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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS2001

Influence of Specimen Preparation and Specimen Size on Composite Transverse Tensile Strength and Scatter

The influence of specimen polishing, configuration, and size on the transverse tension strength of two glass-epoxy materials, and one carbon-epoxy material, loaded in three and four point bending was evaluated. Polishing machined edges, arid/or tension side failure surfaces, was detrimental to specimen strength characterization instead of yielding a higher, more accurate, strength as a result of removing inherent manufacture and handling flaws. Transverse tension strength was typically lower for longer span lengths due to the classical weakest link effect. However, strength was less sensitive to volume changes achieved by increasing specimen width. The Weibull scaling law typically over-predicted changes in transverse tension strengths in three point bend tests and under-predicted changes in transverse tension strengths in four point bend tests. Furthermore, the Weibull slope varied with specimen configuration, volume, and sample size. Hence, this scaling law was not adequate for predicting transverse tension strength of heterogeneous, fiber-reinforced, polymer matrix composites.

OBrien, T. Kevin↗
NASA NTRS1999

Influence of Specimen Preparation and Specimen Size on the Transverse Tensile Strength and Scatter of Glass Epoxy Laminates

The influence of specimen polishing, specimen configuration, and specimen size on the transverse tension strength of two glass epoxy materials loaded in three and four point bending was evaluated. Polishing machined edges, and/or tension side failure surfaces, was detrimental to specimen strength characterization instead of yielding a higher, more accurate, strength as a result of removing inherent manufacture and handling flaws. Transverse tension strength was sensitive to span length due to the classical weakest link effect. However, strength was less sensitive to volume changes achieved by increasing specimen width. The Weibull scaling law over-predicted changes in transverse tension strengths in three point bend tests and under-predicted changes in transverse tension strengths in four point bend tests. Furthermore, the Weibull slope varied with specimen configuration, volume, and sample size. Hence, the utility of this scaling law for predicting transverse tension strength is unclear.

OBrien, T. Kevin↗
NASA NTRS1986

Effects of specimen preparation on the electromagnetic property measurements of solid materials with an automatic network analyzer

Effects of specimen preparation on measured values of an acrylic's electomagnetic properties at X-band microwave frequencies, TE sub 1,0 mode, utilizing an automatic network analyzer have been studied. For 1 percent or less error, a gap between the specimen edge and the 0.901-in. wall of the specimen holder was the most significant parameter. The gap had to be less than 0.002 in. The thickness variation and alignment errors in the direction parallel to the 0.901-in. wall were equally second most significant and had to be less than 1 degree. Errors in the measurement f the thickness were third most significant. They had to be less than 3 percent. The following parameters caused errors of 1 percent or less: ratios of specimen-holder thicknesses of more than 15 percent, gaps between the specimen edge and the 0.401-in. wall less than 0.045 in., position errors less than 15 percent, surface roughness, hickness variation in the direction parallel to the 0.401-in. wall less than 35 percent, and specimen alignment in the direction parallel to the 0.401-in. wall mass than 5 degrees.

Long, E. R., Jr.↗
NASA NTRS2001

Specimens Prepared for Materials International Space Station Experiment

The Materials International Space Station Experiment (MISSE) is a materials flight experiment sponsored by the Materials and Manufacturing Directorate of the Air Force Research Laboratory at Wright-Patterson Air Force Base and the NASA Space Environmental Effects Program at the NASA Marshall Space Flight Center. MISSE is a cooperative effort among the Air Force, several NASA field centers, and industry. The experiment package will be placed on the exterior of the International Space Station in the summer of 2001. Approximately half of the specimens will be exposed to the space environment for 1 year, and the other half will be exposed for 3 years. The Electro-Physics Branch at the NASA Glenn Research Center has prepared and delivered over 150 specimens to be included in MISSE. Specimens include: 1) Double-coated polyimide Kapton to compare mass loss from in-space atomic oxygen undercutting erosion to ground-laboratory atomic oxygen undercutting erosion for predicting in-space durability; 2) Silicones to study changes in surface hardness and optical properties after combined atomic oxygen--ultraviolet radiation exposure for predicting in-space durability; 3) Forty-one different polymers to accurately measure their atomic oxygen erosion yields; 4) Scattering chambers to study atomic oxygen scattering characteristics that are relevant to the degradation found in spacecraft with exterior openings; 5) Thin polymer film disks and tensile specimens to study the effects of radiation on their optical properties and mechanical properties; 6) Lightweight intercalated graphite epoxy composites to study electromagnetic interference shielding performance; and 7) Polymer-based materials utilizing new atomic oxygen protection concepts to study their durability.

