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Barbee, T. W.

Publications and source records attributed to Barbee, T. W..

Computation of Bragg Reflection for Layered Microstructures

Bragg diffractors analyzed for use in X-ray mirrors and other applications. SLM tailored to specific applications by varying layer thicknesses and number of layers to control reflectivity diffraction width, and wavelength resolution. Applications as glancing incidence mirrors or filters for wavelengths of few to few hundred angstroms.

Underwood, J. W.

X-ray and extreme ultraviolet imaging using layered synthetic microstructures

Up to now designers of X-ray optical instruments such as microscopes and telescopes have been compelled to use mirrors operating at small glancing angles. However, using vapor deposition techniques, it is now possible to build multilayered thin film structures in which the individual layers have thicknesses comparable with a wavelength of X-rays. These devices operate in a manner exactly analogous to multilayer dielectric coatings at visible wavelengths and can be used to increase the X-ray and extreme ultraviolet reflectivity of surfaces at large glancing angles. These X-ray mirrors have numerous potential applications in X-ray optics. Attention is given to X-ray images with a normal incidence mirror, and applications of multilayer optics. Single-mirror telescopes for solar/stellar astronomy are discussed, taking into account solar corona and transition region studies, and X-ray and extreme ultraviolet astronomy. Hybrid X-ray telescopes are also considered.

Underwood, J. H.