Search NASA⌕ Search

SEARCH · Search NASA

Results for “metrology”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS2004

Laser Metrology in the Micro-Arcsecond Metrology Testbed

The Space Interferometer Mission (SIM), scheduled for launch in 2009, is a space-born visible light stellar interferometer capable of micro-arcsecond-level astrometry. The Micro-Arcsecond Metrology testbed (MAM) is the ground-based testbed that incorporates all the functionalities of SIM minus the telescope, for mission-enabling technology development and verification. MAM employs a laser heterodyne metrology system using the Sub-Aperture Vertex-to-Vertex (SAVV) concept. In this paper, we describe the development and modification of the SAVV metrology launchers and the metrology instrument electronics, precision alignments and pointing control, locating cyclic error sources in the MAM testbed and methods to mitigate the cyclic errors, as well as the performance under the MAM performance metrics.

interferometry↗
NASA NTRS1991

Assessment of the present NASA optical metrology capabilities and recommendations for establishing an in-house NASA Optical Metrology Group

An investigation into when it was first recognized that there was a deficiency in NASA optical metrology oversight capability, why this deficiency existed unnoticed for so long, and a proposal for correcting the problem is presented. It is explained why this optical metrology oversight is so critical to program success and at the same time, why it is difficult to establish due to the nature of the technology. The solution proposed is the establishment of an Optics Metrology Group within the NASA/MSFC Optics Branch with a line of authority from NASA S & MA.

Parks, Robert E.↗
NASA NTRS1998

Metrology for the Micro-Arcsecond Metrology Testbed

The Space Interferometry Mission (SIM) relies on the combination of interferometry with a metrology system capable of measureing picometer relative length changes and micrometer absolute lengths.

interferometer↗
NASA NTRS2007

Photogrammetric Metrology for the James Webb Space Telescope Integrated Science Instrument Module

The James Webb Space Telescope (JWST) is a 6.6m diameter, segmented, deployable telescope for cryogenic IR space astronomy (approximately 40K). The JWST Observatory architecture includes the Optical Telescope Element and the Integrated Science Instrument Module (ISIM) element that contains four science instruments (SI) including a Guider. The ISM optical metering structure is a roughly 2.2x1.7x2.2m, asymmetric frame that is composed of carbon fiber and resin tubes bonded to invar end fittings and composite gussets and clips. The structure supports the SIs, isolates the SIs from the OTE, and supports thermal and electrical subsystems. The structure is attached to the OTE structure via strut-like kinematic mounts. The ISIM structure must meet its requirements at the approximately 40K cryogenic operating temperature. The SIs are aligned to the structure's coordinate system under ambient, clean room conditions using laser tracker and theodolite metrology. The ISIM structure is thermally cycled for stress relief and in order to measure temperature-induced mechanical, structural changes. These ambient-to-cryogenic changes in the alignment of SI and OTE-related interfaces are an important component in the JWST Observatory alignment plan and must be verified. We report on the planning for and preliminary testing of a cryogenic metrology system for ISIM based on photogrammetry. Photogrammetry is the measurement of the location of custom targets via triangulation using images obtained at a suite of digital camera locations and orientations. We describe metrology system requirements, plans, and ambient photogrammetric measurements of a mock-up of the ISIM structure to design targeting and obtain resolution estimates. We compare these measurements with those taken from a well known ambient metrology system, namely, the Leica laser tracker system. We also describe the data reduction algorithm planned to interpret cryogenic data from the Flight structure. Photogrammetry was selected from an informal trade study of cryogenic metrology systems because its resolution meets sub-allocations to ISIM alignment requirements and it is a non-contact method that can in principle measure six degrees of freedom changes in target location. In addition, photogrammetry targets can be readily related to targets used for ambient surveys of the structure. By thermally isolating the photogrammetry camera during testing, metrology can be performed in situ during thermal cycling. Photogrammetry also has a small but significant cryogenic heritage in astronomical instrumentation metrology. It was used to validate the displacement/deformation predictions of the reflectors and the feed horns during thermal/vacuum testing (90K) for the Microwave Anisotropy Probe (MAP). It also was used during thermal vacuum testing (100K) to verify shape and component alignment at operational temperature of the High Gain Antenna for New Horizons. With tighter alignment requirements and lower operating temperatures than the aforementioned observatories, ISIM presents new challenges in the development of this metrology system.

