Radiative heat transfer between planar surfaces with filleted junctures
Circular fillet effect on radiative heat transfer between planar surfaces of zero conductivity intersecting at sharp angle
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Circular fillet effect on radiative heat transfer between planar surfaces of zero conductivity intersecting at sharp angle
Incident white light and ordinary interferometer attachment provide images that differ in color according to relative heights of planar surfaces. With aid of technique, it is possible to perceive buried layers, such as diffused collectors, as well as discover defects in buried layers.
Characteristics of free-jet vapor expansions created by the pulsed-laser vaporization of some refractory materials are examined. Such expansions were generated from planar surfaces at laser power densities up to 2.5 MW/sq cm. Time-integrated and time-resolved photography were used to show that the structure and pressures of such flows are correlated by the same relationship that is valid for free jets from orifice flows. Data show that the vapor velocity becomes sonic at or very near the vaporizing surface. A method is presented for deriving vaporization pressure from flow-field photos; such pressures from carbon-vaporization data for temperatures to 4500 K are in good agreement with extrapolated equilibrium vapor pressures. It is shown that this technique may be a means to determine vapor pressures of refractory materials at high temperatures.
A monolithic 120 GHz free-space, continuous-wave source capable of providing 10 dBm of EIRP at 11.1 percent DC-to-EIRP conversion efficiency is presented.
Paralleling the sophisticated control of Si and GaAs growth from fluid media, we demonstrate control of Si growth using a solid growth medium. Faceted dissolution pits were first produced in a Si substrate using standard photolithographic techniques and Al metallization. Si was then evaporated onto the cold structure, depositing as amorphous material. Upon heating, the amorphous Si migrated through the solid Al and grew rapidly in the faceted pits, typically refilling them flush with the surrounding substrate. Evidence that the rapid growth occurs only while the amorphous Si is dissolving into the Al is presented.
High-resolution Viking Orbiter images contain significant information on Martian surface roughness at 25- to 100-m lateral scales, while earth-based radar observations of Mars are sensitive to roughness at lateral scales of 1 to 30 m or more. High-rms slopes predicted for the Tharsis-Memnonia-Amazonis volcanic plains from extremely weak radar returns are qualitatively confirmed by the Viking image data. Large-scale, curvilinear ridges on lava flows in the Memnonia Fossae region are interpreted as innate flow morphology caused by compressional foldover of moving lava sheets of possible rhyolite-dacite composition. The presence or absence of a recent mantle of fine-grained eolian material on the volcanic surfaces studied was determined by the visibility of fresh impact craters with diameters less than 50 m. Lava flows with surfaces modified by eolian erosion and deposition occur west-northwest of Apollinaris Patera at the border of the cratered equatorial uplands and southern Elysium Planitia. Nearby yardangs, for which radar observations indicate very high-rms slopes, are similar to terrestrial features of similar origin.
Electromagnetic scattering analysis of objects at resonance is difficult because low frequency techniques are slow and computer intensive, and high frequency techniques may not be reliable. A new technique for predicting the electromagnetic backscatter from electrically conducting objects at resonance is studied. This technique is based on modeling three dimensional objects as a combination of flat plates where some of the plates are blocking the scattering from others. A cube is analyzed as a simple example. The preliminary results compare well with the Geometrical Theory of Diffraction and with measured data.
This material was presented at the Acoustics Technical Working Group Meeting on April22, 2011. It provides an overview of an experiment called the Jet / Surface Interaction Test which was conducted to expand the database available regarding how a planar surface interacts with a jet to shield and/or enhance the jet noise. This presentation focuses on data obtained during Phase 1 of the test, JSIT1, which was conducted using the Small Hot Jet Acoustic Rig located in the Aeroacoustics Propulsion Lab at NASA GRCduring January and February, 2011. A second phase of the test, JSIT2, is planned for 2012.There were two parts of the phase 1 test. In part 1, known as the shielding surface part of the test, a planar surface was placed between the jet and the microphones. In part 2, the reflecting surface part of the test, the surface was placed on the opposite side of the jet so that the jet noise was free to reflect off the surface toward the microphones. Phased array, pressure sensitive paint, and far field acoustic data obtained during JSIT1 are presented. The phased array data illustrate how the jet noise is blocked by the shielding surface. It also shows that the low frequency scrubbing noise generated when the surface is impacted by the jet comes predominantly from the surface trailing edge. The far field data show the trailing edge noise to be a dipole source. The pressure sensitive paint data show how the pressure distribution on the surface varies as the surface is traversed toward jet.This material was presented at the Acoustics Technical Working Group Meeting on April22, 2011. It provides an overview of an experiment called the Jet/Surface Interaction Test which was conducted to expand the database available regarding how a planar surface interacts with a jet to shield and/or enhance the jet noise. This presentation focuses on data obtained during Phase 1 of the test, JSIT1, which was conducted using the Small Hot Jet Acoustic Rig located in the Aeroacoustics Propulsion Lab at NASA GRCduring January and February, 2011. A second phase of the test, JSIT2, is planned for 2012.There were two parts of the phase 1 test. In part 1, known as the shielding surface part of the test, a planar surface was placed between the jet and the microphones. In part 2, the reflecting surface part of the test, the surface was placed on the opposite side of the jet so that the jet noise was free to reflect off the surface toward the microphones. Phased array, pressure sensitive paint, and far field acoustic data obtained during JSIT1 are presented. The phased array data illustrate how the jet noise is blocked by the shielding surface. It also shows that the low frequency scrubbing noise generated when the surface is impacted by the jet comes predominantly from the surface trailing edge. The far field data show the trailing edge noise to be a dipole source. The pressure sensitive paint data show how the pressure distribution on the surface varies as the surface is traversed toward jet.