Banks, Bruce A.↗
NASA NTRS1977

Carbon distribution profiles in lunar fines

Radial distribution profiles of elemental carbon in lunar soils consisting of particles in the size range of 50 to 150 microns were investigated. Initial experiments on specimen preparation and the analysis of prepared specimens by Auger electron spectrometry (AES) and scanning electron microscopy (SEM) are described. Results from splits of samples 61501,84 and 64421,11, which were mounted various ways in several specimen holders, are presented. A low carbon content was observed in AES spectra from soil particles that were subjected to sputter-ion cleaning with 960eV argon ions for periods of time up to a total exposure for one hour. This ion charge was sufficient to remove approximately 70 nm of material from the surface. All of the physically adsorbed carbon (as well as water vapor, etc.) would normally be removed in the first few minutes, leaving only carbon in the specimen, and metal support structure, to be detected thereafter.

Hart, R. K.↗
NASA NTRS1973

Bidirectional reflectance of zinc oxide

This investigation was undertaken to determine original and useful information about the bidirection reflectance of zinc oxide. The bidirectional reflectance will be studied for the spectra between .25-2.5 microns and the hemisphere above the specimen. The following factors will be considered: (1) surface conditions; (2) specimen preparation; (3) specimen substrate, (4) polarization; (5) depolarization; (6) wavelength; and (7) angles of incident and reflection. The bidirectional reflectance will be checked by experimentally determined angular hemispherical measurements or hemispherical measurements will be used to obtain absolute bidirectional reflectance.

Scott, R.↗
NASA NTRS2007

An Improved Technique for the Preparation of Mounted or Unmounted Carbon/Epoxy Specimens

As carbon/epoxy materials became more prevalent in the aerospace industry, microstructural analysis demanded specimen preparation techniques that led to better polished surfaces, achievable in a shorter time, and using fewer steps. The desire to use image analysis for material characterization also helped drive the goal for defect free surfaces. At NASA-Langley (LaRC), carbon/epoxy specimens had been historically prepared in 1 inch diameter Bakelite mounts. Carbon/epoxy specimens that were 1/8 to 1/4 inch thick were not affected by the heat and pressure required for mounting in Bakelite, however thinner specimens were crushed during mounting. A two-part room temperature curing epoxy was chosen as an alternative but sometimes voids developed between the specimen and the mounting material. This was prevented by either heating the epoxy to 140 degrees F to lower the viscosity of the epoxy or by using a vacuum impregnation apparatus. Both techniques helped facilitate flow and allowed the epoxy to penetrate crevices.

Edahl, Robert A., Jr.↗
NASA NTRS2004

Focused Ion Beam Recovery and Analysis of Interplanetary Dust Particles (IDPs) and Stardust Analogues

Meteoritics research is a major beneficiary of recent developments in analytical instrumentation [1,2]. Integrated studies in which multiple analytical techniques are applied to the same specimen are providing new insight about the nature of IDPs [1]. Such studies are dependent on the ability to prepare specimens that can be analyzed in multiple instruments. Focused ion beam (FIB) microscopy has revolutionized specimen preparation in materials science [3]. Although FIB has successfully been used for a few IDP and meteorite studies [1,4-6], it has yet to be widely utilized in meteoritics. We are using FIB for integrated TEM/NanoSIMS/synchrotron infrared (IR) studies [1].

Graham, G. A.↗
NASA NTRS2003

Preparation of Regular Specimens for Atom Probes

A method of preparation of specimens of non-electropolishable materials for analysis by atom probes is being developed as a superior alternative to a prior method. In comparison with the prior method, the present method involves less processing time. Also, whereas the prior method yields irregularly shaped and sized specimens, the present developmental method offers the potential to prepare specimens of regular shape and size. The prior method is called the method of sharp shards because it involves crushing the material of interest and selecting microscopic sharp shards of the material for use as specimens. Each selected shard is oriented with its sharp tip facing away from the tip of a stainless-steel pin and is glued to the tip of the pin by use of silver epoxy. Then the shard is milled by use of a focused ion beam (FIB) to make the shard very thin (relative to its length) and to make its tip sharp enough for atom-probe analysis. The method of sharp shards is extremely time-consuming because the selection of shards must be performed with the help of a microscope, the shards must be positioned on the pins by use of micromanipulators, and the irregularity of size and shape necessitates many hours of FIB milling to sharpen each shard. In the present method, a flat slab of the material of interest (e.g., a polished sample of rock or a coated semiconductor wafer) is mounted in the sample holder of a dicing saw of the type conventionally used to cut individual integrated circuits out of the wafers on which they are fabricated in batches. A saw blade appropriate to the material of interest is selected. The depth of cut and the distance between successive parallel cuts is made such that what is left after the cuts is a series of thin, parallel ridges on a solid base. Then the workpiece is rotated 90 and the pattern of cuts is repeated, leaving behind a square array of square posts on the solid base. The posts can be made regular, long, and thin, as required for samples for atom-probe analysis. Because of their small volume and regularity, the amount of FIB-milling time can be much less than that of the method of sharp shards. Individual posts can be broken off for mounting in a manner similar to that of the method of sharp shards. Alternatively, the posts can be left intact on the base and the base can be cut to a small square (e.g., 3 by 3 mm) suitable for mounting in an atom probe of a type capable of accepting multiple-tip specimens. The advantage of multiple-tip specimens is the possibility of analyzing many tips without the time-consuming interchange of specimens.

