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Correlation approach for quality assurance of additive manufactured parts based on optical metrology
Surface topography and surface finish are two significant factors for evaluating the quality of products in additive manufacturing (AM). AM parts are fabricated layer by layer, which is quite different from traditional formative or subtractive methods. Despite rapid progress in additive manufacturing and associated optical metrology for quality control and in-situ monitoring, limited research has been conducted to investigate the reliability of 3D surface measurement data. The surface topologies scanned by multiple optical systems demonstrated significant differences due to varying sampling mechanisms, resolutions, system noises, etc. The 3D datasets should be trustworthy in order to extract parameters for quality assurance or feedback control from 3D surface measurements. In this paper, we set up new standards to evaluate the reliability of 3D surface measurement data and analyze the variation in the topographical profile. In this study, two non-contact optical methods based on Focus Variation Microscopy (FVM) and Structured Light System (SLS) were adopted to measure the surface topography of the target components. The two optical metrology systems generated two entirely different point cloud datasets. Statistical methods were applied to test the difference between the data obtained from the two systems. By using a data analytics approach for comparison, it was found that the surface roughness estimated from the point cloud data sets of FVM and SLS has no significant difference, though the point cloud data sets were completely different. This paper provides standard validation approach to evaluate the plausibility of metrology data from in-situ real-time surface analysis for process planning of AM.
Optical Metrology for Near-Net-Shaped Additively Manufactured Ceramic Components
Optical Metrology for Near-Net-Shaped Additively Manufactured Ceramic Components presented at the 45th International Conference and Exposition on Advanced Ceramics and Composites
Optical metrology and fabrication for synchrotron x-ray optics at NSLS-II
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Dual-Image Color Normalization to Enable High-Performance Concentrating Solar Optical Metrology
Concentrating Solar Power (CSP) requires precision mirrors, and these in turn require metrology systems to measure their optical slope. In this project we studied a color-based approach to the correspondence problem, which is the association of points on an optical target with their corresponding points seen in a reflection. This is a core problem in deflectometry-based metrology, and a color solution would enable important new capabilities. We modeled color as a vector in the [R,G,B] space measured by a digital camera, and explored a dual-image approach to compensate for inevitable changes in illumination color. Through a series of experiments including color target design and dual-image setups both indoors and outdoors, we collected reference/measurement image pairs for a variety of configurations and light conditions. We then analyzed the resulting image pairs by selecting example [R,G,B] pixels in the reference image, and seeking matching [R,G,B] pixels in the measurement image. Modulating a tolerance threshold enabled us to assess both match reliability and match ambiguity, and for some configurations, orthorectification enabled us to assess match accuracy. Using direct-direct imaging, we demonstrated color correspondence achieving average match accuracy values of 0.004 h, where h is the height of the color pattern. We found that wide-area two-dimensional and linear one-dimensional color targets outperformed hybrid linear/lateral gradient targets in the cases studied. Introducing a mirror degraded performance under our current techniques, and we did not have time to evaluate whether matches could be reliably achieved despite varying light conditions. Nonetheless, our results thus far are promising.
EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging
For more than 15 years, Imagine Optic have developed Extreme Ultra Violet (EUV) and X-ray Hartmann wavefront sensors for metrology and imaging applications. These sensors are compatible with a wide range of X-ray sources: from synchrotrons, Free Electron Lasers, laser-driven betatron and plasma-based EUV lasers to High Harmonic Generation. In this paper, we first describe the principle of a Hartmann sensor and give some key parameters to design a high-performance sensor. We also present different applications from metrology (for manual or automatic alignment of optics), to soft X-ray source optimization and X-ray imaging.
Improvements in optical metrology for high-performance variable-line-spacing x-ray gratings
Here, we discuss a project to develop a precision metrology system for variable-line-spacing x-ray gratings using interferometric microscopes. We are developing test standards and calibration techniques to measure and correct for geometrical distortion and blur, and data processing techniques to combine multiple measurements and measure line spacing with high accuracy.
