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Ao, Tommy

Publications and source records attributed to Ao, Tommy.

At least 19 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2024

X-Ray Generation for Diffraction Experiments on Z

Explanation of the concept and benefit of X-ray diffraction in the context of material sciences on Z. Explanation why we use ZBL and ZPW for these experiments and what the progress on X-ray generation for this purpose is.

Geissel, Matthias↗
DOE OSTI2024

DENNIS: a design and analysis tool for dynamic material x-ray diffraction experiments

We present DENNIS (Diffraction Experiment desigN and aNalysiS): a graphical software tool useful for the design and analysis of dynamic x-ray diffraction experiments, such as those performed on the Z Pulsed Power Facility, Thor Pulsed Power Generator, and Dynamic Compression Sector (DCS) of the Advanced Photon Source. DENNIS provides rapid powder and single-crystal diffraction pattern predictions and powder diffraction pattern image integration in three-dimensional geometries. Additional features include crystallographic information file reading, image processing, and synthetic diffraction pattern image generation. We overview the software's capabilities, detail the prediction and integration methodologies, and provide example implementations on Z and DCS experiments.

47 OTHER INSTRUMENTATION↗
DOE OSTI2024

X-ray Conversion Efficiencies for Diffraction Experiments on Z

We have used a deep-depletion CCD camera in single-hit mode to measure X-ray conversion efficiencies with Z-Beamlet and Z-Petawatt. Z-Petawatt is superior to Z-Beamlet for X-rays harder than 10 keV. For diffraction samples with Z > 42, we likely require X-rays with 15 keV or higher photon energy (Z-Petawatt). We are developing a robust, reproducible setup for X-ray polycapillaries as a part for X-ray diffraction experiments (XRD).

Geissel, Matthias↗
DOE OSTI2023

Design and Characterization of a Lens-Coupled System for Dynamic X-Ray Diffraction

X-ray diffraction (XRD) is a necessary technique for understanding states of materials under static and dynamic loading conditions. The higher-pressure Equation of State (EOS) of many materials can only be explored via shock or ramp compression at temperatures and pressures of interest. While static XRD work has yielded EOS measurements in the 100 - 200 GPa regime, dynamic X-ray diffraction (DXRD) can explore EOS phases in the TPa regime, which closely resembles inner-core planetary conditions. DXRD hinges on the ability to measure the exact phase or phase change of a material while under dynamic loading conditions. Macroscopic diagnostic systems (e.g. velocimetry and pyrometry) can infer a phase change but not identify the specific phase entered by a material. While microscopic (atomic-level) diagnostic systems (e.g. DXRD) have been designed and implemented in Department of Energy’s (DOE) National Laboratories complex, the unique nature of Sandia National Laboratories’ Pulsed Power Facility (Z Machine) prohibits the use of such devices. The destructive nature of Z experiments presents a challenge to data capture and retrieval. Furthermore there are electromagnetic interference, X-ray background, and mechanical constraints to consider. Thus, a multi-part X-ray diagnostic for use on the Z Machine and Z-Beamlet Laser system has been designed and analyzed. Portions of this new DYnamic SCintillator Optic (DYSCO) have been built, tested and fielded. A data analysis software has been written. Finally, the radiance profile of the DYSCO’s scintillator has been characterized through experiments performed at the University of Arizona.

36 MATERIALS SCIENCE↗