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Results for “zernike phase contrast”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2015

Image segmentation of nanoscale Zernike phase contrast X-ray computed tomography images

Zernike phase contrast is a useful technique for nanoscale X-ray computed tomography (CT) imaging of materials with a low X-ray absorption coefficient. It enhances the image contrast by phase shifting X-ray waves to create changes in amplitude. However, it creates artifacts that hinder the use of traditional image segmentation techniques. We propose an image restoration method that models the X-ray phase contrast optics and the three-dimensional image reconstruction method. We generate artifact-free images through an optimization problem that inverts this model. Though similar approaches have been used for Zernike phase contrast in visible light microscopy, this optimization employs an effective edge detection method tailored to handle Zernike phase contrast artifacts. We characterize this optics-based restoration method by removing the artifacts in and thresholding multiple Zernike phase contrast X-ray CT images to produce segmented results that are consistent with the physical specimens. We quantitatively evaluate and compare our method to other segmentation techniques to demonstrate its high accuracy.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2020

X-ray Nanocomputed Tomography in Zernike Phase Contrast for Studying 3D Morphology of Li–O 2 Battery Electrode

In this work, we investigated the lithium peroxide (Li 2 O 2 ) and pore size distribution in lithium-O 2 battery electrodes at different states of charge using transmission X-ray microscopy coupled with Zernike phase contrast to carry out nano-Computed Tomography. We report that such technique enables, at the nanoscale, to distinguish light elements such as carbon and Li 2 O 2 in Li-O 2 battery cathode electrodes. We verified by wave-propagation simulation that this approach efficiently improves the contrast of images in comparison with the pure absorption. The Li 2 O 2 distribution and thickness, interphases, and pore network are visualized and quantified, which give a valuable insight into our cathode architecture. From this 3D analysis, we highlight modifications of the air-cathode morphology and the Li 2 O 2 spatial organization as well as their potential implication in terms of carbon surface passivation and pore-clogging. After the full recharge process, this technique can also reveal the spatial distribution of the residual Li 2 O 2 and other byproducts.

25 ENERGY STORAGE↗
DOE OSTI2017

Morphological and Electrochemical Characterization of Nanostructured Li 4 Ti 5 O 12 Electrodes Using Multiple Imaging Mode Synchrotron X-ray Computed Tomography

In this study, synchrotron X-ray computed tomography has been utilized using two different imaging modes, absorption and Zernike phase contrast, to reconstruct the real three-dimensional (3D) morphology of nanostructured Li 4 Ti 5 O 12 (LTO) electrodes. The morphology of the high atomic number active material has been obtained using the absorption contrast mode, whereas the percolated solid network composed of active material and carbon-doped polymer binder domain (CBD) has been obtained using the Zernike phase contrast mode. The 3D absorption contrast image revealed that some LTO nano-particles tend to agglomerate and form secondary micro-sized particles with varying degrees of sphericity. The tortuosity of electrode’s pore and solid phases were found to have directional dependence, different from Bruggeman’s tortuosity commonly used in macro-homogeneous models. The electrode’s heterogeneous structure was investigated by developing a numerical model to simulate galvanostatic discharge process using the Zernike phase contrast mode. The inclusion of CBD in the Zernike phase contrast results in an integrated percolated network of active material and CBD that is highly suited for continuum modeling. As a result, the simulation results highlight the importance of using the real 3D geometry since the spatial distribution of physical and electrochemical properties have a strong non-uniformity due to microstructural heterogeneities.

25 ENERGY STORAGE↗
DOE OSTI2014

A broader view on EUV-masks: adding complementary imaging modes to the SHARP microscope

The authors are expanding the capabilities of the SHARP microscope by implementing complementary imaging modes. SHARP (the SEMATECH High-NA Actinic Reticle review Project) is an actinic, synchrotron-based microscope dedicated to extreme ultraviolet (EUV) photomask research. SHARP’s programmable Fourier Synthesis Illuminator and its use of Fresnel zoneplate lenses as imaging optics provide a versatile framework, facilitating the implementation of diverse modes beyond conventional imaging. In addition to SHARP’s set of standard zoneplates, we have created more than 100 zoneplates for complementary imaging modes, all designed to extract additional information from photomasks, improve navigation and enhance defect detection. More than 50 new zoneplates are installed in the tool; the remaining lenses are currently in production. Here in this paper we discuss the design and fabrication of zoneplates for complementary imaging modes and present image data, obtained using Zernike Phase Contrast and different implementations of Differential Interference Contrast.

