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At least 19 records

In Situ Surface Characterization

Operation of in situ space assets, such as rovers and landers, requires operators to acquire a thorough understanding of the environment surrounding the spacecraft. The following programs help with that understanding by providing higher-level information characterizing the surface, which is not immediately obvious by just looking at the XYZ terrain data. This software suite covers three primary programs: marsuvw, marsrough, and marsslope, and two secondary programs, which together use XYZ data derived from in situ stereo imagery to characterize the surface by determining surface normal, surface roughness, and various aspects of local slope, respectively. These programs all use the Planetary Image Geometry (PIG) library to read mission-specific data files. The programs themselves are completely multimission; all mission dependencies are handled by PIG. The input data consists of images containing XYZ locations as derived by, e.g., marsxyz. The marsuvw program determines surface normals from XYZ data by gathering XYZ points from an area around each pixel and fitting a plane to those points. Outliers are rejected, and various consistency checks are applied. The result shows the orientation of the local surface at each point as a unit vector. The program can be run in two modes: standard, which is typically used for in situ arm work, and slope, which is typically used for rover mobility. The difference is primarily due to optimizations necessary for the larger patch sizes in the slope case. The marsrough program determines surface roughness in a small area around each pixel, which is defined as the maximum peak-to-peak deviation from the plane perpendicular to the surface normal at that pixel. The marsslope program takes a surface normal file as input and derives one of several slope-like outputs from it. The outputs include slope, slope rover direction (a measure of slope radially away from the rover), slope heading, slope magnitude, northerly tilt, and solar energy (compares the slope with the Sun s location at local noon). The marsuvwproj program projects a surface normal onto an arbitrary plane in space, resulting in a normalized 3D vector, which is constrained to lie in the plane. The marsuvwrot program rotates the vectors in a surface normal file, generating a new surface normal file. It also can change coordinate systems for an existing surface normal file. While the algorithms behind this suite are not particularly unique, what makes the programs useful is their integration into the larger in situ image processing system via the PIG library. They work directly with space in situ data, understanding the appropriate image metadata fields and updating them properly. The secondary programs (marsuvwproj, marsuvwrot) were originally developed to deal with anomalous situations on Opportunity and Spirit, respectively, but may have more general applicability.

Deen, Robert G.↗

Fabrication and surface characterization of composite refractory compounds suitable for thermionic converters

The techniques of fabricating and characterizing the surface properties of electrode materials were investigated. The basic surface properties of these materials were studied with respect to their utilization as thermionic energy converter electrodes. Emphasis was placed on those factors (e.g, cesium disorption kinetic and mechanisms of low work function production) which are of primary concern to thermionic converter performance.

Davis, P. R.↗

Surface Characterization and Contamination

Nondestructive characterization of surface contamination can play an extremely important role in improving quality in manufacturing processes. This area of interest led to the formation of a Surface Contamination Analysis Team (SCAT) at Marshall Space Flight Center, which is primarily concerned with critical bondlines and has provided the major focus for activities under this grant. In addition, determining minute levels of contamination on emerging aerospace systems fabricated from composites has also been an area of interest for which the methods being presented here can be used. Important considerations for the inspection methodologies are good sensitivity, large area coverage, robustness, portability and ease of use for normal production personnel. In parallel with the evaluation of detection methods, considerable effort has been made to developing good, uniform contamination films to use as calibration standards. This activity within itself has presented unique challenges. The development of NIR methods for detecting and identifying contaminants has been in progress for several years. Cooperative efforts between the University, NASA, and Thiokol Corporation has shown some useful results for implementation in both laboratory and on-line procedures.

Workman, Gary L.↗

Surface characterization of selected LDEF tray clamps

The surface characterization of chromic acid anodized 6061-T6 aluminum alloy tray clamps has shown differences in surface chemistry depending upon the position on the Long Duration Exposure Facility (LDEF). Water contact angle results showed no changes in wettability of the tray clamps. The overall surface topography of the control, trailing edge(E3) and leading edge(D9) samples was similar. The thickness of the aluminum oxide layer for all samples determined by Auger depth profiling was less than one micron. X-ray photoelectron spectroscopy (XPS) analysis of the tray clamps showed significant differences in the surface composition. Carbon and silicon containing compounds were the primary contaminants detected.

