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This slide presentation reviews the mask design used for the internal metrology of the Space Interferometry Mission (SIM). Included is information about the project, the method of measurements with SIM, the internal metrology, numerical model of internal metrology, wavefront examples, performance metrics, and mask design
The Space Interferometry Mission, planned for launch in 2009, will measure the positions of celestial objects to an unprecedented accuracy of 4.0 microarcseconds.
Picometer scale optical metrology specifications for the Space Interferometry Mission require precision calibration functions involving the optical and orientation characteristics of corner cube.
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In a 3-baseline interferometer fourteen metrology gauges are used to monitor changes in the two baselines and calculate the length of the third. Simulation for estimating the third baseline indicates measurement capability of better than 1 nm error.
This paper discusses the techniques for the reduction of cyclic errors in laser metrology gauges for the space interferometry mission.
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The Space Interferometry Mission, scheduled for launch in 2008, is an optical stellar interferometer with a 10 meter baseline capable of micro-arcsecond accuracy astrometry.
A common-path laser heterodyne interferometer capable of measuring the internal optical path difference (OPD) with accuracy of the order of 10 pm was demonstrated at JPL. To achieve this accuracy, the relative power received by the detector that is contributed by the scattering of light at the optical surfaces should be less than -97 dB. A method has been developed to estimate the cyclic error caused by the scattering of the optical surfaces. The result of the analysis is presented.
A common-path laser heterodyne interferometer capable of measuring the internal OPD with accuracy of the order of 10 picometers was demonstrated at JPL. To achieve this accuracy, the relative power received by the detector that is contributed by the scattering of light at the optical surfaces should be less than -97 dB. A method has been developed to estimate the cyclic error caused by the scattering of the optical surfaces. The result of the analysis is presented.
The Space Interferometry Mission (SIM) requires fringe measurements to the level of picometers in order to produce astrometric data at the micro-arc-second level. To be more specific, it is necessary to measure both the position of the starlight central fringe and the change in the internal optical path of the interferometer to a few hundreds of picometers. The internal path is measured with a small heterodyne metrology beam, whereas the starlight fringe position is estimated with a CCD sampling a large concentric annular beam. One major challenge for SIM is to align the metrology beam with the starlight beam to keep the consistency between these two sensors at the system level while articulating the instrument optics over the field of view.
Kite is a system level testbed for the External Metrology system of the Space Interferometry Mission (SIM). The External Metrology System is used to track the fiducial that are located at the centers of the interferometer's siderostats. The relative changes in their positions needs to be tracked to tens of picometers in order to correct for thermal measurements, the Kite testbed was build to test both the metrology gauges and out ability to optically model the system at these levels. The Kite testbed is an over-constraint system where 6 lengths are measured, but only 5 are needed to determine the system. The agreement in the over-constrained length needs to be on the order of 140 pm for the SIM Wide-Angle observing scenario and 8 pm for the Narrow-Angle observing scenario. We demonstrate that we have met the Wide-Angle goal with our current setup. For the Narrow-Angle case, we have only reached the goal for on-axis observations. We describe the testbed improvements that have been made since our initial results, and outline the future Kite changes that will add further effects that SIM faces in order to make the testbed more SIM like.
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The Space Interferometry Mission (SIM) relies on the combination of interferometry with a metrology system capable of measureing picometer relative length changes and micrometer absolute lengths.
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Explore the source record for details and available documents.
Explore the source record for details and available documents.