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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records

Sequential Infiltration Synthesis for the Design of Low Refractive Index Surface Coatings with Controllable Thickness

Control over refractive index and thickness of surface coatings is central to the design of low refraction films used in applications ranging from optical computing to antireflective coatings. Here, we introduce gas-phase sequential infiltration synthesis (SIS) as a robust, powerful, and efficient approach to deposit conformal coatings with very low refractive indices. We demonstrate that the refractive indices of inorganic coatings can be efficiently tuned by the number of cycles used in the SIS process, composition, and selective swelling of the of the polymer template. We show that the refractive index of Al2O3 can be lowered from 1.76 down to 1.1 using this method. The thickness of the Al2O3 coating can be efficiently controlled by the swelling of the block copolymer template in ethanol at elevated temperature, thereby enabling deposition of both single-layer and graded-index broadband antireflective coatings. Using this technique, Fresnel reflections of glass can be reduced to as low as 0.1% under normal illumination over a broad spectral range.

Berman, Diana↗

Influence of refraction index strength on the light propagation in dielectrics material with periodic refraction index

This study investigated the influence of refraction index strength on the light propagation in refraction index-varied dielectric material. This dielectric material served as photonic lattice. The behavior of light propagation influenced by variation of refraction index in photonic lattice was investigated. Modes of the guiding light were determined numerically using squared-operator iteration method. It was found that the greater the strength of refraction index, the smaller the guiding modes.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗

Near-edge X-ray refraction fine structure microscopy

We demonstrate a method for obtaining increased spatial resolution and specificity in nanoscale chemical composition maps through the use of full refractive reference spectra in soft x-ray spectro-microscopy. Using soft x-ray ptychography, we measure both the absorption and refraction of x-rays through pristine reference materials as a function of photon energy and use these reference spectra as the basis for decomposing spatially resolved spectra from a heterogeneous sample, thereby quantifying the composition at high resolution. While conventional instruments are limited to absorption contrast, our novel refraction based method takes advantage of the strongly energy dependent scattering cross-section and can see nearly five-fold improved spatial resolution on resonance.

36 MATERIALS SCIENCE↗

Atmospheric microwave refractivity and refraction

The atmospheric refractivity can be expressed as a function of temperature, pressure, water vapor content, and operating frequency. Based on twenty-year meteorological data, statistics of the atmospheric refractivity were obtained. These statistics were used to estimate the variation of dispersion, attenuation, and refraction effects on microwave and millimeter wave signals propagating along atmospheric paths. Bending angle, elevation angle error, and range error were also developed for an exponentially tapered, spherical atmosphere.

Yu, E.↗

The Cryogenic, High-Accuracy, Refraction Measuring System (CHARMS): A New Facility for Cryogenic Infrared through Vacuum Far-Ultraviolet Refractive Index Measurements

The optical designs of future NASA infrared (IR) missions and instruments, such as the James Webb Space Telescope's (JWST) Near-Mixed Camera (NIRCam), will rely on accurate knowledge of the index of refraction of various IR optical materials at cryogenic temperatures. To meet this need, we have developed a Cryogenic, High-Accuracy Refraction Measuring System (CHARMS). In this paper we discuss the completion of the design and construction of CHARMS as well as the engineering details that constrained the final design and hardware implementation. In addition, we will present our first light, cryogenic, IR index of refraction data for LiF, BaF2, and CaF2, and compare our results to previously published data for these materials.

Frey, Bradley J.↗

Inserting a Low-Refractive-Index Dielectric Rear Reflector into PERC Cells: Challenges and Opportunities

One of the simplest and most effective ways to reduce the operating temperature of photovoltaic systems in the field is to reflect unusable, 'sub-bandgap' light with energies below the cell absorber's bandgap energy. In this work, low-refractive index SiO2 nanoparticle films inserted between c-Si wafers and metal electrodes significantly increase the reflectance of sub-bandgap light in fabricated test structures. These films are then integrated into the standard PERC fabrication sequence, revealing that the reflection benefits remains after some processing steps but are lost in certain conditions. The SiO2 nanoparticle films are easily ablated during laser contact opening, but are undesirably etched during post-laser cleaning. After Al metallization, the fully fabricated devices show enhanced sub-bandgap reflection when annealed at moderate temperatures, but energy-dispersive X-ray spectroscopy shows that high-temperature firing causes unwanted Al penetration into the SiO2 nanoparticle film, compromising reflection.

14 SOLAR ENERGY↗

Testing Densities and Refractive Indices of Extraterrestrial Ice Components Using Molecular Structures - Organic Compounds and Molar Refractions

The use of infrared spectra to determine molecular abundances of icy astronomical objects and to study their chemistry requires laboratory measurements of reference spectra and related quantities, such as the index of refraction (n) and density (p) of candidate ices. Here we present new n and p measurements on ices involving over 30 C-, H-, and O-containing compounds, both acyclic and cyclic, representing seven chemical families. We examine the results in a way that is rare in the astrochemical literature, namely one in which data from an ice formed from molecules of a particular chemical family are compared to measurements on another member of the same family, such as of a homologous series or a pair of isomers. Apart from the intrinsic usefulness of the n and data, a structure-based comparison can help establish trends and identify possibly spurious results. As liquid-phase data sometimes are used in low-temperature astrochemical work in the absence of solid-phase measurements, we compare our new ice results to those for the corresponding room-temperature liquids. We emphasize the use of our n and p data to compute the molar refraction (RM) for each of our ices, and how the resulting RM values compare to those expected from molecular structures. The use of calculated RM values and measured n values to calculate ice densities, in the absence of direct measurements, is also addressed.

