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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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9 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1974

Tantalum capacitor behavior under fast transient overvoltages

Tantalum capacitors were tested to determine failure time when subjected to short-duration, high-voltage surges caused by lightning strikes. Lightning is of concern to NASA because of possible damage to critical spacecraft circuits. The test was designed to determine the minimum time for tantalum capacitor failure and the amount of overvoltage a capacitor could survive, without permanent damage, in 100 microseconds. All tested exhibited good recovery from the transient one-shot pulses with no failure at any voltage, forward or reverse, in less than 25 microseconds.

Zill, J. A.↗
NASA NTRS1983

Electrical insulation design requirements and reliability goals

The solar cells in a photovoltaic module which must be electrically isolated from module exterior surfaces to satisfy a variety of safety and operating considerations are discussed. The performance and reliability of the insulation system are examined. Technical requirements involve the capability of withstanding the differential voltage from the solar cells to the module frame. The maximum system voltage includes consideration of maximum open circuit array voltages achieved under low-temperature, high-irradiance conditions, and transient overvoltages due to system feedback of lightning transients. The latter is bounded by the characteristics of incorporated voltage limiting devices such as MOVs.

Ross, R. G., Jr.↗
NASA NTRS1980

Surge protection with automatic reset

Circuit turns power off automatically when surge occurs and restores power when voltage returns to normal. Transmitters and other equipment are protected in electrically noisy environments; however, if three transient overvoltages (or continuous overvoltage) are sensed within 3.2 seconds, circuit turns power supply off permanently since serious failure may have occurred.

Chan, R. B.↗
NASA NTRS1981

Analytical investigation of critical MHD phenomena

Development and analysis of schemes for suppression of the startup overvoltage transient in the AEDC High Performance Demonstration Experiment (HPDE), analysis of performance enhancement due to electrode voltage drop reduction by use of pyrolytic graphites in the HPDE, prediction of optimal loading schemes for the HPDE, prediction of PHDE performance with a diagonal electrical connection, and predictions of the likelihood and effects of axial current leakage between adjacent electrodes in the HPDE are reviewed. Simulations of tests at the AEDC/HPDE with STD Research Corporation multidimensional and time dependent computer codes provided additional validation for the computer codes and shed light on physical mechanisms which govern performance and durability of MHD power generators. The magnetoaerothermal effect was predicted by STD Research Corporation to have a significant effect on the HPDE/MHD generator performance at high interaction.

Source record↗
NASA NTRS2000

Temperature Distribution Within a Defect-Free Silicon Carbide Diode Predicted by a Computational Model

Most solid-state electronic devices diodes, transistors, and integrated circuits are based on silicon. Although this material works well for many applications, its properties limit its ability to function under extreme high-temperature or high-power operating conditions. Silicon carbide (SiC), with its desirable physical properties, could someday replace silicon for these types of applications. A major roadblock to realizing this potential is the quality of SiC material that can currently be produced. Semiconductors require very uniform, high-quality material, and commercially available SiC tends to suffer from defects in the crystalline structure that have largely been eliminated in silicon. In some power circuits, these defects can focus energy into an extremely small area, leading to overheating that can damage the device. In an effort to better understand the way that these defects affect the electrical performance and reliability of an SiC device in a power circuit, the NASA Glenn Research Center at Lewis Field began an in-house three-dimensional computational modeling effort. The goal is to predict the temperature distributions within a SiC diode structure subjected to the various transient overvoltage breakdown stresses that occur in power management circuits. A commercial computational fluid dynamics computer program (FLUENT-Fluent, Inc., Lebanon, New Hampshire) was used to build a model of a defect-free SiC diode and generate a computational mesh. A typical breakdown power density was applied over 0.5 msec in a heated layer at the junction between the p-type SiC and n-type SiC, and the temperature distribution throughout the diode was then calculated. The peak temperature extracted from the computational model agreed well (within 6 percent) with previous first-order calculations of the maximum expected temperature at the end of the breakdown pulse. This level of agreement is excellent for a model of this type and indicates that three-dimensional computational modeling can provide useful predictions for this class of problem. The model is now being extended to include the effects of crystal defects. The model will provide unique insights into how high the temperature rises in the vicinity of the defects in a diode at various power densities and pulse durations. This information also will help researchers in understanding and designing SiC devices for safe and reliable operation in high-power circuits.

