Optimizing exposure times of structured light metrology systems using a digital twin
Not Available
36 MATERIALS SCIENCE↗
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Results for “structured light metrology”
Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Cutting force and stability for inserted cutters using structured light metrology
This paper describes force and stability prediction for inserted end and face mills using a reverse engineering approach. Structured light scanning is used to identify the spatial coordinates of the points that define the multiple insert cutting edges. These points are used to extract the cutting edge radius and angle and are then incorporated in a time domain simulation that predicts cutting force and tool/workpiece deflection for user-selected operating parameters. Good agreement between predicted and measured cutting forces is demonstrated. The process stability is then predicted using the validated force model and measured structural dynamics.
Machining↗
Hybrid manufacturing of Invar mold for carbon fiber layup using structured light scanning
This paper describes coordinate system definition and transfer for five-axis machining of additively-manufactured preforms. In this method, a set of fiducials are attached to the temporarily attached to the part, and their location relative to the preform geometry is calibrated using a structured light scanner. Those fiducials can then be measured in the machine tool to determine the location and orientation of the part. The method is demonstrated by finish-machining a carbon fiber layup mold from an additively manufactured Invar preform. In addition to showing the coordinate transfer methods necessary to machine the part, several key challenges with machining additively-manufactured preforms are discussed and potential solutions are proposed. Unfortunately, the final part was ultimately unusable due to porosity inside the part left from the additive process. Future work will remanufacture this part while taking steps to avoid porosity and other challenges encountered.
36 MATERIALS SCIENCE↗
Structured light scanning artifact-based performance study
Structured light scanning is used to create a digital twin of a manufactured part, where features are extracted to determine if the part meets the designer’s intent and required tolerances. This paper describes repeatability and reproducibility analyses for a commercially-available structured light scanning system and measurement artifact. The repeatability study used five repeated scans at 15 measurement positions. Repeatability was assessed by randomly selecting one of the five scans at each of the 15 positions and creating a part mesh. This process was performed 50 times and the statistics for the dimension variations were calculated to isolate the scanning effects only. The same sequence was then performed for 10 of the 15 positions and five of the 15 positions to evaluate the repeatability sensitivity to the number of measurement positions. Reproducibility was assessed by selecting 15 positions to create a mesh and repeating the 15-position measurement sequence 10 times using different positions for each mesh construction. The statistics for the dimension variations were then calculated. This incorporated the effects of both scanning and the position and orientation of the part relative to the scanner. This sequence was repeated for 10-position and five-position scans to evaluate the corresponding sensitivity. Finally, the artifact dimensions from structured light scanning were compared to coordinate measuring machine measurements of the same features.
42 ENGINEERING↗
Complete spectroscopy in the attosecond regime
Harnessing light waveforms at attosecond time scales provides information of the structure and dynamics of matter on it's natural time scales. For this reason attosecond metrology has been at the forefront of the optical sciences for more than a decade, and it represents the latest time-domain frontier of the quantum world. Attosecond light pulses are commonly generated using higher-order harmonic generation (HHG) , a process capable of generating XUV coherent pulses. In addition to generate attosecond pulses, HHG can be used to study the structure and dynamics of atoms and molecules by analyzing the spectral content of the XUV pulses. This approach is known as HHG spectroscopy and it provides a coherent, time-dependent approach to study structure and dynamics in the quantum world. In this proposal we will generate harmonics from two optical foci produced by a system of a two-dimensional spatial light modulator (SLM) and a lens. In the far eld the train of attosecond pulses will interfere creating harmonic-dependent fringes. The position of such fringes is a direct measurement of the relative phase between the two foci and they also carry information about the quantum state of the target atom or molecule. Therefore, by measuring the amplitude and relative phase of the emitted harmonics we will have access to both, the amplitude and phase of the dipole moments of the studied target. Because the two beams are completely indistinguishable from each other up to a few millimeters from the focus, both driving pulses share the exact beam path. So far we have measured a jitter of 700 zeptoseconds with a 12.5 attosecond resolution in the delay control of the two foci. These two time scales represent some of the best time controls ever achieved to date.
