Low-energy electrons measured on IMP 2.
Integral spectrum for low-energy electrons measured with detailed definition of temperature and number density by IMP II
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Integral spectrum for low-energy electrons measured with detailed definition of temperature and number density by IMP II
Three curved plate energy analyzers coupled with three electron multiplier tubes detect and measure low energy electron flux in several directions simultaneously.
Electron diffraction and photoelectric study of crystal surface structure stability of tantalum subjected to ion bombardment and heat treatment
Scintillation counter satellite data on low energy electron flux and particle trapping in dark magnetosphere
Low energy electrons in earth magnetosphere observed by OGO III
Possible source mechanism for low energy galactic electrons
Low energy galactic electrons attributed to knock- on collisions of primary nuclear beam with interstellar gas
Low energy electron-electron bremsstrahlung can help account for discrepancies in X-ray continuum intensity and ionized gas emission calculations
Optical potential approach to low energy electron- helium scattering
Voltage pulses in capacitors and insulated wires during low-energy electron irradiation
Low-energy electron diffraction study of initial oxidation product in oxidation of tantalum
OGO-C observations of low-energy protons and electrons in earth magnetosphere
Instrumentation and calibrations of low energy proton and electron experiment for orbiting geophysical observatories
On production of low energy cosmic ray electron
Production of low energy cosmic ray electrons, investigating energy inputs to injected secondary electrons by possible low magnitude solar electric field and possible galactic Fermi acceleration
Decay of positive pions measured by electronic techniques and low-energy pion beams
Electron and proton differential velocity spectra observed for low-energy relativistic cosmic rays, noting spectral neutrality of radiation
Nondestructive testing of the breakdown voltage of transistors and other electronic components is achieved by a simple relay circuit. The circuit operates by applying low-energy, high-voltage microsecond pulses to the components under test.