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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records

General Aviation Aircraft Reliability Study

This reliability study was performed in order to provide the aviation community with an estimate of Complex General Aviation (GA) Aircraft System reliability. To successfully improve the safety and reliability for the next generation of GA aircraft, a study of current GA aircraft attributes was prudent. This was accomplished by benchmarking the reliability of operational Complex GA Aircraft Systems. Specifically, Complex GA Aircraft System reliability was estimated using data obtained from the logbooks of a random sample of the Complex GA Aircraft population.

Pettit, Duane↗

Impact of Device Scaling on Deep Sub-micron Transistor Reliability: A Study of Reliability Trends using SRAM

As microelectronics are scaled in to the deep sub-micron regime, users of advanced technology CMOS, particularly in high-reliability applications, should reassess how scaling effects impact long-term reliability. An experimental based reliability study of industrial grade SRAMs, consisting of three different technology nodes, is proposed to substantiate current acceleration models for temperature and voltage life-stress relationships. This reliability study utilizes step-stress techniques to evaluate memory technologies (0.25mum, 0.15mum, and 0.13mum) embedded in many of today's high-reliability space/aerospace applications. Two acceleration modeling approaches are presented to relate experimental FIT calculations to Mfr's qualification data.

CMOS integrated circuits↗

Software reliability studies

There are many software reliability models which try to predict future performance of software based on data generated by the debugging process. Our research has shown that by improving the quality of the data one can greatly improve the predictions. We are working on methodologies which control some of the randomness inherent in the standard data generation processes in order to improve the accuracy of predictions. Our contribution is twofold in that we describe an experimental methodology using a data structure called the debugging graph and apply this methodology to assess the robustness of existing models. The debugging graph is used to analyze the effects of various fault recovery orders on the predictive accuracy of several well-known software reliability algorithms. We found that, along a particular debugging path in the graph, the predictive performance of different models can vary greatly. Similarly, just because a model 'fits' a given path's data well does not guarantee that the model would perform well on a different path. Further we observed bug interactions and noted their potential effects on the predictive process. We saw that not only do different faults fail at different rates, but that those rates can be affected by the particular debugging stage at which the rates are evaluated. Based on our experiment, we conjecture that the accuracy of a reliability prediction is affected by the fault recovery order as well as by fault interaction.

Hoppa, Mary Ann↗

Reliability study of the NiH2 strain gage

This paper summarizes a joint study by Gates Aerospace Batteries (GAB) and the Reliability Analysis Center (RAC). This study characterizes the reliability and robustness of the temperature compensated strain gages currently specified for sensing of internal pressure of NiH2 cells. These strain gages are characterized as fully encapsulated, metallic foil grids with known resistance that varies with deformation. The measurable deformation, when typically installed on the hemispherical portion of a NiH2 cell, is proportional to the material stresses as generated by internal cell pressures. The internal pressure sensed in this manner is calibrated to indicate the state-of-charge for the cell. This study analyzes and assesses both robustness and reliability for the basic design of the strain gage, the installation of the strain gage, and the circuitry involved.

Klein, Glenn C.↗

Cost and Reliability Study for a Large Array of Small Reflector Antennas for JPL/NASA Deep Space Network (DSN)

A study is performed to estimate the cost of an array of small aperture reflector antennas to be used instead or in conjunction with the current large reflector antennas of the JPL/NASA Deep Space Network (DSN), for servicing present and future NASA missions which involve smaller spacecraft with limited power and smaller, lower gain antennas. The advantages of the array configuration in terms of cost and reliability are studied. A probabilistic determination of the reliability and availability of the array as a function of the number of array elements and the availability of individual array elements is made. The impact of additional marginal elements on the operational availability of the array is studied. Parametric cost and reliability plots are presented and directions for further investigation are outlined.

