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Results for “phase shifting interferometry”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1992

Temporal averaging in a turbulent environment - Compensation for phase drifts in phase shifting interferometry

In an effort to improve the signal to noise in an interference experiment, we have developed a method to remove systematic phase drift between data sets acquired over long time intervals. Using this technique, it is possible to average repeatedly acquired phase measurements and improve the phase estimate without sacrificing spatial resolution. Results from tests using real-time phase stepping holographic interferometry applied to cantilever bending of a piezoelectric bimorph indicate that white noise has been reduced from 3 to less than 1 deg (lambda/360) by averaging 36 phase compensated data sets before object bending and 36 data sets after bending.

Ovryn, B.↗
NASA NTRS1993

Advanced technology development multi-color holography

This is the final report of the Multi-color Holography project. The comprehensive study considers some strategic aspects of multi-color holography. First, various methods of available techniques for accurate fringe counting are reviewed. These are heterodyne interferometry, quasi-heterodyne interferometry, and phase-shifting interferometry. Phase-shifting interferometry was found to be the most suitable for multi-color holography. Details of experimentation with a sugar solution are also reported where better than 1/200 of a fringe order measurement capability was established. Rotating plate glass phase shifter was used for the experimentation. The report then describes the possible role of using more than two wavelengths with special reference-to-object beam intensity ratio needs in multicolor holography. Some specific two- and three-color cases are also described in detail. Then some new analysis methods of the reconstructed wavefront are considered. These are deflectometry, speckle metrology, confocal optical signal processing, and phase shifting technique related applications. Finally, design aspects of an experimental breadboard are presented.

Vikram, Chandra S.↗
NASA NTRS1999

Phase-Shifted Laser Feedback Interferometry

Phase-shifted, laser feedback interferometry is a new diagnostic tool developed at the NASA Lewis Research Center under the Advanced Technology Development (ATD) Program directed by NASA Headquarters Microgravity Research Division. It combines the principles of phase-shifting interferometry (PSI) and laser-feedback interferometry (LFI) to produce an instrument that can quantify both optical path length changes and sample reflectivity variations. In a homogenous medium, the optical path length between two points is the product of the index of refraction and the geometric distance between the two points. LFI differs from other forms of interferometry by using the laser as both the source and the phase detector. In LFI, coherent feedback of the incident light either reflected directly from a surface or reflected after transmission through a region of interest will modulate the output intensity of the laser. The combination of PSI and LFI has produced a robust instrument, based on a low-power helium-neon (HeNe) gas laser, with a high dynamic range that can be used to measure either static or oscillatory changes of the optical path length. Small changes in optical path length are limited by the fraction of a fringe that can be measured; we can measure nonoscillatory changes with a root mean square (rms) error of the wavelength/1000 without averaging.

Ovryn, Benjie↗
NASA NTRS1996

Application of Phase Shifted, Laser Feedback Interferometry to Fluid Physics

We have combined the principles of phase-shifting interferometry (PSI) and laser-feedback interferometry (LFI) to produce a new instrument that can measure both optical path length (OPL) changes and discern sample reflectivity variations. In LFI, coherent feedback of the incident light either reflected directly from a surface or reflected after transmission through a region of interest will modulate the output intensity of the laser. LFI can yield a high signal-to-noise ratio even for low reflectivity samples. By combining PSI and LFI, we have produced a robust instrument, based upon a HeNe laser, with high dynamic range that can be used to measure either static (dc) or oscillatory changes along the optical path. As with other forms of interferometry, large changes in OPL require phase unwrapping. Conversely, small phase changes are limited by the fraction of a fringe that can be measured. We introduce the phase shifts with an electro-optic modulator (EOM) and use either the Carre or Hariharan algorithms to determine the phase and visibility. We have determined the accuracy and precision of our technique by measuring both the bending of a cantilevered piezoelectric bimorph and linear ramps to the EOM. Using PSI, sub-nanometer displacements can be measured. We have combined our interferometer with a commercial microscope and scanning piezoelectric stage and have measured the variation in OPL and visibility for drops of PDMS (silicone oil) on coated single crystal silicon. Our measurement of the static contact angle agrees with the value of 68 deg stated in the literature.