74 ATOMIC AND MOLECULAR PHYSICS↗
Correlation approach for quality assurance of additive manufactured parts based on optical metrology
Surface topography and surface finish are two significant factors for evaluating the quality of products in additive manufacturing (AM). AM parts are fabricated layer by layer, which is quite different from traditional formative or subtractive methods. Despite rapid progress in additive manufacturing and associated optical metrology for quality control and in-situ monitoring, limited research has been conducted to investigate the reliability of 3D surface measurement data. The surface topologies scanned by multiple optical systems demonstrated significant differences due to varying sampling mechanisms, resolutions, system noises, etc. The 3D datasets should be trustworthy in order to extract parameters for quality assurance or feedback control from 3D surface measurements. In this paper, we set up new standards to evaluate the reliability of 3D surface measurement data and analyze the variation in the topographical profile. In this study, two non-contact optical methods based on Focus Variation Microscopy (FVM) and Structured Light System (SLS) were adopted to measure the surface topography of the target components. The two optical metrology systems generated two entirely different point cloud datasets. Statistical methods were applied to test the difference between the data obtained from the two systems. By using a data analytics approach for comparison, it was found that the surface roughness estimated from the point cloud data sets of FVM and SLS has no significant difference, though the point cloud data sets were completely different. This paper provides standard validation approach to evaluate the plausibility of metrology data from in-situ real-time surface analysis for process planning of AM.
36 MATERIALS SCIENCE↗
Collimated phase measuring deflectometry II: Re-design of the optical layout for high-curvature surfaces
Collimated phase measuring deflectometry (CPMD) is an optical metrology technique developed to improve upon traditional phase measuring deflectometry (PMD). CPMD utilizes telecentric imaging and collimated structured light illumination to eliminate the height-slope ambiguity present in traditional PMD measurements. After the publication of the first CPMD paper, efforts began to optimize the optical layout of the CPMD system. The first proposed change, and the one detailed in this work, was to move the Fourier transform (FT) lens closer to the surface under test (SUT). Moving the FT lens closer to the SUT meant that for a given FT lens diameter, a larger range of surface slopes on the SUT could be measured. This change to the optical layout was not trivial and introduced at least two concerns that had to be addressed: telecentricity in the imaging path and possible ghost reflections from the re-located FT lens. Here, in this work, we examine how these concerns were addressed and present results showing that the revised optical layout is capable of measurement results at least as good as the original CPMD optical layout. We also demonstrate the increased slope measuring range of the revised optical layout.
47 OTHER INSTRUMENTATION↗
Mid-infrared photodetection with 2D metal halide perovskites at ambient temperature
The detection of mid-infrared (MIR) light is technologically important for applications such as night vision, imaging, sensing, and thermal metrology. Traditional MIR photodetectors either require cryogenic cooling or have sophisticated device structures involving complex nanofabrication. Here, we conceive spectrally tunable MIR detection by using two-dimensional metal halide perovskites (2D-MHPs) as the critical building block. Leveraging the ultralow cross-plane thermal conductivity and strong temperature-dependent excitonic resonances of 2D-MHPs, we demonstrate ambient-temperature, all-optical detection of MIR light with sensitivity down to 1 nanowatt per square micrometer, using plastic substrates. Through the adoption of membrane-based structures and a photonic enhancement strategy unique to our all-optical detection modality, we further improved the sensitivity to sub–10 picowatt-per-square-micrometer levels. The detection covers the mid-wave infrared regime from 2 to 4.5 micrometers and extends to the long-wave infrared wavelength at 10.6 micrometers, with wavelength-independent sensitivity response. Our work opens a pathway to alternative types of solution-processable, long-wavelength thermal detectors for molecular sensing, environmental monitoring, and thermal imaging.
Li, Yanyan [Yale University, New Haven, CT (United↗
Classification of Intensity Distributions of Transmission Eigenchannels of Disordered Nanophotonic Structures Using Machine Learning
Light-matter interaction optimization in complex nanophotonic structures is a critical step towards the tailored performance of photonic devices. The increasing complexity of such systems requires new optimization strategies beyond intuitive methods. For example, in disordered photonic structures, the spatial distribution of energy densities has large random fluctuations due to the interference of multiply scattered electromagnetic waves, even though the statistically averaged spatial profiles of the transmission eigenchannels are universal. Classification of these eigenchannels for a single configuration based on visualization of intensity distributions is difficult. However, successful classification could provide vital information about disordered nanophotonic structures. Emerging methods in machine learning have enabled new investigations into optimized photonic structures. In this work, we combine intensity distributions of the transmission eigenchannels and the transmitted speckle-like intensity patterns to classify the eigenchannels of a single configuration of disordered photonic structures using machine learning techniques. Specifically, we leverage supervised learning methods, such as decision trees and fully connected neural networks, to achieve classification of these transmission eigenchannels based on their intensity distributions with an accuracy greater than 99%, even with a dataset including photonic devices of various disorder strengths. Simultaneous classification of the transmission eigenchannels and the relative disorder strength of the nanophotonic structure is also possible. Our results open new directions for machine learning assisted speckle-based metrology and demonstrate a novel approach to classifying nanophotonic structures based on their electromagnetic field distributions. These insights can be of paramount importance for optimizing light-matter interactions at the nanoscale.
