Procedures for Including Secondary Electron Emission in Numerical Simulations of Plasma-Insulator Interactions
Previous Monte Carlo simulations provide a data base for properties of secondary electron emission (SEE) from insulators and metals. Incident primary electrons are considered at energies up to 1200 eV. The behavior of secondary electrons is characterized by (1) yield vs. primary energy E(sub p), (2) distribution vs. secondary energy E(sub s), and (3) distribution vs. angle of emission theta. Special attention is paid to the low energy range E(sub p) up to 50 eV, where the number and energy of secondary electrons is limited by the finite band gap of the insulator. For primary energies above 50 eV the SEE yield curve can be conveniently parameterized by a Haffner formula. The energy distribution of secondary electrons is described by an empirical formula with average energy about 8.0 eV. The angular distribution of secondaries is slightly more peaked in the forward direction than the customary cos theta distribution. Empirical formulas and parameters are given for all yield and distribution curves. Procedures and algorithms are described for using these results to find the SEE yield, and then to choose the energy and angle of emergence of each secondary electron. These procedures can readily be incorporated into numerical simulations of plasma-solid surface interactions in low earth orbit.