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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records

Experimental investigation of beam-ion losses induced by magnetic perturbations using the light ion beam probe technique in the ASDEX Upgrade tokamak

The impact of externally applied magnetic perturbations (MPs) on fast-ion losses has been investigated by means of the light ion beam probe (LIBP) technique in the ASDEX Upgrade tokamak. The LIBP technique allows to experimentally infer the fast-ion orbit displacement induced by MPs via first-orbit losses using scintillator based fast-ion loss detector (FILD) measurements. The fast-ion orbit displacement against different applied MP spectra has been studied. These shots were conducted in ELM mitigated H-mode plasmas. A rigid rotation of the MP coils was applied with a frequency of 1 Hz, with an n = 2 configuration and changing the differential phase between the upper and lower set of coils (ΔΦ ul ) on a shot-to-shot basis. Beam sources Q7 (tangential) and Q8 (radial) were used to probe different fast-ion orbits with FILD1. The measured fast-ion orbit displacement ranges from 3 to 20 mm approximately, and no qualitative difference is observed between ions from beam sources Q7 and Q8. The minimum is found for a ΔΦ ul ~ 50°, which is shifted with respect to the minimum of the plasma boundary displacement, found at ΔΦ ul ~ 0°. A first attempt to validate the orbit following code ASCOT—including the plasma response calculated with the MARS-F code—against these experimental measurements is performed. Finally, while the dependence of the first-orbit fast-ion displacement with ΔΦ ul does not match the experimental measurements, these simulations do capture other features such as the order of magnitude of the orbit displacement and the importance of the toroidal spectrum of the applied perturbation.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗

Fast ignition inertial fusion energy using laser-driven ion beams

Ion fast ignition (IFI), or fusion fast ignition initiated by a laser-driven ion beam, is a promising path to high-gain inertial fusion energy (IFE). In IFI, cold, dense deuterium-tritium (DT) fuel is first assembled using lasers or pulsed power drivers. Then, a high-power ion beam is focused onto a small volume within the fuel (the hot spot), heating the fuel rapidly to conditions where fusion ignition takes place. Fusion burn in this hot spot propagates to the fuel surrounding the hot spot, leading to burnup of a significant fraction of this fuel and the possibility of high gain (G~100), as needed for inertial fusion energy. IFI uses separate drivers for the two basic elements, fuel compression and ignition, allowing maximum control and optimization of each. On the other hand, conventional laser fusion uses multiple beams of the same driver to compress the fuel and shock-heat its very center to ignite a burn wave. Despite impressive progress in conventional laser fusion, the precise spatial symmetry, temporal pulse shaping and timing required for high gain and IFE remain a serious unmet challenge.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗

Extraction of ion beam from laser ion source for direct plasma injection scheme

Laser ion sources are expected to be used in various applications of heavy ion beam technology. The plasma direct injection scheme (DPIS) is a method in which ion beams extracted from a laser ion source are directly injected into a radio frequency quadrupole (RFQ) linear accelerator. In this study, a new shape of the plasma electrode with a concave surface for the DPIS was proposed to inject a converging beam to a cavity of RFQ accelerator. This approach allows the use of a large-diameter extraction electrode, which is not limited by the aperture of the RFQ electrode rods. The DPIS, using the concave surface electrode, was employed to accelerate C 6+ ion beams. The results indicated that both the beam current and the number of ions increased nearly twice with the proposed electrode shape compared to values obtained with the conventional electrode. This enhancement corresponded to the increased extraction area of the beam.

43 PARTICLE ACCELERATORS↗

Investigation of UV, ns-laser damage resistance of hafnia films produced by electron beam evaporation and ion beam sputtering deposition methods

Laser-induced damage in coating materials with a high index of refraction, such as hafnia, limits the performance of high power and high energy laser systems. Understanding the underlying physics responsible for laser damage holds the key for developing damage-resistant optical films. Previous studies have reported a substantial difference in laser damage onset for hafnia films produced by different deposition methods, yet the underlying mechanisms for the observed difference remain elusive. We combined laser damage testing with analytical characterizations and theoretical simulations to investigate the response of hafnia films produced by electron (e-) beam evaporation vs ion beam sputtering (IBS) methods upon UV ns-laser exposure. We found that e-beam produced hafnia films were overall more damage resistant; in addition, we observed a polarization anisotropy associated with the onset of damage in the e-beam films, while this effect was absent in the latter films. The observed differences can be attributed to the stark contrast in the pressure inside the pores inherent in both films. The high pressure inside the IBS-induced nanobubbles has been shown to reduce the threshold for laser-induced plasma breakdown leading to film damage. The polarization effects in the e-beam coatings can be related to the asymmetric electric field intensification induced by the columnar void structure. Our findings provide a fundamental basis for developing strategies to produce laser damage-resistant coatings for UV pulsed laser applications.

