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Results for “high-energy x-ray diffraction”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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7 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS2005

In-situ High-energy X-ray Diffraction Study of the Local Structure of Supercooled Liquid Si

While changes in the coordination number for liquid silicon upon supercooling, signaling an underlying liquid-liquid phase transition, have been predicted, x-ray and neutron measurements have produced conflicting reports. In particular some studies have found an increase in the first shell coordination as temperature decreases in the supercooled regime, while others have reported increases in the coordination number with decreasing temperature. Employing the technique of electrostatic levitation coupled with high energy x-ray diffraction (125 keV), and rapid data acquisition (100ms collection times) using an area detector, we have obtained high quality structural data more deeply into the supercooled regime than has been possible before. No change in coordination number is observed in this temperature region, calling into question previous experimental claims of structural evidence for the existence of a liquid-liquid phase transition.

Lee, G. W.↗
NASA NTRS2013

In Situ Assessment of Lattice in an Al-Li Alloy

The lattice strains of individual grains are measured in an Al-Li alloy, AA 2195, using high-energy X-ray diffraction at a synchrotron source. The diffraction of individual grains in this highly textured production alloy was isolated through use of a depth-defining aperture. It is shown that hydrostatic stress, and in turn the stress triaxiality, can vary significantly from grain to grain.

Beaudoin, A. J.↗
NASA NTRS2019

Automated Grain Yield Behavior Classification

A method for classifying grain stress evolution behaviors using unsupervised learning techniques is presented. The method is applied to analyze grain stress histories measured in-situ using high-energy X-ray diffraction microscopy (HEDM) from the aluminum-lithium alloy Al-Li 2099 at the elastic-plastic transition (yield). The unsupervised learning process automatically classified the grain stress histories into four groups: major softening, no work-hardening or softening, moderate work-hardening, and major work-hardening. The orientation and spatial dependence of these four groups are discussed. In addition, the generality of the classification process to other samples is explored.

Pagan, Darren C↗
NASA NTRS2024

Exploring the Role of Type-II Residual Stresses in A Laser Powder Bed Fusion Nickel-Based Superalloy Using Measurement and Modeling

Far-field high-energy X-ray diffraction microscopy (ff-HEDM) and the crystal plasticity finite element method (CPFEM) are used to investigate the role of grain-scale (Type-II) residual stresses on the fatigue life of additively manufactured (AM) Inconel alloy 625 (IN-625). Grain-averaged orientations, centroids, and residual elastic strain tensors from ff-HEDM data are used to instantiate a crystal plasticity model to simulate the effect of residual stresses at the grain scale. Simulation results indicate that the presence of tensile residual strains increase stress localization and heterogeneity within grains, triggering an earlier onset of plasticity. A microscale fatigue indicator parameter (FIP) is computed to model the impact of these residual strains on the cycles to fatigue crack nucleation. The crack nucleation model, based on the computed FIPs, predicts a significant reduction in the number of cycles for fatigue crack nucleation for mid- and high-cycle fatigue due to the residual strain induced localization, while the residual strains have minimal impact on low-cycle fatigue life.

Inconel↗
NASA NTRS2004

Microscopic and Metallurgical Aspects of the Space Shuttle Columbia Accident Investigation and Reconstruction

The Space Shuttle Columbia was descending for a landing at the Kennedy Space Center (KSC) on February 1, 2003. Approximately 20 minutes prior to touchdown, the Columbia began disintegrating over the western United States; the majority of debris eventually impacted in eastern Texas and western Louisiana. A monumental effort eventually recovered approximately 84,000 pieces of debris, approximately 38% of the Orbiter's original dry weight. The debris was transported to KSC, where the items were catalogued and evaluated. Critical areas of interest, such as the left and right leading edge surfaces and the underside of the ship, were placed upon a grid to aid in the reconstruction. Items of interest included metallic structures, reinforced carbon-carbon composites, and ceramic heat insulation tiles. Many of the leading edge elements had re-solidified metallic deposits spattered on them. These deposits became known as slag and were one of the main focuses of the investigation. In order to help determine the sequence of events inside the left wing during the accident, the slag's composition, layering order, and directionality of deposition were studied. A myriad of analytical tests were performed in an attempt to ascertain the compositional and depositional characteristics of selected slag deposits, including the ordering of deposited layers within each individual slag deposit harvested. Initially, Scanning Electron Microscopy and Energy Dispersive X-Ray Spectroscopy (SEM/EDX) were performed to quickly characterize the overall composition of individual slag deposits: SEM utilizes a narrowlyfocused high-energy electron beam impinging upon a specimen. The incident beam excites and liberates lower energy secondary electrons, which are detected and analyzed, providing a visual representation of the sample's surface topography. EDX also relies on an incident electron beam, except an EDX unit measures X-ray energies generated by the impinging beam. Each element generates a unique X-ray signature; the EDX detector measures these discreet energies. EDX actually penetrates approximately 2 microns into the bulk of the sample. However, random examination of various portions of slag, coupled with the semiquantitative nature of the SEM/EDX analysis, did not yield convincingly pertinent data. Therefore, X-ray dot mapping was conducted, which provided more understandable data, both in terms of slag layering and composition. An X-ray dot map is generated by performing numerous EDX scans for individual elements, then compiling the scans in a visual representation. Eventually, specimens consisting of not only the slag, but of the adjacent RCC substrate as well were cross-sectioned. X-Ray dot mapping of the materialographicallymounted and -polished cross- sections provided a visual representation of both the layering sequence and compositional characteristics of the slag. Contemporaneously, Electron Spectroscopy for Chemical Analysis/X-Ray Photoelectron Spectroscopy (ESCA/XPS) and powdered X-Ray Diffraction (XRD) were performed to further characterize the deposits and to attempt to identify what, if any, compounds were present. The ESCA/XPS analysis allowed the analyst to "sputter" into the sample with an electron gun, aiding in the identification of the layering sequence. XPS uses photons, rather than electrons, which impinge upon the surface of the sample. XPS measures the electrons emitted from within the first 5 nm of the sample's surface. The XRD measures the scatter angles of incident X-rays; the angle and intensity of scatter depend upon the crystalline structure of the pulverized sample. XRD is considered a qualitative rather than quantitative technique. ESCA/XPS revealed that the final layer to deposit was predominantly carbonaceous. XRD was successful in identifying specific compounds, such as Al 2O3, Al and/or Al3 21SiO47, mullite (3(Al2)O3 -SiO2), and nickel-aluminides. Eventually, Electron MicroProbe Analysis (EMPA) was conducted on the marialographically-prepared cross- sections of selected slag deposits. Microprobe combines SEM and Wavelength Dispersive X-Ray Spectroscopy (WDS), and, like EDX, uses a narrowly-focused high-energy electron beam impinging upon a specimen to elicit, in the case of EPMA, characteristic X-rays with specific wavelengths. This quantitative, analytical tool proved the most useful in determining depositional layering and composition of the slag deposits. This information was utilized in verifying the location of the breach in the left leading edge of the wing of the Columbia.

