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Optical surfaces built for X-ray telescopes are made to reflect very short wavelengths that range in magnitude from 2 to 100 angstroms. Minor irregularities or contamination on sufrace of any telescope mirror can affect quality of optical image. Apparatus checks reflection of optical surfaces; scattering of X-rays is measured with angular accuracy of one arc-second.
Optical surfaces contamination analysis by holographic interferometry, using fringe patterns for contaminant film thickness and uniformity
An optical nulling apparatus for testing an optical surface includes an aspheric mirror having a reflecting surface for imaging light near or onto the optical surface under test, where the aspheric mirror is configured to reduce spherical aberration of the optical surface under test. The apparatus includes a light source for emitting light toward the aspheric mirror, the light source longitudinally aligned with the aspheric mirror and the optical surface under test. The aspheric mirror is disposed between the light source and the optical surface under test, and the emitted light is reflected off the reflecting surface of the aspheric mirror and imaged near or onto the optical surface under test. An optical measuring device is disposed between the light source and the aspheric mirror, where light reflected from the optical surface under test enters the optical measuring device. An imaging mirror is disposed longitudinally between the light source and the aspheric mirror, and the imaging mirror is configured to again reflect light, which is first reflected from the reflecting surface of the aspheric mirror, onto the optical surface under test.
Precision optical figuring demands fast and accurate dwell time optimization to reach nanometer- and sub-nanometer-level accuracy in next-generation optical systems. We introduce CUDO (closed-form universal dwell-time optimization), the first, to the best of our knowledge, unified closed-form analytical framework that supports both function-form and matrix-form dwell time models in computer-controlled optical surfacing (CCOS). In contrast to traditional methods, which rely on iterative optimization and hyperparameter tuning, our framework derives direct analytical solutions with no adjustable parameters. This approach unifies the solution principles of existing methods within a single mathematical model, delivering three key advantages: (1) accuracy on par with, or superior to, iterative solvers, (2) substantial reduction in computation time, and (3) numerical robustness. Comparative studies with prior art confirm that closed-form solutions achieve equivalent residual error while removing runtime bottlenecks. By simplifying the implementation and enabling real-time, scalable deployment, CUDO establishes a practical foundation for future deterministic fabrication of large-aperture and high-performance optics.
An optical design is presented for a measurement system used to assess the impact of surface errors originating from diamond turning artifacts. Diamond turning artifacts are common by-products of optical surface shaping using the diamond turning process (a diamond-tipped cutting tool used in a lathe configuration). Assessing and evaluating the errors imparted by diamond turning (including other surface errors attributed to optical manufacturing techniques) can be problematic and generally requires the use of an optical interferometer. Commercial interferometers can be expensive when compared to the simple optical setup developed here, which is used in combination with an image-based sensing technique (phase retrieval). Phase retrieval is a general term used in optics to describe the estimation of optical imperfections or aberrations. This turnkey system uses only image-based data and has minimal hardware requirements. The system is straightforward to set up, easy to align, and can provide nanometer accuracy on the measurement of optical surface defects.
The 2-dimensional Power Spectral Density (PSD) can be used to characterize the mid- and the high-spatial frequency components of the surface height errors of an optical surface. We found it necessary to have a complete, easy-to-use approach for specifying and evaluating the PSD characteristics of large optical surfaces, an approach that allows one to specify the surface quality of a large optical surface based on simulated results using a PSD function and to evaluate the measured surface profile data of the same optic in comparison with those predicted by the simulations during the specification-derivation process. This paper provides a complete mathematical description of PSD error, and proposes a new approach in which a 2-dimentional (2D) PSD is converted into a 1-dimentional (1D) one by azimuthally averaging the 2D-PSD. The 1D-PSD calculated this way has the same unit and the same profile as the original PSD function, thus allows one to compare the two with each other directly.
With the rapid development of precision technologies, the demand of high-precision optical surfaces has drastically increased. These optical surfaces are mainly fabricated with computer controlled optical surfacing (CCOS). In a CCOS process, a target surface removal profile is achieved by scheduling the dwell time for a set of machine tools. The optimized dwell time should be positive and smooth to ensure convergence to the target while considering CNC dynamics. The total run time of each machine tool is also expected to be balanced to improve the overall processing efficiency. In the past few decades, dwell time optimization for a single machine tool has been extensively developed. While the methods are applicable to multi-tool scenarios, they fail to consider the overall contributions of multiple tools simultaneously. In this paper, we conduct a systematic study on the strategies for multi-tool dwell time optimization and propose an innovative method for simultaneously scheduling dwell time for multiple tools for the first time. First, the influential factors to the positiveness and smoothness of dwell time solutions for a single machine tool are analyzed. The compensation strategies that minimize the residual while considering the CNC dynamics limit are then proposed. Afterwards, these strategies are extended to the proposed multi-tool optimization that further balances the run time of machine tools. Finally, the superiority of each strategy is carefully studied via simulation and experiment. The experiment is performed by bonnet polishing a 60 mm × 60 mm mirror with three tools of different diameters ( i.e., 12 mm, 8 mm, and 5 mm). The figure error of the mirror is reduced from 45.42 nm to 11.18 nm root mean square in 13.28 min. Moreover, the measured polishing result well coincides with the estimation, which proves the effectiveness of the proposed method.
