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All sourcesNASA NTRSDOE OSTI
NASA NTRSDate not supplied

Measurement of Secondary Electron Yield from Dielectric Materials

Secondary Electron Yield (SEY) is a material property that plays a fundamental role in material and spacecraft charging. SEY values for dielectric materials (insulators) are crucial inputs to models used to assess mission risk posed by high differential voltages and electrostatic discharge (ESD) on spacecraft. There are only two (non-NASA) facilities that attempt such measurements. The lack of NASA capability results in high cost and long, unpredictable schedules to obtain measurements. Future Artemis crewed lunar surface missions will involve the first use of many insulating materials for which SEY properties are poorly understood or absent entirely. Unconstrained SEY values in models increase uncertainty in charging/ESD risk assessment. The capability for reliable SEY determination will lead to improved charging and ESD risk assessments. We are developing a new capability, using pulsed ultralow (<femtoampere) incident electron beam intensity to eliminate sample charging, coupled with sensitive non-contact surface potential measurements, to measure secondary electron yield (SEY) from insulating materials. Present methods for SEY measurement on insulators suffer from highly inconsistent results due to sample charging from the incident electron beam during the measurement. In this first phase we are leveraging existing EM41 instrumentation, facilities, and expertise to perform proof-of-concept tests.

secondary electron emission↗
NASA NTRS1992

Secondary electron yields of solar system ices

The secondary electron yields of H2O, CO2, NH3, and CH3OH ices have been measured as a function of electron beam energy in the 2- to 30-keV energy range. The ices were produced on a liquid-nitrogen-cooled cold finger and transferred under vacuum to a SEM where the yield measurements were made. The imaging capabilities of the SEM provide a means of correlating the yield measurements with the morphology of the ices and are also used to monitor charging effects. The yields were determined by measuring the amplified current from a secondary electron detector and calibrating this current signal with the amplified current signal from samples of metals with known secondary electron yields. Each of the measured yields is found to decrease with an increase in energy in the 2- to 30-keV range. Estimates are given for the maximum secondary electron yield Y(max) of each ice and the energy at which this maximum yield occurs. Implications for the charging of solar system ice grains are discussed.

Suszcynsky, David M.↗
DOE OSTI2024

Analysis of multipacting threshold sensitivity to the random distributions of the secondary electron yield parameters

The way multipacting develops, depends strongly on the secondary emission property of the surface material. The knowledge of secondary electron yield is crucial for accurate prediction of the multipacting threshold. Variations in secondary electron yield parameters from experimental measurements create uncertainty, stemming from handling and surface preparation, and these uncertainties significantly affect multipacting threshold predictions. Despite their significance, the previous studies on the multipacting phenomenon did not adequately address the effect of an assumed random distribution of the secondary emission parameters on the multipacting threshold. Therefore, this paper aims to provide a comprehensive statistical study on how the different random distributions of the secondary emission parameters and, as a result, the uncertainty in the secondary electron yield affect multipacting thresholds. We focus on three commonly used distributions, namely uniform, normal, and truncated normal distributions, to define the uncertainty of random inputs. We use the chaos polynomial expansion method to determine how much each of the random parameters contributes to the multipacting threshold uncertainty. Additionally, we calculate Sobol sensitivity indices to evaluate the impact of the individual parameters or groups of parameters on the model outputs and study how different random distributions of these parameters affected the Sobol index results.

physics↗
DOE OSTI2023

The influence of secondary electron yield uncertainty on the single-sided multipacting in dielectrics

Multipacting is an electrical discharge caused by the emission of secondary electrons which can occur in vacuum radio frequency systems. Generally multipacting is highly undesirable obstacle, which increases the noise level as well as the return loss of radio frequency systems. Therefore, a prediction of multipacting is necessary to avoid it during radio frequency system design. In this regard, the accurate evaluation of the factors that affect multipacting is required. One of the critical factors determining the multipacting development is the secondary electron yield of the material. In practice the emission properties of materials are not known very accurately. There are uncertainties in the measured values of this yield. In this paper, the generalized Polynomial Chaos (gPC) method is used to quantify uncertainty of the secondary electron yield. This method is verified by Monte Carlo simulation. The effect of uncertainty for two secondary electron yield parameters is then investigated on the multipacting using gPC method.