Kuhlman, Kim↗
NASA NTRS2021

Interpretation of Zerodur® Strength Data

Recent, detailed fractographic analysis of Zerodur® strength test specimens prepared by linear grinding and etching with a proprietary process indicated low frequency damage to be the strength limiting defects Recent, detailed fractographic analysis of Zerodur® strength test specimens prepared by linear grinding and etching with a proprietary process indicated low frequency damage to be the strength limiting defects [1]. The 2-parameter Weibull distribution is usually assumed when working with ceramic and glasses such as Zerodur®, although 3-parameter behavior is occasionally considered [2]. Detailed statistical modeling of the Zerodur® strength data with the was initial perspective of a 3-parameter Weibull distribution gave unsatisfying results [3]. The subsequent fractographic investigation indicated [1] that the usual assumption of many small, random, noninteracting flaws [4] was not represented, but instead, less frequent, aligned flaws along etching ridges parallel to the grinding direction were present, Figure 1. It was thus concluded that the strength of Zerodur® as prepared was not Weibull distributed. The flaws represent a sparse flaw population relative to typical grinding damage, but an extensive occurrence (high frequency) of handling damage. We examine the type of distribution present and explain the appearance of a 3-parameter distribution.

Glass, ceramic, strength, Weibull, distribution, m↗
NASA NTRS1992

X-Ray Microanalysis and Electron Energy Loss Spectrometry in the Analytical Electron Microscope: Review and Future Directions

This paper reviews and discusses future directions in analytical electron microscopy for microchemical analysis using X-ray and Electron Energy Loss Spectroscopy (EELS). The technique of X-ray microanalysis, using the ratio method and k(sub AB) factors, is outlined. The X-ray absorption correction is the major barrier to the objective of obtaining I% accuracy and precision in analysis. Spatial resolution and Minimum Detectability Limits (MDL) are considered with present limitations of spatial resolution in the 2 to 3 microns range and of MDL in the 0.1 to 0.2 wt. % range when a Field Emission Gun (FEG) system is used. Future directions of X-ray analysis include improvement in X-ray spatial resolution to the I to 2 microns range and MDL as low as 0.01 wt. %. With these improvements the detection of single atoms in the analysis volume will be possible. Other future improvements include the use of clean room techniques for thin specimen preparation, quantification available at the I% accuracy and precision level with light element analysis quantification available at better than the 10% accuracy and precision level, the incorporation of a compact wavelength dispersive spectrometer to improve X-ray spectral resolution, light element analysis and MDL, and instrument improvements including source stability, on-line probe current measurements, stage stability, and computerized stage control. The paper reviews the EELS technique, recognizing that it has been slow to develop and still remains firmly in research laboratories rather than in applications laboratories. Consideration of microanalysis with core-loss edges is given along with a discussion of the limitations such as specimen thickness. Spatial resolution and MDL are considered, recognizing that single atom detection is already possible. Plasmon loss analysis is discussed as well as fine structure analysis. New techniques for energy-loss imaging are also summarized. Future directions in the EELS technique will be the development of new spectrometers and improvements in thin specimen preparation. The microanalysis technique needs to be simplified and software developed so that the EELS technique approaches the relative simplicity of the X-ray technique. Finally, one can expect major improvements in EELS imaging as data storage and processing improvements occur.

Goldstein, J. I.↗
NASA NTRS1981

Failure of morphology of (0 deg)8 graphite/epoxy as influenced by environments and processing

Optical and scanning electron microscopy were used to investigate the failure morphology of graphite/epoxy specimens which had been tested until tensile failure. Failure morphology was studied as a function of the quality control variables of specimen preparation technique, prepreg batch, and cure condition, and also as a function of the environmental parameters of temperature and moisture content. Defective specimens were found to exhibit a low energy failure morphology. Poor specimen edge preparation and one batch of prepreg when tested at elevated temperature or moisture content also exhibited energy failure morphology. Postcuring had no effect on strength but did slightly alter failure morphology. Temperature or moisture appeared to decrease flaw sensitivity and thus increase strength; however, moisture also appeared to increase interfacial debonding between filament and matrix. When combined moisture and temperature increased interfacial debonding and made the epoxy matrix more prone to fracture.