79 ASTRONOMY AND ASTROPHYSICS↗
Contributions of scanning metrology uncertainty to milling force prediction
Not Available
36 MATERIALS SCIENCE↗
Collimated phase measuring deflectometry
Phase measuring deflectometry has been applied for free-form specular surface metrology, but its measured slope results are sensitive to the depth of sample positioning, which is also called the height-slope ambiguity. The objective of this work is to tackle this height-slope ambiguity problem. The main idea is to introduce collimated camera rays using a telecentric imaging lens and collimated structured-light illumination with a Fourier lens. This setup makes the fringe phases become only sensitive to the surface slopes and insensitive to the depth of the sample positioning. In this way, the slope calculation is theoretically independent of the sample depth. We call this new deflectometry technique Collimated Phase Measuring Deflectometry (CPMD). With our developed CPMD experimental setup, the measurement is insensitive to the depth of sample positioning, e.g., the measured height dispersion is less than 30 nm RMS within a 10 mm depth range when measuring a 50-mm-diameter spherical mirror with a 200 mm radius of curvature. In conclusion, the merits and limitations of the proposed CPMD technique are discussed, revealing its prospects in practical metrology applications and potential future investigations.
36 MATERIALS SCIENCE↗
Precision spectroscopy of nuclear decays using quantum optomechanical sensors
This project developed and demonstrated a fundamentally new way to detect individual nuclear decays: rather than capturing the energy that decay products deposit in a detector, we measure the tiny mechanical recoil of the entire micron- or nanometer-sized particle in which the decaying nucleus is embedded. Because momentum is conserved, this approach is sensitive even to neutral, weakly interacting particles, including neutrinos, that escape conventional detectors. During the award, the Yale group reported the first-ever mechanical detection of single nuclear decays, a result featured widely in the scientific press, and pushed the sensitivity of smaller levitated nanoparticles into the quantum measurement regime, reaching an impulse resolution within a factor of five of the fundamental Standard Quantum Limit (SQL), good enough in principle to detect the momentum kicked to the particle by a single emitted neutrino. In parallel, the LBNL group developed the theory of quantum-enhanced (sub-SQL) readout tailored to this experiment, showing how squeezed light can push the sensitivity below the SQL. Together these results establish levitated optomechanical sensors as a new tool for precision nuclear decay spectroscopy, with further applications in neutrino physics, quantum metrology, and nuclear forensics and safeguards.
73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗
Hybrid manufacturing by additive friction stir deposition, metrology, CNC machining, and microstructure analysis
Aerospace flight panels must provide high strength with low mass. For aluminum panels, it is common practice to begin with a wrought plate and remove the majority of the material to attain the desired structure, comprising a thinner plate with the desired pattern of reinforcement ribs. As an alternative, this study implements hybrid manufacturing, where aluminum is first deposited on a baseplate only at the rib locations using additive friction stir deposition (AFSD). Structured light scanning is then used to measure the printed geometry. This geometry is finally used as the stock model for computer numerical control (CNC) machining. This paper details the hybrid manufacturing process that consists of: AFSD to print the preform, structured light scanning to generate the stock model and tool path, three-axis CNC machining, and post-process measurements for part geometry and microstructure.
42 ENGINEERING↗
Binary pseudo-random array standards for calibration of 3D optical surface profilers used for metrology with significantly curved x-ray optics
High-accuracy metrology is vitally important in manufacturing ultra-high-quality free-form mirrors designed to manipulate X-ray light with nanometer-scale wavelengths. The current capabilities and possibility for improvements in X-ray mirror manufacturing are limited by inherent imperfections of the integrated metrology tools. In the case of Fizeau interferometry, metrology tools are currently calibrated with super-polished flat test-standard/reference mirrors. This is acceptable for measuring slightly curved X-ray optics. However, for even moderately curved aspherical X-ray mirrors the flat-reference calibration is not sufficiently accurate and stitching Fizeau interferometer-based surface metrology is used to mitigate the problem. But still, the retrace and aberration errors, as well as the limited spatial resolution, described with the instrument transfer function (ITF), can be transferred into the optical surface topography of X-ray mirrors obtained in stitching metrology. For ITF calibration, we have developed an original technique, based on test standards structured as two-dimensional (2D) highly-randomized (HR) binary pseudo-random arrays (BPRAs). The technique employs the unique properties of the HR BPRA patterns in the spatial frequency domain., i.e. the inherent 2D power spectral density of the HR BPRA pattern has a deterministic white-noise-like character that allows direct determination of the ITF with uniform sensitivity over the entire spatial frequency range and field-of-view of an instrument. Here, we explore technological, metrological, and analytical aspects essential for calibration of the retrace and aberration errors of Fizeau interferometers using different types of tilted test samples, including a super-polished reference mirror for the re-trace calibration and the uniformly redundant array (URA) BPRA standards for the geometrical distortion (aberration) calibration. While the first method was previously demonstrated by researchers at DIAMOND Light Source, a method based on the URA BPRA is described and demonstrated here for the first time. We outline the design and fabrication process used in fabrication of URA BPRA test standards, and present the results of application of the URA BPRA standards demonstrating the high efficacy of our approach to geometrical distortion calibration of Fizeau interferometers. We also discuss the possible sources of unexpected peculiarities of the systematic errors, including an astigmatic character of the retrace error, observed with Fizeau interferometers at the Advanced Light Source X-Ray Optics Laboratory.