A method of bulk manufacturing SiC sensors is disclosed and claimed. Materials other than SiC may be used as the substrate material. Sensors requiring that the SiC substrate be pierced are also disclosed and claimed. A process flow reversal is employed whereby the metallization is applied first before the recesses are etched into or through the wafer. Aluminum is deposited on the entire planar surface of the metallization. Photoresist is spun onto the substantially planar surface of the Aluminum which is subsequently masked (and developed and removed). Unwanted Aluminum is etched with aqueous TMAH and subsequently the metallization is dry etched. Photoresist is spun onto the still substantially planar surface of Aluminum and oxide and then masked (and developed and removed) leaving the unimidized photoresist behind. Next, ITO is applied over the still substantially planar surface of Aluminum, oxide and unimidized photoresist. Unimidized and exposed photoresist and ITO directly above it are removed with Acetone. Next, deep reactive ion etching attacks exposed oxide not protected by ITO. Finally, hot phosphoric acid removes the Al and ITO enabling wires to connect with the metallization. The back side of the SiS wafer may be also etched.
A method of bulk manufacturing SiC sensors is disclosed and claimed. Materials other than SiC may be used as the substrate material. Sensors requiring that the SiC substrate be pierced are also disclosed and claimed. A process flow reversal is employed whereby the metallization is applied first before the recesses are etched into or through the wafer. Aluminum is deposited on the entire planar surface of the metallization. Photoresist is spun onto the substantially planar surface of the Aluminum which is subsequently masked (and developed and removed). Unwanted Aluminum is etched with aqueous TMAH and subsequently the metallization is dry etched. Photoresist is spun onto the still substantially planar surface of Aluminum and oxide and then masked (and developed and removed) leaving the unimidized photoresist behind. Next, ITO is applied over the still substantially planar surface of Aluminum, oxide and unimidized photoresist. Unimidized and exposed photoresist and ITO directly above it are removed with Acetone. Next, deep reactive ion etching attacks exposed oxide not protected by ITO. Finally, hot phosphoric acid removes the Al and ITO enabling wires to connect with the metallization. The back side of the SiC wafer may be also be etched.
An optical image is projected onto a planar surface of a photocathode that derives an electron beam replica of the image. A target electrode displaced relative to the photocathode so that it does not obstruct the optical image includes a planar surface for receiving and deriving an accurate replica of the electron beam image. The two planar surfaces are parallel. The electron beam image is focused on the target electrode by providing throughout a region that extends between the planar surfaces of the photocathode and receiving electrode, constant homogeneous dc electric and magnetic fields. The electric field extends in a direction perpendicular to the planar surfaces while the magnetic field extends along a straight line that intersects the photocathode and target electrode at an acute angle.
Many current and future aircraft designs rely on the wing or other aircraft surfaces to shield the engine noise from observers on the ground. However the available data regarding how a planar surface interacts with a jet to shield and/or enhance the jet noise are currently limited. Therefore, the Jet-Surface Interaction Tests supported by NASA's Fundamental Aeronautics Program's Fixed Wing Project were undertaken to supply experimental data covering a wide range of surface geometries and positions interacting with high-speed jet flows in order to support the development of noise prediction methods. Phase 1 of the Test was conducted in the Aero-Acoustic Propulsion Laboratory at NASA Glenn Research Center and consisted of validating noise prediction schemes for a round nozzle interacting with a planar surface. Phased array data and far-field acoustic data were collected for both the shielded and reflected sides of the surface. Phase 1 results showed that the broadband shock noise was greatly reduced by the surface when the jet was operated at the over-expanded condition, however, it was unclear whether this reduction was due a change in the shock cell structure by the surface. In the present study, Background Oriented Schlieren is implemented in Phase 2 of the Jet-Surface Interaction Tests to investigate whether the planar surface interacts with the high-speed jet ow to change the shock cell structure. Background Oriented Schlieren data are acquired for under-expanded, ideally-expanded, and over-expanded ow regimes for multiple axial and radial positions of the surface at three different plate lengths. These data are analyzed with far-field noise measurements to relate the shock cell structure to the broadband shock noise produced by a jet near a surface.