Clements, L. L.↗
NASA NTRS1994

Preparation And Analysis Of Specimens Of Ablative Materials

Procedure for chemical analysis of specimens of silicone-based ablative thermal-insulation materials SLA-561 and MA25 involves acid digestion of specimens to prepare them for analysis by inductively-coupled-plasma/atomic-emission spectroscopy (ICP/AES). In comparison with atomic-absorption spectroscopy (AAS), ICP/AES is faster and more accurate than AAS. Results of analyses stored in data base, used to trace variations in concentrations of chemical elements in materials during long-term storage, and used in timely manner in investigations of failures. Acid-digestion portion of procedure applied to other thermal-insulation materials containing room-temperature-vulcanizing silicones and enables instrumental analysis of these materials.

Solomon, William C.↗
NASA NTRS1988

Fatigue Lives Of Laser-Cut Metals

Fatigue lives made to approach those attainable by traditional grinding methods. Fatigue-test specimens prepared from four metallic alloys, and material removed from specimens by manual grinding, by Nd:glass laser, and by Nd:YAG laser. Results of fatigue tests of all specimens indicated reduction of fatigue strengths of laser-fired specimens. Laser machining holds promise for improved balancing of components of gas turbines.

Martin, Michael R.↗
NASA NTRSDate not supplied

A New Coordinated NanoSIMS, Transmission Electron Microscopy and Atom Probe Tomography Approach For the Characterization of Primitive Astromaterials

Presolar grains are remnants of evolved stellar systems preserved within primitive extraterrestrial materials. They are important for studying physical and chemical processing, and formation mechanisms occurring within the interstellar medium, Solar Nebula and their parent stellar environments [1]. Our recent work has shown coordinated nano-scale Secondary Ion Mass Spectrometry (NanoSIMS) and Atom Probe Tomography (APT) can show isotopic and chemical signatures at major to trace levels, morphological signatures, and regional contextual relationships [2,3]. Previous studies have shown Transmission Electron Microscopy (TEM) of Focus Ion Beam (FIB) TEM lamella, can provide localized contextual relationships, crystallographic information and chemical information [1]. Coordinating NanoSIMS, TEM, and APT could gain access to almost all contextual, structural and geochemical signatures within each presolar grain. However, this has proved challenging owing to the preparation requirements for TEM and APT. For example, studying specimen prepared as APT needles in TEM removes the local context, the higher degree of surface exposure can alter the chemistry of beam sensitive materials, and the shank angle of the needle can impact the quality of TEM diffraction images. We designed a new FIB method which takes a 100 nm thick FIB-TEM lamella and sandwiches it between two indium slices (5 μm x ~300 nm x 3 μm). The indium is melted onto the lamella surface using the electron beam (Fig 1). This process adds bulk to the lamella, making it more amenable to APT needle formation (Fig 2). Consequently, samples can be prepared per the optimal requirements for each technique improving data quality, acquisition stability, and access to the signatures and relationships summarised earlier. This technique can be used for measuring multiple phases across a TEM lamella and targeting an individual phase. For example, a presolar grain identified in NanoSIMS could be targeted, studied in TEM and then indium sandwiched with its precise location in the TEM lamella marked using a Pt button for preparation of an APT needle and atomic scale acquisition. [1] A. M. Davis (2014) Meteorites and cosmochemical processes, 1. [2] Nevill N. et al. (2023) LPSC, 54, #1707. [3] Nevill N. et al. (2023) LPSC, 54, #1714.

NanoSIMS↗
NASA NTRS1986

Fractography of unidirectional graphite-epoxy as a function of moisture, temperature and specimen quality

Optical microscopy and SEM have been used to examine the tensile failure surfaces of (0-deg)8 T300/5208 graphite-epoxy specimens, and fractography is employed to determine how moisture content and temperature, together with specimen preparation, affect failure modes. A low energy failure morphology is noted in defective specimens; specimens made from nondefective prepregs appeared to exhibit a decrease in flaw sensitivity and increasing strength with either temperature or moisture, although moisture also seemed to increase interfacial debonding between filament and matrix. The combination of temperature and moisture degraded performance by increasing interfacial debonding, and rendering the epoxy more prone to fracture.

Clements, L. L.↗