RF Models for Plasma-Surface Interactions
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70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
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Inverse design for waveguide dispersion with a differentiable mode solver
Inverse design of optical components based on adjoint sensitivity analysis has the potential to address the most challenging photonic engineering problems. However, existing inverse design tools based on finite-difference-time-domain (FDTD) models are poorly suited for optimizing waveguide modes for adiabatic transformation or perturbative coupling, which lies at the heart of many important photonic devices. Among these, dispersion engineering of optical waveguides is especially challenging in ultrafast and nonlinear optical applications involving broad optical bandwidths and frequency-dependent anisotropic dielectric material response. In this work, we develop gradient back-propagation through a general-purpose electromagnetic eigenmode solver and use it to demonstrate waveguide dispersion optimization for second harmonic generation with maximized phase-matching bandwidth. This optimization of three design parameters converges in eight steps, reducing the computational cost of optimization by ∼100x compared to exhaustive search and identifying new designs for broadband optical frequency doubling of laser sources in the 1.3–1.4 µm wavelength range. Furthermore, we demonstrate that the computational cost of gradient back-propagation is independent of the number of parameters, as required for optimization of complex geometries. This technique enables practical inverse design for a broad range of previously intractable photonic devices.
Gray, Dodd (ORCID:000000030469599X)↗
Tools and techniques for estimating high intensity RF effects
Tools and techniques for estimating and measuring coupling and component disturbance for avionics and electronic controls are described. A finite-difference-time-domain (FD-TD) modeling code, TSAR, used to predict coupling is described. This code can quickly generate a mesh model to represent the test object. Some recent applications as well as the advantages and limitations of using such a code are described. Facilities and techniques for making low-power coupling measurements and for making direct injection test measurements of device disturbance are also described. Some scaling laws for coupling and device effects are presented. A method for extrapolating these low-power test results to high-power full-system effects are presented.
Zacharias, Richard L.↗