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Optical surfaces built for X-ray telescopes are made to reflect very short wavelengths that range in magnitude from 2 to 100 angstroms. Minor irregularities or contamination on sufrace of any telescope mirror can affect quality of optical image. Apparatus checks reflection of optical surfaces; scattering of X-rays is measured with angular accuracy of one arc-second.
Optical surfaces contamination analysis by holographic interferometry, using fringe patterns for contaminant film thickness and uniformity
An optical nulling apparatus for testing an optical surface includes an aspheric mirror having a reflecting surface for imaging light near or onto the optical surface under test, where the aspheric mirror is configured to reduce spherical aberration of the optical surface under test. The apparatus includes a light source for emitting light toward the aspheric mirror, the light source longitudinally aligned with the aspheric mirror and the optical surface under test. The aspheric mirror is disposed between the light source and the optical surface under test, and the emitted light is reflected off the reflecting surface of the aspheric mirror and imaged near or onto the optical surface under test. An optical measuring device is disposed between the light source and the aspheric mirror, where light reflected from the optical surface under test enters the optical measuring device. An imaging mirror is disposed longitudinally between the light source and the aspheric mirror, and the imaging mirror is configured to again reflect light, which is first reflected from the reflecting surface of the aspheric mirror, onto the optical surface under test.
An optical design is presented for a measurement system used to assess the impact of surface errors originating from diamond turning artifacts. Diamond turning artifacts are common by-products of optical surface shaping using the diamond turning process (a diamond-tipped cutting tool used in a lathe configuration). Assessing and evaluating the errors imparted by diamond turning (including other surface errors attributed to optical manufacturing techniques) can be problematic and generally requires the use of an optical interferometer. Commercial interferometers can be expensive when compared to the simple optical setup developed here, which is used in combination with an image-based sensing technique (phase retrieval). Phase retrieval is a general term used in optics to describe the estimation of optical imperfections or aberrations. This turnkey system uses only image-based data and has minimal hardware requirements. The system is straightforward to set up, easy to align, and can provide nanometer accuracy on the measurement of optical surface defects.
The 2-dimensional Power Spectral Density (PSD) can be used to characterize the mid- and the high-spatial frequency components of the surface height errors of an optical surface. We found it necessary to have a complete, easy-to-use approach for specifying and evaluating the PSD characteristics of large optical surfaces, an approach that allows one to specify the surface quality of a large optical surface based on simulated results using a PSD function and to evaluate the measured surface profile data of the same optic in comparison with those predicted by the simulations during the specification-derivation process. This paper provides a complete mathematical description of PSD error, and proposes a new approach in which a 2-dimentional (2D) PSD is converted into a 1-dimentional (1D) one by azimuthally averaging the 2D-PSD. The 1D-PSD calculated this way has the same unit and the same profile as the original PSD function, thus allows one to compare the two with each other directly.
Surface roughness measurement has several applications. Even a few A roughness will cause scattered light in optical systems. Smooth surfaces are required in a wide variety of instruments. For example, the outputs of the high power lasers are limited by the surface roughness of mirrors and windows. Similarly, the information storage capacity of magnetic media is limited by the roughness of the surface. Roughness reduces the resolving power of optics and distorts images. The performance of certain thin film components in electronic industries is affected by the roughness on the film surface. X-ray astronomical telescopes require smooth curved surfaces. To improve the surface quality, super sensitive detection methods are required. Wide ranging measurement techniques are developed based on interferometry, electron microscopy, C-rays, ellipsometry, light scattering, and using mechanical stylus, etc. Though there are several techniques available for measurement and evaluation of the surfaces, no single technique is fully adequate. Also, the technique used should be nondestructive and highly sensitive. So, an optical heterodyne profilometer was fabricated. Its current sensitivity is much better than 10A rms. It is a noncontact and nondestructive technique. The instrument can be operated even by unskilled personnel for routine measurements.
The performance of optical systems is limited by imperfect optical surfaces that degrade the images below the level set by wave theoretical limits. The central irradiance functions are derived for slit and circular apertures with five distributions of wavefront errors and for a range of maximal wavefront deviations. For practical frequency of occurrence distributions of wavefront deviations, the point spread and the image energy integral functions are determined. Practical performances of optical systems are derived and performance limits discussed.
Results of a study on the feasibility of removing contaminant films from optical surfaces in vacuum, using an oxygen plasma, are discussed. Contaminant films were deposited onto optical surfaces from butadiene and methane gases at a pressure of about 4 torr in the presence of ultraviolet radiation. Optical surfaces evaluated included ultraviolet-reflecting mirrors, gratings, quartz disks, and spacecraft thermal control surfaces. In general, it was found that contaminants could be removed successfully from surfaces using an oxygen plasma. Exceptions were the white-paint thermal control surfaces, which, when contaminated, degraded further during exposure to the oxygen plasma.
Positive ion beam polishing of optical surfaces
The effect of an ammonia environment on the spectral reflectance of certain optical surfaces in the vacuum ultraviolet region was studied. In particular, the optical surfaces in the space shuttle were considered. Scans made of sample beams showed no change in the relative intensities before or after exposure to ammonia. Ammonia showed no effect on the Al/MgF2 mirror reflectance in the vacuum ultraviolet.
The Multispectral Scanner carried by the ERTS-1 satellite (launched on July 23, 1972) is a very high resolution line scanning imaging radiometer operating in the visible and near infrared spectral regions. The instrument contains optical surfaces that are exposed to both direct and reflected sunlight, and the reflectivity and transmission of some of these surfaces have decreased in orbit. Details of the optical system are explained, and data on the degradation are reviewed as a function of both spectral interval and time in orbit. The history of the scanner during testing (when hydrocarbons from an external source may have been deposited on the optical surfaces) is also examined, and a mechanism is postulated for the observed degradation in orbit.
The effect of molecular contamination on Space Station optical surfaces is examined. In particular, contamination of solar voltaic power sources and optical solar reflectors for thermal control or solar dynamic power generation is addressed. The published Space Station requirements for molecular contamination accretion and for the monitoring of such accretion is discussed in the context of the historical performance of space systems. Specific reference is made to the results from the Spacecraft Charging at High Altitudes (SCATHA) ML12 experiment.
Particulate and impact contamination of optical surfaces in space shown to originate from spacecraft debris
Alteration of surface optical properties by high speed micron-size particles
Contaminated optical surface investigation technique in near UV, visible and near IR range, investigating property changes of systems in transmission and reflection
Plasma cleaning technique for removing contaminants from optical surfaces in spacecraft
An active cleaning technique for removing contaminants from optical surfaces in space was investigated with emphasis on the feasibility of using plasma exposure as a means of in-situ cleaning. The major work accomplished includes: (1) development of an in-situ reflectometer for use in conjunction with the contaminant film deposition/cleaning facility; (2) completion of Apollo Telescope Mount (ATM) filter treatment experiments to assess the effects of plasma exposure on the UV transmittance; (3) attempts to correlate the atomic oxygen flux with cleaning rate; (4) completion of in-situ butadien contamination/plasma cleaning/UV reflectance measurement experiments; (5) carbon cleaning experiments using various gases; (6) completion of silicone contamination/cleaning experiments; and (7) experiments conducted at low chamber pressures to determine cleaning rate distribution and contamination of surfaces adjacent to those being cleaned.
The purpose of this modification to the Optical Surface Analysis Code (OSAC) is to upgrade the PSF program to allow the user to get proper diffracted energy normalization even when deliberately obscuring rays with internal obscurations.