Phase estimation algorithm for the multibeam optical metrology
Unitary Fourier transform lies at the core of the multitudinous computational and metrological algorithms. Here we show experimentally how the unitary Fourier transform-based phase estimation protocol, used namely in quantum metrology, can be translated into the classical linear optical framework. The developed setup made of beam splitters, mirrors and phase shifters demonstrates how the classical coherence, similarly to the quantum coherence, poses a resource for obtaining information about the measurable physical quantities. Our study opens route to the reliable implementation of the small-scale unitary algorithms on path-encoded qudits, thus establishing an easily accessible platform for unitary computation.
Swept-Lookback Deflectometry for High Performance Concentrating Solar Power Optical Metrology
This report describes an initial investigation into a proposed solution to the important problem of performing a detailed evaluation of heliostat optical performance, in situ in a heliostat field. Our approach is to place digital cameras in a position near the receiver where they look back toward the heliostat mirrors. The pixels of each camera sensor identify a set of small cells on the mirror surface, each corresponding to a “mixel.” By either passing reflected sunbeam over the camera or passing the camera through the reflected sunbeam, the cameras intercept sunlight reflected from each mixel. We then analyze the recorded video data to determine times when each mixel transitions from dark to light, and then back to dark. We then use these transitions to construct vectors from the camera to the mixel, and then from the mixel to the edge of the Sun at that moment. We then compute the surface normal at the mixel, which bisects the angle between these vectors. Performing this analysis for all mixels in the mirror yields a high-resolution map of slope across the mirror surface. We have implemented most of this process, successfully collecting data for an example heliostat facet and computing a preliminary estimated slope map. However, more work remains to complete this calculation, since certain factors and transformations are not yet included. Our observations so far support our hypothesis that such a system is possible, but we have not yet completed our quantitative evaluation of the concept.
Spectral and Temperature-Dependent Optical Metrology: Towards More Robust, Effective and Durable Materials for Concentrated Solar Power
The primary objective of this project is to develop reliable and standardized spectroscopic measurement techniques to determine radiative properties, specifically the emittance and reflectance, of materials relevant for the next generation (Gen3) concentrated solar power (CSP) technologies. Experimental measurements will span near- and mid-infrared wavelengths (1–20 µm) with emphasis on quantifying the influences of: (1) operating temperatures of 25–1000 °C, (2) thermal cycling, and (3) environmental exposure of materials during operation (vacuum/air). A secondary goal is to develop open-access and digitized databases to host and share experimental data, together with standardized measurement protocols and operating procedures to determine optical properties of materials. This project will also include reasonable emphasis on developing predictive modeling tools to augment experimental data to extract more fundamental and material-specific radiative properties.
Real-time single-element-detection structured illumination optical metrology for laser powder bed fusion
Laser powder bed fusion (LPBF) is a type of metal additive manufacturing which could benefit from improved process monitoring to improve quality control. We demonstrate, for the first time to our knowledge, the coaxial monitoring of melt track formation in steel powder with spatial frequency modulation imaging (SPIFI), an enhanced-resolution imaging technique which uses a photodiode to record one-dimensional images. Using a custom live-display software and a high-speed SPIFI geometry, we offset the SPIFI field of view from the fusing beam to monitor different regions of the LPBF melt pool and surrounding area. This demonstrates the potential of SPIFI to monitor spatial features within the melt pool in real-time with increased data efficiency.
Question-Based Gap Analysis of Heliostat Optical Metrology Methods.
Abstract not provided.
High-Accuracy Angle Generator for Angular Calibrations to Support Optical Metrology Laboratories and Light Source Facilities
The overarching vision for this project was to build the most accurate full-rotation angular positioning system in the Americas, and that goal remains. In labs performing similar work, the environment is typically closer to a clean room than an office space, like we had before the upgrades. We are now positioned to achieve our intended result with our upgraded infrastructure, system hardware, calibration techniques, and software. As detailed below, the combination of the pandemic schedule and technical challenges have set us back, but we will continue on the path toward our vision beyond the end of this Phase 2. It’s too important for us, for industry, and for the nation not to do so.