Cromer, T. F.↗

Surface characterization of LDEF materials

The NASA Long Duration Exposure Facility (LDEF), a passive experimental satellite, was placed into low-Earth orbit by the Shuttle Challenger in Apr. 1984. The LDEF spent an unprecedented 69 months in space. The flight and recovery of the LDEF provided a wealth of information on the longterm space environmental effects of a variety of materials exposed to the low-Earth orbit environment. Surface characterization of LDEF materials included polymers, composites, thermal control paints, and aluminum. X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), scanning electron microscopy (SEM), and contact angle analysis were used to document changes in both the surface composition and surface chemistry of these materials. Detailed XPS analysis of the polymer systems, such as Kapton, polyimide polysiloxane copolymers, and fluorinated ethylene propylene thermal blankets on the backside of the LDEF revealed significant changes in both the surface composition and surface chemistry as a result of exposure to the low-Earth orbit environment. Polymer systems such as Kapton, polyimide polysiloxane copolymers, and polysulfone showed a common trend of decreasing carbon content and increasing oxygen content with respect to the control sample. Carbon 1s curve fit XPS analysis of the composite samples, in conjunction with SEM photomicrographs, revealed significant ablation of the polymer matrix resin to expose the carbon fibers of the composite during exposure to the space environment. Surface characterization of anodized aluminum tray clamps, which were located at regular intervals over the entire LDEF frame, provided the first results to evaluate the extent of contamination with respect to position on the LDEF. The XPS results clearly showed that the amount and state of both silicon and fluorine contamination were directly dependent upon the position of the tray clamp on the LDEF.

Wightman, J. P.↗

Surface characterization and testing II; Proceedings of the Meeting, San Diego, CA, Aug. 10, 11, 1989

Various papers on surface characterization and testing are presented. Individual topics addressed include: simple Hartmann test data interpretation, optimum configuration of the Offner null corrector, system for phase-shifting interferometry in the presence of vibration, fringe variation and visibility in speckle-shearing interferometry, functional integral representation of rough surfaces, calibration of surface heights in an interferometric optical profiler, image formation in common path differential profilometers, SEM of optical surfaces, measuring surface profiles with scanning tunneling microscopes, surface profile measurements of curved parts, high-resolution optical profiler, scanning heterodyne interferometer with immunity from microphonics, real-time crystal axis measurements of semiconductor materials, radial metrology with a panoramic annular lens, surface analysis for the characterization of defects in thin-film processes, Spacelab Optical Viewport glass assembly optical test program for the Starlab mission, scanning differential intensity and phase system for optical metrology.

Greivenkamp, John E.↗

Surface characterization and adhesion of oxygen plasma-modified LARC-TPI

LARC-TPI, an aromatic thermoplastic polyimide, was exposed to an oxygen plasma as a surface pretreatment for adhesive bonding. Chemical and physical changes which occurred in the polyimide surface as a result of the plasma treatment were investigated using X-ray photoelectron spectroscopy (XPS), infrared reflection-absorption spectroscopy (IR-RAS), contact-angle analysis, ellipsometry, and high resolution SEM. A 180-deg peel test with an acrylate-based pressure sensitive adhesive as a flexible adherent was utilized to study the interactions of the plasma-treated polyimide surface with other polymeric materials. The surface characterization and adhesion testing results showed that the oxygen plasma treatment, while creating a more hydrophilic, polar surface, also caused chain scission, resulting in the formation of a weak boundary layer which inhibited adhesion.

Chin, J. W.↗

Surface characterization in composite and titanium bonding: Carbon fiber surface treatments for improved adhesion to thermoplastic polymers

The effect of anodization in NaOH, H2SO4, and amine salts on the surface chemistry of carbon fibers was examined by X-ray photoelectron spectroscopy (XPS). The surfaces of carbon fibers after anodization in NaOH and H2SO4 were examined by scanning transmission electron microscopy (STEM), angular dependent XPS, UV absorption spectroscopy of the anodization bath, secondary ion mass spectrometry, and polar/dispersive surface energy analysis. Hercules AS-4, Dexter Hysol XAS, and Union Carbide T-300 fibers were examined by STEM, angular dependent XPS, and breaking strength measurement before and after commercial surface treatment. Oxygen and nitrogen were added to the fiber surfaces by anodization in amine salts. Analysis of the plasmon peak in the carbon 1s signal indicated that H2SO4 anodization affected the morphological structure of the carbon fiber surface. The work of adhesion of carbon fibers to thermoplastic resins was calculated using the geometric mean relationship. A correlation was observed between the dispersive component of the work of adhesion and the interfacial adhesion.

Devilbiss, T. A.↗

Surface characterization through shape oscillations of drops in microgravity and 1-g

The goal of these experiments is to determine the rheological properties of liquid drops of single or multiple components in the presence or absence of surface active materials by exciting drops into their quadrupole resonance and observing their free decay. The resulting data coupled with appropriate theory should give a better description of the physics of the underlying phenomena, providing a better foundation than earlier empirical results could. The space environment makes an idealized geometry available (spherical drops) so that theory and experiment can be properly compared, and allows a 'clean' environment, by which is meant an environment in which no solid surfaces come in contact with the drops during the test period. Moreover, by considering the oscillations of intentionally deformed drops in microgravity, a baseline is established for interpreting surface characterization experiments done on the ground by other groups and ours. Experiments performed on the United States Microgravity Laboratory Laboratory (USML-1) demonstrated that shape oscillation experiments could be performed over a wide parameter range, and with a variety of surfactant materials. Results, however, were compromised by an unexpected, slow drop tumbling, some problems with droplet injection, and the presence of bubbles in the drop samples. Nevertheless, initial data suggests that the space environment will be useful in providing baseline data that can serve to validate theory and permit quantitative materials characterization at 1-g.

