Analysis and Optimization of Plannar Rectangular T-anode Schottky Barrier Diodes for Submillimeter-wave Multipliers
Explore the source record for details and available documents.
semiconductor wafer structure Schottky Barrier Dio↗
SEARCH · Search NASA
Results for “semiconductor wafer structure Schottky Barrier Diodes”
Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.
Electron-beam studies of Schottky-barrier detector surfaces
Review of the surface anomalies occurring in Schottky-barrier particle detectors identifiable by means of an electron beam technique employed by Czaja (1965) for analyzing defects in diode structures. The technique is shown to make possible the detection and identification of the following anomalies: (1) chemical contamination of the detector surface; (2) mechanical damage of the wafer substrates; (3) damage introduced in semiconductor surface preparation; (4) radiation damage; and (5) defective surface metallization.
Peckerar, M. C.↗