Surface roughness measurement has several applications. Even a few A roughness will cause scattered light in optical systems. Smooth surfaces are required in a wide variety of instruments. For example, the outputs of the high power lasers are limited by the surface roughness of mirrors and windows. Similarly, the information storage capacity of magnetic media is limited by the roughness of the surface. Roughness reduces the resolving power of optics and distorts images. The performance of certain thin film components in electronic industries is affected by the roughness on the film surface. X-ray astronomical telescopes require smooth curved surfaces. To improve the surface quality, super sensitive detection methods are required. Wide ranging measurement techniques are developed based on interferometry, electron microscopy, C-rays, ellipsometry, light scattering, and using mechanical stylus, etc. Though there are several techniques available for measurement and evaluation of the surfaces, no single technique is fully adequate. Also, the technique used should be nondestructive and highly sensitive. So, an optical heterodyne profilometer was fabricated. Its current sensitivity is much better than 10A rms. It is a noncontact and nondestructive technique. The instrument can be operated even by unskilled personnel for routine measurements.
The performance of optical systems is limited by imperfect optical surfaces that degrade the images below the level set by wave theoretical limits. The central irradiance functions are derived for slit and circular apertures with five distributions of wavefront errors and for a range of maximal wavefront deviations. For practical frequency of occurrence distributions of wavefront deviations, the point spread and the image energy integral functions are determined. Practical performances of optical systems are derived and performance limits discussed.
Results of a study on the feasibility of removing contaminant films from optical surfaces in vacuum, using an oxygen plasma, are discussed. Contaminant films were deposited onto optical surfaces from butadiene and methane gases at a pressure of about 4 torr in the presence of ultraviolet radiation. Optical surfaces evaluated included ultraviolet-reflecting mirrors, gratings, quartz disks, and spacecraft thermal control surfaces. In general, it was found that contaminants could be removed successfully from surfaces using an oxygen plasma. Exceptions were the white-paint thermal control surfaces, which, when contaminated, degraded further during exposure to the oxygen plasma.
Positive ion beam polishing of optical surfaces
Over the past few decades, computer-controlled optical surfacing (CCOS) systems have become more deterministic. A target surface profile can be predictably achieved with a combination of tools of different sizes. However, deciding the optimal set of tool sizes that will achieve the target residual error in the shortest run time is difficult, and no general guidance has been proposed in the literature. In this paper, we present a computer-assisted study on choosing the proper tool size for a given surface error map. First, we propose that the characteristic frequency ratio (CFR) can be used as a general measure of the correction capability of a tool over a surface map. Second, the performance of different CFRs is quantitatively studied with a computer simulation by applying them to guide the tool size selection for polishing a large number of randomly generated surface maps with similar initial spatial frequencies and root mean square errors. Finally, we find that CFR = 0.75 achieves the most stable trade-off between the total run time and the number of iterations and thus can be used as a general criterion in tool size selection for CCOS processes. To the best of our knowledge, the CFR is the first criterion that ties tool size selection to overall efficiency.
High-accuracy surface metrology is vitally important in manufacturing ultra-high-quality free-form mirrors designed to manipulate x-ray light with nanometer-scale wavelengths. The current and potential capabilities of x˗ray mirror manufacturing are limited by inherent imperfections of the integrated metrology tools. Metrology tools are currently calibrated with super-polished flat test-standard/reference mirrors. This is acceptable for fabrication of slightly curved x-ray optics. However, for even moderately curved aspherical x-ray mirrors the flat-reference calibration is not sufficiently accurate. For micro-stitching interferometry developed for surface measurements with curved x-ray mirrors, the tool aberration errors are known to be transferred into the optical surface topography of x-ray mirrors. Our approach to improving metrology is to thoroughly calibrate the measuring tool and apply the results of the calibration to deconvolution of the measured data. Here we explore the application of a recently developed technique for calibrating the instrument transfer function (ITF) of 3D optical surface profilers to metrology with significantly curved x-ray optics. The technique, based on test standards patterned with two-dimensional (2D) binary pseudo-random arrays (BPRAs), employs the unique properties of the BPRA patterns in the spatial frequency domain. The inherent 2D power spectral density of the pattern has a deterministic white-noise-like character that allows direct determination of the ITF with uniform sensitivity over the entire spatial frequency range and field of view of an instrument. The high efficacy of the technique has been previously demonstrated in application to metrology with flat and slightly curved optics. Here, we concentrate on development of an efficient fabrication process for production of highly randomized (HR) BPRA test standards on flat and 500-mm spherical optical substrates. We also compare and discuss the results of the ITF calibration of an interferometric microscope when using the HR BPRA standards on flat and curved substrates.
The effect of an ammonia environment on the spectral reflectance of certain optical surfaces in the vacuum ultraviolet region was studied. In particular, the optical surfaces in the space shuttle were considered. Scans made of sample beams showed no change in the relative intensities before or after exposure to ammonia. Ammonia showed no effect on the Al/MgF2 mirror reflectance in the vacuum ultraviolet.
The Multispectral Scanner carried by the ERTS-1 satellite (launched on July 23, 1972) is a very high resolution line scanning imaging radiometer operating in the visible and near infrared spectral regions. The instrument contains optical surfaces that are exposed to both direct and reflected sunlight, and the reflectivity and transmission of some of these surfaces have decreased in orbit. Details of the optical system are explained, and data on the degradation are reviewed as a function of both spectral interval and time in orbit. The history of the scanner during testing (when hydrocarbons from an external source may have been deposited on the optical surfaces) is also examined, and a mechanism is postulated for the observed degradation in orbit.
The effect of molecular contamination on Space Station optical surfaces is examined. In particular, contamination of solar voltaic power sources and optical solar reflectors for thermal control or solar dynamic power generation is addressed. The published Space Station requirements for molecular contamination accretion and for the monitoring of such accretion is discussed in the context of the historical performance of space systems. Specific reference is made to the results from the Spacecraft Charging at High Altitudes (SCATHA) ML12 experiment.
Particulate and impact contamination of optical surfaces in space shown to originate from spacecraft debris
Alteration of surface optical properties by high speed micron-size particles