Characterizing a Precise Ground Truth Mirror for CSP Optical Metrology
Short and sweet three-minute presentation on CSP metrology techniques
Question-Based Gap Analysis of Heliostat Optical Metrology Methods
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Development of a position–velocity–time-modulated two-dimensional ion beam figuring system for synchrotron x-ray mirror fabrication
With the rapid evolution of synchrotron x-ray sources, the demand for high-quality precision x-ray mirrors has greatly increased. Single nanometer shape accuracy is required to keep imaging capabilities at the diffraction limit. Ion beam figuring (IBF) has been used frequently for ultra-precision finishing of mirrors, but achieving the ultimate accuracy depends on three important points: careful alignment, accurate dwell time calculation and implementation, and accurate optical metrology. The Optical Metrology Group at National Synchrotron Light Source II has designed and built a position–velocity–time-modulated two-dimensional IBF system (PVT-IBF) with three novel characteristics: (1) a beam footprint on the mirror was used as a reference to align the coordinate systems between the metrology and the IBF hardware; (2) the robust iterative Fourier transform-based dwell time algorithm proposed by our group was applied to obtain an accurate dwell time map; and (3) the dwell time was then transformed to velocities and implemented with the PVT motion scheme. In this study, the technical aspects of the PVT-IBF systems are described in detail, followed by an experimental demonstration of the figuring results. In our first experiment, the 2D RMS in a 50mm×5mm clear aperture was reduced from 3.4 to 1.1 nm after one IBF run. In our second experiment, due to a 5 mm pinhole installed in front of the source, the 2D RMS in a 50mm×5mm clear aperture was reduced from 39.1 to 1.9 nm after three IBF runs, demonstrating that our PVT-IBF solution is an effective and deterministic figuring process.
Dynamic motion trajectory control with nanoradian accuracy for multi-element X-ray optical systems via laser interferometry
The past decades have witnessed the development of new X-ray beam sources with brightness growing at a rate surpassing Moore’s law. Current and upcoming diffraction limited and fully coherent X-ray beam sources, including multi-bend achromat based synchrotron sources and high repetition rate X-ray free electron lasers, puts increasingly stringent requirements on stability and accuracy of X-ray optics systems. Parasitic motion errors at sub-micro radian scale in beam transport and beam conditioning optics can lead to significant loss of coherence and brightness delivered from source to experiment. To address this challenge, we incorporated optical metrology based on interferometric length and angle sensing and real-time correction as part of the X-ray optics motion control system. A prototype X-ray optics system was constructed following the optical layout of a tunable X-ray cavity. On-line interferometric metrology enabled dynamical feedback to a motion control system to track and compensate for motion errors. The system achieved sub-microradian scale performance, as multiple optical elements are synchronously and continuously adjusted. This first proof of principle measurement demonstrated both the potential and necessity of incorporating optical metrology as part of the motion control architecture for large scale X-ray optical systems such as monochromators, delay lines, and in particular, X-ray cavity systems to enable the next generation cavity-based X-ray free electron lasers.
Compact instantaneous phase-shifting Sagnac interferometer for nanoscale tilt measurement
There is a large inter disciplinary need for high precision angular sensors in state-of-the-art technologies. This particularly applies to optical metrology in the field of Extreme Ultraviolet (EUV) or X-ray where the optics are commonly characterized in terms of slope errors at a nanoradian scale level. Here, in this paper, we present the in-lab development of an angular sensor based on a single reflection compact Sagnac interferometer using instantaneous phase shifting. Our automated prototype and first results show less than 15 nrad RMS repeatability, at least 200 nrad sensitivity and 280 nrad reproducibility over 100 μrad angular range.