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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2022

Extended Accelerated Stress Testing (EAST) of Glass/Glass, Glass/Backsheet and Glass/Transparent Backsheet PV Modules: Influence of EVA and POE Encapsulants: Preprint

This paper presents the indoor extended accelerated stress testing (EAST) results of glass/glass (GG), glass/backsheet (GB) and glass/transparent backsheet (GT) modules having identical cells and two different encapsulant types, ethyl-vinyl-acetate (EVA) and polyolefin-elastomer (POE). Six 4-cell modules having the above-mentioned construction combinations were subjected to extended ultraviolet (UV; 600 kWh/m2), damp-heat (DH; 2000 hours) and thermal-cycling (TC; 600 cycles) tests. The post-stress UV fluorescent imaging, electroluminescent imaging, reflectance spectrophotometry and colorimetry results indicated that the grid finger degradation and encapsulant browning are slightly higher in the GG modules compared to the GB modules. The post-stress IV test results indicated, in general, that the GG/EVA modules tend to perform inferior to the GG/POE modules with the EAST evaluation.

EVA↗
DOE OSTI2021

Failure Analysis of a New Polyamide-Based Fluoropolymer-Free Backsheet After Combined-Accelerated Stress Testing

The viability of novel coextruded, fluoropolymer-free backsheets for photovoltaic (PV) modules has been questioned as a result of a large number of early-life backsheet failures in PV installations containing one of the earliest co-extruded polyamide (PA)-based backsheet to reach the market, “AAA.” New PV reliability testing protocols have been recently developed and applied to backsheets to reproduce failures observed in the field and evaluate the durability of novel backsheet materials and designs prior to commercialization. A new co-extruded PA-based backsheet was tested using combined-accelerated stress testing (C-AST) and demonstrated a greater lifetime than AAA, and some other fluoropolymer-based backsheets such as polyvinylidene fluoride. The improved PA-based backsheet also eventually failed by through-thickness cracking. Using surface and bulk material characterization techniques, we performed a comprehensive study of material properties before and after the stress testing. Aging of the backsheet resulted in an increase of surface roughness by erosion of the outer PA layer. However the failure is more likely related to an increase in crystallinity of the polyolefin core layer reducing the backsheet tearing energy. The analysis can ultimately inform on the specific weaknesses of the materials so that the manufacturer can improve the backsheet design to extend its lifetime.

14 SOLAR ENERGY↗
DOE OSTI2023

Accelerated Stress Testing of Perovskite Photovoltaic Modules: Differentiating Degradation Modes with Electroluminescence Imaging

Herein, electroluminescence (EL) and thermal imaging are used to examine p–i–n metal halide perovskite (MHP) photovoltaic (PV) mini-modules (MA0.6FA0.4PbI3, 20 cells, 78 cm2) before and after indoor-accelerated stress testing or outdoor deployment. Distinct spatial patterns in the EL images emerge, which depend on the external stress conditions experienced by the mini-module. Imaging results highlight a distribution of dark speckle features that dominate after UV stress, attributed to widespread interfacial contact degradation. Lateral intensity gradients across cells dominate after thermal cycling (TC) stress, attributed to current crowding near scribe defects. While current–voltage analysis alone does not give full insight on the degradation process, this study shows that distinct degradation modes can be further defined by multimodal electro-optical imaging (i.e., EL combined with photoluminescence and dark lock-in thermography). Neither UV exposure nor TC-accelerated stress testing alone replicates the same degradation signatures observed after outdoor deployment, suggesting that multiple degradation modes occur under concurrent stressors outdoors. Finally, spatial characterization of degradation modes in MHP PV mini-modules before and after accelerated stress testing lays the groundwork for developing targeted accelerated stress testing procedures through comparison with outdoor aging.

14 SOLAR ENERGY↗
DOE OSTI2022

Electrolyzer Performance Loss from Accelerated Stress Tests and Corresponding Changes to Catalyst Layers and Interfaces

Stress tests are developed for proton exchange membrane electrolyzers that utilize low catalyst loading, elevated potential, and frequent cycling with square- and triangle-waves to accelerate anode catalyst layer degradation during intermittent operation. Kinetics drive performance losses (ohmic/transport secondary) and are accompanied by decreasing exchange current density, decreasing cyclic voltammetric capacitance, and increasing polarization resistance. Decreased kinetics are likely due to a combination of iridium (Ir) migration into electrochemically inaccessible locations in the anode or membrane, Ir particle growth (supported by X-ray scattering), changes in the extent of the Ir oxidation state (supported by X-ray absorption spectroscopy), and anode catalyst layer reordering. Decreasing catalyst/transport layer contact and catalyst/membrane interfacial tearing may add contact resistances and account for increasing ohmic losses. Performance losses for low and moderate catalyst loading, as well as from accelerated and model wind/solar cycling protocols, were likewise dominated by kinetics but vary in severity. Additionally, accelerated cycling (1 cycle per minute) appears to reasonably accelerate relevant loss mechanisms and can be used to project electrolyzer lifetime from anode deterioration. Ongoing accelerated stress test development and studies into performance loss mechanisms will continue to be critical as electrolysis shifts to intermittent power and low-cost applications.