Apfel, Robert E.↗

Surface Characterization Techniques: An Overview

To understand the benefits that surface modifications provide, and ultimately to devise better ones, it is necessary to study the physical, mechanical, and chemical changes they cause. This chapter surveys classical and leading-edge developments in surface structure and property characterization methodologies. The primary emphases are on the use of these techniques as they relate to surface modifications, thin films and coatings, and tribological engineering surfaces and on the implications rather than the instrumentation.

Miyoshi, Kazuhisa↗

Surface characterization in composite and titanium bonding

The failure surface analysis of adhesively bonded carbon fiber composites is described. The emphasis is on the bonding of composites when the surface has been made intentionally resin-rich. Also discussed is surface analysis of both commercially available and pretreated carbon fibers. The interaction of the fibers with polysulfone is described.

Devilbiss, T. A.↗

Characterizing Surfaces of the Wide Bandgap Semiconductor Ilmenite with Scanning Probe Microcopies

Ilmenite (FeTiO3) is a wide bandgap semiconductor with an energy gap of about 2.5eV. Initial radiation studies indicate that ilmenite has properties suited for radiation tolerant applications, as well as a variety of other electronic applications. Two scanning probe microscopy methods have been used to characterize the surface of samples taken from Czochralski grown single crystals. The two methods, atomic force microscopy (AFM) and scanning tunneling microscopy (STM), are based on different physical principles and therefore provide different information about the samples. AFM provides a direct, three-dimensional image of the surface of the samples, while STM give a convolution of topographic and electronic properties of the surface. We will discuss the differences between the methods and present preliminary data of each method for ilmenite samples.

Wilkins, R.↗

Surface characterization of InP using photoluminescence

Photoluminescence (PL) measurements have been performed on InP samples in situ during various surface treatments including chemical etching, wet anodization, and low-pressure chemical vapor deposition. It was found, in agreement with previously published results, that the magnitude of the PL signal varies markedly with surface treatment due presumably to changes in either surface-state density, and/or surface potential. In an attempt to assess the effectiveness of this noninvasive method as a tool for characterizing and monitoring the progressive development of a semiconductor surface during processing, a number of experiments on InP have been performed. The results indicate that although some uncertainty may exist in assigning a mechanism for the PL change in any given experiment, the general trend appears to be that surface degradation results in a reduced signal. As a result, process steps which enhance the PL intensity are likely to be beneficial in the preparation of a high-quality interface.

Chang, R. R.↗

Evaluation of methods for characterizing surface topography of models for high Reynolds number wind-tunnels

Current work by the National Bureau of Standards at the NASA National Transonic Facility (NTF) to evaluate the performance of stylus instruments for determining the topography of models under investigation is described along with instrumentation for characterization of the surface microtopography. Potential areas of surface effects are reviewed, and the need for finer surfaced models for the NTF high Reynolds number flows is stressed. Current stylus instruments have a radii as large as 25 microns, and three models with surface finishes of 4-6, 8-10, and 12-15 micro-in. rms surface finishes were fabricated for tests with a stylus with a tip radius of 1 micron and a 50 mg force. Work involving three-dimensional stylus profilometry is discussed in terms of stylus displacement being converted to digital signals, and the design of a light scattering instrument capable of measuring the surface finish on curved objects is presented.

Teague, E. C.↗

Surface characterization of hydrogen charged and uncharged alpha-2 and gamma titanium aluminide alloys using AES and REELS

The surfaces of selected uncharged and hydrogen charged alpha-2 and gamma titanium aluminide alloys with Nb additions were characterized by Auger electron (AES) and reflected electron energy loss (REELS) spectroscopy. The alloy surfaces were cleaned before analysis at room temperature by ion sputtering. The low energy (500 eV) ion sputtering process preferentially sputtered the surface concentration. The surface concentrations were determined by comparing AES data from the alloys with corresponding data from elemental references. No differences were observed in the Ti or Nb Auger spectra for the uncharged and hydrogen charged alloys, even though the alpha-2 alloy had 33.4 atomic percent dissolved hydrogen. Also, no differences were observed in the AES spectra when hydrogen was adsorbed from the gas phase. Bulk plasmon energy shifts were observed in all alloys. The energy shifts were induced either by dissolved hydrogen (alpha-2 alloy) or hydrogen adsorbed from the gas phase (alpha-2 and gamma alloys). The adsorption induced plasmon energy shifts were greatest for the gamma alloy and cp-Ti metal.

Shanabarger, M. R.↗

Surface Characterization of LMMS Molybdenum Disilicide Coated HTP-8 Using Arc- Jet Hypersonic Flow

Surface properties for an advanced Lockheed Martin Missile and Space (LMMS) molybdenum disilicide coated insulation (HTP-8) were determined using arc-jet flow to simulate Earth entry at hypersonic speeds. The catalytic efficiency (atom recombination coefficients) for this advanced thermal protection system was determined from arc-jet data taken in both oxygen and nitrogen streams at temperatures ranging from 1255 K to roughly 1600 K. In addition, optical and chemical stability data were obtained from these test samples.

Stewart, David A.↗