Nowak, Maria↗
NASA NTRS1998

MSFC Optical Metrology: A National Resource

A national need exists for Large Diameter Optical Metrology Services. These services include the manufacture, testing, and assurance of precision and control necessary to assure the success of large optical projects. "Best Practices" are often relied on for manufacture and quality controls while optical projects are increasingly more demanding and complex. Marshall Space Flight Center (MSFC) has acquired unique optical measurement, testing and metrology capabilities through active participation in a wide variety of NASA optical programs. An overview of existing optical facilities and metrology capabilities is given with emphasis on use by other optical projects. Cost avoidance and project success is stressed through use of existing MSFC facilities and capabilities for measurement and metrology controls. Current issues in large diameter optical metrology are briefly reviewed. The need for a consistent and long duration Large Diameter Optical Metrology Service Group is presented with emphasis on the establishment of a National Large Diameter Optical Standards Laboratory. Proposals are made to develop MSFC optical standards and metrology capabilities as the primary national standards resource, providing access to MSFC Optical Core Competencies for manufacturers and researchers. Plans are presented for the development of a national lending library of precision optical standards with emphasis on cost avoidance while improving measurement assurance.

Burdine, Robert↗
NASA NTRS2003

The Micro-Arcsecond Metrology Testbed

The Micro-Arcsecond Metrology (MAM) testbed is a ground-based system of optical and electronic equipment for testing components, systems, and engineering concepts for the Space Interferometer Mission (SIM) and similar future missions, in which optical interferometers will be operated in outer space. In addition, the MAM testbed is of interest in its own right as a highly precise metrological system. The designs of the SIM interferometer and the MAM testbed reflect a requirement to measure both the position of the starlight central fringe and the change in the internal optical path of the interferometer with sufficient spatial resolution to generate astrometric data with angular resolution at the microarcsecond level. The internal path is to be measured by use of a small metrological laser beam of 1,319-nm wavelength, whereas the position of the starlight fringe is to be estimated by use of a charge-coupled-device (CCD) image detector sampling a large concentric annular beam. For the SIM to succeed, the optical path length determined from the interferometer fringes must be tracked by the metrological subsystem to within tens of picometers, through all operational motions of an interferometer delay line and siderostats. The purpose of the experiments performed on the MAM testbed is to demonstrate this agreement in a large-scale simulation that includes a substantial portion of the system in the planned configuration for operation in outer space. A major challenge in this endeavor is to align the metrological beam with the starlight beam in order to maintain consistency between the metrological and starlight subsystems at the system level. The MAM testbed includes an optical interferometer with a white light source, all major optical components of a stellar interferometer, and heterodyne metrological sensors. The aforementioned subsystems are installed in a large vacuum chamber in order to suppress atmospheric and thermal disturbances. The MAM is divided into two distinct subsystems: the test article (TA), which is the interferometer proper, and the inverse interferometer pseudo-star (IIPS), which synthesizes the light coming from a distant target star by providing spatially coherent wavefronts out of two mirrors, separated by the MAM baseline, that feed directly into two siderostats that are parts of the TA. The two feed mirrors of the IIPS are articulated (in translation and tilt) in order to simulate stars located at different orientations in space, while still illuminating the TA siderostats. The spectrum of the simulated starlight of the IIPS corresponds to that of a blackbody at a temperature of about 3,100 K.

Goullioud, Renaud↗
NASA NTRS2004

Error Modeling of Multi-baseline Optical Truss: Application to SIM Metrology Truss Field Dependent Error - Part II

The current design of the Space Interferometry Mission (SIM) employs a 19 laser-metrology-beam system (also called L19 external metrology truss) to monitor changes of distances between the fiducials of the flight system's multiple baselines. The function of the external metrology truss is to aid in the determination of the time-variations of the interferometer baseline. The largest contributor to truss error occurs in SIM wide-angle observations when the articulation of the siderostat mirrors (in order to gather starlight from different sky coordinates) brings to light systematic errors due to offsets at levels of instrument components (which include comer cube retro-reflectors, etc.). This error is labeled external metrology wide-angle field-dependent error. Physics-based model of field-dependent error at single metrology gauge level is developed and linearly propagated to errors in interferometer delay. In this manner delay error sensitivity to various error parameters or their combination can be studied using eigenvalue/eigenvector analysis. Also validation of physics-based field-dependent model on SIM testbed lends support to the present approach. As a first example, dihedral error model is developed for the comer cubes (CC) attached to the siderostat mirrors. Then the delay errors due to this effect can be characterized using the eigenvectors of composite CC dihedral error. The essence of the linear error model is contained in an error-mapping matrix. A corresponding Zernike component matrix approach is developed in parallel, first for convenience of describing the RMS of errors across the field-of-regard (FOR), and second for convenience of combining with additional models. Average and worst case residual errors are computed when various orders of field-dependent terms are removed from the delay error. Results of the residual errors are important in arriving at external metrology system component requirements. Double CCs with ideally co-incident vertices reside with the siderostat. The non-common vertex error (NCVE) is treated as a second example. Finally combination of models, and various other errors are discussed.