Hudson, Reggie L.↗

Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic

Talbot-Lau x-ray interferometry has been implemented to map electron density gradients in High Energy Density Physics (HEDP) experiments. X-ray backlighter targets have been evaluated for Talbot-Lau X-ray Deflectometry (TXD). Cu foils, wires, and sphere targets have been irradiated by 10–150 J, 8–30 ps laser pulses, while two pulsed-power generators (∼350 kA, 350 ns and ∼200 kA, 150 ns) have driven Cu wire, hybrid, and laser-cut x-pinches. A plasma ablation front generated by the Omega EP laser was imaged for the first time through TXD for densities >1023 cm−3. Backlighter optimization in combination with x-ray CCD, image plates, and x-ray film has been assessed in terms of spatial resolution and interferometer contrast for accurate plasma characterization through TXD in pulsed-power and high-intensity laser environments. The results obtained thus far demonstrate the potential of TXD as a powerful diagnostic for HEDP.

Valdivia, M. P.↗

Retrieving the Vertical Structure of the Effective Aerosol Complex Index of Refraction from a Combination of Aerosol in Situ and Remote Sensing Measurements During TARFOX

The largest uncertainty in estimates of the effects of atmospheric aerosols on climate stems from uncertainties in the determination of their microphysical properties, including the aerosol complex index of refraction, which in turn determines their optical properties. A novel technique is used to estimate the aerosol complex index of refraction in distinct vertical layers from a combination of aerosol in situ size distribution and remote sensing measurements during the Tropospheric Aerosol Radiative Forcing Observational Experiment (TARFOX). In particular, aerosol backscatter measurements using the NASA Langley LASE (Lidar Atmospheric Sensing Experiment) instrument and in situ aerosol size distribution data are utilized to derive vertical profiles of the "effective" aerosol complex index of refraction at 815 nm (i.e., the refractive index that would provide the same backscatter signal in a forward calculation on the basis of the measured in situ particle size distributions for homogeneous, spherical aerosols). A sensitivity study shows that this method yields small errors in the retrieved aerosol refractive indices, provided the errors in the lidar-derived aerosol backscatter are less than 30% and random in nature. Absolute errors in the estimated aerosol refractive indices are generally less than 0.04 for the real part and can be as much as 0.042 for the imaginary part in the case of a 30% error in the lidar-derived aerosol backscatter. The measurements of aerosol optical depth from the NASA Ames Airborne Tracking Sunphotometer (AATS-6) are successfully incorporated into the new technique and help constrain the retrieved aerosol refractive indices. An application of the technique to two TARFOX case studies yields the occurrence of vertical layers of distinct aerosol refractive indices. Values of the estimated complex aerosol refractive index range from 1.33 to 1.45 for the real part and 0.001 to 0.008 for the imaginary part. The methodology devised in this study provides, for the first time, a complete set of vertically resolved aerosol size distribution and refractive index data. yielding the vertical distribution of aerosol optical properties required for the determination of aerosol-induced radiative flux changes.

Redemann, J.↗

Retrieving the Vertical Structure of the Effective Aerosol Complex Index of Refraction from a Combination of Aerosol in Situ and Remote Sensing Measurements During TARFOX

The largest uncertainty in estimates of the effects of atmospheric aerosols on climate stems from uncertainties in the determination of their microphysical properties, including the aerosol complex index of refraction, which in turn determines their optical properties. A novel technique is used to estimate the aerosol complex index of refraction in distinct vertical layers from a combination of aerosol in situ size distribution and remote sensing measurements during the Tropospheric Aerosol Radiative Forcing Observational Experiment (TARFOX). In particular, aerosol backscatter measurements using the NASA Langley LASE (Lidar Atmospheric Sensing Experiment) instrument and in situ aerosol size distribution data are utilized to derive vertical profiles of the 'effective' aerosol complex index of refraction at 815 nm (i.e., the refractive index that would provide the same backscatter signal in a forward calculation on the basis of the measured in situ particle size distributions for homogeneous, spherical aerosols). A sensitivity study shows that this method yields small errors in the retrieved aerosol refractive indices, provided the errors in the lidar derived aerosol backscatter are less than 30% and random in nature. Absolute errors in the estimated aerosol refractive indices are generally less than 0.04 for the real part and can be as much as 0.042 for the imaginary part in the case of a 30% error in the lidar-derived aerosol backscatter. The measurements of aerosol optical depth from the NASA Ames Airborne Tracking Sunphotometer (AATS-6) are successfully incorporated into the new technique and help constrain the retrieved aerosol refractive indices. An application of the technique to two TARFOX case studies yields the occurrence of vertical layers of distinct aerosol refractive indices. Values of the estimated complex aerosol refractive index range from 1.33 to 1.45 for the real part and 0.001 to 0.008 for the imaginary part. The methodology devised in this study provides, for the first time a complete set of vertically resolved aerosol size distribution and refractive index data, yielding the vertical distribution of aerosol optical properties required for the determination of aersol-induced radiative flux changes

Redemann, J.↗