Kuczmarski, Maria A.↗
NASA NTRS2006

Single Event Transients in Voltage Regulators for FPGA Power Supply Applications

As with other bipolar analog devices, voltage regulators are known to be sensitive to single event transients (SET). In typical applications, large output capacitors are used to provide noise immunity. Therefore, since SET amplitude and duration are generally small, they are often of secondary importance due to this capacitance filtering. In low voltage applications, however, even small SET are a concern. Over-voltages may cause destructive conditions. Under-voltages may cause functional interrupts and may also trigger electrical latchup conditions. In addition, internal protection circuits which are affected by load as well as internal thermal effects can also be triggered from heavy ions, causing dropouts or shutdown ranging from milliseconds to seconds. In the case of FPGA power supplies applications, SETS are critical. For example, in the case of Actel FPGA RTAX family, core power supply voltage is 1.5V. Manufacturer specifies an absolute maximum rating of 1.6V and recommended operating conditions between 1.425V and 1.575V. Therefore, according to the manufacturer, any transient of amplitude greater than 75 mV can disrupt normal circuit functions, and overvoltages greater than 100 mV may damage the FPGA. We tested five low dropout voltage regulators for SET sensitivity under a large range of circuit application conditions.

Poivey, Christian↗
NASA NTRS2018

Advanced Stirling Convertor Control Unit Testing at NASA Glenn Research Center in the Radioisotope Power Systems System Integration Laboratory

Future NASA missions could include long-duration flyby, orbital, lander, or rover applications where generating power from sunlight may be limited. Radioisotope power systems (RPSs) provide a dependable power source for missions where inadequate sunlight or operational requirements make other power systems impractical. Over the past 16 years, NASA Glenn Research Center has been supporting the development of RPSs. The advanced Stirling radioisotope generator (ASRG) utilized a pair of advanced Stirling convertors (ASCs). Although flight development of the ASRG has been canceled, much of the technology and hardware continued development and testing to guide future activities. Specifically, a controller for the convertor(s) is an integral part of a Stirling-based RPS. For the ASRG design, the controller maintains stable operation of the convertors, regulates the alternating current produced by the linear alternator of the convertor, provides a specified direct-current output voltage for the spacecraft, and synchronizes the piston motion of the two convertors to minimize vibration as well as manage and maintain operation with a stable piston amplitude and hot-end temperature. It not only provides power to the spacecraft but also must regulate convertor operation to avoid damage to internal components and maintain safe thermal conditions after fueling. Lockheed Martin Coherent Technologies, Inc., has designed, developed, and tested an ASC control unit engineering development unit (ACU EDU) to support this effort. GRC used the ACU EDU as part of its nonnuclear representation of a RPS that also consists of a Dual advanced Stirling convertor simulator (DASCS), and associated support equipment to perform a test in the Radioisotope Power Systems System Integration Laboratory (RSIL). The RSIL was designed and built with flexibility to evaluate hardware utilizing RPS technology. The RSIL provides insight into the electrical interactions between as many as three radioisotope power generators, associated control strategies, and typical electric system loads. The first phase of testing included a DASCS that was developed by Johns Hopkins University Applied Physics Laboratory and simulates the operation and electrical behavior of a pair of ASCs in real time via a combination of hardware and software. Testing included the following spacecraft electrical energy storage configurations: capacitor, battery, and supercapacitor. Testing of the DASCS and ACU in each energy storage configuration included simulation of a typical mission profile and transient voltage and current data during load turnon and turnoff. Testing for these devices also included the initiation of several system faults such as short circuits, electrical bus overvoltage, undervoltage, and a "dead bus" recovery to restore normal power operations. The goal of this testing was to verify operation of the ACU(s) when connected to a spacecraft electrical bus. The results of these tests are presented here.

General↗
NASA NTRS1982

Lightning protection of wind turbines

Possible damages to wind turbine components due to lightning strikes are discussed and means to prevent the damage are presented. A low resistance path to the ground is noted to be essential for any turbine system, including metal paths on nonmetal blades to conduct the strike. Surge arrestors are necessary to protect against overvoltages both from utility lines in normal operation and against lightning damage to control equipment and contactors in the generator. MOS structures are susceptible to static discharge injury, as are other semiconductor devices, and must be protected by the presence of static protection circuitry. It is recommended that the electronics be analyzed for the circuit transient response to a lightning waveform, to induced and dc current injection, that input/output leads be shielded, everything be grounded, and lightning-resistant components be chosen early in the design phase.

Dodd, C. W.↗