Modeling Logic Error Single-Event Cross Sections at the 7-nm Bulk FinFET Technology Node

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Xiong, Yoni, Feeley, Alexandra T. (ORCID:0000000162881315), Ball, Dennis R., Bhuva, Bharat L. (ORCID:000000022171100X). 2022-03-01. Modeling Logic Error Single-Event Cross Sections at the 7-nm Bulk FinFET Technology Node. https://doi.org/10.1109/tns.2021.3138501

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