Engineering topics
Publications and source records attributed to Looker, Quinn Michael.
Explanation of the concept and benefit of X-ray diffraction in the context of material sciences on Z. Explanation why we use ZBL and ZPW for these experiments and what the progress on X-ray generation for this purpose is.
We have used a deep-depletion CCD camera in single-hit mode to measure X-ray conversion efficiencies with Z-Beamlet and Z-Petawatt. Z-Petawatt is superior to Z-Beamlet for X-rays harder than 10 keV. For diffraction samples with Z > 42, we likely require X-rays with 15 keV or higher photon energy (Z-Petawatt). We are developing a robust, reproducible setup for X-ray polycapillaries as a part for X-ray diffraction experiments (XRD).