36 MATERIALS SCIENCE↗

Subsurface Characteristics of Metal-Halide Perovskites Polished by an Argon Ion Beam

Focused ion beam (FIB) techniques have been frequently used to section metal-halide perovskites for microstructural investigations. However, the ion beams directly irradiating the sample surface may alter its properties far different from those of pristine, potentially leading to modified deterioration mechanisms under aging stressors. Here, we combine complementary approaches to measure the subsurface characteristics of polished perovskites and identify the chemical species responsible for the measured properties. Analysis of the experimental results in conjunction with Monte Carlo simulations indicates that atomic displacements and local heating occur in the first ≈15 nm of the subsurface of methylammonium lead iodide (MAPbI 3 ) by glancing-angle Ar + beam irradiation (4 kV at 3°). The lead-rich, iodine-deficient surface promotes rapid phase segregation under thermal aging conditions. On the other hand, despite the subsurface modification, our experiments confirm that the rest of the MAPbI 3 bulk retains the material integrity. Our observation supports that polished perovskites could serve in studying the properties of bulk or buried junctions far away from the altered subsurface with care.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Tin–Lead Liquid Metal Alloy Source for Focused Ion Beams

Focused Ion Beam (FIB) systems are increasingly utilized in nanotechnology for nanostructuring, surface modification, doping, and rapid prototyping. Recently, their potential for quantum applications has been explored, leveraging FIB’s direct-write capabilities for in situ single ion implantation, which is crucial for fabricating single photon emitters. Color centers in diamond can function as qubits and are of particular interest due to their capacity to store and transmit quantum information. While Group-IV color centers exhibit high brightness, they require low temperatures to retain coherence. However, lead-vacancy in diamond (PbV) operates at the higher end (4 K) of this temperature spectrum due to larger ground-state splitting, making them particularly interesting. In this context, our study presents results for lead (Pb)-containing alloys with eutectic points below 600 °C and results on using tantalum (Ta) and titanium (Ti) as emitter materials for a Pb liquid metal alloy ion source. We show that a standard FIB system is able to resolve the different Pb isotopes and achieve nanoscale spot sizes, as required for quantum information science applications.

color center↗

Demonstration of closed shell breeding of cesium ions with an electron beam ion source

An electron beam ion source serves as a charge breeder for the Californium Rare Isotope Breeder Upgrade (CARIBU) at the Argonne Tandem Linac Accelerator System (ATLAS). The source accepts radioactive beams of 1+ or 2+ ions and raises their charge state for post-acceleration by ATLAS. The efficiency of this process impacts the length of each experiment and, hence, the type and number of experiments that can be run in each program cycle. Recent efforts to improve the charge breeding efficiency for the 80 < A < 160 species typical of CARIBU have focused on utilizing the closed shell breeding technique. Here, with this technique, the electron beam energy is manipulated to take advantage of the large gap in ionization energies at shell closures and selectively populate a single charge state. Charge breeding studies with stable cesium ions have demonstrated an absolute efficiency of 72% for Cs 27+ and a total efficiency of 93%. The Cs 27+ efficiency result represents a factor of 3 improvement over the previous best charge breeding result of 23% for Cs 27+ .

Vondrasek, R. [Argonne National Laboratory (ANL), ↗

Realizing the scientific program with polarized ion beams at the future BNL Electron Ion Collider

Polarized ion beams at the Electron Ion Collider (EIC) are essential to address some of the most important open questions at the twenty-first century frontiers of understanding of the fundamental structure of matter. Here, in this work, we summarize the science case and identify polarized 2 H, 3 He, 6 Li, and 7 Li ion beams as critical technology that will enable experiments which address the most important science. Furthermore, we discuss the required ion polarimetry and spin manipulation at the EIC. The current EIC accelerator design is presented. We identify a significant research and development effort across national and international laboratories and universities that is required over about a decade to realize the polarized ion beams and estimate (based on previous experience) that it will require about 20 full-time equivalent (FTE) over 10 years (or a total of about 200 FTE-years) of personnel, including graduate students, postdoctoral researchers, technicians, and engineers. Attracting, educating, and training a new generation of physicists in experimental spin techniques will be essential for the successful realization. Artificial intelligence and machine learning are seen as having significant potential for both acceleration of research and development and amplification of discovery in the optimal realization of this unique quantum technology on a cutting-edge collider. The research and development effort is synergistic with research in atomic physics and fusion energy science.

