Destructive breakdown in thin films of SiO, MgF sub 2, CaF sub 2, CeF sub 3, CeO sub 2, and Teflon.
Prebreakdown and breakdown electrical properties and light emission during destructive breakdown in thin film capacitors
Budenstein, P. P.↗
Engineering topics
Budenstein, P. P.
Publications and source records attributed to Budenstein, P. P..
Destructive breakdown in thin films of SiO, MgF sub 2, CaF sub 2, CeF sub 3, CeO sub 2, and Teflon.
Prebreakdown and breakdown electrical properties of thin film capacitors with certain oxides, fluorides and Teflon dielectrics
Budenstein, P. P.↗
Breakdown conduction in thin films of SiO, MgF2, CaF2, CeF3, CeO2 and Teflon Final report
Breakdown conduction in thin film dielectrics of silicon oxide, magnesium fluoride, calcium fluoride, cesium oxides, cesium fluorides, and Teflon
Budenstein, P. P.↗
Breakdown conduction in Al-SiO-Al capacitors.
Destructive breakdown conduction in aluminum- silicon oxide-aluminum capacitors, discussing voltage threshold, etc
THRESHOLD CURRENT↗