An electron microscope and field ion microscope study of defects in quenched platinum.
Defects in quenched and aged platinum, using electron and field ion microscopes
Newman, R. W.↗
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The atom-probe field ion microscope.
Atom probe field ion microscope combining probe hole FIM and mass spectrometer with single particle sensitivity
Mclane, S. B.↗
Effect of the variation of tip radius on the operation of the field-ion microscope.
Tip radius variation effect on field-ion microscope operation, noting field-temperature characteristics
Weizer, V. G.↗
On the resolution and image intensity of the field-ion microscope
High resolution and image intensity of field ion microscope at low temperatures
Forestieri, A. F.↗
A field ion microscope investigation of oxygen in tungsten.
Oxygen caused bright spots in field ion microscope patterns of tungsten, noting oxygen variation effects
CRYSTAL DISLOCATION↗
An interpretational study of field ion microscope images.
Computerized image simulation to interpret crystal dislocations in field ion microscope images, investigating dislocations in various lattice systems by shell model
Sanwald, R. C.↗
On the resolution of the field-ion microscope.
Threshold voltage for onset of image-spot blurring of field-ion microscope screen and function of tip temperature
ION MICROSCOPE↗
A study of defect structures with the field ion microscope Semiannual report, 1 Mar. - 31 Aug. 1970
Study of defect structures with field ion microscope
Hren, J. J.↗
A study of defect structures with the field ion microscope Semiannual report, 1 Mar. - 31 Aug. 1969
Development and testing of atom probe field-ion microscope and quantitative measurements of atomic order in platinum and nickel alloys
Hren, J. J.↗
Investigation of intermittent enhancement of ion emission from a tungsten surface using the field ion microscope
Measuring intermittent enhancement of blinking effect upon addition of neon to imaging gas in helium-tungsten field-ion microscope
Weizer, V. G.↗
A Study of Defect Structures with the Field Ion Microscope First Semiannual Report, 1 Mar. - 31 Aug. 1966
Lattice defects in nickel-molybdenum alloys, and computer simulation of field ion microscope
COMPUTER SIMULATION↗
A study of defect structures with the field ion microscope Semiannual report, Sep. 1, 1966 - Feb. 28, 1967
Defect structures in ion emission images of metals and stress distributions under imaging conditions studied with field ion microscope
ION MICROSCOPE↗
Investigation of intermittent enhancement of ion emission from a tungsten surface using the field-ion microscope.
The blinking effect, or the intermittent enhancement of ion emission, which is observed when a few parts per million neon are added to the imaging gas in a helium-tungsten field-ion microscope, has been investigated. Measurements of the characteristic quantities involved - i.e., blinking rate, voltage limits, etc. - and their variation with temperature, field, and gas pressure, are described.
Weizer, V. G.↗
Field ion microscopical studies of exchange current density on iridium.
Field ion microscopy application in electrochemistry for surface effects observations, studying exchange current density on iridium tip
Javet, P.↗
A study of defect structures with the field ion microscope Semiannual report, 1 Sep. 1969 - 28 Feb. 1970
Field ion microscopy of stoichiometric platinum and nickel alloys for atomic ordering parameters
Hren, J. J.↗
Measurements of atomic order with the field-ion microscope
Near stoichiometric binary alloys atomic ordering parameters quantization by field ion micrography, using direct counting and optical transformation techniques
Hren, J. J.↗
A study of defect structures with the field ion microscope Semiannual report, 1 Mar. - 31 Aug. 1967
Computer models to aid in interpretating field ion micrographs of crystal structures
Hren, J. J.↗
CHAMP (Camera, Handlens, and Microscope Probe)
CHAMP (Camera, Handlens And Microscope Probe)is a novel field microscope capable of color imaging with continuously variable spatial resolution from infinity imaging down to diffraction-limited microscopy (3 micron/pixel). As a robotic arm-mounted imager, CHAMP supports stereo imaging with variable baselines, can continuously image targets at an increasing magnification during an arm approach, can provide precision rangefinding estimates to targets, and can accommodate microscopic imaging of rough surfaces through a image filtering process called z-stacking. CHAMP was originally developed through the Mars Instrument Development Program (MIDP) in support of robotic field investigations, but may also find application in new areas such as robotic in-orbit servicing and maintenance operations associated with spacecraft and human operations. We overview CHAMP'S instrument performance and basic design considerations below.
robotic field investigations↗