Ovryn, Ben↗
NASA NTRS2015

Optical Distortion Evaluation in Large Area Windows using Interferometry

It is important that imagery seen through large area windows, such as those used on space vehicles, not be substantially distorted. Many approaches are described in the literature for measuring the distortion of an optical window, but most suffer from either poor resolution or processing difficulties. In this paper a new definition of distortion is presented, allowing accurate measurement using an optical interferometer. This new definition is shown to be equivalent to the definitions provided by the military and the standards organizations. In order to determine the advantages and disadvantages of this new approach the distortion of an acrylic window is measured using three different methods; image comparison, Moiré interferometry, and phase-shifting interferometry.

Interferometer↗
NASA NTRS2015

A Comparison of Three Methods for Measuring Distortion in Optical Windows

It's important that imagery seen through large-area windows, such as those used on space vehicles, not be substantially distorted. Many approaches are described in the literature for measuring the distortion of an optical window, but most suffer from either poor resolution or processing difficulties. In this paper a new definition of distortion is presented, allowing accurate measurement using an optical interferometer. This new definition is shown to be equivalent to the definitions provided by the military and the standards organizations. In order to determine the advantages and disadvantages of this new approach, the distortion of an acrylic window is measured using three different methods: image comparison, moiré interferometry, and phase-shifting interferometry.

Interferometry↗
NASA NTRSDate not supplied

Metrological and Spectral Characterization of the Aspera Flight Optics

Aspera is a NASA's Astrophysics Pioneers mission, led by the University of Arizona. The aim of this mission is to study the presence of hot gasses (T=10^5-10^6 K) in the circumgalactic medium (CGM) and how the flow of these gasses affects galactic formation. One key enabling technology in the Aspera optical system is the use of more efficient UV-reflective optical coatings particularly at around 103.2 nm where the O VI emission line is located . In order to meet radiometric effective area requirements, the Goddard Space Flight Center (GSFC) code 551 Optics Branch applied Al (aluminum) + eLiF (enhanced lithium fluoride) on these optics, where the Al+LiF is annealed at elevated temperature (~250˚C) after the deposition and thus providing an improved version of the Al+LiF used in FUSE . Furthermore, these optics are encapsulated with a thin film of atomic layer deposited MgF2 at the Jet Propulsion Laboratory for enhanced durability . The efficiency and durability of these coatings depends on the quality of the optical surface in terms of cleanliness and roughness. Roughness increases the scatter off the coating and reduces the specular reflectance, and surface contaminants can accommodate moisture and other contaminants, increase scattering, and are weak points in the coating that may affect adhesion and subsequently the longevity of these coatings. Extensive optical metrology is necessary to minimize and quantify the impact of surface roughness and contaminants on optical surfaces. In this proceeding we report the inspection procedure implemented for Aspera optics at GSFC, from initial receiving of the optics to post-coating. Inspection includes Atomic Force Microscopy (AFM), Scanning White Light Interferometry (SWILI), Dark Field Microscopy (DFM), Phase Shifting Interferometry (PSI), and Vacuum ultraviolet (VUV) spectroscopy. Combinations of these techniques are used to inspect flight optics at each of the following steps: i) as-received, pre-cleaning inspection, ii) pre-coating, post-cleaning inspection, and iii) post-coating inspection. The evolution of roughness and other surface inspections such as contaminants are compared between each step to quantify the effect each step has on the flight optics. The final far ultraviolet (FUV) spectral performance of witness samples coated with the flight optics are presented.

Far Ultraviolet (FUV)↗
NASA NTRS2001

Optical metrology for testing an all-composite 2-meter diameter mirror

The Herschel Space Observatory (formerly known as FIRST) consists of a 3.5 m space telescope designed for use in the long IR and sub-milimeter wavebands. To demonstrate the viability of a carbon fiber composite telescope for this application, Composite Optics Incorporated (COI) manufactured a fast (f/1), large (2 m), lightweight (10.1 kg/m squared) demonstration mirror. A key challenge in demonstrating the performance of this novel mirror was to characterize the surface accuracy at cryogenic (70 K) temperatures. A wide variety of optical metrology techniques were investigated and a brief survey of empirical test results and limitations of the various techniques will be presented in this paper. Two complementary infrared (IR)techniques operating at a wavelength of 10.6 microns were chosen for further development: (1) IR Twyman-Green Phase Shifting Interferometry (IR PSI) and (2) IR Shack-Hartmann (IR SH) Wavefront Sensing. Innovative design modifications made to an existing IR PSI to achieve high-resolution, scannable, infrared measurements of the composite mirror are described. The modified interferometer was capable of measuring surface gradients larger than 350 microradians. The design and results of measurements made with a custom-built IR SH Wavefrong Sensor operating at 10.6 microns are also presented. A compact experimental setup permitting simultaneous operation of both the IR PSI and IR SH tools is shown. The advantages and the limitations of the two key IR metrology tools are discussed.

