DOE OSTI · 2586338
X-ray Conversion Efficiencies for Diffraction Experiments on Z
Abstract
We have used a deep-depletion CCD camera in single-hit mode to measure X-ray conversion efficiencies with Z-Beamlet and Z-Petawatt. Z-Petawatt is superior to Z-Beamlet for X-rays harder than 10 keV. For diffraction samples with Z > 42, we likely require X-rays with 15 keV or higher photon energy (Z-Petawatt). We are developing a robust, reproducible setup for X-ray polycapillaries as a part for X-ray diffraction experiments (XRD).
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Geissel, Matthias, Ao, Tommy, Fulford, Karin Wikander, Looker, Quinn Michael, Rambo, Patrick K., Seagle, Christopher T, Speas, Robert James, Yang, Chi, Porter, John L.. 2024-06-01. X-ray Conversion Efficiencies for Diffraction Experiments on Z. https://doi.org/10.2172/2586338
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