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Results for “thin-film characterization”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1993

Viscoelastic characterization of thin-film polymers exposed to low Earth orbit

The materials made available through the Long Duration Exposure Facility (LDEF) satellite provide a set of specimens that can be well characterized and have a known exposure history with reference to atomic oxygen and ultraviolet radiation exposure. Mechanical characteristics measured from control samples and exposed samples provide a data base for predicting the behavior of polymers in low earth orbit. Samples of 1.0 mil thick low density polyethylene were exposed to the low earth orbit environment for a period of six years. These materials were not directly exposed to ram atomic oxygen and offer a unique opportunity for measuring the effect of atomic oxygen and UV radiation on mechanical properties with little concern to the effect of erosion. The viscoelastic characteristics of these materials were measured and compared to the viscoelastic characteristics of control samples. To aid in differentiating the effects of changes in crystallinity resulting from thermal cycling, from the effects of changes in chemical structure resulting from atomic oxygen/UV attack to the polymer, a second set of control specimens, annealed to increase crystallinity, were measured as well. The resulting characterization of these materials will offer insight into the impact of atomic oxygen/UV on the mechanical properties of polymeric materials. The viscoelastic properties measured for the control, annealed, and exposed specimens were the storage and loss modulus as a function of frequency and temperature. From these datum is calculated the viscoelastic master curve derived using the principle of time/temperature superposition. Using the master curve, the relaxation modulus is calculated using the method of Ninomiya and Ferry. The viscoelastic master curve and the stress relaxation modulus provide a direct measure of the changes in the chemical or morphological structure. In addition, the effect of these changes on long-term and short-term mechanical properties is known directly. It should be noted that the dependence on directionality for the polymer films was considered since these films were manufactured by a blown-film process.

Letton, Alan↗
NASA NTRS1988

Proposed acceptance, qualification, and characterization tests for thin-film PV modules

Details of a proposed test program for PV thin-film modules which the Department of Energy has directed the Solar Energy Research Institute (SERI) to prepare are presented. Results of one of the characterization tests that SERI has performed are also presented. The objective is to establish a common approach to testing modules that will be acceptable to both users and manufacturers. The tests include acceptance, qualification, and characterization tests. Acceptance tests verify that randomly selected modules have similar characteristics. Qualification tests are based on accelerated test methods designed to simulate adverse conditions. Characterization tests provide data on performance in a predefined environment.

Waddington, D.↗
NASA NTRS1989

Surface characterization and testing II; Proceedings of the Meeting, San Diego, CA, Aug. 10, 11, 1989

Various papers on surface characterization and testing are presented. Individual topics addressed include: simple Hartmann test data interpretation, optimum configuration of the Offner null corrector, system for phase-shifting interferometry in the presence of vibration, fringe variation and visibility in speckle-shearing interferometry, functional integral representation of rough surfaces, calibration of surface heights in an interferometric optical profiler, image formation in common path differential profilometers, SEM of optical surfaces, measuring surface profiles with scanning tunneling microscopes, surface profile measurements of curved parts, high-resolution optical profiler, scanning heterodyne interferometer with immunity from microphonics, real-time crystal axis measurements of semiconductor materials, radial metrology with a panoramic annular lens, surface analysis for the characterization of defects in thin-film processes, Spacelab Optical Viewport glass assembly optical test program for the Starlab mission, scanning differential intensity and phase system for optical metrology.