McDaniels, Steven J.↗
NASA NTRS2004

Buffer Layer Effects on Tandem InGaAs TPV Devices

Single junction indium gallium arsenide (InGaAs) based TPV devices have demonstrated efficiencies in excess of 20% at radiator temperatures of 1058 C. Modeling suggests that efficiency improvements in single bandgap devices should continue although they will eventually plateau. One approach for extending efficiencies beyond the single bandgap limit is to follow the technique taken in the solar cell field, namely tandem TPV cells. Tandem photovoltaic devices are traditionally composed of cells of decreasing bandgap, connected electrically and optically in series. The incident light impinges upon the highest bandgap first. This device acts as a sieve, absorbing the high-energy photons, while allowing the remainder to pass through to the underlying cell(s), and so on. Tandem devices reduce the energy lost to overexcitation as well as reducing the current density (Jsc). Reduced Jsc results in lower resistive losses and enables the use of thinner and lower doped lateral current conducting layers as well as a higher pitch grid design. Fabricating TPV tandem devices utilizing InGaAs for all of the component cells in a two cell tandem necessitates the inclusion of a buffer layer in-between the high bandgap device (In0.53 Ga0.47As - 0.74eV) and the low bandgap device (In0.66Ga0.34As - 0.63eV) to accommodate the approximately 1% lattice strain generated due to the change in InGaAs composition. To incorporate only a single buffer layer structure, we have investigated the use of the indium phosphide (InP) substrate as a superstrate. Thus the high-bandgap, lattice- matched device is deposited first, followed by the buffer structure and the low-bandgap cell. The near perfect transparency of the high bandgap (1.35eV) iron-doped InP permits the device to be oriented such that the light enters through the substrate. In this paper we examine the impact of the buffer layer on the underlying lattice-matched InGaAs device. 0.74eV InGaAs devices were produced in a variety of configurations both with and without buffer layers. All structures were characterized by reciprocal space x-ray diffraction to determine epilayer composition and residual strain. Electrical characterization of the devices was performed to examine the effect of the buffer on the device performance. The effect of the buffer structure depends upon where it is positioned. When near the emitter region, a 2.6x increase in dark current was measured, whereas no change in dark current was observed when it was near the base region.

Wilt, David M.↗
NASA NTRS2021

SMD Technology Highlights

Six technology highlights from the Science Mission Directorate (SMD) Heliophysics, Astrophysics, Earth, and Biological and Physical Sciences divisions. Technologies featured include 1. the 1653 m2 Solar Cruiser Solar Sail Propulsion system to enable missions to reach novel and otherwise difficult or impossible destinations for observing the Sun. 2. Technology sponsored by NASA and developed by MIT Space Nanotechnology Lab is developing high-performance space instrumentation for more powerful future X-ray telescopes that will study the dynamics of the high-energy universe. 3. Active thermal control technology that will help enable large ultra-stable telescopes needed to detect and characterize Earth-like planets around other stars. 4. SMD sponsored high-performance infrared sensors with reduced requirements for cooling onboard satellites and these sensors could potentially be flown on small satellite platforms like CubeSats. 5. A new technology that will utilize electron beams/ultraviolet light to remove dust that could help protect future space assets and astronauts from dangerous effects that arise from Moon/Mars dust exposure. 6. Studies using model organisms on ISS to understand the impact of the spaceflight environment on organisms in preparation for long-duration missions.

solar sail↗