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗
DOE OSTI2025

NOVEL METHODS FOR IN SITU HIGH DENSITY SURFACE CLEANING SCRUBBING OF ULTRAHIGH VAC LONG NARROW TUBES TO REDUCE SECONDARY ELECTRON YIELD AND OUT GASSING

This project developed new methods for cleaning the inside surfaces of very long, narrow vacuum tubes used in particle accelerators. Traditional cleaning approaches are expensive, slow, or difficult to implement in accelerator tunnels. We designed and tested a portable plasma discharge cleaning system that uses lower-cost microwave and magnetron technologies to reduce outgassing and secondary electron emission from stainless steel and copper surfaces. The system, called the Plasma Discharge Test System (PDTS), allows accelerator components to be scrubbed more efficiently, which can improve performance and reduce maintenance costs for research and industrial applications.

POOLE, JOE HENRY [PRESIDENT]↗
NASA NTRS1981

Secondary Electron Emission Yields

The secondary electron emission (SEE) characteristics for a variety of spacecraft materials were determined under UHV conditions using a commercial double pass CMA which permits sequential Auger electron electron spectroscopic analysis of the surface. The transparent conductive coating indium tin oxide (ITO) was examined on Kapton and borosilicate glass and indium oxide on FED Teflon. The total SEE coefficient ranges from 2.5 to 2.6 on as-received surfaces and from 1.5 to 1.6 on Ar(+) sputtered surfaces with 5 nm removed. A cylindrical sample carousel provides normal incidence of the primary beam as well as a multiple Faraday cup measurement of the approximately nA beam currents. Total and true secondary yields are obtained from target current measurements with biasing of the carousel. A primary beam pulsed mode to reduce electron beam dosage and minimize charging of insulating coatings was applied to Mg/F2 coated solar cell covers. Electron beam effects on ITO were found quite important at the current densities necessary to do Auger studies.

Krainsky, I.↗
NASA NTRS2009

Measurements of Lunar Dust Charging Properties by Electron Impact

Dust grains in the lunar environment are believed to be electrostatically charged predominantly by photoelectric emissions resulting from solar UV radiation on the dayside, and on the nightside by interaction with electrons in the solar wind plasma. In the high vacuum environment on the lunar surface with virtually no atmosphere, the positive and negative charge states of micron/submicron dust grains lead to some unusual physical and dynamical dust phenomena. Knowledge of the electrostatic charging properties of dust grains in the lunar environment is required for addressing their hazardous effect on the humans and mechanical systems. It is well recognized that the charging properties of individual small micron size dust grains are substantially different from the measurements on bulk materials. In this paper we present the results of measurements on charging of individual Apollo 11 and Apollo 17 dust grains by exposing them to mono-energetic electron beams in the 10-100 eV energy range. The charging/discharging rates of positively and negatively charged particles of approx. 0.1 to 5 micron radii are discussed in terms of the sticking efficiencies and secondary electron yields. The secondary electron emission process is found to be a complex and effective charging/discharging mechanism for incident electron energies as low as 10-25 eV, with a strong dependence on particle size. Implications of the laboratory measurements on the nature of dust grain charging in the lunar environment are discussed.

Abbas, Mian M.↗
NASA NTRS1979

Effects of secondary yield parameter variation on predicted equilibrium potential of an object in a charging environment

The sensitivity of predicted equilibrium potential to changes in secondary electron yield parameters was investigated using MATCHG, a simple charging code which incorporates the NASCAP material property formulations. The equilibrium potential was found to be a sensitive function of one of the two parameters specifying secondary electron yield due to proton impact and of essentially all the parameters specifying yield due to electron impact. The information on the electron generated secondary yield parameters was discovered to be obtainable from monoenergetic beam charging data if charging rates as well as equilibrium potentials are accurately recorded.

Purvis, C. K.↗
NASA NTRS1979

Effects of secondary yield parameter variation on predicted equilibrium potential of an object in a charging environment

A study is presented in which the sensitivity of predicted equilibrium potential to changes in secondary electron yield parameters is investigated using MATCHG, a simple charging code which incorporates the NASCAP material property formulations. It is found that equilibrium potential is a sensitive function of one of the two parameters specifying secondary electron yield due to proton impact and of essentially all the parameters specifying yield due to electron impact. In addition, it is found that information on the electron generated secondary yield parameters can be obtained from monoenergetic beam charging data if charging rates as well as equilibrium potentials are accurately recorded.