36 MATERIALS SCIENCE↗
DOE OSTI2014

Laboratory micro- and nanoscale X-ray tomographic investigation of Al–7 at.%Cu solidification structures

X-ray computed tomography across multiple length scales provides an opportunity to non-destructively visualize and quantify the micro- to nano-scale microstructural features of solidification structures in three dimensions. Aluminum–7 at.%copper samples were directionally solidified at three cooling rates (0.44, 0.67, and 1.33 °C/s), resulting in systematic changes in the as-solidified microstructure, which are difficult to quantify using traditional microscopic techniques. The cooling rate of a material affects its ultimate microstructure, and characterizing that microstructure is key to predicting and understanding its bulk properties. Here, two different laboratory X-ray computed tomography instruments were used to characterize as-solidified microstructures, including micro-scale computed tomography with approximately 1 mm field-of-view, ∼ 1.7 μm resolution, and nano-scale X-ray computed tomography ∼ 65 μm FOV, 150 nm resolution. Micro-scale X-ray radiography and computed tomography enabled a quantitative investigation of changes in the primary dendritic solidification structure with increasing cooling rate. Nano-scale absorption contrast X-ray computed tomography resolved the distinct phases of the lamellar eutectic structure and three dimensional measurements of the ∼ 1 μm interlamellar spacing. It is found that the lamella eutectic structure thickness is inversely proportional to the cooling rate. Nano-scale Zernike phase contrast was also used to image voids at eutectic colony boundaries. The application and resolution of these two instruments are discussed with respect to the resolvable features of the solidification structures. - Highlights: • Al–Cu eutectic is a model system for studying solidification microstructure. • X-ray computed tomography provides a 3D picture of these complex structures. • Micro-scale tomography images the primary and secondary dendritic structures. • Nano-scale tomography images the eutectic lamella and measures its thickness. • The ∼ 1 micrometer thickness of the eutectic lamella correlates to the cooling rate.

36 MATERIALS SCIENCE↗
DOE OSTI2021

Information transfer as a framework for optimized phase imaging

In order to efficiently image a non-absorbing sample (a phase object), dedicated phase contrast optics are required. Typically, these optics are designed with the assumption that the sample is weakly scattering, implying a linear relation between a sample’s phase and its transmission function. In the strongly scattering, nonlinear case, the standard optics are ineffective, and the transfer functions used to characterize them are uninformative. We use the Fisher information (FI) to assess the efficiency of various phase imaging schemes and to calculate an information transfer function (ITF). We show that a generalized version of Zernike phase contrast is efficient given sufficient prior knowledge of the sample. We show that with no prior knowledge, a random sensing measurement yields a significant fraction of the available information. Finally, we introduce a generalized approach to common path interferometry that can be optimized to prioritize sensitivity to particular sample features. Each of these measurements can be performed using Fourier lenses and phase masks.

Koppell, Stewart↗
DOE OSTI2016

Pollen structure visualization using high-resolution laboratory-based hard X-ray tomography

A laboratory-based X-ray microscope is used to investigate the 3D structure of unstained whole pollen grains. For the first time, high-resolution laboratory-based hard X-ray microscopy is applied to study pollen grains. Based on the efficient acquisition of statistically relevant information-rich images using Zernike phase contrast, both surface- and internal structures of pine pollen - including exine, intine and cellular structures - are clearly visualized. The specific volumes of these structures are calculated from the tomographic data. The systematic three-dimensional study of pollen grains provides morphological and structural information about taxonomic characters that are essential in palynology. Such studies have a direct impact on disciplines such as forestry, agriculture, horticulture, plant breeding and biodiversity. - Highlights: • The unstained whole pine pollen was visualized by high-resolution laboratory-based HXRM for the first time. • The comparison study of pollen grains by LM, SEM and high-resolution laboratory-based HXRM. • Phase contrast imaging provides significantly higher contrast of the raw images compared to absorption contrast imaging. • Surface and internal structure of the pine pollen including exine, intine and cellular structures are clearly visualized. • 3D volume data of unstained whole pollen grains are acquired and the specific volumes of the different layer are calculated.

60 APPLIED LIFE SCIENCES↗
DOE OSTI2015

Quantitative phase retrieval with arbitrary pupil and illumination

We present a general algorithm for combining measurements taken under various illumination and imaging conditions to quantitatively extract the amplitude and phase of an object wave. The algorithm uses the weak object transfer function, which incorporates arbitrary pupil functions and partially coherent illumination. The approach is extended beyond the weak object regime using an iterative algorithm. Finally, we demonstrate the method on measurements of Extreme Ultraviolet Lithography (EUV) multilayer mask defects taken in an EUV zone plate microscope with both a standard zone plate lens and a zone plate implementing Zernike phase contrast.