IR metrology phase shifting interferometry Shack-H↗
NASA NTRS2005

Cryogenic System for Interferometry of High-precision Optics at 20 K: Design and Performance

This report describes the facility and experimental methods at the Goddard Space Flight Center Optics Branch for the measurement of the surface figure of cryogenically-cooled spherical mirrors using standard phase-shifting interferometry, with a standard uncertainty below 2nm rms. Two developmental silicon carbide mirrors were tested: both were spheres with radius of curvature of 600 mm, and clear apertures of 150 mm. The mirrors were cooled within a cryostat, and the surface figure error measured through a fused-silica window. The GSFC team developed methods to measure the in-situ SFE at 20 K with a combined standard uncertainty below 2 nm rms and the change in SFE with temperature (the cryochange) with a combined standard uncertainty of 0.25 -- 0.75 nm rms. This paper will present the measurement facility, methods, and uncertainty analysis.

Blake,Peter↗
NASA NTRS2001

Effects of Convective Transport of Solute and Impurities on Defect-Causing Kinetics Instabilities

For in-situ studies of the formation and evolution of step patterns during the growth of protein crystals, we have designed and assembled an experimental setup based on Michelson interferometry with the surface of the growing protein crystal as one of the reflective surfaces. The crystallization part of the device allows optical monitoring of a face of a crystal growing at temperature stable within 0.05 C in a developed solution flow of controlled direction and speed. The reference arm of the interferometer contains a liquid-crystal element that allows controlled shifts of the phase of the interferograms. We employ an image processing algorithm which combines five images with a pi/2 phase difference between each pair of images. The images are transferred to a computer by a camera capable of capturing 6-8 frames per second. The device allows data collection data regarding growth over a relatively large area (approximately .3 sq. mm) in-situ and in real time during growth. The estimated dept resolution of the phase shifting interferometry is about 100 A. The lateral resolution, depending on the zoom ratio, varies between 0.3 and 0.6 micrometers. We have now collected quantitative results on the onset, initial stages and development of instabilities in moving step trains on vicinal crystal surfaces at varying supersaturation, position on the facet, crystal size and temperature with the proteins ferritin, apoferritin and thaumatin. Comparisons with theory, especially with the AFM results on the molecular level processes, see below, allow tests of the rational for the effects of convective flows and, as a particular case, the lack thereof, on step bunching.

Vekilov, Peter G.↗
NASA NTRS1989

Surface characterization and testing II; Proceedings of the Meeting, San Diego, CA, Aug. 10, 11, 1989

Various papers on surface characterization and testing are presented. Individual topics addressed include: simple Hartmann test data interpretation, optimum configuration of the Offner null corrector, system for phase-shifting interferometry in the presence of vibration, fringe variation and visibility in speckle-shearing interferometry, functional integral representation of rough surfaces, calibration of surface heights in an interferometric optical profiler, image formation in common path differential profilometers, SEM of optical surfaces, measuring surface profiles with scanning tunneling microscopes, surface profile measurements of curved parts, high-resolution optical profiler, scanning heterodyne interferometer with immunity from microphonics, real-time crystal axis measurements of semiconductor materials, radial metrology with a panoramic annular lens, surface analysis for the characterization of defects in thin-film processes, Spacelab Optical Viewport glass assembly optical test program for the Starlab mission, scanning differential intensity and phase system for optical metrology.

