Dependence of Interfacial Excess on the Threshold Value of the Isoconcentration Surface
The proximity histogram (or proxigram for short) is used for analyzing data collected by a three-dimensional atom probe microscope. The interfacial excess of Re (2.41 +/- 0.68 atoms/sq nm) is calculated by employing a proxigram in a completely geometrically independent way for gamma/gamma' interfaces in Rene N6, a third-generation single-crystal Ni-based superalloy. A possible dependence of interfacial excess on the variation of the threshold value of an isoconcentration surface is investigated using the data collected for Rene N6 alloy. It is demonstrated that the dependence of the interfacial excess value on the threshold value of the isoconcentration surface is weak.
Yoon, Kevin E.↗