97 MATHEMATICS AND COMPUTING↗
NASA NTRS2015

Zernike Wavefront Sensor Modeling Development for LOWFS on WFIRST-AFTA

WFIRST-AFTA design makes use of an existing 2.4m telescope for direct imaging of exoplanets. To maintain the high contrast needed for the coronagraph, wavefront error (WFE) of the optical system needs to be continuously sensed and controlled. Low Order Wavefront Sensing (LOWFS) uses the rejected starlight from an immediate focal plane to sense wavefront changes (mostly thermally induced low order WFE) by combining the LOWFS mask (a phase plate located at the small center region with reflective layer) with the starlight rejection masks, i.e. Hybrid Lyot Coronagraph (HLC)'s occulter or Shaped Pupil Coronagraph (SPC)'s field stop. Zernike wavefront sensor (ZWFS) measures phase via the phase-contrast method and is known to be photon noise optimal for measuring low order aberrations. Recently, ZWFS was selected as the baseline LOWFS technology on WFIST/AFTA for its good sensitivity, accuracy, and its easy integration with the starlight rejection mask. In this paper, we review the theory of ZWFS operation, describe the ZWFS algorithm development, and summarize various numerical sensitivity studies on the sensor performance. In the end, the predicted sensor performance on SPC and HLC configurations are presented.

Zernike phase contrast↗
NASA NTRS2011

Phase-Shifting Zernike Interferometer Wavefront Sensor

The canonical Zernike phase-contrast technique transforms a phase object in one plane into an intensity object in the conjugate plane. This is done by applying a static pi/2 phase shift to the central core (approx. lambda/diameter) of the PSF which is intermediate between the input and output plane. Here we present a new architecture for this sensor. First, the optical system is simple and all reflective, and second the phase shift in the central core of the PSF is dynamic and can be made arbitrarily large. This common-path, all-reflective design makes it minimally sensitive to vibration, polarization and wavelength. We review the theory of operation, describe the optical system, summarize numerical simulations and sensitivities and review results from a laboratory demonstration of this novel instrument.

Zernike phase-contrast↗
NASA NTRS2011

Phase-Shifting Zernike Interferometer Wavefront Sensor

The canonical Zernike phase-contrast technique1,2,3,4 transforms a phase object in one plane into an intensity object in the conjugate plane. This is done by applying a static pi/2 phase shift to the central core (approx. lambda/D) of the PSF which is intermediate between the input and output planes. Here we present a new architecture for this sensor. First, the optical system is simple and all reflective. Second, the phase shift in the central core of the PSF is dynamic and or arbitrary size. This common-path, all-reflective design makes it minimally sensitive to vibration, polarization and wavelength. We review the theory of operation, describe the optical system, summarize numerical simulations and sensitivities and review results from a laboratory demonstration of this novel instrument

wavefront sensing↗
NASA NTRS2004

Simple broadband implementation of a phase contrast wavefront sensor for adaptive optics

The most critical element of an adaptive optics system is its wavefront sensor, which must measure the closed-loop difference between the corrected wavefront and an ideal template at high speed, in real time, over a dense sampling of the pupil. Most high-order systems have used Shack-Hartmann wavefront sensors, but a novel approach based on Zernike's phase contrast principle appears promising. In this paper we discuss a simple way to achromatize such a phase contrast wavefront sensor, using the pi/2 phase difference between reflected and transmitted rays in a thin, symmetric beam splitter. We further model the response at a range of wavelengths to show that the required transverse dimension of the focal-plane phase-shifting spot, nominally lambda/D, may not be very sensitive to wavelength, and so in practice additional optics to introduce wavelength-dependent transverse magnification achromatizing this spot diameter may not be required. A very simple broadband implementation of the phase contrast wavefront sensor results.

wavefront sensors↗
DOE OSTI2026

The ABCs of phase retrieval: Connecting the acronyms of scanning transmission electron microscopy