Resch, G.↗

Software reliability studies

The longterm goal of this research is to identify or create a model for use in analyzing the reliability of flight control software. The immediate tasks addressed are the creation of data useful to the study of software reliability and production of results pertinent to software reliability through the analysis of existing reliability models and data. The completed data creation portion of this research consists of a Generic Checkout System (GCS) design document created in cooperation with NASA and Research Triangle Institute (RTI) experimenters. This will lead to design and code reviews with the resulting product being one of the versions used in the Terminal Descent Experiment being conducted by the Systems Validations Methods Branch (SVMB) of NASA/Langley. An appended paper details an investigation of the Jelinski-Moranda and Geometric models for software reliability. The models were given data from a process that they have correctly simulated and asked to make predictions about the reliability of that process. It was found that either model will usually fail to make good predictions. These problems were attributed to randomness in the data and replication of data was recommended.

Wilson, Larry W.↗

Organic flip chip reliability study for space applications

The current state-of-the-art flip chip packages for space applications are the class-Y non-hermetic ceramic packages, whereas for commercial applications, organic packages have been the mainstream technology for about two decades. The high reliability of the class-Y parts suggests that the hermeticity is not critical for the reliability of flip chip devices and that organic flip chip packages could be reliable enough for space applications. The current report summarizes the result of collaboration between JPL and Cobham semiconductor space solutions to study the reliability of the organic flip chip packages.

Measmer, Rich↗

Reliability studies of integrated modular engine system designs

A study was performed to evaluate the reliability of Integrated Modular Engine (IME) concepts. Comparisons were made between networked IME systems and non-networked discrete systems using expander cycle configurations. Both redundant and non-redundant systems were analyzed. Binomial approximation and Markov analysis techniques were employed to evaluate total system reliability. In addition, Failure Modes and Effects Analyses (FMEA), Preliminary Hazard Analyses (PHA), and Fault Tree Analysis (FTA) were performed to allow detailed evaluation of the IME concept. A discussion of these system reliability concepts is also presented.

Hardy, Terry L.↗

Reliability studies of Integrated Modular Engine system designs

A study was performed to evaluate the reliability of Integrated Modular Engine (IME) concepts. Comparisons were made between networked IME systems and non-networked discrete systems using expander cycle configurations. Both redundant and non-redundant systems were analyzed. Binomial approximation and Markov analysis techniques were employed to evaluate total system reliability. In addition, Failure Modes and Effects Analyses (FMEA), Preliminary Hazard Analyses (PHA), and Fault Tree Analysis (FTA) were performed to allow detailed evaluation of the IME concept. A discussion of these system reliability concepts is also presented.

Hardy, Terry L.↗

Reliability Studies for Fatigue-Crack Detection

Reusable test panels available to assess reliability of techniques that use fluorescent penetrant to detect fatigue cracks. Ultrasonic cleaning method developed for removing penetrant from panels prior to reuse.

Christner, B. K.↗

Selected reliability studies for the NERVA program

An investigation was made into certain methods of reliability analysis that are particularly suitable for complex mechanisms or systems in which there are many interactions. The methods developed were intended to assist in the design of such mechanisms, especially for analysis of failure sensitivity to parameter variations and for estimating reliability where extensive and meaningful life testing is not feasible. The system is modeled by a network of interconnected nodes. Each node is a state or mode of operation, or is an input or output node, and the branches are interactions. The network, with its probabilistic and time-dependent paths is also analyzed for reliability and failure modes by a Monte Carlo, computerized simulation of system performance.

Hoover, S. V.↗

Cost and reliability study for a large array of small reflector antennas for JPL/NASA Deep Space Network (DSN)

A study performed to estimate the cost of an array of small aperture reflector antennas to be used instead of or in conjunction with the current large reflector antennas of the JPL/NASA Deep Space Network (DSN) is described. The arrays are used for servicing present and future NASA missions that involve smaller spacecraft with limited power and smaller, lower-gain antennas. The advantages of the array configuration in terms of cost and reliability are discussed. A probabilistic determination of the reliability and availability of the array as a function of the number of array elements and the availability of individual array elements is made. The impact of additional marginal elements on the operational availability of the array is studied. Parametric cost and reliability plots are presented and directions for further investigation are outlined.

Jamnejad, Vahraz↗