Purvis, C. K.↗
NASA NTRS1995

Chemical Vapor-Deposited (CVD) Diamond Films for Electronic Applications

Diamond films have a variety of useful applications as electron emitters in devices such as magnetrons, electron multipliers, displays, and sensors. Secondary electron emission is the effect in which electrons are emitted from the near surface of a material because of energetic incident electrons. The total secondary yield coefficient, which is the ratio of the number of secondary electrons to the number of incident electrons, generally ranges from 2 to 4 for most materials used in such applications. It was discovered recently at the NASA Lewis Research Center that chemical vapor-deposited (CVD) diamond films have very high secondary electron yields, particularly when they are coated with thin layers of CsI. For CsI-coated diamond films, the total secondary yield coefficient can exceed 60. In addition, diamond films exhibit field emission at fields orders of magnitude lower than for existing state-of-the-art emitters. Present state-of-the-art microfabricated field emitters generally require applied fields above 5x10^7 V/cm. Research on field emission from CVD diamond and high-pressure, high-temperature diamond has shown that field emission can be obtained at fields as low as 2x10^4 V/cm. It has also been shown that thin layers of metals, such as gold, and of alkali halides, such as CsI, can significantly increase field emission and stability. Emitters with nanometer-scale lithography will be able to obtain high-current densities with voltages on the order of only 10 to 15 V.

Source record↗
NASA NTRS1985

Surface discharge through an insulator in a vacuum

A model for the mechanism of stationary discharges over insulators in a vacuum was developed. Upon introduction of this discharge, the insulator charges as a result of secondary emissions, in such a way that electrons coming from the cathode strike with an average secondary electron yield of 1, and so that the secondary electrons return again to the insulator through the electric field near the insulator. When the secondary electrons strike, electrons with an average yield of 1 are released again. The electrons move in short faults toward the anode, which they strike with lesser energy.

Boersch, H.↗
NASA NTRS1994

Fabrication of an electron multiplier utilizing diamond films

High secondary electron yields (sigma=14-27) from polycrystalline diamond films on Mo substrates have been reported previously. We observed that continuous exposure to an electron beam degraded the secondary yield in vacuum as a function of fluence owing to a loss of surface hydrogen. However, the hydrogen partial pressure could be adjusted such that the high secondary yield remained stable during beam exposure. We have constructed a prototype electron multiplier using these diamond films for use in ultrahigh vacuum. A gain of 0.9 times 10(exp 5) has been measured in a d.c. mode. Palladium, titanium and aluminum nitride have been studied for possible dynode substrate materials which might eliminate the need for hydrogen during operation. Total secondary yields as high as 50 were measured from diamond on palladium and sigma was stable at 25 during heating at 700 K in vacuum. Raman spectroscopy and scanning electron microscopy showed that variations in sigma from diamond films on Pd were due to differing concentrations of non-diamond carbon.

Mearini, G. T.↗
NASA NTRS2012

Plasma Wake Simulations and Object Charging in a Shadowed Lunar Crater During a Solar Storm

Within a permanently shadowed lunar crater the horizontal flow of solar wind is obstructed by upstream topography, forming a plasma wake that electrostatically diverts ions toward the crater floor and generates a surface potential that can reach kilovolts. In the present work kinetic plasma simulations are employed to investigate the morphology of a lunar crater wake during passage of a solar storm. Results are cast in terms of leading dimensionless ratios including the ion Mach number, ratio of crater depth to plasma Debye length, peak secondary electron yield, and electron temperature vs. electron impact energy at peak secondary yield. This small set of ratios allows generalization to a much wider range of scenarios. The kinetic simulation results are fed forward into an equivalent-circuit model of a roving astronaut. In very low-plasma-current environments triboelectric charging of the astronaut suit becomes effectively perpetual, representing a critical engineering concern for roving within shadowed lunar regions. Finally, simulated ion fluxes are used to explore sputtering and implantation processes within an idealized crater. It is suggested that the physics of plasma mini-wakes formed in the vicinity of permanently shadowed topography may play a critical role in modulating the enigmatic spatial distribution of volatiles at the lunar poles.

