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Results for “part-to-part variation”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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All sourcesNASA NTRSDOE OSTI
NASA NTRS2002

Inadvertently programmed bits in Samsung 128 Mbit flash devices: a flaky investigation

JPL's X2000 avionics design pioneers new territory by specifying a non-volatile memory (NVM) board based on flash memories. The Samsung 128Mb device chosen was found to demonstrate bit errors (mostly program disturbs) and block-erase failures that increase with cycling. Low temperature, certain pseudo- random patterns, and, probably, higher bias increase the observable bit errors. An experiment was conducted to determine the wearout dependence of the bit errors to 100k cycles at cold temperature using flight-lot devices (some pre-irradiated). The results show an exponential growth rate, a wide part-to-part variation, and some annealing behavior.

flash memory program disturb wearout erase fail re↗
NASA NTRS2010

Statistical Model Selection for TID Hardness Assurance

Radiation Hardness Assurance (RHA) methodologies against Total Ionizing Dose (TID) degradation impose rigorous statistical treatments for data from a part's Radiation Lot Acceptance Test (RLAT) and/or its historical performance. However, no similar methods exist for using "similarity" data - that is, data for similar parts fabricated in the same process as the part under qualification. This is despite the greater difficulty and potential risk in interpreting of similarity data. In this work, we develop methods to disentangle part-to-part, lot-to-lot and part-type-to-part-type variation. The methods we develop apply not just for qualification decisions, but also for quality control and detection of process changes and other "out-of-family" behavior. We begin by discussing the data used in ·the study and the challenges of developing a statistic providing a meaningful measure of degradation across multiple part types, each with its own performance specifications. We then develop analysis techniques and apply them to the different data sets.

Ladbury, R.↗
NASA NTRS2020

Development of TID Hardness Assurance Methodologies to Capitalize on Statistical Radiation Environment Models

We develop methods for bounding part-to-part variation in TID data. When used in conjunction with statistical radiation environment models, these methods allow development of RHA that deliver estimated piece part reliability for any desired confidence level, moving beyond risk avoidance methodologies based on radiation design margin. Two methods are developed, and their results compared for realistic data.

Total Ionizing Dose↗
NASA NTRS2020

Development of TID Hardness Assurance Methodologies to Capitalize on Statistical Radiation Environment Models

We develop methods for bounding part-to-part variation in TID data. When used in conjunction with statistical radiation environment models, these methods allow development of RHA that deliver estimated piece part reliability for any desired confidence level, moving beyond risk avoidance methodologies based on radiation design margin. Two methods are developed, and their results compared for realistic data.

Total ionizing dose↗