43 PARTICLE ACCELERATORS↗

Thermoreflectance Detection of Point Defects Resulting from Focused Ion Beam Milling

Focused ion beam (FIB) milling is a commonly used tool for nanoscale material processing, such as for transmission electron microscopy (TEM) sample preparation, or the creation of fiducial markers prior to other processes and measurements. During milling, a high energy ion beam is used to remove material via sputtering. The expelled target material may return to the sample surface however, affecting subsequent measurements. Beam spreading or irradiation due to neutral gallium may also irradiate a larger area than intended. Extensive research has explored the effects of FIB milling on the prepared TEM sample, but few have looked at the effects of milling on the properties of the sample surrounding the milled region. We use multiple pump-probe laser-based techniques (time domain thermoreflectance and steady-state thermoreflectance) to measure the spatial extent of FIB-induced surface/subsurface changes on a series of silicon wafers milled at multiple currents and doses. We supplement these measurements with high-resolution scanning transmission electron microscopy, energy dispersive X-ray spectroscopy, stylus profilometry, and time-of-flight secondary ion mass spectroscopy. We find a sample surface affected by the FIB up to 1 mm from where milling occurred, with a notable dependence on the ion beam current. We also note remarkably high sensitivity to surface defects using the thermoreflectance metrologies, including detection where other measurements failed.

defects↗

On the perturbation effect and LET dependence of beam quality correction factors in carbon ion beams

Background: In a recent study, we reported beam quality correction factors, f Q , in carbon ion beams using Monte Carlo (MC) methods for a cylindrical and a parallel-plate ionization chamber (IC). A non-negligible perturbation effect was observed; however, the magnitude of the perturbation correction due to the specific IC subcomponents was not included. Furthermore, the stopping power data presented in the International Commission on Radiation Units and Measurements (ICRU) report 73 were used, whereas the latest stopping power data have been reported in the ICRU report 90. Purpose: The aim of this study was to extend our previous work by computing f Q correction factors using the ICRU 90 stopping power data and by reporting IC-specific perturbation correction factors. Possible energy or linear energy transfer (LET) dependence of the f Q correction factor was investigated by simulating both pristine beams and spread-out Bragg peaks (SOBPs). Methods: The TOol for PArticle Simulation (TOPAS)/GEANT4 MC code was used in this study. A 30 × 30 × 50 cm 3 water phantom was simulated with a uniform 10 × 10 cm 2 parallel beam incident on the surface. A Farmer-type cylindrical IC (Exradin A12) and two parallel-plate ICs (Exradin P11 and A11) were simulated in TOPAS using the manufacturer-provided geometrical drawings. The f Q correction factor was calculated in pristine carbon ion beams in the 150–450 MeV/u energy range at 2 cm depth and in the middle of the flat region of four SOBPs. The k Q correction factor was calculated by simulating the f Qo correction factor in a 60 Co beam at 5 cm depth. The perturbation correction factors due to the presence of the individual IC subcomponents, such as the displacement effect in the air cavity, collecting electrode, chamber wall, and chamber stem, were calculated at 2 cm depth for monoenergetic beams only. Additionally, the mean dose-averaged and track-averaged LET was calculated at the depths at which the f Q was calculated. Results: The ICRU 90 f Q correction factors were reported. The p dis correction factor was found to be significant for the cylindrical IC with magnitudes up to 1.70%. The individual perturbation corrections for the parallel-plate ICs were <1.0% except for the A11 p cel correction at the lowest energy. The f Q correction for the P11 IC exhibited an energy dependence of >1.00% and displayed differences up to 0.87% between pristine beams and SOBPs. Conversely, the f Q for A11 and A12 displayed a minimal energy dependence of <0.50%. The energy dependence was found to manifest in the LET dependence for the P11 IC. A statistically significant LET dependence was found only for the P11 IC in pristine beams only with a magnitude of <1.10%. Conclusions: The perturbation and k Q correction factor should be calculated for the specific IC to be used in carbon ion beam reference dosimetry as a function of beam quality.