30 DIRECT ENERGY CONVERSION↗
DOE OSTI2026

Combined-Accelerated Stress Testing of Photovoltaic Materials

By applying multiple environmental stresses in fieldrepresentative combinations and sequences, combined-accelerated stress testing (CAST) identifies degradation modes and failure mechanisms of photovoltaic (PV) modules and components that are missed by single stress factor accelerated testing.

14 SOLAR ENERGY↗
DOE OSTI2023

Acceleration Factors for Combined‐Accelerated Stress Testing of Photovoltaic Modules

Combined‐accelerated stress testing (C‐AST) is developed to establish the durability of photovoltaic (PV) products, including for degradation modes that are not a priori known or examined in standardized tests. C‐AST aims to comprehensively represent the sample, stress factors, and their combinations using levels at the statistical tails of the natural environment. Acceleration factors for relevant climate sequences within the C‐AST cycle with respect to the Florida USA climate are estimated for selected degradation mechanisms. It is found that for degradation of the outer backsheet polymer layer, the acceleration factor of the tropical climate sequence (the longest of the climate sequences) is f ( T , G ) = 17.3 with ultraviolet photodegradation; for polyethylene terephthalate hydrolysis (backsheets), f ( T , RH ) = 426; for electrochemical corrosion (PV cell), f ( I ) = 14.1; and for PbSn solder fatigue f (Δ T , r ( T )) = 17.3. Here, T is the module temperature, G is the broadband spectrum irradiance on the plane of array of the module, RH is the relative humidity on the module surface, I is the leakage current through the module packaging, and r ( T ), the number of temperature reversals. The methods discussed herein are generally applicable for evaluating acceleration factors in other accelerated test methods.

14 SOLAR ENERGY↗
DOE OSTI2020

In-Situ Measurement of Power Loss for Crystalline Silicon Modules Undergoing Thermal Cycling and Mechanical Loading Stress Testing

An in-situ method is proposed for monitoring and estimating the power degradation of mc-Si photovoltaic (PV) modules undergoing thermo-mechanical degradation tests that primarily manifest through cell cracking, such as mechanical load tests, thermal cycling and humidity freeze tests. The method is based on in-situ measurement of the module’s dark current-voltage (I-V) characteristic curve during the stress test, as well as initial and final module flash testing on a Sun simulator. The method uses superposition of the dark I-V curve with final flash test module short-circuit current to account for shunt and junction recombination losses, as well as series resistance estimation from the in-situ measured dark I-Vs and final flash test measurements. The method is developed based on mc-Si standard modules undergoing several stages of thermo-mechanical stress testing and degradation, for which we investigate the impact of the degradation on the modules light I-V curve parameters, and equivalent solar cell model parameters. Experimental validation of the method on the modules tested shows good agreement between the in-situ estimated power degradation and the flash test measured power loss of the modules, of up to 4.31 % error (RMSE), as the modules experience primarily junction defect recombination and increased series resistance losses. However, the application of the method will be limited for modules experiencing extensive photo-current degradation or delamination, which are not well reflected in the dark I-V characteristic of the PV module.

14 SOLAR ENERGY↗
DOE OSTI2021

Towards Validation of Advanced Accelerated Stress Testing Protocols through Failure Analysis and Materials Characterization

As the lifetime of photovoltaic modules increases toward the goal of 50 years, accelerated stress testing is critical to assessing the viability of newer, improved, and often cheaper materials in the field. However, the validation of accelerated testing to reproduce field failure has remained elusive. The recent developments of more advanced stress testing protocols utilizing sequential and combined stressors have provided another opportunity for validation. Using a suite of mechanical, chemical, and structural characterization methods we report the development of our approach using a known bad backsheet “AAA.” We then apply this approach to PVDF-based backsheets to further confirm the generalizability of this approach. The outcome of this work is two-fold: (1) validation of advanced accelerated testing protocols which will enable the prediction of field failures in new materials, and (2) deeper insights into the degradation mechanisms observed through the extensive characterization allowing for improved materials engineering and development.