Planar two-dimensional arrays of thermopiles intended for use as thermal-imaging detectors are to be fabricated by a process that includes surface micromachining. These thermopile arrays are designed to perform better than do prior two-dimensional thermopile arrays. The lower performance of prior two-dimensional thermopile arrays is attributed to the following causes: The thermopiles are made from low-performance thermoelectric materials. The devices contain dielectric supporting structures, the thermal conductances of which give rise to parasitic losses of heat from detectors to substrates. The bulk-micromachining processes sometimes used to remove substrate material under the pixels, making it difficult to incorporate low-noise readout electronic circuitry. The thermoelectric lines are on the same level as the infrared absorbers, thereby reducing fill factor. The improved pixel design of a thermopile array of the type under development is expected to afford enhanced performance by virtue of the following combination of features: Surface-micromachined detectors are thermally isolated through suspension above readout circuitry. The thermopiles are made of such high-performance thermoelectric materials as Bi-Te and Bi-Sb-Te alloys. Pixel structures are supported only by the thermoelectric materials: there are no supporting dielectric structures that could leak heat by conduction to the substrate.
As impact excavation diameters subtend a nontrivial fraction of a planetary body, both the excavation process and ejecta emplacement may depart form the classical description of impacts into a planar surface. Hemispherical particulate targets were impacted at the NASA-Ames Vertical Gun Range in order to trace the evolution of the ejecta curtain and to document the effects of slope and surface curvature on crater shape and cratering efficiency. The experiments suggest that basin size impacts or large craters on small bodies may be shallower than their counterparts on a planar surface but may have displaced a larger relative mass. Moreover, the increased ejecta curtain angle with distance may result in a change in ejecta emplacement style with distance. Although the ejecta curtain is vertical, ejecta within the curtain impact the surface at 45 deg and the time between first and last arrival within the curtain increases. This increased interaction time as the ejecta curtain density decreases should result in a more chaotic style of implacement.
Recent simulations of the interaction between planar surfaces and model Atomic Force Microscope (AFM) tips have suggested that there are conditions under which the tip may become unstable and 'avalanche' toward the sample surface. Here we investigate via computer simulation the stability of a variety of model AFM tip configurations with respect to the avalanche transition for a number of fcc metals. We perform Monte-Carlo simulations at room temperature using the Equivalent Crystal Theory (ECT) of Smith and Banerjea. Results are compared with recent experimental results as well as with our earlier work on the avalanche of parallel planar surfaces. Our results on a model single-atom tip are in excellent agreement with recent experiments on tunneling through mechanically-controlled break junctions.
An apparatus, and its accompanying method, for reducing the drag of flows over a surface includes arrays of small disks and sensors. The arrays are embedded in the surface and may extend above, or be depressed below, the surface, provided they remain hydraulically smooth either when operating or when inactive. The disks are arranged in arrays of various shapes, and spaced according to the cruising speed of the vehicle on which the arrays are installed. For drag reduction at speeds of the order of 30 meters/second, preferred embodiments include disks that are 0.2 millimeter in diameter and spaced 0.4 millimeter apart. For drag reduction at speeds of the order of 300 meters/second, preferred embodiments include disks that are 0.045 millimeter in diameter and spaced 0.09 millimeter apart. Smaller and larger dimensions for diameter and spacing are also possible. The disks rotate in the plane of the surface, with their rotation axis substantially perpendicular to the surface. The rotating disks produce velocity perturbations parallel to the surface in the overlying boundary layer. The sensors sense the flow at the surface and connect to control circuitry that adjusts the rotation rates and duty cycles of the disks accordingly. Suction and blowing holes can be interspersed among, or made coaxial with, the disks for creating general three-component velocity perturbations in the near-surface region. The surface can be a flat, planar surface or a nonplanar surface, such as a triangular riblet surface. The present apparatus and method have potential applications in the field of aeronautics for improving performance and efficiency of commercial and military aircraft, and in other industries where drag is an obstacle, including gas and oil delivery through long-haul pipelines.
A description is presented of the liquid-phase epitaxial (LPE) growth of high-quality InGaAsP/InP continuous-wave (CW) laser structures on (110) InP substrates using conventional LPE without the need for special growth procedures. Double heterojunction laser structures were grown using the LPE supercooling method with a horizontal sliding boat. Low broad-area current densities (970 A/sq cm) and CW operation achieved at room temperature indicate that results comparable to up-to-date devices may be achieved. The inherent tendency for surface planarity maintenance due to the perfect surface stoichiometry of the (110) surface is a feature that may lend itself to the generation of improved interface growth in quaternary III-V and related semiconductor alloy systems. The similar cross-sectional appearance of structures grown on (110) and (100) orientations show that conventional LPE can be used with (110) surface planes without introducing special growth procedures.
New developments for X-ray nanomachinging include pattern transfer onto non-planar surfaces coated with eletrodeposited resists using synchrotron radion X-rays through extremely high-resolution masks made by chemically assisted focused ion beam lithography.