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Results for “modulation sideband technology for absolute ranging (MSTAR)”

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NASA NTRS2003

Absolute Distance Measurement with the MSTAR Sensor

The MSTAR sensor (Modulation Sideband Technology for Absolute Ranging) is a new system for measuring absolute distance, capable of resolving the integer cycle ambiguity of standard interferometers, and making it possible to measure distance with sub-nanometer accuracy. The sensor uses a single laser in conjunction with fast phase modulators and low frequency detectors. We describe the design of the system - the principle of operation, the metrology source, beamlaunching optics, and signal processing - and show results for target distances up to 1 meter. We then demonstrate how the system can be scaled to kilometer-scale distances.

modulation sideband technology for absolute rangin↗
NASA NTRS2007

Metrology Camera System Using Two-Color Interferometry

A metrology system that contains no moving parts simultaneously measures the bearings and ranges of multiple reflective targets in its vicinity, enabling determination of the three-dimensional (3D) positions of the targets with submillimeter accuracy. The system combines a direction-measuring metrology camera and an interferometric range-finding subsystem. Because the system is based partly on a prior instrument denoted the Modulation Sideband Technology for Absolute Ranging (MSTAR) sensor and because of its 3D capability, the system is denoted the MSTAR3D. Developed for use in measuring the shape (for the purpose of compensating for distortion) of large structures like radar antennas, it can also be used to measure positions of multiple targets in the course of conventional terrestrial surveying. A diagram of the system is shown in the figure. One of the targets is a reference target having a known, constant distance with respect to the system. The system comprises a laser for generating local and target beams at a carrier frequency; a frequency shifting unit to introduce a frequency shift offset between the target and local beams; a pair of high-speed modulators that apply modulation to the carrier frequency in the local and target beams to produce a series of modulation sidebands, the highspeed modulators having modulation frequencies of FL and FM; a target beam launcher that illuminates the targets with the target beam; optics and a multipixel photodetector; a local beam launcher that launches the local beam towards the multi-pixel photodetector; a mirror for projecting to the optics a portion of the target beam reflected from the targets, the optics being configured to focus the portion of the target beam at the multi-pixel photodetector; and a signal-processing unit connected to the photodetector. The portion of the target beam reflected from the targets produces spots on the multi-pixel photodetector corresponding to the targets, respectively, and the signal-processing unit centroids the spots to determine bearings of the targets, respectively. As the spots oscillate in intensity because they are mixed with the local laser beam that is flood illuminating the focal plane, the phase of oscillation of each spot is measured, the phase of sidebands in the oscillation of each spot being proportional to a distance to the corresponding target relative to the reference target A.

Dubovitsky, Serge↗
NASA NTRS2005

Laser System for Precise, Unambiguous Range Measurements

The Modulation Sideband Technology for Absolute Range (MSTAR) architecture is the basis of design of a proposed laser-based heterodyne interferometer that could measure a range (distance) as great as 100 km with a precision and resolution of the order of 1 nm. Simple optical interferometers can measure changes in range with nanometer resolution, but cannot measure range itself because interference is subject to the well-known integer-multiple-of-2 -radians phase ambiguity, which amounts to a range ambiguity of the order of 1 m at typical laser wavelengths. Existing rangefinders have a resolution of the order of 10 m and are therefore unable to resolve the ambiguity. The proposed MSTAR architecture bridges the gap, enabling nanometer resolution with an ambiguity range that can be extended to arbitrarily large distances. The MSTAR architecture combines the principle of the heterodyne interferometer with the principle of extending the ambiguity range of an interferometer by using light of two wavelengths. The use of two wavelengths for this purpose is well established in optical metrology, radar, and sonar. However, unlike in traditional two-color laser interferometry, light of two wavelengths would not be generated by two lasers. Instead, multiple wavelengths would be generated as sidebands of phase modulation of the light from a single frequency- stabilized laser. The phase modulation would be effected by applying sinusoidal signals of suitable frequencies (typically tens of gigahertz) to high-speed electro-optical phase modulators. Intensity modulation can also be used

Dubovitsky, Serge↗
NASA NTRS2005

Absolute optical metrology : nanometers to kilometers

We provide and overview of the developments in the field of high-accuracy absolute optical metrology with emphasis on space-based applications. Specific work on the Modulation Sideband Technology for Absolute Ranging (MSTAR) sensor is described along with novel applications of the sensor.

optical metrology↗
NASA NTRS2004

Design considerations and validation of the MSTAR absolute metrology system

Absolute metrology measures the actual distance between two optical fiducials. A number of methods have been employed, including pulsed time-of-flight, intensity-modulated optical beam, and two-color interferometry. The rms accuracy is currently limited to -5 microns. Resolving the integer number of wavelengths requires a 1-sigma range accuracy of -0.1 microns. Closing this gap has a large pay-off the range (length measurement) accuracy can be increased substantially using the unambiguous optical phase. The MSTAR sensor (Modulation Sideband Technology for Absolute Ranging) is a new system for measuring absolute distance, capable of resolving the integer cycle ambiguity of standard interferometers, and making it possible to measure distance with sub-nanometer accuracy. In this paper, we present recent experiments that use dispersed white light interferometry to independently validate the zero-point of the system. We also describe progress towards reducing the size of optics, and stabilizing the laser wavelength for operation over larger target ranges. MSTAR is a general-purpose tool for conveniently measuring length with much greater accuracy than was previously possible, and has a wide range of possible applications.

Jeganathan, Muthu↗
NASA NTRS2004

MSTAR: an absolute metrology system with submicrometer accuracy

Laser metrology systems are a key component of stellar interferometers, used to monitor path lengths and dimensions internal to the instrument. Most interferometers use ‘relative’ metrology, in which the integer number of wavelengths along the path is unknown, and the measurement of length is ambiguous. Changes in the path length can be measured relative to an initial calibration point, but interruption of the metrology beam at any time requires a re-calibration of the system. The MSTAR sensor (Modulation Sideband Technology for Absolute Ranging) is a new system for measuring absolute distance, capable of resolving the integer cycle ambiguity of standard interferometers, and making it possible to measure distance with sub-nanometer accuracy. We describe the design of the system, show results for target distances up to 1 meter, and demonstrate how the system can be scaled to kilometer-scale distances. In recent experiments, we have used white light interferometry to augment the ‘truth’ measurements and validate the zero-point of the system. MSTAR is a general-purpose tool for conveniently measuring length with much greater accuracy than was previously possible, and has a wide range of possible applications

Fetterman, Harrold R.↗
NASA NTRS2004

MSTAR: an absolute metrology system with submicrometer accuracy

Laser metrology systems are a key component of stellar interferometers, used to monitor path lengths and dimensions internal to the instrument. Most interferometers use ‘relative’ metrology, in which the integer number of wavelengths along the path is unknown, and the measurement of length is ambiguous. Changes in the path length can be measured relative to an initial calibration point, but interruption of the metrology beam at any time requires a re- calibration of the system. iThe MSTAR sensor (Modulation Sideband Technology for Absolute Ranging) is a new system for measuring absolute distance, capable of resolving the integer cycle ambiguity of standard interferometers, and making it possible to measure distance with sub-nanometer accuracy. We describe the design of the system, show results for target distances up to 1 meter, and demonstrate how the system can be scaled to kilometer-scale distances. In recent experiments, we have used white light interferometry to augment the ‘truth’ measurements and validate the zero-point of the system. MSTAR is a general-purpose tool for conveniently measuring length with much greater accuracy than was previously possible, and has a wide range of possible applications.

Lay, Oliver↗