accelerated aging↗
DOE OSTI2024

Assessment of Accelerated Stress Testing Data for Silicon Photovoltaics Using Tensor Decomposition Methods

The photovoltaic (PV) industry is simultaneously targeting long warranties and new materials/designs for high-energy-yield modules, requiring an advanced methodology to forecast long-term durability of products with un-proven materials combinations. Extended, sequential, and combined stress testing methods are gaining popularity for assessing durability of PV modules/materials beyond the early-stage mortalities. Importantly, multiple degradation mechanisms can proceed simultaneously, and their separate contributions to the overall power loss should ideally be quantified. This work examines the use of data-driven tools towards developing a strategy for faster learning cycles in accelerated stress testing.

accelerated stress testing↗
DOE OSTI2024

Assessment of Accelerated Stress Testing Data for Silicon Photovoltaics Using Tensor Decomposition Methods

In this work, we examine the use of high-order tensor decompositions to analyze degradation pathways emerging from accelerated stress testing of silicon photovoltaic (PV) modules. Matrix-based decompositions are powerful tools for studying two-dimensional data arrays and form the foundation of a host of classical data analysis techniques. Tensors are high-order extrapolations of matrices that are able to account for more parameter dimensions, and a variety of tensor decomposition methods have been developed that similarly seek to extend insights from matrix decompositions to higher dimensions. Applying and interpreting tensor decomposition methods to sequences of PV module image data, we seek to uncover and isolate different degradation modes occurring from accelerated stress testing procedures. Further, we consider the contributions of different modes to PV module performance degradations.

data analysis↗
DOE OSTI2023

PV encapsulant formulations and stress test conditions influence dominant degradation mechanisms

Polyethylene-based poly(ethylene-co-vinyl acetate) (EVA), polyolefin elastomer (POE), and thermoplastic polyolefin (TPO) are common polymer candidates for photovoltaic (PV) module encapsulants. The choice of encapsulant must be carefully considered in novel module designs, such as bifacial glass/glass laminates, to limit performance degradation through loss of optical transmittance, mechanical integrity, and corrosion - as well as potential-induced degradation. Encapsulant quality and resilience against environmental stressors are readily influenced by the additives in the encapsulant formulation. Here, we show that, the changes in optical transmittance after UV aging result from the discoloration caused by interactions between additives, and optical scattering from changes in the polymer crystal structure. We observed competing cross-linking and chain scission mechanisms, with their kinetics influenced by the presence of oxygen and elevated temperatures. Increasing chamber temperatures from 55 °C to 85 °C during the UV stress test amplified encapsulant discoloration and promoted polymer cross-linking, causing severe, irreversible damage that remains to be proven field relevant. Damp heat aging was found to be insufficient to produce significant encapsulant degradation; however, combining stress tests sequentially allowed detection of further degradation beyond the limitations of the damp heat test alone. Appropriate degradation screening methods are necessary to uncover potential encapsulant weaknesses.

14 SOLAR ENERGY↗
DOE OSTI2022

Evaluation of bifacial module technologies with combined–accelerated stress testing

In view of the increasing interest and market share of bifacial cells and modules, suitable substrates such as glass and transparent backsheets along with ethylene vinyl acetate (EVA) and polyolefin elastomer (POE) encapsulants were examined in combined-accelerated stress testing (C-AST) to evaluate and compare degradation modes. Testing with both monofacial and bifacial cells, we found glass-glass modules with monofacial cells led to greater grid finger breakage than those with polymeric backsheets. Furthermore, this is attributed to previous X-ray topography and modeling work showing higher stress in cells and interconnections in glass-glass modules than glass-backsheet modules. Consistent with the objectives of C-AST, which stresses modules at levels corresponding to the limits seen in the natural environment, we observed the UV-fluorescence signatures of modules tested in C-AST (considering the degradation associated with developing chromophores, moisture penetration and photobleaching effects) to be like those in fielded modules, more so than other chamber stress testing implemented for comparison. We found light-induced degradation (LID) in module types with regenerated (inactive) cells with C-AST, suggesting the possibility of LID destabilization in some field conditions. We could also distinguish potential-induced degradation (PID) on the back of the bifacial passivated emitter and rear cells (PERC) in C-AST. Confirming with ex-situ tests, we found polarization-type PID most prevalent in glass-glass modules with EVA as would be anticipated considering the greater leakage current through such module encapsulation. Unlike PID tests performed in the dark, which can lead to false positive PID test results, field-representative illumination is experienced by the modules on the front and back side while –1200 V system voltage is applied in C-AST, supporting the conclusion that this module type with glass-glass construction would be susceptible to PID in the field.

