DOE OSTI2023Efficacy of Spatial and Temporal RHBD Techniques at Advanced Bulk FinFET Technology NodesNot provided.Engineering↗
DOE OSTI2023Evaluation of the Single-Event-Upset Vulnerability for Low-Energy Protons at the 7- and 5-nm Bulk FinFET NodesNot provided.Engineering↗
DOE OSTI2023Single-Event Upset Cross-Section Trends for D-FFs at the 5- and 7-nm Bulk FinFET Technology NodesNot provided.Engineering↗
DOE OSTI2022Modeling Logic Error Single-Event Cross Sections at the 7-nm Bulk FinFET Technology NodeNot provided.Engineering↗