Greivenkamp, John E.↗
NASA NTRS1991

High-efficiency heteroepitaxial InP solar cells

High-efficiency, thin-film InP solar cells grown heteroepitaxially on GaAs and Si single-crystal bulk substrates are being developed as a means of eliminating the problems associated with using single-crystal InP substrates. A novel device structure employing a compositionally graded Ga(x)In(1-x)As layer between the bulk substrate and the InP cell layers is used to reduce the dislocation density and improve the minority carrier properties in the InP. The structures are grown in a continuous sequence of steps using computer-controlled atmospheric pressure metalorganic vapor phase epitaxy (APMOVPE). Dislocation densities as low as 3 x 10(exp 7) sq cm and minority carrier lifetimes as high as 3.3 ns are achieved in the InP layers with this method using both GaAs or Si substrates. Structures prepared in this fashion are also completely free of microcracks. These results represent a substantial improvement in InP layer quality when compared to heteroepitaxial InP prepared using conventional techniques such as thermally cycled growth and post-growth annealing. The present work is is concerned with the fabrication and characterization of high-efficiency, thin-film InP solar cells. Both one-sun and concentrator cells were prepared for device structures grown on GaAs substrates. One-cell cells have efficiencies as high as 13.7 percent at 25 C. However, results for the concentrator cells are emphasized. The concentrator cell performance is characterized as a function of the air mass zero (AM0) solar concentration ratio and operating temperature. From these data, the temperature coefficients of the cell performance parameters are derived as a function of the concentration ratio. Under concentration, the cells exhibit a dramatic increase in efficiency and an improved temperature coefficient of efficiency. At 25 C, a peak conversion efficiency of 18.9 percent is reported. At 80 C, the peak AM0 efficiency is 15.7 percent at 75.6 suns. These are the highest efficiencies yet reported for InP heteroepitaxial cells. Approaches for further improving the cell performance are discussed.

Wanlass, M. W.↗
NASA NTRS1990

Electrical characterization of chemically modified YBa2Cu3O(7-x) surfaces

Results on electrical characterization of YBa2Cu3O(7-x) thin-film surfaces treated with a Br/ethanol chemical etch are presented. Electrical measurements of YBa2Cu3O(7-x)/Au/Nb device structures fabricated using polycrystalline, post-annelaed YBa2Cu3O(7-x) films with Br-etched surfaces, show improvements of approximately one or two orders of magnitude in current densities and resistivities (resistance-area products) relative to unetched devices. The existence of supercurrents in these structures has been confirmed by observation of the ac Josephson effect, and by magnetic field and temperature studies of the critical currents. The Br-etch process has produced 10 x 10 sq micron devices with critical current densities greater than 400 A/sq cm and resistivities as low as 4 x 10 to the -7th ohm/sq cm.

Hunt, B. D.↗
NASA NTRS1989

Experience with advanced instrumentation in a hot section cascade

The Lewis Research Center gas turbine Hot Section Test Facility was developed to provide a real engine environment with known boundary conditions for the aerothermal performance evaluation and verification of computer design codes. This verification process requires experimental measurements in a hostile environment. The research instruments used in this facility are presented, and their characteristics and how they perform in this environment are discussed. The research instrumentation consisted of conventional pressure and temperature sensors, as well as thin-film thermocouples and heat flux gages. The hot gas temperature was measured by an aspirated temperature probe and by a dual-element, fast-response temperature probe. The data acquisition mode was both steady state and time dependent. These experiments were conducted over a wide range of gas Reynolds numbers, exit gas Mach numbers, and heat flux levels. This facility was capable of testing at temperatures up to 1600 K, and at pressures up to 18 atm. These corresponded to an airfoil exit Reynolds number range of 0.5 x 10(6) to 2.5 x 10(6) based on the airfoil chord of 5.55 cm. The results characterize the performance capability and the durability of the instrumentation. The challenge of making measurements in hostile environments is also discussed. The instruments exhibited more than adequate durability to achieve the measurement profile. About 70 percent of the thin-film thermocouples and the dual-element temperature probe survived several hundred thermal cycles and more than 35 hr at gas temperatures up to 1600 K. Within the experimental uncertainty, the steady-state and transient heat flux measurements were comparable and consistent over the range of Reynolds numbers tested.

Yeh, Frederick C.↗
NASA NTRS1986

Theoretical and material studies on thin-film electroluminescent devices

Electroluminescent materials and device technology were assessed. The evaluation strongly suggests the need for a comprehensive theoretical and experimental study of both materials and device structures, particularly in the following areas: carrier generation and multiplication; radiative and nonradiative processes of luminescent centers; device modeling; new device concepts; and single crystal materials growth and characterization. Modeling of transport properties of hot electrons in ZnSe and the generation of device concepts were initiated.

Summers, C. J.↗
NASA NTRS1978

Effects of ultrathin oxides in conducting MIS structures on GaAs

Schottky barrier-type GaAs baseline devices (semiconductor surface etched and then immediately metalized) and GaAs conducting metal oxide-semiconductor devices are fabricated and characterized. The baseline surfaces (no purposeful oxide) are prepared by a basic or an acidic etch, while the surface for the MIS devices are prepared by oxidizing after the etch step. The metallizations used are thin-film Au, Ag, Pd, and Al. It is shown that the introduction of purposeful oxide into these Schottky barrier-type structures examined on n-type GaAs modifies the barrier formation, and that thin interfacial layers can modify barrier formation through trapping and perhaps chemical reactions. For Au- and Pd-devices, enhanced photovoltaic performance of the MIS configuration is due to increased barrier height.