14 SOLAR ENERGY↗
DOE OSTI2021

Towards validation of combined-accelerated stress testing through failure analysis of polyamide-based photovoltaic backsheets

Abstract Novel methods for advancing reliability testing of photovoltaic (PV) modules and materials have recently been developed. Combined-accelerated stress testing (C-AST) is one such method which has demonstrated reliable reproduction of some field-failures which were not reproducible by standard certification tests. To increase confidence and assist in the development of C-AST, and other new testing protocols, it is important to validate that the failure modes observed and mechanisms induced are representative of those observed in the field, and not the product of unrealistic stress conditions. Here we outline a method using appropriate materials characterization and modelling to validate the failure mechanisms induced in C-AST such that we can increase confidence in the test protocol. The method is demonstrated by applying it to a known cracking failure of a specific polyamide (PA)-based backsheet material. We found that the failure of the PA-based backsheet was a result of a combination of stress factors. Photo-oxidation from ultra-violet (UV) radiation exposure caused a reduction in fracture toughness, which ultimately lead to the cracking failure. We show that the chemical and structural changes observed in the backsheet following C-AST aging were also observed in field-aged samples. These results increase confidence that the conditions applied in C-AST are representative of the field and demonstrates our approach to validating the failure mechanisms induced.

14 SOLAR ENERGY↗
DOE OSTI2022

Evaluation of Bifacial Modules and PV Technologies with Combined-Accelerated Stress Testing

In view of the increasing interest and market share of bifacial cells and modules, suitable substrates such as glass and transparent backsheets along with ethylene vinyl acetate (EVA) and polyolefin elastomer (POE) encapsulants were examined in combined-accelerated stress testing (C-AST) to evaluate and compare degradation modes. Testing with both monofacial and bifacial cells, we found glass-glass modules with monofacial cells led to greater grid finger breakage than those with polymeric backsheets. This is attributed to previous x-ray topography work showing higher stress in cells in glass-glass modules than glass backsheet modules. Consistent with the objectives of C-AST, which stresses modules at levels corresponding to the limits seen in the natural environment, we observed the UV-fluorescence signatures of modules tested in C-AST (considering the degradation associated with developing chromophores, moisture penetration and photobleaching effects) to be like those in fielded modules, more so than other chamber stress testing implemented for comparison. Finally, among multiple cell degradation modes that we observed such as light-induced degradation (LID), we differentiated susceptibility to potential-induced degradation (PID) on the back of the bifacial Passivated Emitter Back Cells (PERC) in C-AST. Confirming with ex-situ tests, we found polarization-type PID most prevalent in glass/glass modules with EVA as would be anticipated considering the greater leakage current through such module encapsulation. Unlike PID tests performed in the dark, which can lead to false positive PID test results, field-representative illumination is experienced by the modules on the front and back side while -1200 V system voltage is applied in C-AST, supporting the conclusion that this module type would be susceptible to PID in the field.

bifacial modules↗
DOE OSTI2022

Investigating the Particle Growth in Bimodal Pt/C Catalysts by In-Situ Small-Angle X-ray Scattering: Challenges in the Evaluation of Stress Test Protocol-Dependent Degradation Mechanisms

The influence of different combinations of accelerated stress test (AST) protocols simulating load-cycle and start/stop conditions of a proton exchange membrane fuel cell (PEMFC) vehicle is investigated on a bimodal Pt/C catalyst. The bimodal Pt/C catalyst, prepared by mixing two commercial catalysts, serves as a model system and consists of two distinguishable size populations. The change in mean particle size was investigated by in situ small-angle X-ray scattering (SAXS). The comparison to the reference catalysts, i.e., the two single-size population catalysts, uncovers the presence of electrochemical Ostwald ripening as a degradation mechanism in the bimodal catalyst. Increasing the harshness of the applied AST protocol combinations by faster changing between load-cycle or start/stop conditions, the particle size of the larger population of the bimodal catalyst increases faster than expected. Surprisingly, the change in mean particle size of the smaller size population indicates a smaller increase for harsher AST protocols, which might be explained by a substantial electrochemical Ostwald ripening.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
DOE OSTI2022

PACT Perovskite PV Module Stress Testing Protocol (Version 0.0)

The purpose of this protocol is to use accelerated stress testing to assess the durability of metal halide perovskite (MHP) photovoltaic (PV) modules. The protocol aims to apply field relevant stressors to packaged MHP modules to screen for early failures that may be observed in the field. The current protocol has been designed with a glass/glass-PIB edge seal, no encapsulant package in mind. PACT anticipates adding additional testing sequences to evaluate additional stressors (e.g., PID, reverse bias) in the future.

42 ENGINEERING↗