comer cube retro-reflector↗
NASA NTRS1996

Metrology for Spatial Interferometry III

Very high resolution spatial interferometry requires picometer level one-dimensional metrology, surface metrology, and 3-dimensional metrology. The absolute distance measurements with accuracies of only 1 part in a million are required due to the careful design of spacecraft like the proposed Stellar Interferometry Mission (SIM), carrying high resolution stellar interferometers. An absolute calibration system for the surface gauge described in a previous paper is demonstrated. A self-calibrating absolute metrology system with a repeatability of 2 microns rms over a one-way distance of a meter is demonstrated. The accuracy calibration of this gauge is in progress. An auto-aligning, 3-dimensional metrology gauge is constructed using the sub-picometer linear metrology gauge described in earlier papers. Initial test results from this demonstration are presented.

high↗
NASA NTRS2008

Metrology - Beyond the Calibration Lab

We rely on data from measurements every day; a gas-pump, a speedometer, and a supermarket weight scale are just three examples of measurements we use to make decisions. We generally accept the data from these measurements as "valid." One reason we can accept the data is the "legal metrology" requirements established and regulated by the government in matters of commerce. The measurement data used by NASA, other government agencies, and industry can be critical to decisions which affect everything from economic viability, to mission success, to the security of the nation. Measurement data can even affect life and death decisions. Metrology requirements must adequately provide for risks associated with these decisions. To do this, metrology must be integrated into all aspects of an industry including research, design, testing, and product acceptance. Metrology, the science of measurement, has traditionally focused on the calibration of instruments, and although instrument calibration is vital, it is only a part of the process that assures quality in measurement data. For example, measurements made in research can influence the fundamental premises that establish the design parameters, which then flow down to the manufacturing processes, and eventually impact the final product. Because a breakdown can occur anywhere within this cycle, measurement quality assurance has to be integrated into every part of the life-cycle process starting with the basic research and ending with the final product inspection process. The purpose of this paper is to discuss the role of metrology in the various phases of a product's life-cycle. For simplicity, the cycle will be divided in four broad phases, with discussions centering on metrology within NASA. .

Mimbs, Scott M.↗
NASA NTRS2018

LUVOIR Primary Mirror Segment Alignment Control With Joint Laser Metrology and Segment Edge Sensing

An approach is developed for the alignment and stability maintenance of the LUVOIR segmented primary mirror using a segment state estimation and wavefront control method based on a hybrid segment motion sensing architecture of laser truss metrology and segment edge sensors. Our current computer model was generated for LUVOIR Architecture Option A with a 15-meter aperture, 120segment primary mirror. The methodology and simulation results will be presented and analyzed. JPL has a long history of technology development in laser metrology and edge sensors, including work in SIM [7], Keck and TMT [8], CCAT [3] and LUVOIR [1]. We will discuss our current efforts of LUVOIR laser metrology and edge-sensor models development, showing sensitivities of sensor measurements to various mirror eigenmodes, removing global modes and strengthening weak modes by performing joint (hybrid) laser-metrology and edge sensing. We will define and derive an important performance metric called wavefront error multiplier (WEM), and show that WEM provides a simple link between sensor errors and the closed-loop (controlled) system wavefront error. We will show WEM values for several hybrid sensor configuration options studied. We will discuss an algorithm for mirror shape control and maintenance through segment state and wavefront estimations using joint edge-metrology sensing. We will compare simulated performance of mirror state estimation, wavefront estimation and wavefront control based on joint edge-metrology sensing among several sensor configurations, and show the impact of sensor error distributions on the segmented mirror alignment performance. Mirror shape control performance will be also be evaluated in terms of imaging contrast between inner working angles (IWA) and outer working angles (OWA) of a LUVOIR coronagraph. The research was carried out at the Jet Propulsion Laboratory, California Institute of Technology, under a contract with the National Aeronautics and Space Administration. LUVOIR is a mission concept under study for the next astronomy Decadal Survey—the information presented in this paper is pre-decisional and is provided for planning and discussion purposes only.