Childs, R. B.↗
NASA NTRS1993

Vapor-Exposure Cell For Testing Thin-Film Electrodes

Vapor-exposure test cell (VETC) designed to be used in testing thin-film electrodes on solid electrolytes electrochemically at high temperature. Use of VETC much simpler and less expensive than testing alkali-metal thermal-to-electric converter (AMTEC) fuel cell, electrolysis cell, or other entire device containing solid electrolyte and electrodes of material and configuration to be characterized.

Ryan, Margaret A.↗
NASA NTRS1986

Overview of advanced components for fiber optic systems

The basic operating principles and potential performance of several state-of-the-art fiber-optic devices are illustrated with diagrams and briefly characterized. Technologies examined include high-birefringence polarization-maintaining fibers and directional couplers, single-mode fiber polarizers and cut-off polarizers, optical-fiber modulators with radially poled piezoactive polymer (PVF2) jackets, and piezoelectric-squeezer polarization modulators. The need for improved manufacturing techniques to make such fiber-optic devices cost-competitive with their thin-film integrated-optics analogs is indicated.

Depaula, Ramon P.↗
NASA NTRS1991

A space ultra-vacuum experiment - Application to material processing

An experiment to create and characterize an ultra-vacuum environment in low earth orbit is being developed. A wake region is known to form behind a satellite in low earth orbit. Limited theoretical and experimental results for flowfields around spacecraft are available and a brief discussion of these results is presented. The space experiment package to create an ultra-vacuum condition in the wake region is referred to as the Wake Shield Facility (WSF), manifested for flight on the Space Shuttle in 1993. In the vacuum region, epitaxial thin-films will be processed by molecular and chemical beam epitaxial growth techniques. Various particle flowfield and materials processing considerations for this experiment are presented.

Sega, R. M.↗
NASA NTRS1986

Hydrazine reduction of transition metal oxides - In situ characterization using X-ray photoelectron spectroscopy

The transition metal oxides (TMOs) V2O5, FeO3, Co3O4, NiO, CuO, and ZnO were exposed to hydrazine at various pressures. The metallic surfaces were surveyed by in situ X-ray photoelectron spectroscopy to determine the irrelative rate of reduction by hydrazine. The most easily reducible oxide, CuO, could be reduced to the metallic state at room temperature and 10 to the -6th torr. The reaction is first order with respect to CuO, with an activation energy of about 35 kJ/mol. Two types of adsorption were seen to occur at 295 K: (1) a reversible component in which the measured N:Cu ratio increased to 0.60 at hydrazine pressures up to 0.5 torr, and (2) an irreversible component, with a N:Cu ratio of 0.28, which could not be removed by extended vacuum pumping. The results of this study are useful for the identification of TMO's that can be used as solid neatallizers of hydrazine spills, and for the preparation of metal surfaces for electroplating and evaporative thin-film coating.

Littrell, D. M.↗
NASA NTRS1993

Defects in electro-optically active polymer solids

There is considerable current interest in the application of organic and polymeric materials for electronic and photonic devices. The rapid, non-linear optical (NLO) response of these materials makes them attractive candidates for waveguides, interferometers, and frequency doublers. In order to realize the full potential of these systems, it is necessary to develop processing schemes which can fabricate these molecules into ordered arrangements. There is enormous potential for introducing well-defined, local variations in microstructure to control the photonic properties of organic materials by rational 'defect engineering.' This effort may eventually become as technologically important as the manipulation of the electronic structure of solid-state silicon based devices is at present. The success of this endeavor will require complimentary efforts in the synthesis, processing, and characterization of new materials. Detailed information about local microstructure will be necessary to understand the influence of symmetry breaking of the solid phases near point, line, and planar defects. In metallic and inorganic polycrystalline materials, defects play an important role in modifying macroscopic properties. To understand the influence of particular defects on the properties of materials, it has proven useful to isolate the defect by creating bicrystals between two-component single crystals. In this way the geometry of a grain boundary defect and its effect on macroscopic properties can be determined unambiguously. In crystalline polymers it would be valuable to establish a similar depth of understanding about the relationship between defect structure and macroscopic properties. Conventionally processed crystalline polymers have small crystallites (10-20 nm), which implies a large defect density in the solid state. Although this means that defects may play an important or even dominant role in crystalline or liquid crystalline polymer systems, it also makes it difficult to isolate the effect of a particular boundary on a macroscopically observed property. However, the development of solid-state and thin-film polymerization mechanisms have facilitated the synthesis of highly organized and ordered polymers. These systems provide a unique opportunity to isolate and investigate in detail the structure of covalently bonded solids near defects and the effect of these defects on the properties of the material. The study of defects in solid polymers has been the subject of a recent review (Martin, 1993).

