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Decline in Radiation Hardened Microcircuit Infrastructure

Two areas of radiation hardened microcircuit infrastructure will be discussed: 1) The availability and performance of radiation hardened microcircuits, and, and 2) The access to radiation test facilities primarily for proton single event effects (SEE) testing. Other areas not discussed, but are a concern include: The challenge for maintaining radiation effects tool access for assurance purposes, and, the access to radiation test facilities primarily for heavy ion single event effects (SEE) testing. Status and implications will be discussed for each area.

performance of radiation hardened microcircuits↗

System-Level Radiation Hardening

Although system-level radiation hardening can enable the use of high-performance components and enhance the capabilities of a spacecraft, hardening techniques can be costly and can compromise the very performance designers sought from the high-performance components. Moreover, such techniques often result in a complicated design, especially if several complex commercial microcircuits are used, each posing its own hardening challenges. The latter risk is particularly acute for Commercial-Off-The-Shelf components since high-performance parts (e.g. double-data-rate synchronous dynamic random access memories - DDR SDRAMs) may require other high-performance commercial parts (e.g. processors) to support their operation. For these reasons, it is essential that system-level radiation hardening be a coordinated effort, from setting requirements through testing up to and including validation.

Radiation Hardness Assurance (RHA)↗

The effects of radiation on the outer planets grand tour

A handbook is presented which was designed to accompany an oral presentation on the effects of radiation on the outer planets grand tour (OPGT). A summary of OPGT radiation environments expected from natural sources and the radioisotope thermoelectric generators and basic radiation effects and processes are reviewed, and ionization and displacement effects are examined. The presentation summarizes the effects of radiation on miscellaneous spacecraft materials and devices. The annealing and hardening of electronics are described. Special emphasis is placed on microcircuits. Mathematical modeling of circuits affected by radiation and radiation environmental testing are discussed. A review of means of evaluating the performance and correcting failures of irradiated devices is also presented.

Source record↗