Shelton, Chris↗
NASA NTRS2002

Optical metrology for Starlight Separated Spacecraft Stellar Interferometry Mission

We describe a high-precision inter-spacecraft metrology system designed for NASA 's StarLight mission, a space-based separated-spacecraft stellar interferometer. It consists of dual-target linear metrology, based on a heterodyne interferometer with carrier phase modulation, and angular metrology designed to sense the pointing of the laser beam and provides bearing information. The dual-target operation enables one metrology beam to sense displacement of two targets independently. We present the current design, breadboard implementation of the Metrology Subsystem in a stellar interferometer testbed and the present state of development of flight qualifiable subsystem components.

metrology stellar interferometry formation flying↗
NASA NTRS2008

Range-Gated Metrology: An Ultra-Compact Sensor for Dimensional Stabilization

Point-to-point laser metrology systems can be used to stabilize large structures at the nanometer levels required for precision optical systems. Existing sensors are large and intrusive, however, with optical heads that consist of several optical elements and require multiple optical fiber connections. The use of point-to-point laser metrology has therefore been limited to applications where only a few gauges are needed and there is sufficient space to accommodate them. Range-Gated Metrology is a signal processing technique that preserves nanometer-level or better performance while enabling: (1) a greatly simplified optical head - a single fiber optic collimator - that can be made very compact, and (2) a single optical fiber connection that is readily multiplexed. This combination of features means that it will be straightforward and cost-effective to embed tens or hundreds of compact metrology gauges to stabilize a large structure. In this paper we describe the concept behind Range-Gated Metrology, demonstrate the performance in a laboratory environment, and give examples of how such a sensor system might be deployed.

laser metrology↗
NASA NTRS2015

The Development of a Deflectometer for Accurate Surface Figure Metrology

Marshall Space Flight Center is developing the method of direct fabrication for high resolution full-shell x-ray optics. In this technique the x-ray optics axial profiles are figured and polished using a computer-controlled ZeekoIRP600X polishing machine. Based on the Chandra optics fabrication history about one third of the manufacturing time is spent on moving a mirror between fabrication and metrology sites, reinstallation and alignment with either the metrology or fabrication instruments. Also, the accuracy of the alignment significantly affects the ultimate accuracy of the resulting mirrors. In order to achieve higher convergence rate it is highly desirable to have a metrology technique capable of in situ surface figure measurements of the optics under fabrication, so the overall fabrication costs would be greatly reduced while removing the surface errors due to the re-alignment necessary after each metrology cycle during the fabrication. The goal of this feasibility study is to demonstrate if the Phase Measuring Deflectometry can be applied for in situ metrology of full shell x-ray optics. Examples of the full-shell mirror substrates suitable for the direct fabrication

X-ray optics metrology↗
NASA NTRS2011

Cryogenic Thermal Vacuum Testing with Remote Optical Metrology

Flexure Engineering was awarded an SBIR to research and develop technology needed to build a thermal vacuum chamber made to take laser radar metrology through a window. The XATF test is proof of concept for this, and demonstrated the need for such a chamber. XATF refers to two pieces of critical ground support equipment for NASA's JWST (James Webb Space Telescope) Integrated Science Instrument Module (ISIM), the ISIM Alignment Target Fixture (IATF) and the Master Alignment Target Fixture (MATF). These optical alignment assemblies require characterization while under cryogenic temperature. A thermal vacuum chamber equipped with a shroud cooled with gaseous and liquid nitrogen was used. An inner shroud was cooled with liquid helium to approximately 30K. The XATF assemblies were kinematically mounted and oriented inside the inner shroud such that the optical targets were visible from outside an optical window on one of the chamber ports. Laser radar and theodolite mounted outside the window took measurements of various optical targets. Two cold cycles were completed. A third cycle was aborted. Metrology was successfully taken. There were some problems with the helium system. The cryo pumps were turned off to reduce vibrations during metrology. Many new technologies and testing methods must be developed for JWST and future programs that will require precision measurements. These technologies will be applicable to other cold temperature applications, such as lunar missions and superconductors. Remote metrology technologies can also be applicable to testing in harsh environments. Facilities with remote metrology capability will be valuable.

