH), which is an indirect indicator of the amount of charge stored on the cells floating gate. This paper will present the results of our on-going tests: long-term storage at 150 C for a small population of devices, neutron radiation exposure, electrostatic discharge (ESD) testing, and the trends of large populations (over 300 devices for each condition) exposed to three difference temperatures: 25 C, 125 C, and 150 C.

Flash↗
NASA NTRS2004

8th Spacecraft Charging Technology Conference

The 8th Spacecraft Charging Technology Conference was held in Huntsville, Alabama, October 20-24, 2003. Hosted by NASA s Space Environments and Effects (SEE) Program and co-sponsored by the Air Force Research Laboratory (AFRL) and the European Space Agency (ESA), the 2003 conference saw attendance from eleven countries with over 65 oral papers and 18 poster papers. Presentation topics highlighted the latest in spacecraft charging mitigation techniques and on-orbit investigations, including: Plasma Propulsion and Tethers; Ground Testing Techniques; Interactions of Spacecraft and Systems With the Natural and Induced Plasma Environment; Materials Characterizations; Models and Computer Simulations; Environment Specifications; Current Collection and Plasma Probes in Space Plasmas; On-Orbit Investigations. A round-table discussion of international standards regarding electrostatic discharge (ESD) testing was also held with the promise of continued discussions in the off years and an official continuation at the next conference.

Minor, J. L.↗
NASA NTRS2021

A Heuristic Method for Determining the Necessary Time Duration of Electron Beam Tests ESD of Spacecraft Dielectrics

Electrostatic discharge or ESD can pose a significant risk to spacecraft in many space environments. Laboratory electron beam facilities can be used to test the performance of candidate spacecraft dielectrics. However, limited resources necessitate accelerated testing. The aim of this work is the development of a criterion for determining when an ESD test has run for sufficient time to capture representative ESD behavior. Such a criterion has the potential of saving hours of personnel and facility time per test. A comparison of the distributions of ESD event magnitudes from consecutive segments of an ESD test can be used to determine when the test has reached a quasi-steady state. Once this quasi-steady state has been observed the test may be truncated without a significant reduction in test fidelity.

Chinn, James↗
NASA NTRSDate not supplied

ROSA and Solar Cell Module Combined Environments Test Plan

Roll-out solar array (ROSA) technology is an emerging component of the future of spacecraft photovoltaic power subsystems. Qualification and risk reduction testing are necessary to demonstrate design worthiness for spaceflight implementation of the array and solar cell modules. Maxar Space LLC and NASA have undertaken a rigorous combined environment (CE) test campaign for a ROSA design expected to be a part of the Power and Propulsion Element (PPE) for the NASA Gateway which will be an outpost orbiting the Moon. The CE tests consist of several simulated space environment exposures associated with the planned mission: UV radiation, electron/proton radiation, xenon ion plume exposures, and vacuum thermal cycling and electrostatic discharge (ESD). These tests are conducted on small coupons consisting of the planned ROSA flight elements, and all tests are performed at the NASA Marshall Space Flight Center. This paper discusses the test plan, requirements for each environment, and the functional testing performed. Of note is a new approach for the induced primary arc used in the ESD testing, which better simulates the plasma expansion during the ESD event. Progress on executing the test plan is presented.

Space Environments Effects Testing↗
NASA NTRS2013

Robust Platinum Resistor Thermometer (PRT) Sensors and Reliable Bonding for Space Missions

Platinum resistance thermometers (PRTs) provide accurate temperature measurements over a wide temperature range and are used extensively on space missions due to their simplicity and linearity. A standard on spacecraft, PRTs are used to provide precision temperature control and vehicle health assessment. This paper reviews the extensive reliability testing of platinum resistor thermometer sensors (PRTs) and bonding methods used on the Mars Science Laboratory (MSL) mission and for the upcoming Soil Moisture Active Passive (SMAP) mission. During the Mars Exploration Rover (MER) mission, several key, JPL-packaged PRTs failed on those rovers prior to and within 1-Sol of landing due to thermally induced stresses. Similar failures can be traced back to other JPL missions dating back thirty years. As a result, MSL sought out a PRT more forgiving to the packaging configurations used at JPL, and extensively tested the Honeywell HRTS-5760-B-U-0-12 sensor to successfully demonstrate suitable robustness to thermal cycling. Specifically, this PRT was cycled 2,000 times, simulating three Martian winters and summers. The PRTs were bonded to six substrate materials (Aluminum 7050, treated Magnesium AZ231-B, Stainless Steel 304, Albemet, Titanium 6AL4V, and G-10), using four different aerospace adhesives--two epoxies and two silicones--that conformed to MSL's low out-gassing requirements. An additional epoxy was tested in a shorter environmental cycling test, when the need for a different temperature range adhesive was necessary for mobility and actuator hardware late in the fabrication process. All of this testing, along with electrostatic discharge (ESD) and destructive part analyses, demonstrate that this PRT is highly robust, and not subject to the failure of PRTs on previous missions. While there were two PRTs that failed during fabrication, to date there have been no in-flight PRT failures on MSL, including those on the Curiosity rover. Since MSL, the sensor has gone through a change in construction such that the manufacturer significantly restricts the minimum temperature. However, significant subsequent testing was performed with this new version of the part to show that it indeed is still robust to at least Mars minimum temperatures of -135(sup o)C. The additional completed testing will be described. This work has resulted in a successful sensor package qualification and a reliable bonding method suitable for use over large temperature extremes.