High-resolution scanning transmission electron microscopy (S/TEM) is an indispensable tool for characterizing the structure and properties of materials down to the atomic scale. Conventional S/TEM imaging, however, is limited by the phase problem, whereby the phase of the electron exit wave is lost upon detection. Recent advances in diffractive imaging and 4D-STEM have enabled a range of phase-retrieval techniques that computationally reconstruct the missing information encoded in the phase of the transmission function. These approaches offer improved dose efficiency and enhanced sensitivity to weakly scattering signals, extending quantitative imaging to beam-sensitive materials composed of light elements. In this work, we introduce the phase problem in electron microscopy and survey the diverse landscape of phase-retrieval techniques used in the field. Despite their many acronyms and algorithmic variations, these techniques share a common physical and mathematical foundation. We present a unified framework that connects these seemingly distinct methods, from parallax imaging and tilt-corrected bright-field (tcBF-STEM), to aberration-corrected bright-field (acBF-STEM), optimum bright-field (OBF-STEM) and single-sideband (SSB) ptychography, as well as first-moment integrated center of mass techniques (iCOM) and iterative ptychographic algorithms. Based on these insights, we discuss the opportunities and practical limitations of applying these methods across different materials systems, detector designs, and microscope configurations.Graphical abstractRepresentative electron microscopy configurations used for phase retrieval and diffractive imaging in S/TEM: (a) Zernike phase-contrast transmission electron microscopy (TEM), (b) small-convergence-angle four-dimensional scanning transmission electron microscopy (4D-STEM) for nanobeam-based phase reconstruction methods, and (c) large-convergence-angle 4D-STEM for ptychographic and related diffractive imaging techniques reviewed in this work.

36 MATERIALS SCIENCE↗
NASA NTRS2016

Zernike Wavefront Sensor (ZWFS) Development for Low Order Wavefront Sensing (LOWFS)

ZWFS is known to be photon noise optimal for measuring low order aberrations. Recently, ZWFS was selected as the baseline LOWFS technology on WFIRST for its sensitivity, accuracy, and its ease of integration with the starlight rejection mask. In this paper, we present the development of ZWFS sensor, including the algorithm description, sensitivity analysis, and some early experimental model validation results from a fabricated ZWFS phase mask on a stand-alone LOWFS testbed.

Zernike phase contrast↗
DOE OSTI2017

A method for measuring the nonlinear refractive index from the contrast of an amplitude object image in the optical scheme with phase Zernike filters based on electronic Kerr nonlinearity

We propose a method for determining the nonlinear refractive index from the image contrast of amplitude objects in the phase-contrast scheme with a sample acting as a phase Zernike filter based on the electronic Kerr nonlinearity. This method implies the measurement of the calibration dependence of the contrast of an amplitude object image on the laser pulse energy for a test sample with a known nonlinearity and makes it possible to find the nonlinear refractive index of samples under study using a single laser pulse. (paper)

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
NASA NTRS1953

A New Simple Interferometer for Obtaining Quantitatively Evaluable Flow Patterns

The method described in the present report makes it possible to obtain interferometer records with the aid of any one of the available Schlieren optics by the addition of very simple expedients, which fundamentally need not to be inferior to those obtained by other methods, such as the Mach-Zehnder interferometer, for example. The method is based on the fundamental concept of the phase-contrast process developed by Zernike, but which in principle has been enlarged to such an extent that it practically represents an independent interference method for general applications. Moreover, the method offers the possibility, in case of necessity, of superposing any apparent wedge field on the density field to be gauged. The theory is explained on a purely physical basis and illustrated and proved by experimental data. A number of typical cases are cited and some quantitative results reported.

INSTRUMENTS - INTERFEROMETERS↗
DOE OSTI2023

Reflective Phase-Contrast for High-Contrast Imaging of van der Waals Heterostructure

Optical microscopy plays a critical role in the fabrication of two-dimensional (2D) van der Waals heterostructures. An outstanding challenge in conventional microscopy is to visualize transparent 2D layers as well as embedded monolayers in a stacked heterostructure with high optical contrast. Phase-contrast microscopy, first developed by Frits Zernike in the 1930s, leverages the interference effect between specimen scattered light and background light to increase the contrast of transparent specimens. Such phase-contrast microscopy, always in a transmission configuration, revolutionized the study of transparent cellular structures in biology. Here, we develop a versatile reflective phase-contrast microscopy for imaging 2D heterostructures. We employ two spatial light modulators to flexibly control the intensity and phase of the illumination and the reflected light. This reflective phase-contrast microscopy achieves unprecedented high contrast for imaging a transparent 2D monolayer. In conclusion, it also enables direct observation of 2D monolayers embedded inside a thick heterostructure that are "invisible" in conventional microscopy.

77 NANOSCIENCE AND NANOTECHNOLOGY↗