Greivenkamp, John E.↗
NASA NTRS2012

Method to Enhance the Operation of an Optical Inspection Instrument Using Spatial Light Modulators

For many aspheric and freeform optical components, existing interferometric solutions require a custom computer-generated hologram (CGH) to characterize the part. The overall objective of this research is to develop hardware and a procedure to produce a combined, dynamic, Hartmann/ Digital Holographic interferometry inspection system for a wide range of advanced optical components, including aspheric and freeform optics. This new instrument would have greater versatility and dynamic range than currently available measurement systems. The method uses a spatial light modulator to pre-condition wavefronts for imaging, interferometry, and data processing to improve the resolution and versatility of an optical inspection instrument. Existing interferometers and Hartmann inspection systems have either too small a dynamic range or insufficient resolution to characterize conveniently unusual optical surfaces like aspherical and freeform optics. For interferometers, a specially produced, computer-generated holographic optical element is needed to transform the wavefront to within the range of the interferometer. A new hybrid wavefront sensor employs newly available spatial light modulators (SLMs) as programmable holographic optical elements (HOEs). The HOE is programmed to enable the same instrument to inspect an optical element in stages, first by a Hartmann measurement, which has a very large dynamic range but less resolution. The first measurement provides the information required to precondition a reference wave that avails the measurement process to the more precise phase shifting interferometry. The SLM preconditions a wavefront before it is used to inspect an optical component. This adds important features to an optical inspection system, enabling not just wavefront conditioning for null testing and dynamic range extension, but also the creation of hybrid measurement procedures. This, for example, allows the combination of dynamic digital holography and Hartmann sensing procedures to cover a virtually unlimited dynamic range with high resolution. Digital holography technology brings all of the power and benefits of digital holographic interferometry to the requirement, while Hartmann-type wavefront sensors bring deflectometry technologies to the solution. The SLM can be used to generate arbitrary wavefronts in one leg of the interferometer, thereby greatly simplifying its use and extending its range. The SLM can also be used to modify the system into a dynamic Shack-Hartmann system, which is useful for optical components with large amounts of slope. By integrating these capabilities into a single instrument, the system will have tremendous flexibility to measure a variety of optical shapes accurately.

Trolinger, James↗
NASA NTRS1992

Strain sensing technology for high temperature applications

This review paper discusses the status of strain sensing technology for high temperature applications. Technologies covered are those supported by NASA such as required for applications in hypersonic vehicles and engines, advanced subsonic engines, as well as material and structure development. The applications may be at temperatures of 540 C (1000 F) to temperatures in excess of 1400 C (2500 F). The most promising technologies at present are the resistance strain gage and remote sensing schemes. Resistance strain gages discussed include the BCL gage, the LaRC compensated gage, and the PdCr gage. Remote sensing schemes such as laser based speckle strain measurement, phase-shifting interferometry and X-ray extensometry will be discussed. Present status and limitations of these technologies are presented.

Williams, W. D.↗
NASA NTRS2001

Adjustable Focus Optical Correction Lens (AFOCL)

This report describes a metrology plan that was developed for the characterization of PLZT-based devices, such as the Adjustable Focus Optical Correction Lens (AFOCL) in support of and as part of the deliverables for NASA contract NAS8-00118. The areas to be investigated include intensiometric effects (those that limit or alter the intensity of the light transmitted through the optic); interferometric effects (the phase change induced through the optic); and polarimetric effects (evaluating the differential lag between two polarization states propagating through the optic). These distinct phenomena are often coupled together in real applications consequently, there is a need to develop different standardized testing apparatus to: (1) isolate one effect from another; (2) gather information for understanding the physical effects; (3) anchor wavefront corrector modeling efforts; (4) develop the ability to decouple different effects; (5) demonstrate the suitability of PLZT technology to perform wavefront correction. The Center for Applied Optics (CAO) at the University of Alabama in Huntsville (UAH) is skilled in the characterization of transmission wavefront shaping devices using traditional interferometers available within the CAO Optical Metrology Laboratory and their Advanced Polarization Test Facility. Besides the imaging and interferometers available, the polarimetry facility has at its disposal, a Mueller Matrix Imaging Polarimeter (MMIP) which is well suited to the characterization of SLMs, polarizers, and thin film coatings within the visible and near-IR spectrums. In addition, the phase-shifting interferometry facilities at NASA-MSFC and the unique interferometers they processes are some of the most advanced available and may be of value especially for performing real-time optical performance evaluation of AFOCL test components.

Peters, Bruce R.↗