Boyd, Guinevere↗
DOE OSTI2025

Noise Constraints on Sensitivity Scaling in Quantum Nonlinear Metrology

Quantum-enhanced metrology surpasses classical metrology by improving estimation precision scaling with a resource 𝑁 (e.g., particle number or energy) from 1/√𝑁 to 1/𝑁. Through the use of nonlinear effects, Roy and Braunstein [Exponentially enhanced quantum metrology, Phys. Rev. Lett. 100, 220501 (2008)] derived a 1/𝑁 2 scaling. However, later works argued this exponential improvement is unphysical and that even modest gains, like 1/𝑁 2 , may vanish under noise. We show that, in the presence of small errors, the nonlinear interactions enabling metrological enhancement induce emergent errors. Here, the errors propagate through the sensing protocol and are magnified proportional to any intended nonlinear enhancement. We identify a critical value of the parameter to be estimated, for a fixed error, below which the emergent errors can be avoided.

Quantum Fisher information↗
NASA NTRS2014

Ambient Optomechanical Alignment and Pupil Metrology for the Flight Instruments Aboard the James Webb Space Telescope

The James Webb Space Telescope science instruments are in the final stages of being integrated into the Integrated Science Instrument Module (ISIM) element. Each instrument is tied into a common coordinate system through mechanical references that are used for optical alignment and metrology within ISIM after element-level assembly. In addition, a set of ground support equipment (GSE) consisting of large, precisely calibrated, ambient, and cryogenic structures are used as alignment references and gauges during various phases of integration and test (I&T). This GSE, the flight instruments, and ISIM structure feature different types of complimentary metrology targeting. These GSE targets are used to establish and track six degrees of freedom instrument alignment during I&T in the vehicle coordinate system (VCS). This paper describes the optomechanical metrology conducted during science instrument integration and alignment in the Spacecraft Systems Development and Integration Facility (SSDIF) cleanroom at NASA Goddard Space Flight Center (GSFC). The measurement of each instrument's ambient entrance pupil location in the telescope coordinate system is discussed. The construction of the database of target locations and the development of metrology uncertainties is also discussed.

Optomechanical Alignment↗
NASA NTRS2008

Metrology Optical Power Budgeting in SIM Using Statistical Analysis Techniques

The Space Interferometry Mission (SIM) is a space-based stellar interferometry instrument, consisting of up to three interferometers, which will be capable of micro-arc second resolution. Alignment knowledge of the three interferometer baselines requires a three-dimensional, 14-leg truss with each leg being monitored by an external metrology gauge. In addition, each of the three interferometers requires an internal metrology gauge to monitor the optical path length differences between the two sides. Both external and internal metrology gauges are interferometry based, operating at a wavelength of 1319 nanometers. Each gauge has fiber inputs delivering measurement and local oscillator (LO) power, split into probe-LO and reference-LO beam pairs. These beams experience power loss due to a variety of mechanisms including, but not restricted to, design efficiency, material attenuation, element misalignment, diffraction, and coupling efficiency. Since the attenuation due to these sources may degrade over time, an accounting of the range of expected attenuation is needed so an optical power margin can be book kept. A method of statistical optical power analysis and budgeting, based on a technique developed for deep space RF telecommunications, is described in this paper and provides a numerical confidence level for having sufficient optical power relative to mission metrology performance requirements.

stellar interferometry↗
NASA NTRS1989

On-orbit Metrology and Calibration Requirements for Space Station Activities Definition Study

The Space Station is the focal point for the commercial development of space. The long term routine operation of the Space Station and the conduct of future commercial activities suggests the need for in-space metrology capabilities analogous when possible to those on-Earth. The ability to perform periodic calibrations and measurements with proper traceability is imperative for the routine operation of the Space Station. An initial review, however, indicated a paucity of data related to metrology and calibration requirements for in-space operations. This condition probably exists because of the highly developmental aspect of space activities to date, their short duration, and nonroutine nature. The on-orbit metrology and calibration needs of the Space Station were examined and assessed. In order to achieve this goal, the following tasks were performed: an up-to-date literature review; identification of on-orbit calibration techniques; identification of sensor calibration requirements; identification of calibration equipment requirements; definition of traceability requirements; preparation of technology development plans; and preparation of the final report. Significant information and major highlights pertaining to each task is presented. In addition, some general (generic) conclusions/observations and recommendations that are pertinent to the overall in-space metrology and calibration activities are presented.

Cotty, G. M.↗