62 RADIOLOGY AND NUCLEAR MEDICINE↗

Response of thermal and fast-ion transport to beam ion population, rotation and T e / T i in the DIII-D steady state hybrid scenario

The thermal and fast-ion transport properties of DIII-D steady-state hybrid discharges with normalized beta β N ≳ 3 are studied at low injected torque and an increased electron to ion temperature ratio T e / T i . Linear stability analysis performed with the TGLF turbulent code indicates that a high-k mode is usually dominant at smaller radii, whereas a low-k mode is usually dominant at larger radii in these plasmas. A reduction in the net injected torque from 8.6 to 4.3 N-m leads to reduced E × B shear and hence, an enhanced turbulence that was observed on the Doppler backscattering diagnostic and was also computed with TGLF. As T e / T i in the core was increased from 0.57 to 0.66 by adding electron cyclotron current drive (ECCD) to these plasmas, higher levels of transport are observed with increased high-k modes indicated by TGLF. The fast-ion transport level varied over an order of magnitude in these discharges depending on whether Alfvén eigenmodes, fishbones, or no instabilities were observed. Hybrid plasmas with fishbones have decreased fast-ion transport, compared to plasmas with Alfvén eigenmodes, since they are resonant with a smaller portion of phase space and their resonance is farther from the wall. This reduction in fast-ion transport with ECCD mitigates the increase in turbulent transport, resulting in higher performance than expected during strong electron heating. Similarly, the lowest fast-ion transport was observed in the low torque plasma, which also led to better than expected performance at this torque value. Finally, the thermal and fast-ion transport changes observed as the torque/rotation and T e / T i are varied indicate possible methods for transferring this scenario to a reactor.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗

Improvement in the spatial resolution of heavy ion beam probe measurements through application of ion optics

A technique for more accurately modeling and improving the spatial resolution of heavy ion beam probe measurements is described. We use a set of particle trajectories to numerically determine the focusing properties of a complicated three-dimensional magnetic field and characterize those properties with a transfer matrix. We then modify the transfer matrix approach of traditional ion optics to include a parameter that describes the ionization location of the detected ions. The ion optics model calculated using this technique enables a more accurate description of the particle trajectories than previously feasible. The model also allows one to easily determine an initial beam focus that could be used during experimental operation to optimize the spatial resolution of measurements. The technique has been applied to the design of a heavy ion beam probe diagnostic for the Wendelstein 7-X stellarator and improvements in the modeled spatial resolution by a factor of about 2 over previous estimates are possible. As a result, the improved spatial resolution will enable measurements of plasma fluctuations with smaller wavelengths than would otherwise be possible.

43 PARTICLE ACCELERATORS↗

Ion energy distribution in an electron beam ion trap inferred from simulations of the trapped ion cloud

For this work, we have inferred the energy distribution of trapped ions in an electron beam ion trap (EBIT) from simulations of the spatial distribution of Fe 13+ ions and a comparison with measured visible light images of the ion cloud. We simulated the cloud of Fe 13+ ions by computing ion trajectories in the EBIT for different ion energy distributions used to initialize the trajectories. We then performed a least-squares fit to infer the ion energy distribution that best reproduced the measured ion cloud. These best-fit distributions were typically non-Maxwellian. For electron beam energies of 395–475 eV and electron beam currents of 1–9 mA, we find that the average ion energy is in the range of 10–300 eV. We also find that the average ion energy increases with increasing beam current approximately as $\langle$E$\rangle$ ≈ 25 I e eV, where I e is the electron beam current in mA. We have also compared our results to Maxwell-Boltzmann-distribution ion clouds. We find that our best-fit non-thermal distributions have an $\langle$E$\rangle$ that is less than half that of the T from the best-fit Maxwell-Boltzmann distributions ($\langle$E$\rangle$/q)/T=0.41 ± 0.05.

74 ATOMIC AND MOLECULAR PHYSICS↗

Exploration of Defect Dynamics and Color Center Qubit Synthesis with Pulsed Ion Beams

Short-pulse ion beams have been developed in recent years and now enable applications in materials science. A tunable flux of selected ions delivered in pulses of a few nanoseconds can affect the balance of defect formation and dynamic annealing in materials. We report results from color center formation in silicon with pulses of 900 keV protons. G-centers in silicon are near-infrared photon emitters with emerging applications as single-photon sources and for spin-photon qubit integration. G-centers consist of a pair of substitutional carbon atoms and one silicon interstitial atom and are often formed by carbon ion implantation and thermal annealing. Here, we report on G-center formation with proton pulses in silicon samples that already contained carbon, without carbon ion implantation or thermal annealing. The number of G-centers formed per proton increased when we increased the pulse intensity from 6.9 × 10 9 to 7.9 × 10 10 protons/cm 2 /pulse, demonstrating a flux effect on G-center formation efficiency. We observe a G-center ensemble linewidth of 0.1 nm (full width half maximum), narrower than previously reported. Pulsed ion beams can extend the parameter range available for fundamental studies of radiation-induced defects and the formation of color centers for spin-photon qubit applications.

43 PARTICLE ACCELERATORS↗