dectector↗
NASA NTRS2013

Robust Platinum Resistor Thermometer (PRT) Sensors and Reliable Bonding for Space Missions

Platinum resistance thermometers (PRTs) provide accurate temperature measurements over a wide temperature range and are used extensively on space missions due to their simplicity and linearity. A standard on spacecraft, PRTs are used to provide precision temperature control and vehicle health assessment. This paper reviews the extensive reliability testing of platinum resistor thermometer sensors (PRTs) and bonding methods used on the Mars Science Laboratory (MSL) mission and for the upcoming Soil Moisture Active Passive (SMAP) mission. During the Mars Exploration Rover (MER) mission, several key, JPL-packaged PRTs failed on those rovers prior to and within 1-Sol of landing due to thermally induced stresses. Similar failures can be traced back to other JPL missions dating back thirty years. As a result, MSL sought out a PRT more forgiving to the packaging configurations used at JPL, and extensively tested the Honeywell HRTS-5760-B-U-0-12 sensor to successfully demonstrate suitable robustness to thermal cycling. Specifically, this PRT was cycled 2,000 times, simulating three Martian winters and summers. The PRTs were bonded to six substrate materials (Aluminum 7050, treated Magnesium AZ231-B, Stainless Steel 304, Albemet, Titanium 6AL4V, and G-10), using four different aerospace adhesives--two epoxies and two silicones--that conformed to MSL's low out-gassing requirements. An additional epoxy was tested in a shorter environmental cycling test, when the need for a different temperature range adhesive was necessary for mobility and actuator hardware late in the fabrication process. All of this testing, along with electrostatic discharge (ESD) and destructive part analyses, demonstrate that this PRT is highly robust, and not subject to the failure of PRTs on previous missions. While there were two PRTs that failed during fabrication, to date there have been no in-flight PRT failures on MSL, including those on the Curiosity rover. Since MSL, the sensor has gone through a change in construction such that the manufacturer significantly restricts the minimum temperature. However, significant subsequent testing was performed with this new version of the part to show that it indeed is still robust to at least Mars minimum temperatures of -135 degrees Centigrade. The additional completed testing will be described. This work has resulted in a successful sensor package qualification and a reliable bonding method suitable for use over large temperature extremes

Platinum Resistor Thermometer (PRT)↗
NASA NTRS2010

Combined Space Environmental Exposure Tests of Multi-Junction GaAs/Ge Solar Array Coupons

A set of multi-junction GaAs/Ge solar array test coupons were subjected to a sequence of 5-year increments of combined environmental exposure tests. The purpose of this test program is to understand the changes and degradation of the solar array panel components, including its ESD mitigation design features in their integrated form, after multiple years (up to 15) of simulated geosynchronous space environment. These tests consist of: UV radiation, electrostatic discharge (ESD), electron/proton particle radiation, thermal cycling, and ion thruster plume exposures. The solar radiation was produced using a Mercury-Xenon lamp with wavelengths in the UV spectrum ranging from 230 to 400 nm. The ESD test was performed in the inverted-gradient mode using a low-energy electron (2.6 - 6 keV) beam exposure. The ESD test also included a simulated panel coverglass flashover for the primary arc event. The electron/proton radiation exposure included both 1.0 MeV and 100 keV electron beams simultaneous with a 40 keV proton beam. The thermal cycling included simulated transient earth eclipse for satellites in geosynchronous orbit. With the increasing use of ion thruster engines on many satellites, the combined environmental test also included ion thruster exposure to determine whether solar array surface erosion had any impact on its performance. Before and after each increment of environmental exposures, the coupons underwent visual inspection under high power magnification and electrical tests that included characterization by LAPSS, Dark I-V, and electroluminescence. This paper discusses the test objective, test methodologies, and preliminary results after 5 years of simulated exposure.

Hoang, Bao↗
NASA NTRS2002

Instructions for Plastic Encapsulated Microcircuit(PEM) Selection, Screening and Qualification.

The use of Plastic Encapsulated Microcircuits (PEMs) is permitted on NASA Goddard Space Flight Center (GSFC) spaceflight applications, provided each use is thoroughly evaluated for thermal, mechanical, and radiation implications of the specific application and found to meet mission requirements. PEMs shall be selected for their functional advantage and availability, not for cost saving; the steps necessary to ensure reliability usually negate any initial apparent cost advantage. A PEM shall not be substituted for a form, fit and functional equivalent, high reliability, hermetic device in spaceflight applications. Due to the rapid change in wafer-level designs typical of commercial parts and the unknown traceability between packaging lots and wafer lots, lot specific testing is required for PEMs, unless specifically excepted by the Mission Assurance Requirements (MAR) for the project. Lot specific qualification, screening, radiation hardness assurance analysis and/or testing, shall be consistent with the required reliability level as defined in the MAR. Developers proposing to use PEMs shall address the following items in their Performance Assurance Implementation Plan: source selection (manufacturers and distributors), storage conditions for all stages of use, packing, shipping and handling, electrostatic discharge (ESD), screening and qualification testing, derating, radiation hardness assurance, test house selection and control, data collection and retention.

King, Terry↗