Zimmerman, Michael I.↗
NASA NTRS2004

Materials Characterization at Utah State University: Facilities and Knowledge-base of Electronic Properties of Materials Applicable to Spacecraft Charging

In an effort to improve the reliability and versatility of spacecraft charging models designed to assist spacecraft designers in accommodating and mitigating the harmful effects of charging on spacecraft, the NASA Space Environments and Effects (SEE) Program has funded development of facilities at Utah State University for the measurement of the electronic properties of both conducting and insulating spacecraft materials. We present here an overview of our instrumentation and capabilities, which are particularly well suited to study electron emission as related to spacecraft charging. These measurements include electron-induced secondary and backscattered yields, spectra, and angular resolved measurements as a function of incident energy, species and angle, plus investigations of ion-induced electron yields, photoelectron yields, sample charging and dielectric breakdown. Extensive surface science characterization capabilities are also available to fully characterize the samples in situ. Our measurements for a wide array of conducting and insulating spacecraft materials have been incorporated into the SEE Charge Collector Knowledge-base as a Database of Electronic Properties of Materials Applicable to Spacecraft Charging. This Database provides an extensive compilation of electronic properties, together with parameterization of these properties in a format that can be easily used with existing spacecraft charging engineering tools and with next generation plasma, charging, and radiation models. Tabulated properties in the Database include: electron-induced secondary electron yield, backscattered yield and emitted electron spectra; He, Ar and Xe ion-induced electron yields and emitted electron spectra; photoyield and solar emittance spectra; and materials characterization including reflectivity, dielectric constant, resistivity, arcing, optical microscopy images, scanning electron micrographs, scanning tunneling microscopy images, and Auger electron spectra. Further details of the instrumentation used for insulator measurements and representative measurements of insulating spacecraft materials are provided in other Spacecraft Charging Conference presentations. The NASA Space Environments and Effects Program, the Air Force Office of Scientific Research, the Boeing Corporation, NASA Graduate Research Fellowships, and the NASA Rocky Mountain Space Grant Consortium have provided support.

Dennison, J. R.↗
NASA NTRS2006

Secondary Electron Emission and the Exploration of Space

The emission of secondary electrons from surfaces exposed to the space plasma and radiation environment is a process of great importance to space system engineering design and operations. A spacecraft will collect charge until it reaches an equilibrium potential gov,erned by the balance of incoming electron and ion currents from the space environment with outgoing secondary, backscattered, and photoelectron currents. Laboratory measurements of secondary electron yields are an important parameter for use in spacecraft charging analyses because the magnitude and sign of the equilibrium potential depends on both the energy spectrum of electrons and ions in the space environment and the electrical properties of the surface materials (including the energy dependent secondary electron yields). Typical benign equilibrium potentials range &om a few tens of volts positive in interplanetary space to a few volts negative in low Earth orbit. However, spacecraft are known to charge to negative potentials exceeding one to ten kilovolts in some environments and anomalies or system failures due to electrostatic discharges originating from highly charged surfaces becomes a serious concern. This presentation will provide a review of the spacecraft charging process with special emphasis on the role of secondary electrons in controlling the current balance process. Charging examples will include spacecraft in Earth orbit and interplanetary space as well as dust charging on the lunar surface, a phenomenon of importance to future lunar surface operations.

Minow, Joseph I.↗
NASA NTRS1993

Microchannel plate modal gain variations with temperature

Measurements of the modal gain of two high-gain curved-channel microchannel plates (MCPs) at various operating temperatures are presented. Both MCPs were fabricated from the Long Life glass with 12-micron diam channels on 15-micron centers. The modal gain was found to decrease with increasing temperature at a rate of -0.1 percent C. This reduction of gain with temperature is attributed primarily to an axial temperature gradient along each MCP channel creating a nonuniform electric field within the channel that lowers the effective output gain. A lowering of the secondary electron yield resulting from increased phonon scattering of secondary electrons released within the walls of the MCP channels was assessed, but was found to have a negligible contribution to the drop in gain with temperature.

Slater, David C.↗