Munechika, Keiko↗
Light scattering by V 4 O 7 film across the metal–insulator transition
The experimental study of the angle-resolved hemispherical light scattering by V 4 O 7 film within a broad temperature range across metal–insulator transition reveals complex structural reorganization of the film deposited on the c-cut sapphire crystal. The bidirectional scattering distribution function and the surface autocorrelation function were obtained from scattering data to visualize statistics of the spatially resolved contributions of optical inhomogeneities in normal and lateral directions to the surface. The measurements reveal an anisotropic surface roughness distribution due to the twinned domain structure, with significant anisotropy changes across the phase transition. The V 4 O 7 film deposited on sapphire leads to a polydomain structure, minimizing elastic strain energy with distinct multiscale distributions of surface domains. Near T c , the material shows the lowest roughness but the highest lateral disorder of the surface.
36 MATERIALS SCIENCE↗
A 3D-Printed Millimeter-Wave Inline Waveguide-to-Coplanar-Waveguide Transition to Enable Dense Spectrometer Arrays for Intensity Mapping Surveys
We present a 3D-printed millimeter-wave, octave-bandwidth, in-line waveguide-to-coplanar-waveguide transition designed to enable focal planes with dense arrays of on-chip spectrometers. These arrays will enable compelling surveys of the large-scale structure of the universe through millimeter-wave intensity mapping. The transition consists of a four-step ridge-waveguide transformer that couples light from a rectangular waveguide onto a coplanar waveguide via an electrical connection made with indium bump bonds. We develop a tolerance-aware optimization approach to identify high-performance transition geometries that are robust to manufacturing variations; the same formulation can be applied to other tolerance-sensitive design problems. We also describe the implementation of a custom apparatus and procedure for bump-bonding a silicon chip to a metallized 3D-printed component. We detail the fabrication of the coplanar waveguide chip and three-dimensional waveguide structure, simulations and metrology of a test device, and room temperature reflectance measurements of this device. The room temperature metrology and reflection measurements are consistent with a model that predicts a coupling efficiency of $\mathord{\sim} 95\%$ at cryogenic temperatures in the 85-170 GHz frequency range.
Stover, Austin [Chicago U.; Chicago U., KICP] (ORC↗
Imaging pyrometry for most color cameras using a triple pass filter
A simple combination of the Planck blackbody emission law, optical filters, and digital image processing is demonstrated to enable most commercial color cameras (still and video) to be used as an imaging pyrometer for flames and explosions. The hardware and data processing described take advantage of the color filter array (CFA) that is deposited on the surface of the light sensor array present in most digital color cameras. In this work, a triple-pass optical filter incorporated into the camera lens allows light in three 10-nm wide bandpass regions to reach the CFA/light sensor array. These bandpass regions are centered over the maxima in the blue, green, and red transmission regions of the CFA, minimizing the spectral overlap of these regions normally present. A computer algorithm is used to retrieve the blue, green, and red image matrices from camera memory and correct for remaining spectral overlap. A second algorithm calibrates the corrected intensities to a gray body emitter of known temperature, producing a color intensity correction factor for the camera/filter system. The Wien approximation to the Planck blackbody emission law is used to construct temperature images from the three color (blue, green, red) matrices. A short pass filter set eliminates light of wavelengths longer than 750 nm, providing reasonable accuracy (±10%) for temperatures between 1200 and 6000 K. The effectiveness of this system is demonstrated by measuring the temperature of several systems for which the temperature is known.
47 OTHER INSTRUMENTATION↗