Martin, David C.↗
NASA NTRS1972

Thin-film diffusion brazing of titanium alloys

A thin film diffusion brazing technique for joining titanium alloys by use of a Cu intermediate is described. The method has been characterized in terms of static and dynamic mechanical properties on Ti-6Al-4V alloy. These include tensile, fracture toughness, stress corrosion, shear, corrosion fatigue, mechanical fatigue and acoustic fatigue. Most of the properties of titanium joints formed by thin film diffusion brazing are equal or exceed base metal properties. The advantages of thin film diffusion brazing over solid state diffusion bonding and brazing with conventional braze alloys are discussed. The producibility advantages of this process over others provide the potential for producing high efficiency joints in structural components of titanium alloys for the minimum cost.

Mikus, E. B.↗
NASA NTRS1984

Failure analysis of thin-film amorphous-silicon solar-cell modules

A failure analysis of thin film amorphous silicon solar cell modules was conducted. The purpose of this analysis is to provide information and data for appropriate corrective action that could result in improvements in product quality and reliability. Existing techniques were expanded in order to evaluate and characterize degradational performance of a-Si solar cells. Microscopic and macroscopic defects and flaws that significantly contribute to performance degradation were investigated.

Kim, Q.↗
NASA NTRS1989

Construction and performance of a high-temperature-superconductor composite bolometer

A high-Tc superconducting bolometer has been constructed using a YBa2Cu3O(x) thin-film meander line 20 microns wide and 76,000 microns long, deposited on a SrTiO3 substrate. Radiation is absorbed by a thin film of Bi with well-characterized absorption properties deposited on a Si substrate in contact with the SrTiO3. At 1.8 Hz the measured bolometer response to a 500-K blackbody is 5.2 V/W (820 V/W extrapolated to dc). The impact of apparent nonohmic behavior at the transition is discussed, as are ways of reducing the observed 1/f noise. The response time is 32 s and is dominated by the heat capacity of the SrTiO3 substrate.

Brasunas, J. C.↗
NASA NTRS1990

Microwave characterization of high-temperature superconducting thin films using stripline resonators

A method was derived for the extraction of the surface resistivity (Rs) of high-Tc superconducting (HTS) thin films at microwave frequencies, using a stripline resonator circuit. Surface resistivity values were calculated by measuring the difference in Q-values of a stripline resonator configuration when an HTS thin film was substituted for one of the metallic ground planes. Cryogenic tests were completed for several stripline resonator structures, yielding accurate predictions of the HTS thin-film performance at frequencies between 3 and 26 GHz (in harmonics of approximately 3 GHz). These results were then used to illustrate the dependence of HTS surface resistivity on frequency and temperature in the microwave frequency band.

Macdonald, Alan D.↗
NASA NTRS1993

Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, July 19-22, 1992

The present volume on multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography discusses AXAF grazing incidence mirrors, the theory and high throughput optics of grazing incidence optics, multilayer mirror fabrication and characterization, and multilayer optics for X-ray projection lithography. Attention is given to the VETA-I X-ray detection system, a motion detection system for AXAF X-ray ground testing, image analysis of the AXAF VETA-I X-ray mirror, and optical constants from mirror reflectivities measured at synchrotrons. Topics discussed include the application of aberration theory to calculate encircled energy of Wolter I-II telescopes, W/C multilayers deposited on plastic films, nonspecular X-ray scattering from Si/Mo multilayers, and multilayer thin-film design as FUV polarizers. Also discussed are thin-film filter lifetesting results in the EUV, chromospheric and coronal observations with multilayer optics, present and future requirements of soft X-ray projection lithography, and the imaging Schwarzschild multilayer X-ray microscope.

Hoover, Richard B.↗