NASA NTRS · 19830000300
Computation of Bragg Reflection for Layered Microstructures
Abstract
Bragg diffractors analyzed for use in X-ray mirrors and other applications. SLM tailored to specific applications by varying layer thicknesses and number of layers to control reflectivity diffraction width, and wavelength resolution. Applications as glancing incidence mirrors or filters for wavelengths of few to few hundred angstroms.
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Underwood, J. W., Barbee, T. W.. 1984-04-01. Computation of Bragg Reflection for Layered Microstructures. https://ntrs.nasa.gov/citations/19830000300
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